TY - CONF A1 - Unger, Wolfgang A1 - Gross, Thomas T1 - XPS/ESCA - Ringversuchsergebnisse T2 - Sofa 2003 T2 - Seminar Oberflächenanalytik "Technische Aspekte der Akkreditierung nach ISO/IEC 17025" CY - Berlin, Deutschland DA - 2003-01-24 PY - 2003 SP - 1 EP - 3 AN - OPUS4-2120 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Holzweber, Markus A1 - Hodoroaba, Vasile-Dan A1 - Unger, Wolfgang T1 - What about ionic liquids as a 'hot' certified reference material candidate to check your EDS below 1 keV? T2 - M&M 2015 - Microscopy & Microanalysis (Proceedings) N2 - Energy-dispersive X-ray spectrometry (EDX) is one of the most applied methods used for the analysis of the chemical composition of solids and thin films. Recent progress in EDS (Energy Dispersive X-ray Spectrometer) technology has increased the general performance also in the energy range < 1 keV addressing low Z elements. Suitable test materials to be employed especially to check the low-energy EDS performance – also in line with ISO 15632 - are rather limited and mainly based on C K and F K lines. In order to obtain valid results in laboratories accredited in compliance with ISO/IEC 17025 it is necessary to periodically check the instrument performance. T2 - M&M 2015 - Microscopy & Microanalysis CY - Portland, Oregon, USA DA - 02.08.2015 KW - Reference material KW - EDX KW - Ionic liquids PY - 2015 DO - https://doi.org/10.1017/S1431927615009356 VL - 21 SP - Suppl. 3, Paper 0856 AN - OPUS4-34211 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Friedrich, Jörg Florian A1 - Unger, Wolfgang A1 - Lippitz, Andreas A1 - Koprinarov, Ivaylo A1 - Weidner, Steffen A1 - Kühn, Gerhard ED - Nowack, H. T1 - Wechselwirkungen zwischen plasmamodifizierten Polymeroberflächen und Metallen T2 - Plasmatec '97 T2 - 5. Internationale Fachtagung - ND-Plasma-Technologie CY - Duisburg, Deutschland DA - 1997-09-22 PY - 1997 VL - 5 SP - 1(?) EP - 17(?) PB - Print-Service CY - Mülheim AN - OPUS4-6995 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - Web site for information on reference materials T2 - EC Thematic Network on Glow Discharge Spectrometry for Spectrochemical Analysis T2 - Proceedings of the Final Meeting CY - Wiener Neustadt, Austria DA - 2002-03-04 PY - 2002 SP - 1(?) EP - 3(?) AN - OPUS4-1472 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Röhsler, Andreas A1 - Sobol, Oded A1 - Nolze, Gert A1 - Unger, Wolfgang A1 - Böllinghaus, Thomas T1 - Use of time-of-flight secondary ion mass spectrometry for the investigation of hydrogen-induced effects in austenitic steel AISI 304L T2 - Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena N2 - During the energy transformation from fossil fuels to renewable energy sources, the use of hydrogen as fuel and energy storage can play a key role. This presents new challenges to industry and the scientific community alike. The storage and transport of hydrogen, which is nowadays mainly realized by austenitic stainless steels, remains problematic, which is due to the degradation of mechanical properties and the possibility of phase transformation by hydrogen diffusion and accumulation. The development of materials and technologies requires a fundamental understanding of these degradation processes. Therefore, studying the behavior of hydrogen in austenitic steel contributes to an understanding of the damage processes, which is crucial for both life assessment and safe use of components in industry and transportation. As one of the few tools that is capable of depicting the distribution of hydrogen in steels, time-of-flight secondary ion mass spectrometry was conducted after electrochemical charging. To obtain further information about the structural composition and cracking behavior, electron-backscattered diffraction and scanning electron microscopy were performed. Gathered data of chemical composition and topography were treated employing data fusion, thus creating a comprehensive portrait of hydrogen-induced effects in the austenite grade AISI 304L. Specimens were electrochemically charged with deuterium instead of hydrogen. This arises from the difficulties to distinguish between artificially charged hydrogen and traces existing in the material or the rest gas in the analysis chamber. Similar diffusion and permeation behavior, as well as solubility, allow nonetheless to draw conclusions from the experiments. T2 - 21st International Conference on Secondary Ion Mass Spectrometry CY - Kraków, Poland DA - 10.09.2017 KW - AISI 304L KW - Hydrogen KW - ToF-SIMS KW - Austenitic stainless steel PY - 2018 DO - https://doi.org/10.1116/1.5013931 SN - 1071-1023 VL - 36 IS - 3 SP - Article 03F103, 1 EP - 6 PB - American Vacuum Society (AVS) AN - OPUS4-44840 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Friedrich, Jörg Florian A1 - Unger, Wolfgang A1 - Lippitz, Andreas A1 - Koprinarov, Ivaylo A1 - Weidner, Steffen A1 - Kühn, Gerhard ED - Schindel-Bidinelli, E. T1 - Umweltfreundliches Metallisieren von Kunststoffen durch Plasmavorbehandlung in einem geschlossenen Reaktor T2 - Kleben : Grundlagen, Technologie, Anwendung T2 - Swissbonding 97 ; 11. Internationales Symposium Klebtechnik und Umwelt ; 11th International Symposium Bonding and Sealing Technology CY - Rapperswil, Schweiz DA - 1997-05-26 PY - 1997 SP - 1(?) EP - 3(?) PB - SWIBOTECH CY - Rorbas AN - OPUS4-6994 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - The application of X-ray Photoelectron Spectroscopy (ESCA) and X-Ray Absorption Spectroscopy (NEXAFS) in Interface Analysis of Metallized Polymers T2 - Summer Workshop on "Functionalized Surfaces: Applications and Analytical Tools" T2 - Summer Workshop "Functionalized Surfaces: Applications and Analytical Tools" CY - Zurich, Switzerland DA - 1999-07-05 KW - ESCA KW - NEXAFS PY - 1999 SP - F1 EP - F12 AN - OPUS4-797 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - The application of X-ray Photoelectron Spectroscopy (ESCA) and X-Ray Absorption Spectroscopy (NEXAFS) in Interface Analysis of Metallized Polymers T2 - AIST-BAM Symposium on Materials Surface Technology in Twin Institute Programme T2 - AIST-BAM Symposium on Materials Surface Technology in Twin Institute Programme CY - Tsukuba, Japan DA - 2003-02-18 PY - 2003 SP - 53 EP - 58 AN - OPUS4-6929 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Matsubayashi, N. A1 - Imamura, M. A1 - Tanaka, T. A1 - Shimada, H. A1 - Retzko, Iris A1 - Unger, Wolfgang T1 - Surface Analysis by XPS and XAS Using a High-Rsolution and High-Flux Soft X-ray from Synchrotron T2 - AIST-BAM Symposium on Materials Surface Technology in Twin Institute Programme T2 - AIST-BAM Symposium on Materials Surface Technology in Twin Institute Programme CY - Tsukuba, Japan DA - 2003-02-18 KW - XPS KW - XAS KW - DLC KW - Synchrotron Radiation PY - 2003 SP - 67 EP - 69 AN - OPUS4-6927 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Retzko, Iris A1 - Unger, Wolfgang A1 - Gesatzke, Wolfgang A1 - Scholl, A. A1 - Kilcoyne, A. D. A1 - Koprinarov, I. A1 - Ade, H. A1 - Hitchcock, A. P. A1 - Schulz, H. A1 - Scheibe, H.-J. ED - Tamura, L. S. T1 - Spectromicroscopy with inhomogeneous ta - C samples T2 - Advanced Light Source Compendium of User Abstracts 2002 PY - 2003 UR - http://repositories.cdlib.org/lbnl/LBNL-52519/ SP - 1 EP - 3(?) AN - OPUS4-4694 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang A1 - Böse, Olaf A1 - Gross, Thomas A1 - Lippitz, Andreas A1 - Gelius, U. ED - Boehlig, H. T1 - Results of a VAMAS TWA 2 inter-laboratory test experimen - Evaluation of static charge stabilization and determination methods in XPS on non-conducting samples T2 - Proceedings of the 11th Conference on Applied Surface Analysis (Applied surface science 179.2001,1) T2 - 11th Conference on Applied Surface Analysis (AOFA) CY - Leipzig, Germany DA - 2000-09-24 PY - 2000 SN - 0169-4332 VL - 179 IS - 1 PB - Elsevier CY - Amsterdam AN - OPUS4-978 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Friedrich, Jörg Florian A1 - Koprinarov, Ivaylo A1 - Giebler, Rainer A1 - Lippitz, Andreas A1 - Unger, Wolfgang T1 - Reactions and Intermediates at the Metal-Polymer Interface - Detected by XPS and NEXAFS Spectroscopy T2 - Proceedings of the 4th European Conference on Adhesion (EURADH '98) and 1st World Congress on Adhesion and Related Phenomena (WCARP-1) (The journal of adhesion 75.2001,1) T2 - 4th European Conference on Adhesion (EURADH '98) ; 1st World Congress on Adhesion and Related Phenomena (WCARP) CY - Garmisch-Partenkirchen, Germany DA - 1998-09-06 PY - 1998 SN - 0021-8464 VL - 75 IS - 1 SP - 1.60 EP - 1.62 PB - Gordon & Breach CY - New York, NY AN - OPUS4-6991 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Friedrich, Jörg Florian A1 - Ghode, Archana A1 - Kühn, Gerhard A1 - Weidner, Steffen A1 - Geng, Shiming A1 - Retzko, Iris A1 - Unger, Wolfgang A1 - Lippitz, Andreas ED - Schindel-Bidinelli, E. T1 - Polymeroberflächenfunktionalisierungen im gepulsten Plasma mit nachfolgender chemischer Behandlung T2 - Kleben 2000 - konstruktionsgerechtes praxisnahes und innovatives Fügen T2 - 14. Internationales Symposium Swissbonding ; 14. Internationaler Kongreß Swiss Bonding ; 14th Swiss Bonding 00 CY - Rapperswil, Schweiz DA - 2000-05-16 PY - 2000 SP - 31 EP - 44 PB - SWIBOTECH GmbH CY - Bülach AN - OPUS4-6980 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Friedrich, Jörg Florian A1 - Wigant, L. A1 - Unger, Wolfgang A1 - Lippitz, Andreas A1 - Weidner, Steffen A1 - Kühn, Gerhard A1 - Geng, Sh. A1 - Erdmann, J. A1 - Gorsler, H.-V. T1 - Plasmavorbehandlungen von Polymeroberflächen T2 - 2. Freiberger Polymertag : 30. Mai 1995 / Forschungsinstitut für Leder- und Kunstledertechnologie, Aninstitut der TU Bergakademie Freiberg T2 - 2. Freiberger Polymertag CY - Freiberg DA - 1995-05-30 PY - 1995 SP - 17 Seiten CY - Freiberg AN - OPUS4-7014 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang ED - Blasek, G. T1 - Plasmapolymerschichten: Zu den Möglichkeiten einer chemischen Charakterisierung mit den Methoden ESCA, ToF-SIMS und Röntgen-absorptions-Spektroskopie (XAS) T2 - Tagungsband des 12. Neuen Dresdener Vakuumtechnischen Kolloquium (NDVaK) T2 - 12. Neues Dresdener Vakuumtechnisches Kolloquium (NDVaK) CY - Dresden, Deutschland DA - 2004-10-14 KW - ESCA KW - ToF-SIMS KW - XAS KW - Plasma-Polymerisation PY - 2004 SP - 133 EP - 140 PB - Dresdner Transferstelle für Vakuumtechnik CY - Dresden AN - OPUS4-4699 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Güttler, B. A1 - Schiel, D. A1 - Danzebrink, H. A1 - Unger, Wolfgang A1 - Gross, Thomas A1 - Lippitz, Andreas A1 - Müller, J.-P. T1 - Physical and Chemical Characterization of Thermal and Native Siliconoxide layers on Silicon T2 - Symposium "Reference Materials for Technologies in the New Millenium" T2 - Symposium "Reference Materials for Technologies in the New Millenium" CY - Berlin, BAM, Germany DA - 2000-05-22 PY - 2000 SP - 1(?) EP - 7(?) AN - OPUS4-6924 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Bütefisch, S. A1 - Weimann, T. A1 - Busch, I. A1 - Danzebrink, H.-U. A1 - Gross, Thomas A1 - Unger, Wolfgang A1 - Wirth, Thomas T1 - New reference material for imaging XPS (X-ray photoelectron spectroscopy) instrument characterization T2 - Sensor 2015 - 17th International conference on sensors and measurement technology (Proceedings - AMA conferences 2015) N2 - Reference materials without variations in topography are essential for the characterization of imaging XPS (X-ray Photoelectron Spectroscopy) Instruments. Therefore a new fabrication process for this kind of zero-topography reference material was developed at PTB and resulted in first prototypes. The fabrication process and first measurement results will be presented in this paper. T2 - Sensor 2015 - 17th International conference on sensors and measurement technology CY - Nuremberg, Germany DA - 19.05.2015 KW - Imaging XPS KW - Reference material KW - Topography free KW - Micro technology PY - 2015 SN - 978-3-9813484-8-4 DO - https://doi.org/10.5162/sensor2015/P7.1 SP - Chapter P7, 821 EP - 825 AN - OPUS4-33837 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - Methoden der Oberflächen- und Schichtanalytik - Anwendungen, Normung und Qualitätssicherung T2 - 12. Jahreskolloquium "Analyse von Feststoffen unterschiedlicher Materialien aus Industrie und Umwelt" T2 - 12. Jahreskolloquium "Analyse von Feststoffen unterschiedlicher Materialien aus Industrie und Umwelt" CY - Berlin, Deutschland DA - 2002-11-19 PY - 2002 AN - OPUS4-1997 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang A1 - Lippitz, Andreas A1 - Koprinarov, Ivaylo A1 - Friedrich, Jörg Florian A1 - Wöll, Ch. T1 - K-Edge Soft X-ray Absorption (NEXAFS) Spectroscopy In Surface Chemical Analysis of Polymers T2 - Program, abstracts, participants T2 - International Discussion Meeting Advanced Methods of Polymer Characterization: New Developments and Applications in Industry CY - Mainz, Germany DA - 1999-03-15 PY - 1999 SP - P3.53 CY - Mainz AN - OPUS4-6925 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Straub, Franka A1 - Böllinghaus, Thomas A1 - Unger, Wolfgang A1 - Mente, Tobias ED - Somerday, B. P. ED - Sofronis, P. T1 - In-situ detection of Deuterium in duplex stainless steels by time-of-flight secondary ion mass spectrometry (TOF-SIMS) T2 - Hydrogen-materials interactions - Proceedings of the International Hydrogen Conference (IHC 2012) T2 - Hydrogen-materials interactions - 2012 International hydrogen conference CY - Moran, WY, USA DA - 2012-09-09 PY - 2014 SN - 978-0-7918-6029-8 SP - 505 EP - 512 PB - ASME CY - New York AN - OPUS4-27669 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Sobol, Oded A1 - Boellinghaus, Thomas A1 - Wirth, Thomas A1 - Unger, Wolfgang A1 - Eliezer, D. T1 - High resolution ToF-SIMS imaging of deuterium permeation and cracking in duplex stainless steels T2 - 2016 International Hydrogen Conference N2 - Fundamental understanding and elucidation of hydrogen assisted degradation and trapping mechanisms is dependent on sufficient imaging techniques for respective hydrogen interactions, in particular with multi-phase metallic microstructures. The present work shows the progress in elucidating the deuterium behavior in austenitic-ferritic duplex stainless steels under the consideration that deuterium behaves in many ways similarly to hydrogen. A novel combination of deuterium permeation and in-situ Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) imaging technique is compared with post charging ToF-SIMS imaging experiments. As a step beyond state-of-the-art, integration of chemo-metric and high resolution structural characterization techniques with computational multivariate data analysis (MVA) and data fusion is presented. T2 - 2016 International Hydrogen Conference CY - Grand Teton National Park, Jackson Lake Lodge, Wyoming, USA DA - 11.09.2016 KW - DSS KW - ToF-SIMS KW - Data-fusion KW - EBSD PY - 2017 SN - 978-0-7918-6138-7 SP - 407 EP - 415 PB - ASME Press CY - Two Park Ave. New-York, NY 10016, USA AN - OPUS4-42647 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Friedrich, Jörg Florian A1 - Mix, Renate A1 - Kühn, Gerhard A1 - Unger, Wolfgang T1 - Functional groups bearing plasma homo and copolymer layers as adhesion promoters in metal-polymer composites T2 - Beschichtung und Modifizierung von Kunststoffoberflächen : 10. Neues Dresdner Vakuumtechnisches Kolloquium T2 - 10. Neues Dresdner Vakuumtechnisches Kolloquium (NDVaK) CY - Dresden, Germany DA - 2002-10-17 PY - 2002 SP - 6 EP - 15 PB - DTVa CY - Dresden AN - OPUS4-6970 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Retzko, Iris A1 - Friedrich, Jörg Florian A1 - Kühn, Gerhard A1 - Lippitz, Andreas A1 - Unger, Wolfgang T1 - Eine neue Generation von alterungsbeständigen Plasmapolymeren mit definierter chemischer Struktur T2 - Beschichtung und Modifizierung von Kunststoffoberflächen : 8. Neues Dresdner Vakuumtechnisches Kolloquium T2 - 8. Neues Dresdner Vakuumtechnisches Kolloquium (NDVaK) CY - Dresden, Deutschland DA - 2000-10-19 PY - 2000 VL - 8 SP - 110 EP - 114 CY - Dresden AN - OPUS4-6974 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Gross, Thomas A1 - Lippitz, Andreas A1 - Unger, Wolfgang T1 - Charakterisierung von Siliziumoxidschichten auf Silizium mit ESCA - Ein Beitrag zur Präszisionsbestimmung der Avogadro-Konstanten T2 - EMASS 2000 T2 - EMASS 2000 CY - Berlin, Deutschland DA - 2000-11-10 PY - 2000 AN - OPUS4-1020 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Friedrich, Jörg Florian A1 - Unger, Wolfgang A1 - Lippitz, Andreas A1 - Weidner, Steffen A1 - Geng, Sh. A1 - Wigant, L. A1 - Wöll, Ch. A1 - Erdmann, J. A1 - Gorsler, H.-V. T1 - Characterization of plasma-modified organic surfaces by electron spectroscopy, SEIRA, and MALDI-TOF-MS T2 - Proceedings of the 6th European Conference on Applications of Surface and Interface Analysis T2 - 6th European Conference on Applications of Surface and Interface Analysis CY - Montreux, Switzerland DA - 1995-10-09 PY - 1995 SP - TC 11 PB - Wiley CY - Chichester AN - OPUS4-7001 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - Bewertung & Charakterisierung technischer Oberflächen für die verarbeitende Industrie T2 - Bewertung & Charakterisierung technischer Oberflächen für die verarbeitende Industrie T2 - Workshop und Präsentation CY - Bergisch Gladbach, Deutschland DA - 2000-05-11 PY - 2000 CY - Dresden AN - OPUS4-999 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Retzko, Iris A1 - Treu, Dieter A1 - Matsubayashi, N. A1 - Imamura, M. A1 - Tanaka, T. A1 - Schulz, H. A1 - Lippitz, Andreas A1 - Unger, Wolfgang T1 - Analysis of carbon materials and plasma polymers by X-ray photoelectron spectroscopy and X-ray absorption spectroscopy (XPS, XAS) T2 - AIST-BAM Symposium on Materials Surface Technology in Twin Institute Programme T2 - AIST-BAM Symposium on Materials Surface Technology in Twin Institute Programme CY - Tsukuba, Japan DA - 2003-02-18 PY - 2003 SP - 59 EP - 65 AN - OPUS4-6928 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Senoner, Mathias A1 - Unger, Wolfgang A1 - Koenders, L. A1 - Wilkening, G. T1 - Accuracy of step height determination by Atomic Force Microscopy - results of an inter-laboratory comparison T2 - Proceedings of the 3rd International Conference European Society for Precision Engineering and Nanotechnology (euspen) T2 - 3rd International Conference European Society for Precision Engineering and Nanotechnology (euspen) CY - Eindhoven, The Netherlands DA - 2002-05-26 PY - 2002 SP - 773 EP - 776 AN - OPUS4-1415 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Senoner, Mathias A1 - Wirth, Thomas A1 - Unger, Wolfgang T1 - A reference material for calibration and testing of instruments with nanometric lateral resolution T2 - SIMS Europe 2002 T2 - SIMS Europe 2002 ; 3rd European Workshop on Secondary Ion Mass Spectrometry CY - Münster, Germany DA - 2002-09-15 PY - 2002 SP - 58 AN - OPUS4-6841 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -