TY - CONF A1 - Pollakowski, B. A1 - Holzlechner, Gerald A1 - Lippitz, Andreas A1 - Beckhoff, B. A1 - Unger, Wolfgang T1 - Qualifying PDMS deposited on silicon wafer surfaces as calibration standard for organic matter by X-ray spectrometry and XPS N2 - Polydimethylsiloxane (PDMS)is one of the most appearing contamination of medical devices.Dedicated analysis of PDMS on surfaces necessary, but the lack of calibration samples provides a bottle neck. There is a demand for metrological tools ensuring traceable and reliable analysis of mass deposition and of the chemical species of contaminants. Photoelectron spectroscopy (PES) and reference-free GIXRF can be used to qualify bench top instrumentation. Comparison of PES data and GIXRF data enable the establishment of a traceability chain. T2 - EXRS 2016, European Conference on X - ray Spectrometry CY - Gothenburg, Sweden DA - 19.06.2016 KW - Silicone analysis KW - XPS KW - GIXRF PY - 2016 AN - OPUS4-37295 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -