TY - JOUR A1 - Liehr, Sascha A1 - Breithaupt, Mathias A1 - Krebber, Katerina T1 - Distributed humidity sensing in PMMA optical fibers at 500 nm and 650 nm wavelengths JF - Sensors N2 - Distributed measurement of humidity is a sought-after capability for various fields of application, especially in the civil engineering and structural health monitoring sectors. This article presents a method for distributed humidity sensing along polymethyl methacrylate (PMMA) polymer optical fibers (POFs) by analyzing wavelength-dependent Rayleigh backscattering and attenuation characteristics at 500 nm and 650 nm wavelengths. Spatially resolved humidity sensing is obtained from backscatter traces of a dual-wavelength optical time domain reflectometer (OTDR). Backscatter dependence, attenuation dependence as well as the fiber length change are characterized as functions of relative humidity. Cross-sensitivity effects are discussed and quantified. The evaluation of the humidity-dependent backscatter effects at the two wavelength measurements allows for distributed and unambiguous measurement of relative humidity. The technique can be readily employed with low-cost standard polymer optical fibers and commercial OTDR devices. KW - Optical fiber sensor KW - Humidity sensor KW - Distributed sensor KW - Polymer optical fiber KW - Rayleigh scattering PY - 2017 UR - https://nbn-resolving.org/urn:nbn:de:kobv:b43-396363 UR - http://www.mdpi.com/1424-8220/17/4/738 DO - https://doi.org/10.3390/s17040738 SN - 1424-8220 VL - 17 IS - 4 SP - Article 738, 1 EP - 12 PB - MDPI CY - Basel, Switzerland AN - OPUS4-39636 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Rackwitz, Vanessa A1 - Hodoroaba, Vasile-Dan T1 - An attempt of exploiting the compton-to-rayleigh intensity ratio for improved analysis with muXRF at a SEM JF - Microscopy and microanalysis KW - X-ray scattering KW - Compton scattering KW - Rayleigh scattering KW - XRF PY - 2012 DO - https://doi.org/10.1017/S1431927612006678 SN - 1431-9276 SN - 1435-8115 VL - 18 IS - Suppl. 2 SP - 964 EP - 965 PB - Cambridge University Press CY - New York, NY AN - OPUS4-26753 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -