TY - CONF A1 - Unger, Wolfgang A1 - Böse, Olaf A1 - Gross, Thomas A1 - Lippitz, Andreas A1 - Gelius, U. ED - Boehlig, H. T1 - Results of a VAMAS TWA 2 inter-laboratory test experimen - Evaluation of static charge stabilization and determination methods in XPS on non-conducting samples T2 - 11th Conference on Applied Surface Analysis (AOFA) CY - Leipzig, Germany DA - 2000-09-24 PY - 2000 SN - 0169-4332 VL - 179 IS - 1 PB - Elsevier CY - Amsterdam AN - OPUS4-978 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Friedrich, Jörg Florian A1 - Koprinarov, Ivaylo A1 - Giebler, Rainer A1 - Lippitz, Andreas A1 - Unger, Wolfgang T1 - Reactions and Intermediates at the Metal-Polymer Interface - Detected by XPS and NEXAFS Spectroscopy T2 - 4th European Conference on Adhesion (EURADH '98) ; 1st World Congress on Adhesion and Related Phenomena (WCARP) CY - Garmisch-Partenkirchen, Germany DA - 1998-09-06 PY - 1998 SN - 0021-8464 VL - 75 IS - 1 SP - 1.60 EP - 1.62 PB - Gordon & Breach CY - New York, NY AN - OPUS4-6991 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Friedrich, Jörg Florian A1 - Ghode, Archana A1 - Kühn, Gerhard A1 - Weidner, Steffen A1 - Geng, Shiming A1 - Retzko, Iris A1 - Unger, Wolfgang A1 - Lippitz, Andreas ED - Schindel-Bidinelli, E. T1 - Polymeroberflächenfunktionalisierungen im gepulsten Plasma mit nachfolgender chemischer Behandlung T2 - 14. Internationales Symposium Swissbonding ; 14. Internationaler Kongreß Swiss Bonding ; 14th Swiss Bonding 00 CY - Rapperswil, Schweiz DA - 2000-05-16 PY - 2000 SP - 31 EP - 44 PB - SWIBOTECH GmbH CY - Bülach AN - OPUS4-6980 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Friedrich, Jörg Florian A1 - Wigant, L. A1 - Unger, Wolfgang A1 - Lippitz, Andreas A1 - Weidner, Steffen A1 - Kühn, Gerhard A1 - Geng, Sh. A1 - Erdmann, J. A1 - Gorsler, H.-V. T1 - Plasmavorbehandlungen von Polymeroberflächen T2 - 2. Freiberger Polymertag CY - Freiberg DA - 1995-05-30 PY - 1995 SP - 17 Seiten CY - Freiberg AN - OPUS4-7014 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang ED - Blasek, G. T1 - Plasmapolymerschichten: Zu den Möglichkeiten einer chemischen Charakterisierung mit den Methoden ESCA, ToF-SIMS und Röntgen-absorptions-Spektroskopie (XAS) T2 - 12. Neues Dresdener Vakuumtechnisches Kolloquium (NDVaK) CY - Dresden, Deutschland DA - 2004-10-14 KW - ESCA KW - ToF-SIMS KW - XAS KW - Plasma-Polymerisation PY - 2004 SP - 133 EP - 140 PB - Dresdner Transferstelle für Vakuumtechnik CY - Dresden AN - OPUS4-4699 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Güttler, B. A1 - Schiel, D. A1 - Danzebrink, H. A1 - Unger, Wolfgang A1 - Gross, Thomas A1 - Lippitz, Andreas A1 - Müller, J.-P. T1 - Physical and Chemical Characterization of Thermal and Native Siliconoxide layers on Silicon T2 - Symposium "Reference Materials for Technologies in the New Millenium" CY - Berlin, BAM, Germany DA - 2000-05-22 PY - 2000 SP - 1(?) EP - 7(?) AN - OPUS4-6924 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Bütefisch, S. A1 - Weimann, T. A1 - Busch, I. A1 - Danzebrink, H.-U. A1 - Gross, Thomas A1 - Unger, Wolfgang A1 - Wirth, Thomas T1 - New reference material for imaging XPS (X-ray photoelectron spectroscopy) instrument characterization N2 - Reference materials without variations in topography are essential for the characterization of imaging XPS (X-ray Photoelectron Spectroscopy) Instruments. Therefore a new fabrication process for this kind of zero-topography reference material was developed at PTB and resulted in first prototypes. The fabrication process and first measurement results will be presented in this paper. T2 - Sensor 2015 - 17th International conference on sensors and measurement technology CY - Nuremberg, Germany DA - 19.05.2015 KW - Imaging XPS KW - Reference material KW - Topography free KW - Micro technology PY - 2015 SN - 978-3-9813484-8-4 DO - https://doi.org/10.5162/sensor2015/P7.1 SP - Chapter P7, 821 EP - 825 AN - OPUS4-33837 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - Methoden der Oberflächen- und Schichtanalytik - Anwendungen, Normung und Qualitätssicherung T2 - 12. Jahreskolloquium "Analyse von Feststoffen unterschiedlicher Materialien aus Industrie und Umwelt" CY - Berlin, Deutschland DA - 2002-11-19 PY - 2002 AN - OPUS4-1997 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang A1 - Lippitz, Andreas A1 - Koprinarov, Ivaylo A1 - Friedrich, Jörg Florian A1 - Wöll, Ch. T1 - K-Edge Soft X-ray Absorption (NEXAFS) Spectroscopy In Surface Chemical Analysis of Polymers T2 - International Discussion Meeting Advanced Methods of Polymer Characterization: New Developments and Applications in Industry CY - Mainz, Germany DA - 1999-03-15 PY - 1999 SP - P3.53 CY - Mainz AN - OPUS4-6925 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Straub, Franka A1 - Böllinghaus, Thomas A1 - Unger, Wolfgang A1 - Mente, Tobias ED - Somerday, B. P. ED - Sofronis, P. T1 - In-situ detection of Deuterium in duplex stainless steels by time-of-flight secondary ion mass spectrometry (TOF-SIMS) N2 - Local in-situ measurements of hydrogen distribution in the microstructure become increasingly important to elucidate the degradation mechanisms. In contrast to other attempts, modern TOF-SIMS instruments might provide precise element and phase mappings at sub-μm lateral resolution, enabling imaging of the microstructure and analysis of the chemical composition. Such technique has thus been applied to image the deuterium distribution in duplex stainless steel microstructures. After electrochemical charging, accumulations of deuterium have been detected in the austenite grains, causing parallel cracking in this phase which up to the present has been regarded as less prone to hydrogen or deuterium deterioration in comparison to the δ-ferrite. Hydrogen and deuterium behave quite similarly in metallic microstructures. TOF-SIMS imaging of Deuterium and Hydrogen might thus significantly contribute to elucidate respective metallurgical failure mechanisms. Such imaging also represents a valuable tool to validate respective numerical analyses of hydrogen distributions. T2 - Hydrogen-materials interactions - 2012 International hydrogen conference CY - Moran, WY, USA DA - 09.09.2012 PY - 2014 SN - 978-0-7918-6029-8 SP - 505 EP - 512 PB - ASME CY - New York AN - OPUS4-27669 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -