TY - CONF A1 - Unger, Wolfgang A1 - Böse, Olaf A1 - Gross, Thomas A1 - Lippitz, Andreas A1 - Gelius, U. ED - Boehlig, H. T1 - Results of a VAMAS TWA 2 inter-laboratory test experimen - Evaluation of static charge stabilization and determination methods in XPS on non-conducting samples T2 - 11th Conference on Applied Surface Analysis (AOFA) CY - Leipzig, Germany DA - 2000-09-24 PY - 2000 SN - 0169-4332 VL - 179 IS - 1 PB - Elsevier CY - Amsterdam AN - OPUS4-978 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Friedrich, Jörg Florian A1 - Koprinarov, Ivaylo A1 - Giebler, Rainer A1 - Lippitz, Andreas A1 - Unger, Wolfgang T1 - Reactions and Intermediates at the Metal-Polymer Interface - Detected by XPS and NEXAFS Spectroscopy T2 - 4th European Conference on Adhesion (EURADH '98) ; 1st World Congress on Adhesion and Related Phenomena (WCARP) CY - Garmisch-Partenkirchen, Germany DA - 1998-09-06 PY - 1998 SN - 0021-8464 VL - 75 IS - 1 SP - 1.60 EP - 1.62 PB - Gordon & Breach CY - New York, NY AN - OPUS4-6991 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Friedrich, Jörg Florian A1 - Ghode, Archana A1 - Kühn, Gerhard A1 - Weidner, Steffen A1 - Geng, Shiming A1 - Retzko, Iris A1 - Unger, Wolfgang A1 - Lippitz, Andreas ED - Schindel-Bidinelli, E. T1 - Polymeroberflächenfunktionalisierungen im gepulsten Plasma mit nachfolgender chemischer Behandlung T2 - 14. Internationales Symposium Swissbonding ; 14. Internationaler Kongreß Swiss Bonding ; 14th Swiss Bonding 00 CY - Rapperswil, Schweiz DA - 2000-05-16 PY - 2000 SP - 31 EP - 44 PB - SWIBOTECH GmbH CY - Bülach AN - OPUS4-6980 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Friedrich, Jörg Florian A1 - Wigant, L. A1 - Unger, Wolfgang A1 - Lippitz, Andreas A1 - Weidner, Steffen A1 - Kühn, Gerhard A1 - Geng, Sh. A1 - Erdmann, J. A1 - Gorsler, H.-V. T1 - Plasmavorbehandlungen von Polymeroberflächen T2 - 2. Freiberger Polymertag CY - Freiberg DA - 1995-05-30 PY - 1995 SP - 17 Seiten CY - Freiberg AN - OPUS4-7014 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang ED - Blasek, G. T1 - Plasmapolymerschichten: Zu den Möglichkeiten einer chemischen Charakterisierung mit den Methoden ESCA, ToF-SIMS und Röntgen-absorptions-Spektroskopie (XAS) T2 - 12. Neues Dresdener Vakuumtechnisches Kolloquium (NDVaK) CY - Dresden, Deutschland DA - 2004-10-14 KW - ESCA KW - ToF-SIMS KW - XAS KW - Plasma-Polymerisation PY - 2004 SP - 133 EP - 140 PB - Dresdner Transferstelle für Vakuumtechnik CY - Dresden AN - OPUS4-4699 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Güttler, B. A1 - Schiel, D. A1 - Danzebrink, H. A1 - Unger, Wolfgang A1 - Gross, Thomas A1 - Lippitz, Andreas A1 - Müller, J.-P. T1 - Physical and Chemical Characterization of Thermal and Native Siliconoxide layers on Silicon T2 - Symposium "Reference Materials for Technologies in the New Millenium" CY - Berlin, BAM, Germany DA - 2000-05-22 PY - 2000 SP - 1(?) EP - 7(?) AN - OPUS4-6924 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Bütefisch, S. A1 - Weimann, T. A1 - Busch, I. A1 - Danzebrink, H.-U. A1 - Gross, Thomas A1 - Unger, Wolfgang A1 - Wirth, Thomas T1 - New reference material for imaging XPS (X-ray photoelectron spectroscopy) instrument characterization N2 - Reference materials without variations in topography are essential for the characterization of imaging XPS (X-ray Photoelectron Spectroscopy) Instruments. Therefore a new fabrication process for this kind of zero-topography reference material was developed at PTB and resulted in first prototypes. The fabrication process and first measurement results will be presented in this paper. T2 - Sensor 2015 - 17th International conference on sensors and measurement technology CY - Nuremberg, Germany DA - 19.05.2015 KW - Imaging XPS KW - Reference material KW - Topography free KW - Micro technology PY - 2015 SN - 978-3-9813484-8-4 DO - https://doi.org/10.5162/sensor2015/P7.1 SP - Chapter P7, 821 EP - 825 AN - OPUS4-33837 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - Methoden der Oberflächen- und Schichtanalytik - Anwendungen, Normung und Qualitätssicherung T2 - 12. Jahreskolloquium "Analyse von Feststoffen unterschiedlicher Materialien aus Industrie und Umwelt" CY - Berlin, Deutschland DA - 2002-11-19 PY - 2002 AN - OPUS4-1997 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang A1 - Lippitz, Andreas A1 - Koprinarov, Ivaylo A1 - Friedrich, Jörg Florian A1 - Wöll, Ch. T1 - K-Edge Soft X-ray Absorption (NEXAFS) Spectroscopy In Surface Chemical Analysis of Polymers T2 - International Discussion Meeting Advanced Methods of Polymer Characterization: New Developments and Applications in Industry CY - Mainz, Germany DA - 1999-03-15 PY - 1999 SP - P3.53 CY - Mainz AN - OPUS4-6925 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Straub, Franka A1 - Böllinghaus, Thomas A1 - Unger, Wolfgang A1 - Mente, Tobias ED - Somerday, B. P. ED - Sofronis, P. T1 - In-situ detection of Deuterium in duplex stainless steels by time-of-flight secondary ion mass spectrometry (TOF-SIMS) T2 - Hydrogen-materials interactions - 2012 International hydrogen conference CY - Moran, WY, USA DA - 2012-09-09 PY - 2014 SN - 978-0-7918-6029-8 SP - 505 EP - 512 PB - ASME CY - New York AN - OPUS4-27669 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -