TY - CONF A1 - Unger, Wolfgang T1 - Designing a sustainable European centre for risk management and safe innovation in nanomaterials & nanotechnologies (EC4SafeNano) N2 - A central challenge to ensure the sustainable production and use of nanotechnologies is to understand the risks for environment, health and safety associated with this technology and resulting materials and products, and to identify and implement practical strategies to minimize these risks. Knowledge about nanotechnology-enabled processes and products and related environment, health and safety issues is growing rapidly, achieved through numerous European or national R&D programs over the last decade, but effective use of this knowledge for risk management by market actors is lagging behind. The EC4SafeNano initiative (www.EC4SafeNano.eu) is an ongoing effort to build a European Centre for Risk Management and Safe Innovation in Nanomaterials and Nanotechnologies. EC4SafeNano aims to bridge the gap between scientific knowledge on hazard and risk, and ‘fit-for-purpose’ risk management tools and strategies supported by measurement and control methods. The consortium comprises 15 partners (INERIS (coordinator), EU-VRi, TNO, BAM, FIOH, VITO, SP, DEMOKRITOS, TECNALIA, Health and Safety Executive, NRCWE, Paris Lodron University Salzburg, Université Libre de Bruxelles, University of Birmingham and ENEA) from 11 European Member States with significant expertise on risk assessment and management, who already provide knowledge and technical services to public and private organizations, to industry and to public authorities and regulatory bodies. The overall objective of the EC4SafeNano project is to develop a distributed Centre of European Organisations offering services for Risk Management and Safe Innovation for Nanomaterials & Nanotechnologies. The Centre will be structured as a hub-based network of organizations managed by a core group of public-oriented bodies providing risk management and safe innovation support to all stakeholders. It will be operated with the support of Associated Partners so as to expand its capabilities, resources and services. It will interact with existing platforms and centres of excellence in nanosafety and foster the organization or development of national hubs mirroring the European hub. The Centre will seek financial support from stakeholders and service users to sustain the services in the longer term. The operational objectives of the project involve understanding and mapping the needs of the various stakeholders (private and public). It will identify the resources and capabilities and develop a range of harmonized services required to meet these needs. The construction of the centre will include putting in place and implementing processes to deliver and update services, to test and benchmark services, to evaluate the governance of the Centre, and developing a business plan to ensure self-sufficiency of the Centre beyond the project lifetime. A cornerstone of the project is to build a community for risk management and safe innovation for nanotechnology. Interested persons or organisations are invited to join this initiative as registered stakeholders or Associated Partners, to engage in focus networks and to help shape the future Centre. The poster will present the EC4SafeNano initiative and will detail the role of registered stakeholders and Associated Partners. T2 - UBA Scientific Stakeholder Meeting on Nanomaterials in the Environment CY - Dessau, Germany DA - 10.10.2017 KW - Risk management KW - Nanomaterials KW - Nanotechnologies PY - 2017 AN - OPUS4-42788 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - Lateral resolution delivered by imaging surface-analytical instruments as SIMS, AES and XPS: Application of the BAM-L200 Certified Reference Material and related ISO Standards N2 - The certified reference material BAM-L200, a nanoscale stripe pattern for length calibration and specification of lateral resolution, is described. BAM-L200 is prepared from a cross-sectioned epitaxially grown layer stack of AlxGa1-xAs and InxGa1-xAs on a GaAs substrate. The surface of BAM-L200 provides a flat pattern with stripe widths ranging down to 1 nm. Calibration distances, grating periods and stripe widths have been certified by TEM with traceability to the length unit. The combination of gratings, isolated narrow stripes and sharp edges of wide stripes offers a plenty of options for the determination of lateral resolution, sharpness and calibration of length scale at selected settings of imaging surface analytical instruments. The feasibility of the reference material for an analysis of the lateral resolution is demonstrated in detail by evaluation of ToF-SIMS, AES and EDX images. Other applications developed in the community are summarized, too. BAM-L200 fully supports the implementation of the revised International Standard ISO 18516 (in preparation) which is based on knowledge outlined in the Technical Report ISO/TR 19319:2013. Fundamental approaches to determination of lateral resolution and sharpness in beam-based methods T2 - SIMS Europe 2016 CY - Münster, Germany DA - 18.09.2016 KW - ISO standards KW - XPS KW - AES KW - SIMS KW - Lateral resolution PY - 2016 AN - OPUS4-37507 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - Pulsed Plasma-polymerized Films Prepared from Organic Molecules: Characterization by X-ray Absorption Spectroscopy, Photoelectron Spectroscopy and Time of Flight Static Secondary Ion Mass Spectrometry T2 - Practical Surface Analysis PSA-04 & 5th Korea-Japan International Symposium on Surface Analysis - KJISSA CY - Jeju, South Korea DA - 2004-10-04 PY - 2004 AN - OPUS4-4598 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - Scanning transmission X-ray microscopy (STXM) of h-bar preparations of chemically modified DLC films T2 - 324. Heraeus-Seminar: Exploring the nanostructures of soft materials with x-rays, Wilhelm und Else Heraeus-Stiftung CY - Bonn, Germany DA - 2004-05-09 PY - 2004 AN - OPUS4-4605 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - K-edge soft x-ray absorption (NEXAFS) spectroscopy in surface chemical analysis of polymers T2 - Deutsche Bunsengesellschaft für Physikalische Chemie, Int. Discussion Meeting "Advanced Methods of Polymer Characterization: New Developments and Application in Industry" CY - Mainz, Germany DA - 1999-03-15 PY - 1999 AN - OPUS4-6075 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - K-edge soft x-ray absorption (NEXAFS) spectroscopy in surface chemical analysis of polymers T2 - European Research Conferences Fundamental Aspects of Surface Science: Structure and Dynamics of Organic and Biological Molecules at Interfaces CY - Castelvecchio Pascoli, Italy DA - 1999-09-03 PY - 1999 AN - OPUS4-6078 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - K-edge soft x-ray absorption (NEXAFS) spectroscopy in surface chemical analysis of polymers T2 - ECASIA´99 CY - Seville, Spain DA - 1999-10-04 PY - 1999 AN - OPUS4-6079 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - K-edge soft x-ray absorption (NEXAFS) spectroscopy in surface chemical analysis of polymers T2 - BESSY Nutzertreffen CY - Berlin, Germany DA - 1999-12-09 PY - 1999 AN - OPUS4-6133 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - Pulsed Plasma-polymerized Films Prepared from Organic Molecules: Characterization by X-ray Absorption Spectroscopy, Photoelectron Spectroscopy and Time of Flight Static Secondary Ion Mass Spectrometry T2 - 3rd International Symposium on Practical Surface Analysis and 5th Korea-Japan International Symposium on Surface Analysis (PSA-04) CY - Jeju, South Korea DA - 2004-09-26 PY - 2004 AN - OPUS4-6447 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - Ageing studies of pulsed r. f. plasma-polymerized films prepared from organic monomers by XAS, ESCA und TOF-SIMS surface analysis T2 - 17th International Symposium on Plasma Chemistry CY - Toronto, Canada DA - 2005-08-07 PY - 2005 AN - OPUS4-10822 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -