TY - GEN A1 - Weidner, Steffen A1 - Kühn, Gerhard A1 - Roessner, D. A1 - Friedrich, Jörg Florian A1 - Unger, Wolfgang A1 - Lippitz, Andreas ED - Olefjord, I. ED - Nyborg, L. ED - Briggs, D. T1 - Changes in molecular weight distribution of polymers by plasma treatment T2 - ECASIA 97 T2 - 7th European Conference on Applications of Surface and Interface Analysis CY - Göteborg, Sweden DA - 1997-06-16 PY - 1997 SN - 0-471-97827-2 SP - 795 EP - 799 PB - Wiley CY - Chichester AN - OPUS4-6997 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Unger, Wolfgang A1 - Wirth, Thomas A1 - Hodoroaba, Vasile-Dan ED - Hodoroaba, Vasile-Dan ED - Unger, Wolfgang ED - Shard, A. G. T1 - Auger electron spectroscopy T2 - Characterization of nanoparticles - Measurement processes for nanoparticles N2 - An introduction in the application of Auger Electron Spectroscopy to surface chemical analysis of nanoparticles is given. Auger Electron Spectroscopy is a mature method in the field of surface chemical analysis. The chapter addresses the physical basis of the method, the principal design of recent instruments together with modes of operation and options for the presentation of spectra, as well as different approaches for qualitative (including identification of chemical species) and quantitative surface analysis of elements. An application paragraph on surface chemical analysis of nanoparticles by AES or SAM introduces the different measurement approaches and sample preparation strategies applied by analysts. The analysis of nanoparticle ensembles, the so-called selected point analysis where a narrow primary electron beam is centered on an individual nanoparticle, and chemical mapping of individual nanoparticles (or a line scan across) are addressed. Existing literature is reviewed and informative case studies presented. Limitations and pitfalls in the application of AES in surface chemical analysis of nanoparticles are also addressed. KW - Auger Electron Spectroscopy KW - Surface chemical analysis KW - Imaging surface chemical analysis KW - Nanoparticles KW - Nanotechnology PY - 2020 SN - 978-0-12-814182-3 DO - https://doi.org/10.1016/B978-0-12-814182-3.00020-1 SP - 373 EP - 395 PB - Elsevier CY - Amsterdam AN - OPUS4-50119 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Unger, Wolfgang A1 - Oran, Umut A1 - Swaraj, Sufal A1 - Lippitz, Andreas ED - Chandra, T. T1 - Ageing studies of plasma deposited organic films by surface chemical analysis (ESCA, ToF-SIMS, XAS) T2 - THERMEC 2006 T2 - 5th International Conference on Processing & Manufacturing of Advanced Materials CY - Vancouver, Canada DA - 2006-07-04 KW - Plasma polymerized organic films KW - Ageing phenomena KW - ESCA KW - TOF-SIMS KW - XAS PY - 2007 SN - 0-87849-428-6 SN - 0255-5476 N1 - Serientitel: Materials science forum – Series title: Materials science forum VL - 539-543 IS - 539/543 SP - 623 EP - 628 PB - Trans Tech Publ. CY - Stafa-Zürich AN - OPUS4-14446 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Unger, Wolfgang A1 - Oran, Umut A1 - Senoner, Mathias A1 - Schmidt, M. T1 - Chemische Charakterisierung von mikro- und nanotechnologischen Bauteilen: Verfahrensentwicklung und Referenzmaterialien T2 - Messtechnik für Mikro- und Nano-Engineering T2 - VDI/VDE-Tagung "Messtechnik für Mikro- und Nano-Engineering" CY - Erlangen, Germany DA - 2006-11-29 KW - Referenzmaterial KW - Mikrofluidik KW - Nanoanalytik PY - 2006 N1 - Serientitel: VDI-Berichte – Series title: VDI-Berichte IS - 1950 SP - 197 EP - 206 PB - VDI-Verl. CY - Düsseldorf AN - OPUS4-14110 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Unger, Wolfgang A1 - Lippitz, Andreas A1 - Friedrich, Jörg Florian A1 - Koprinarov, Ivaylo A1 - Weiss, K. A1 - Wöll, Ch. ED - Mittal, K. T1 - The Application of Near Edge X-ray Absorption Fine Structures (NEXAFS) Spectroscopy and X-ray Photoelectron Spectroscopy (XPS) in Surface Analysis of Chromium-evaporated Polymers and Organic Films T2 - Metallized plastics 5 & 6 PY - 1998 SN - 90-6764-290-8 SP - 147 EP - 168 PB - VSP CY - Utrecht AN - OPUS4-6986 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Unger, Wolfgang A1 - Gross, Thomas ED - Rivière, J. C. ED - Myhra, S. T1 - Catalyst characterization T2 - Handbook of surface and interface analysis PY - 1998 SN - 0-8247-0080-5 SP - 747 EP - 780 PB - Dekker CY - New York AN - OPUS4-7020 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Unger, Wolfgang T1 - The Application of X-ray Photoelectron Spectroscopy (ESCA) and X-Ray Absorption Spectroscopy (NEXAFS) in Interface Analysis of Metallized Polymers T2 - Proceedings of the Materials Week 2000 T2 - Materials Week 2000 ; International Congress on Advanced Materials, Their Processes and Applications 2000 CY - Munich, Germany DA - 2000-09-25 PY - 2000 SN - 3-88355-296-8 CY - München AN - OPUS4-1106 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Unger, Wolfgang ED - Worsfold, P. ED - Townshend, A. ED - Poole, C. T1 - Auger electron spectroscopy T2 - Encyclopedia of analytical science / Vol. 8: [R - S] KW - AES KW - Auger Electron Spectroscopy KW - Oberflächenanalytik PY - 2005 SN - 0-12-764108-4 VL - 8 SP - 466 EP - 474 PB - Elsevier/Acad. Press CY - Amsterdam ET - 2. AN - OPUS4-7015 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Unger, Wolfgang T1 - Surface analysis - Auger electron spectroscopy T2 - Reference module in chemistry, molecular sciences and chemical engineering N2 - Basic principles and technical realization of Auger Electron Spectroscopy (AES) are presented. Different modes of application are briefly addressed. These are spectroscopy at nanoscaled surface layers including quantitative element analysis and chemical state analysis, in-depth element analysis, imaging and element mapping. A survey on standards related to application of AES in surface chemical analysis is given. KW - Auger electron spectroscopy KW - AES KW - Surface analysis KW - Chemical state analysis KW - Depth profiling KW - Element analysis KW - Imaging KW - Surface chemical analysis PY - 2013 UR - http://www.sciencedirect.com/science/article/pii/B9780124095472005163 SN - 978-0-12-409547-2 DO - https://doi.org/10.1016/B978-0-12-409547-2.00516-3 SP - 466 EP - 475 PB - Elsevier Inc. AN - OPUS4-29263 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Shard, A. G. A1 - Hodoroaba, Vasile-Dan A1 - Unger, Wolfgang ED - Hodoroaba, Vasile-Dan ED - Unger, Wolfgang ED - Shard, A. G. T1 - Introduction T2 - Characterization of nanoparticles - Measurement processes for nanoparticles N2 - The purpose of this book is to provide a comprehensive collection of analytical methods that are commonly used to measure nanoparticles, providing information on one, or more, property of importance. The chapters provide up-to-date information and guidance on the use of these techniques, detailing the manner in which they may be reliably employed. Within this chapter, we detail the rationale and context of the whole book, which is driven by the observation of a low level of reproducibility in nanoparticle research. The aim of the book is to encourage awareness of both the strengths and weaknesses of the various methods used to measure nanoparticles and raise awareness of the range of methods that are available. The editors of the book have, for many years, been engaged in European projects and standardization activities concerned with nanoparticle analysis and have identified authors who are experts in the various methods included within the book. This has produced a book that can be used as a definitive guide to current best practice in nanoparticle measurement. KW - Nanoparticles KW - Size distribution KW - Shape KW - Chemistry KW - Coating KW - Concentration KW - Standards KW - Charge KW - Characterisation PY - 2020 SN - 978-0-12-814182-3 DO - https://doi.org/10.1016/B978-0-12-814182-3.00001-8 SP - 1 EP - 6 PB - Elsevier CY - Amsterdam AN - OPUS4-50166 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -