TY - JOUR A1 - Ünveren, Ercan A1 - Kemnitz, E. A1 - Oran, Umut A1 - Unger, Wolfgang T1 - Static TOF-SIMS Surface Analysis of a CCl2F2 Activated Chromia Catalyst Used for a Cl/F Exchange Reaction JF - The journal of physical chemistry / B N2 - Static TOF-SIMS results strongly underpin earlier conclusions from ESCA, XANES, and tracer studies that the accumulation of fluorine and chlorine at the surface of chromia by a heterogeneous reaction with a chlorofluorocarbon compound results in the formation of mixed chromium oxide halide species and not in the nucleation of CrCl3 and/or CrF3 phases. KW - Oberflächenanalytik KW - Katalyse PY - 2004 DO - https://doi.org/10.1021/jp046773h SN - 1520-6106 SN - 1520-5207 SN - 1089-5647 VL - 108 SP - 15454 EP - 15456 PB - Soc. CY - Washington, DC AN - OPUS4-4718 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Ünveren, Ercan A1 - Kemnitz, E. A1 - Lippitz, Andreas A1 - Unger, Wolfgang T1 - Surface Characterization of Chromia for Chlorine/Fluorine Exchange Reactions JF - The journal of physical chemistry / B N2 - The dismutation of CCl2F2 was used to probe the effect of halogenation of chromia by Cl/F exchange reactions to find out the difference between the halogenated inactive and active catalysts. The heterogeneous reactions were performed in a continuous flow Ni reactor and also under simulated reaction conditions in a reactor where after the reaction X-ray photoelectron spectroscopy (XPS) and X-ray excited Auger electron spectroscopy (XAES) analyses are possible without air exposure of the catalyst, i.e., under so-called "in situ" conditions. The Cr(III) 2p XP spectra, which revealed multiplet splitting features and satellite emission, were used for chemical analysis by using a simple evaluation procedure which neglects this inherent complexity. Chemical analysis was also applied by using chemical state plots for Cr 3s in order to cross-check Cr 2p related results. Both ex and in situ XPS show that as soon as Cr2O3 is exposed to CCl2F2 at 390°C fluorination as well as chlorination takes place at the catalyst surface. When the XPS surface composition reaches approximately 4 at. % fluorination and 6 at. % chlorination, maximum catalytic activity was obtained. Application of longer reaction times did not change significantly the obtained surface composition of the activated chromia. The fluorination and chlorination of chromia was further investigated by various HF and HCl treatments. The activated chromia samples and the Cr2O3, Cr(OH)3, CrF2OH, CrF3·H2O, α-CrF3, β-CrF3, and CrCl3 reference samples with well-known chemical structures were also characterized by X-ray absorption near edge structure (XANES), time-of-flight secondary ion mass spectroscopy (TOF-SIMS), pyridine-FTIR, wet chemical (F and Cl) analysis, X-ray powder diffraction (XRD), and surface area (BET) analysis. The results suggest that the formation of chromium oxide chloride fluoride species, e.g., chromium oxide halides, at the surface is sufficient to provide catalytic activity. The presence of any CrF3 and/or CrCl3 phases on the activated chromia samples was not found. PY - 2005 DO - https://doi.org/10.1021/jp045902r SN - 1520-6106 SN - 1520-5207 SN - 1089-5647 VL - 109 IS - 5 SP - 1903 EP - 1913 PB - Soc. CY - Washington, DC AN - OPUS4-10531 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Ünveren, Ercan A1 - Kemnitz, E. A1 - Hutton, S. A1 - Lippitz, Andreas A1 - Unger, Wolfgang T1 - Analysis of highly resolved x-ray photoelectron Cr 2p spectra obtained with a Cr2O3 powder sample prepared with adhesive tape JF - Surface and interface analysis KW - High-resolution XPS KW - Cr2O3 powder KW - Multiplet splitting PY - 2004 SN - 0142-2421 SN - 1096-9918 VL - 36 SP - 92 EP - 95 PB - Wiley CY - Chichester AN - OPUS4-3427 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Zhang, Zhiyang A1 - Merk, V. A1 - Müller, Anja A1 - Unger, Wolfgang A1 - Kneipp, Janina T1 - Role of metal cations in plasmon-catalyzed oxidation: A case study of p-aminothiophenol dimerization JF - ACS Catalysis N2 - The mechanism of the plasmon-catalyzed reaction of p-aminothiophenol (PATP) to 4,4′-dimercaptoazobenzene (DMAB) on the surface of metal nanoparticles has been discussed using data from surface-enhanced Raman scattering of DMAB. Oxides and hydroxides formed in a plasmon-catalyzed process were proposed to play a central role in the reaction. Here, we report DMAB formation on gold nanoparticles occurring in the presence of the metal cations Ag+, Au3+, Pt4+, and Hg2+. The experiments were carried out under conditions where formation of gold oxide or hydroxide from the nanoparticles can be excluded and at high pH where the formation of the corresponding oxidic species from the metal ions is favored. On the basis of our results, we conclude that, under these conditions, the selective oxidation of PATP to DMAB takes place via formation of a metal oxide from the ionic species in a plasmon-catalyzed process. By evidencing the necessity of the presence of the metal cations, the reported results underpin the importance of metal oxides in the reaction. KW - Metal ions KW - Plasmonic catalysis KW - p-aminothiophenol KW - 4,4'-dimercaptoazobenzene KW - Surface-enhanced Raman scattering PY - 2017 UR - http://pubs.acs.org/doi/abs/10.1021/acscatal.7b02700 DO - https://doi.org/10.1021/acscatal.7b02700 SN - 2155-5435 N1 - Geburtsname von Müller, Anja: Hermanns, A. - Birth name of Müller, Anja: Hermanns, A. VL - 7 IS - 11 SP - 7803 EP - 7809 PB - American Chemical Society CY - Washington AN - OPUS4-43001 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Yegen, E. A1 - Zimmermann, Uwe A1 - Unger, Wolfgang A1 - Braun, T. T1 - C-F bond cleavage during derivatization reactions of amino groups with TFBA and PFB at plasma-processed organic surfaces? JF - Plasma processes and polymers N2 - Chemical derivatization XPS is used for the quantitative determination of amines at conventional organic surfaces, and it is also applied to plasma-processed aminated surfaces. When using TFBA and PFB as derivatization reagents for tagging primary amino groups, unexpected fluorine species were observed in the second case. The existence of reaction pathways other than those expected for amine derivatization with PFB or TFBA has to be assumed. This phenomenon is tentatively interpreted as the result of C—F bond cleavage during derivatization reactions of TFBA and PFB at plasma-polymerized allylamine and other plasma-processed aminated surfaces. As a consequence, quantification procedures based on derivatization by PFB or TFBA will underestimate amine surface concentrations. KW - Aminated surfaces KW - Chemical derivatization KW - ESCA KW - Plasma polymers KW - XPS PY - 2009 DO - https://doi.org/10.1002/ppap.200800100 SN - 1612-8850 SN - 1612-8869 VL - 6 IS - 1 SP - 11 EP - 16 PB - Wiley-VCH Verl. CY - Weinheim AN - OPUS4-18686 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Yegen, E. A1 - Lippitz, Andreas A1 - Treu, Dieter A1 - Unger, Wolfgang T1 - Derivatization of amino groups by pentafluorobenzaldehyde (PFB) as observed by XPS and NEXAFS spectroscopy on spin coated 4,4'-methylenebis(2,6-diethylaniline) films JF - Surface and interface analysis N2 - A toluene solution of 4,4´-methylenebis(2,6-diethylaniline) was spin coated on Si wafers. The samples were derivatized with pentafluorobenzaldehyde (PFB) in order to determine the primary amino groups on the surface. XPS C 1s and N 1s and C and N K-edge NEXAFS of underivatized and derivatized films were carefully analyzed. The result was that after 10 min of exposure the gas-surface reaction was already completed. A reasonable derivatization reaction yield in the order of 90% is derived from the experiments. This number correlates well to a reaction yield obtained by a wet chemical approach. KW - Amino groups KW - Derivatization KW - PFB KW - XPS KW - NEXAFS PY - 2008 DO - https://doi.org/10.1002/sia.2685 SN - 0142-2421 SN - 1096-9918 VL - 40 IS - 3-4 SP - 176 EP - 179 PB - Wiley CY - Chichester AN - OPUS4-17193 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Winzer, Nicholas A1 - Xu, Ping A1 - Bender, S. A1 - Gross, Thomas A1 - Unger, Wolfgang A1 - Cross, Carl Edward T1 - Stress corrosion cracking of gas-tungsten arc welds in continuous-cast AZ31 Mg alloy sheet JF - Corrosion science N2 - AZ31 Mg alloy sheet was welded using a gas-tungsten arc (GTA) process over inserts containing 2.3-9.3 wt.% Al. The welded specimens were susceptible to SCC in distilled water, with susceptibility increasing with decreasing weld metal Al (or β particle) concentration. Primary stress corrosion cracks initiated at the weld metal-HAZ interface by stress-assisted localised dissolution and propagated through the weld and base metals by transgranular and intergranular H-assisted fracture (TG-HAF and IG-HAF) respectively. The IG fracture mode may be intrinsic to the texture imparted upon the base metal by rolling. The increase in SCC susceptibility with decreasing weld metal Al concentration is contrary to the purported roles of β particles in promoting localised corrosion and as crack nucleation sites, but corresponds with increases in weld - base metal galvanic current density and weld metal localised corrosion susceptibility. KW - C. Stress corrosion KW - C. Hydrogen embrittlement KW - A. Magnesium KW - C. Welding PY - 2009 DO - https://doi.org/10.1016/j.corsci.2009.05.037 SN - 0010-938X VL - 51 IS - 9 SP - 1950 EP - 1963 PB - Elsevier CY - Orlando, Fla. AN - OPUS4-20049 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Wettmarshausen, Sascha A1 - Min, Hyegeun A1 - Unger, Wolfgang A1 - Jäger, Christian A1 - Hidde, Gundula A1 - Friedrich, Jörg Florian T1 - Significance of hydrogen-deuterium exchange at polyolefin surfaces on exposure to ammonia low-pressure plasma JF - Plasma chemistry and plasma processing N2 - Since more than 40 years ammonia plasma exposure of polyolefins is used for introduction of primary amino groups. The selectivity of this reaction and the yield in primary amino groups was found to be low. Here, a prominent side-reactions of this process was investigated, the hydrogenation by NH3 plasma. For identification of hydrogenation ammonia (NH3) and deuterated ammonia (ND3) were exposed to Polyethylene (h-PE) and fully deuterated polyethylene (d-PE) as well as hexatriacontane (h-HTC) and fully deuterated hexatriacontane (d-HTC) as low-molecular weight model for PE. H–D exchange was assumed and detected by Time-of-Flight Secondary Ion Mass Spectrometry (ToF–SIMS), X-ray Photoelectron Spectroscopy (XPS), Attenuated Total Reflectance (ATR-FTIR) and 1H and 2H Nuclear magnetic Resonance. Results show a significant H–D exchange within the sampling depth of ATR (2.5 µm). However, N- and NH2 introduction was limited to the topmost surface as shown by SIMS and XPS (a few nanometers). KW - Deuterated ammonia KW - Ammonia plasma KW - Deuterated polyolefins KW - Hexatriacontane KW - H-D exchange PY - 2011 DO - https://doi.org/10.1007/s11090-011-9304-5 SN - 0272-4324 VL - 31 IS - 4 SP - 551 EP - 572 PB - Plenum Publ. Corp. CY - New York, NY, USA AN - OPUS4-24178 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Weigert, Florian A1 - Müller, A. A1 - Häusler, I. A1 - Geißler, Daniel A1 - Skroblin, D. A1 - Unger, Wolfgang A1 - Radnik, Jörg A1 - Resch-Genger, Ute T1 - Combining HR‑TEM and XPS to elucidate the core–shell structure of ultrabright CdSe/CdS semiconductor quantum dots JF - Scientific reports N2 - Controlling thickness and tightness of surface passivation shells is crucial for many applications of core–shell nanoparticles (NP). Usually, to determine shell thickness, core and core/shell particle are measured individually requiring the availability of both nanoobjects. This is often not fulfilled for functional nanomaterials such as many photoluminescent semiconductor quantum dots (QD) used for bioimaging, solid state lighting, and display technologies as the core does not show the applicationrelevant functionality like a high photoluminescence (PL) quantum yield, calling for a whole nanoobject approach. By combining high-resolution transmission electron microscopy (HR-TEM) and X-ray photoelectron spectroscopy (XPS), a novel whole nanoobject approach is developed representatively for an ultrabright oleic acid-stabilized, thick shell CdSe/CdS QD with a PL quantum yield close to unity. The size of this spectroscopically assessed QD, is in the range of the information depth of usual laboratory XPS. Information on particle size and monodispersity were validated with dynamic light scattering (DLS) and small angle X-ray scattering (SAXS) and compared to data derived from optical measurements. In addition to demonstrating the potential of this novel whole nanoobject approach for determining architectures of small nanoparticles, the presented results also highlight challenges faced by different sizing and structural analysis methods and method-inherent uncertainties. KW - Photoluminescence KW - Single particle KW - Microscopy KW - Particle architecture KW - Thickness KW - SAXS KW - Shell KW - XPS KW - TEM KW - Semiconductor KW - Quantum dot KW - Photophysics KW - Quantum yield PY - 2020 UR - https://nbn-resolving.org/urn:nbn:de:kobv:b43-517911 DO - https://doi.org/10.1038/s41598-020-77530-z VL - 10 IS - 1 SP - 20712 PB - Springer Nature AN - OPUS4-51791 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Weigel, W. A1 - Unger, Wolfgang A1 - Graf, Nora A1 - Gross, Thomas A1 - Wirth, Thomas T1 - Surface Chemical Analysis of DNA Microarrays - Application of XPS and ToF-SIMS for Surface Chemical Imaging on the µm Scale JF - BioForum Europe KW - Microarrays KW - Oberflächenanalytik KW - XPS KW - ToF-SIMS KW - Chemical imaging PY - 2008 SN - 1611-597X VL - 12 IS - 10 SP - 14 EP - 16 PB - GIT-Verlag CY - Darmstadt AN - OPUS4-18307 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -