TY - JOUR A1 - Reith, F. A1 - Fairbrother, L. A1 - Nolze, Gert A1 - Wilhelmi, O. A1 - Clode, P. L. A1 - Gregg, A. O. A1 - Parsons, J. E. A1 - Wakelin, S. A. A1 - Pring, A. A1 - Hough, R. A1 - Southam, G. A1 - Brugger, J. T1 - Nanoparticle factories: Biofilms hold the key to gold dispersion and nugget formation JF - Geology N2 - Biofilms living on gold (Au) grains play a key role in the biogeochemical cycle of Au by promoting the dispersion of Au via the formation of Au nanoparticles as well as the formation of secondary biomorphic Au. Gold grains from Queensland, Australia, are covered by a polymorphic, organic-inorganic layer that is up to 40 μm thick. It consists of a bacterial biofilm containing Au nanoparticles associated with extracellular polymeric substances as well as bacterioform Au. Focused ion beam (FIB) sectioning through the biofilm revealed that aggregates of nanoparticulate Au line open spaces beneath the active biofilm layer. These aggregates (bacterioform Au type 1) resulted from the reprecipitation of dissolved Au, and their internal growth structures provide direct evidence for coarsening of the Au grains. At the contact between the polymorphic layer and the primary Au, bacterioform Au type 2 is present. It consists of solid rounded forms into which crystal boundaries of underlying primary Au extend, and is the result of dealloying and Ag dissolution from the primary Au. This study demonstrates that (1) microbially driven dissolution, precipitation, and aggregation lead to the formation of bacterioform Au and contribute to the growth of Au grains under supergene conditions, and (2) the microbially driven mobilization of coarse Au into nanoparticles plays a key role in mediating the mobility of Au in surface environments, because the release of nanoparticulate Au upon biofilm disintegration greatly enhances environmental mobility compared to Au complexes only. KW - Nanomaterial KW - Gold KW - Electron backscatter diffraction PY - 2010 DO - https://doi.org/10.1130/G31052.1 VL - 38 IS - 9 SP - 843 EP - 846 PB - Geological Society of America AN - OPUS4-37995 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Schröder, Jakob A1 - Evans, Alexander A1 - Polatidis, E. A1 - Čapek, J. A1 - Mohr, Gunther A1 - Serrano Munoz, Itziar A1 - Bruno, Giovanni T1 - Understanding the impact of texture on the micromechanical anisotropy of laser powder bed fused Inconel 718 JF - Journal of materials science N2 - The manufacturability of metallic alloys using laser-based additive manufacturing methods such as laser powder bed fusion has substantially improved within the last decade. However, local melting and solidification cause hierarchically structured and crystallographically textured microstructures possessing large residual stress. Such microstructures are not only the origin of mechanical anisotropy but also pose metrological challenges for the diffraction-based residual stress determination. Here we demonstrate the influence of the build orientation and the texture on the microstructure and consequently the mechanical anisotropy of as-built Inconel 718. For this purpose, we manufactured specimens with [001]/[011]-, [001]- and [011]/[111]-type textures along their loading direction. In addition to changes in the Young’s moduli, the differences in the crystallographic textures result in variations of the yield and ultimate tensile strengths. With this in mind, we studied the anisotropy on the micromechanical scale by subjecting the specimens to tensile loads along the different texture directions during in situ neutron diffraction experiments. In this context, the response of multiple lattice planes up to a tensile strain of 10% displayed differences in the load partitioning and the residual strain accumulation for the specimen with [011]/[111]-type texture. However, the relative behavior of the specimens possessing an [001]/[011]- and [001]-type texture remained qualitatively similar. The consequences on the metrology of residual stress determination methods are discussed. KW - Laser powder bed fusion KW - Additive manufacturing KW - Electron backscatter diffraction KW - Tensile testing KW - Diffraction PY - 2022 UR - https://nbn-resolving.org/urn:nbn:de:kobv:b43-555840 DO - https://doi.org/10.1007/s10853-022-07499-9 SN - 1573-4803 VL - 2022 IS - 57 SP - 15036 EP - 15058 PB - Springer Science + Business Media B.V. CY - Dordrecht AN - OPUS4-55584 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Serrano Munoz, Itziar A1 - Fernández, R. A1 - Saliwan Neumann, Romeo A1 - González-Doncel, G. A1 - Bruno, Giovanni T1 - Dislocation substructures in pure aluminium after creep deformation as studied by electron backscatter diffraction JF - Journal of applied crystallography N2 - In the present work, electron backscatter diffraction was used to determine the microscopic dislocation structures generated during creep (with tests interrupted at the steady state) in pure 99.8% aluminium. This material was investigated at two different stress levels, corresponding to the power-law and power-law breakdown regimes. The results show that the formation of subgrain cellular structures occurs independently of the crystallographic orientation. However, the density of these cellular structures strongly depends on the grain crystallographic orientation with respect to the tensile axis direction, with <111> grains exhibiting the highest densities at both stress levels. It is proposed that this behaviour is due to the influence of intergranular stresses, which is different in <111> and <001> grains. KW - Creep KW - Pure aluminium KW - Electron backscatter diffraction KW - Cellular structures KW - Power law and power-law breakdown PY - 2022 UR - https://nbn-resolving.org/urn:nbn:de:kobv:b43-552003 DO - https://doi.org/10.1107/S1600576722005209 SN - 0021-8898 SN - 1600-5767 VL - 55 SP - 860 EP - 869 PB - Wiley-Blackwell CY - Copenhagen AN - OPUS4-55200 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Sitzman, S. D. A1 - Nolze, Gert A1 - Nowell, M. M. T1 - EBSD Pattern Quality and its Use in Evaluating Sample Surface Condition JF - Microscopy and Microanalysis N2 - Modern EBSD systems perform diffraction pattern “quality” (PQ) calculations, essentially measurements of the contrast of the brighter bands in the pattern above background, for every pattern analyzed. Since the calculations are independent of EBSD indexing, data are generated from all points on the analyzed sample surface, regardless of indexability or the state of the material beneath. EBSD maps generated from PQ data are like microstructurally sensitive SEM images, collected at EBSD speeds and grid resolutions, with contrast arising from phase density, crystal structure, crystallographic orientation, grain boundary location, near-surface plastic strain, coating density/thickness, and to some extent topography. Grain boundaries and other aspects of sample microstructure are readily revealed, so the PQ map is a very useful characterization tool in its own right, and serves as a reference for EBSD maps generated from indexing-derived data, such as orientation, grain boundary character, phase distribution and strain maps. KW - Electron backscatter diffraction KW - Sample preparation KW - Pattern quality PY - 2010 DO - https://doi.org/10.1017/S143192761005467X VL - 16 IS - Suppl. 2 SP - 698 EP - 699 PB - Microscopy Society of America AN - OPUS4-37997 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Sobol, Oded A1 - Nolze, Gert A1 - Saliwan Neumann, Romeo A1 - Eliezer, D. A1 - Böllinghaus, Thomas A1 - Unger, Wolfgang T1 - Novel approach to image hydrogen distribution and related phase transformation in duplex stainless steels at the sub-micron scale JF - International Journal of Hydrogen Energy N2 - The effect of electrochemical charging of hydrogen on the structure of a lean duplex stainless steel LDX 2101® (EN 1.4162, UNS S32101) was examined by both Time-of-Flight secondary ion mass spectrometry and electron back-scatter diffraction. The goal is to correlate hydrogen concentration and induced structural changes. Chemical and structural characterizations were done for the same region at the sample's surface with sub-micron spatial resolution. Regions of interest were varying in size between 50 × 50 μm and 100 × 100 μm. The results show a phase transformation of austenite to mainly a defect-rich BCC and scarcely a HCP phase. The phase transformation occurred in deuterium rich regions in the austenite. KW - Time-of-flight secondary ion mass spectrometry KW - ToF-SIMS KW - Electron backscatter diffraction KW - EBSD KW - Hydrogen-assisted cracking KW - Data fusion KW - Lean duplex stainless steel PY - 2017 DO - https://doi.org/10.1016/j.ijhydene.2017.08.016 SN - 0360-3199 VL - 42 IS - 39 SP - 25114 EP - 25120 AN - OPUS4-42022 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Wendt, U. A1 - Nolze, Gert A1 - Heyse, H. T1 - Effect of crystal orientation on imaging contrast and sputter results during focused ion beam milling of Cu studied by FIB, EBSD, SEM, and AFM JF - Microscopy and Microanalysis N2 - During focused ion beam microscopy (FIB) of crystalline materials imaging contrast and milling result are effected by orientation of the crystals with respect to the incident ion beam. This is due to the possibility of ion channeling along preferred crystal directions which effects the depth at which interaction between ions and specimen atoms takes place. As a result of channeling emission of ion induced secondary electrons (iiSE) and secondary ions (SI) as well as the sputter rate decreases. Theoretical channeling orientations and critical angles can be calculated. These effects have been studied quantitatively for polycrystalline recrystallized Cu as a typical model case. KW - Electron backscatter diffraction KW - FIB KW - AFM KW - Crystal orientation PY - 2006 DO - https://doi.org/10.1017/S1431927606061812 SN - 1431-9276 SN - 1435-8115 VL - 12 IS - Suppl. 2 SP - 1302 EP - 1303 AN - OPUS4-38027 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Winkelmann, A. A1 - Nolze, Gert A1 - Cios, G. A1 - Tokarski, T. A1 - Bala, P. T1 - Refined Calibration Model for Improving the Orientation Precision of Electron Backscatter Diffraction Maps JF - Materials N2 - For the precise determination of orientations in polycrystalline materials, electron backscatter diffraction (EBSD) requires a consistent calibration of the diffraction geometry in the scanning electron microscope (SEM). In the present paper, the variation of the projection center for the Kikuchi diffraction patterns which are measured by EBSD is calibrated using a projective transformation model for the SEM beam scan positions on the sample. Based on a full pattern matching approach between simulated and experimental Kikuchi patterns, individual projection center estimates are determined on a subgrid of the EBSD map, from which least-square fits to affine and projective transformations can be obtained. Reference measurements on single-crystalline silicon are used to quantify the orientation errors which result from different calibration models for the variation of the projection center. KW - Scanning electron microscopy KW - Electron backscatter diffraction KW - Kikuchi diffraction KW - Projection center KW - Orientation precision PY - 2020 UR - https://nbn-resolving.org/urn:nbn:de:kobv:b43-509342 DO - https://doi.org/10.3390/ma13122816 VL - 13 IS - 12 SP - 2816 PB - MDPI AN - OPUS4-50934 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Winkelmann, Aimo A1 - Nolze, Gert T1 - Chirality determination of quartz crystals using electron backscatter diffraction JF - Ultramicroscopy N2 - We demonstrate the determination of crystal chirality using electron backscatter diffraction (EBSD) in the scanning electron microscope. The chirality of a-quartz as a space-group-dependent property is verified via direct comparison of experimental diffraction features to simulations using the dynamical theory of electron diffraction. KW - Electron backscatter diffraction KW - Kikuchi patterns KW - Chirality KW - Quartz PY - 2015 DO - https://doi.org/10.1016/j.ultramic.2014.11.013 SN - 0304-3991 VL - 149 SP - 58 EP - 63 PB - Elsevier CY - New York, NY AN - OPUS4-31384 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Winkelmann, Aimo A1 - Nolze, Gert T1 - Analysis of Kikuchi band contrast reversal in electron backscatter diffraction patterns of silicon JF - Ultramicroscopy N2 - We analyze the contrast reversal of Kikuchi bands that can be seen in electron backscatter diffraction (EBSD) patterns under specific experimental conditions. The observed effect can be reproduced using dynamical electron diffraction calculations. Two crucial contributions are identified to be at work: First, the incident beam creates a depth distribution of incoherently backscattered electrons which depends on the incidence angle of the beam. Second, the localized inelastic scattering in the outgoing path leads to pronounced anomalous absorption effects for electrons at grazing emission angles, as these electrons have to go through the largest amount of material. We use simple model depth distributions to account for the incident beam effect, and we assume art exit angle dependent effective crystal thickness in the dynamical electron diffraction calculations. Very good agreement is obtained with experimental observations for silicon at 20 key primary beam energy. KW - Electron backscatter diffraction KW - Kikuchi patterns KW - Dynamical electron diffraction simulation PY - 2010 DO - https://doi.org/10.1016/j.ultramic.2009.11.008 SN - 0304-3991 VL - 110 IS - 3 SP - 190 EP - 194 PB - Elsevier CY - New York, NY AN - OPUS4-24008 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Winkelmann, Aimo A1 - Nolze, Gert T1 - Point-group sensitive orientation mapping of non-centrosymmetric crystals JF - Applied physics letters N2 - We demonstrate polarity-sensitive orientation mapping of non-centrosymmetric phases by Electron Backscatter Diffraction (EBSD). The method overcomes the restrictions of kinematic orientation determination by EBSD, which is limited to the centro-symmetric Laue-groups according to Friedel's rule. Using polycrystalline GaP as an example, we apply a quantitative pattern matching approach based on simulations using the dynamical theory of electron diffraction. This procedure results in a distinct assignment of the local orientation according to the non-centrosymmetric point group of the crystal structure under investigation. KW - Scanning electron microscopy KW - Electron backscatter diffraction KW - Orientation mapping KW - Non-centrosymmetric crystals PY - 2015 DO - https://doi.org/10.1063/1.4907938 SN - 0003-6951 SN - 1077-3118 VL - 106 SP - 072101-1 EP - 072101-4 PB - American Institute of Physics CY - Melville, NY AN - OPUS4-32670 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -