TY - CONF A1 - Zscherpel, Uwe T1 - X-ray back scatter techniques for additive manufacturing N2 - X-ray back scatter imaging is rarely applied compared to classical X-ray projection imaging. 20 years ago the company Philips developed “COMSCAN”, a first application case in the aircraft industry, which allowed even a depth resolution using back scatter imaging. The company AS&E in Boston offers back scatter imaging solutions for the security market. Their principle is to scan the object with a highly collimated X-ray needle beam from one side only and detect the backscattered radiation by a large area detector side by side with the collimation wheel. A new prototype is investigated at BAM for application and optimization in non-destructive testing. As modern industrial application field in-situ testing in additive manufacturing is targeted. The accessibility of the printed part during the production process is very limited. This prevent the application of a two sided X-ray inspection or Computed Tomography, were an rotation of the object is required to acquire projections from 360 degrees. An important advantage for the X-ray back scatter technique are also the materials used in additive manufacturing (polymers, ceramics, light metals like Aluminum or Titanium). These materials with lower density and lower Z values give better scatter signals than metals with higher densities and Z values. The back scatter intensity decreases with increasing density and Z value of the material. But the requirements on spatial resolution and contrast sensitivity are more stringent for non-destructive testing of additive manufactured parts compared to the security area. In NDT sizes of indications smaller than 1 mm have to be detected clearly. The investigation of these limits on a stateof-the-art prototype for X-ray back scattering using rotating collimated X-ray needle beams is a part of the BAM project “ProMoAM”. The contribution shows first results of the optimization for NDT and the achieved application limits for several example cases. T2 - International symposium on digital industrial radiology and computed tomography DIR2019 CY - Fürth, Germany DA - 02.07.2019 KW - Radiographic testing KW - X-ray back scattering KW - Additive manufacturing PY - 2019 UR - https://nbn-resolving.org/urn:nbn:de:kobv:b43-505317 UR - https://www.ndt.net/search/docs.php3?id=24760 AN - OPUS4-50531 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Zscherpel, Uwe A1 - Ewert, Uwe T1 - Annual report of sub commission V-A “Radiography-based weld inspection” N2 - Report on the annual activities of IIW commission V, Sub-Commission V-A "Radiography based weld inspection" chaired by Uwe Zscherpel, BAM Berlin T2 - 72. Annual Assembly of the International Institute of Welding 2019 CY - Bratislava, Slovakia DA - 07.07.2019 KW - International Institute of Welding KW - Sub-Commission V-A KW - Radiography based weld inspection PY - 2019 AN - OPUS4-50533 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Zscherpel, Uwe A1 - Nazarzadehmoafi, Maryam A1 - Yuan, Mingchuan A1 - Waske, Anja T1 - X-ray back scatter techniques for additive manufacturing N2 - X-ray back scatter imaging is rarely applied compared to classical X-ray projection imaging. 20 years ago the company Philips developed “COMSCAN”, a first application case in the aircraft industry, which allowed even a depth resolution using back scatter imaging. The company AS&E in Boston offers back scatter imaging solutions for the security market. Their principle is to scan the object with a highly collimated X-ray needle beam from one side only and detect the backscattered radiation by a large area detector side by side with the collimation wheel. A new prototype is investigated at BAM for application and optimization in non-destructive testing. As modern industrial application field in-situ testing in additive manufacturing is targeted. The accessibility of the printed part during the production process is very limited. This prevent the application of a two sided X-ray inspection or Computed Tomography, were an rotation of the object is required to acquire projections from 360 degrees. An important advantage for the X-ray back scatter technique are also the materials used in additive manufacturing (polymers, ceramics, light metals like Aluminum or Titanium). These materials with lower density and lower Z values give better scatter signals than metals with higher densities and Z values. The back scatter intensity decreases with increasing density and Z value of the material. But the requirements on spatial resolution and contrast sensitivity are more stringent for non-destructive testing of additive manufactured parts compared to the security area. In NDT sizes of indications smaller than 1 mm have to be detected clearly. The investigation of these limits on a stateof-the-art prototype for X-ray back scattering using rotating collimated X-ray needle beams is a part of the BAM project “ProMoAM”. The contribution shows first results of the optimization for NDT and the achieved application limits for several example cases. T2 - 72. annual assembly of the international institute of welding 2019 CY - Bratislava, Slovakia DA - 07.07.2019 KW - Nondestructive tesing KW - X-ray back scattering KW - Additive manufacturing PY - 2019 AN - OPUS4-50534 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Zscherpel, Uwe A1 - Stegemann, Robert T1 - Revision of ISO 24497 – NDT – Metal Magnetic Memory (MMM) N2 - The revision of ISO 24497:2007 started in 2017 (by decision of Com-V at the IIW annual assembly in Shanghai). After 3 years of discussions and incorporation of many comments from all over the world the working group C-V-E-b headed by Uwe Zscherpel finalized the work with a final draft to be forwarded for final vote at ISO TC 44. The working group C-V-E-b finalised the work and can be resolved. The chair thanks for all the successfully work done, the vote to forward the latest draft to ISO for final vote was done without any negative. T2 - 72. Annaul assebly of the international institute of welding CY - Bratislava, Slovakia DA - 07.07.2019 KW - International Institute of Welding KW - General Assembly KW - Revision of ISO 24497 KW - Metal Magnetic Memory PY - 2019 AN - OPUS4-50535 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Zscherpel, Uwe T1 - Image Quality in Industrial Radiology N2 - Overview on Concepts and Methodology used for quality ensurance in industrial radiology. The past, present and future. T2 - General Assembly of Academia NDT International CY - Brescia, Italy DA - 12.10.2018 KW - Image quality KW - Computed radiography (CR) KW - Digital Detector Array (DDA) KW - Film radiography PY - 2018 AN - OPUS4-47347 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Zscherpel, Uwe A1 - Ewert, Uwe T1 - Optimum Magnification Factor in Digital Radiography - Selection Criteria and Formulas N2 - The transition from X-ray film to digital detectors in radiography is accompanied by an increase of unsharpness due to the larger inherent digital detector unsharpness in comparison to film. The basic spatial resolution of digital detectors (see EN ISO 17636-2) is used today to describe this unsharpness. The geometrical unsharpness of the radiographic projection of object structures onto the detector plane is determined by the focal spot size of the X-ray tube and the magnification. The focal spot size is measured today (see ASTM E 1165) from pin hole camera exposures or edge unsharpness (see ASTM E 2903). The final image unsharpness is a result of a convolution of the geometrical and inherent detector unsharpness function, divided by the magnification factor of the object onto the detector plane. Different approximations of this convolution result in ASTM E 1000 and ISO 17636-2 in different optimum values for the magnification factor for a given focal spot size of a X—ray tube and the basic spatial resolution of the detector. The higher contrast sensitivity, an advantage of digital radiography, compared to film radiography is furthermore improved when using higher X-ray voltages as used with film and smaller focal spots of the X-ray tubes. This allows a higher distance between object and detector resulting in reduced object scatter in the image. The interactions between all these parameters will be discussed and simple rules for practitioners will be derived in this contribution. T2 - 12th ECNDT 2018 CY - Gothenburg, Sweden DA - 11.06.2018 KW - Digital Radiology KW - Image unsharpness KW - Optimum magnification PY - 2018 AN - OPUS4-47351 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Zscherpel, Uwe A1 - Ewert, Uwe T1 - DIN EN 12681:2017 für die radiographhische Gußteilprüfung mit Film oder digitalen Detektoren N2 - Vorstellung der Konzepte and Anwendungsbereiche der neuen Norm DIN EN 12681 in 2 Teilen: Film und digitale Prüfung T2 - Röntgentechnologietage 2018 CY - Stockelsdorf bei Lübeck, Germany DA - 20.02.2018 KW - Gussteilprüfung KW - DIN EN 12681:2017 KW - Filmbasierend KW - Digitale Röntgendetektoren PY - 2018 AN - OPUS4-47352 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Zscherpel, Uwe A1 - Ewert, Uwe T1 - DIN EN ISO 17636:2013 für die radiographische Schweißnahtprüfung mit Film oder digitalen Detektoren N2 - Die aktuelle Normentwicklung für radiographische Schweißnahtprüfung wird diskutiert und die Konsequenzen für die praktische Anwendung anhand von Beispielen erläutert. T2 - Röntgentechnologietage 2018 CY - Stockelsdorf bei Lübeck, Germany DA - 20.02.2018 KW - Digitale Radiographie KW - Schweißnahtprüfung KW - DIN EN ISO 17636 PY - 2018 AN - OPUS4-47353 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Zscherpel, Uwe A1 - Ewert, Uwe T1 - Aktuelle Normungsaktivitäten in der industriellen Durchstrahlungsprüfung N2 - Neue Normen bei DIN, CEN ISO ASTM und IIW für die industrielle Durchstrahlungsprüfung mit Film und digitalen Detektoren. Stand der Technik und neue Entwicklungen T2 - Radiographie-Forum von Baker Hughes CY - Ahrensburg, Germany DA - 20.06.2018 KW - Wall thickness measurement KW - Aktuelle Normentwicklung KW - Schweißnahtprüfung KW - Digital radiography KW - Computed radiography (CR) KW - Digital Detector Array (DDA) KW - Tangential radiography KW - Image evaluation PY - 2018 AN - OPUS4-47354 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Zscherpel, Uwe A1 - Ewert, Uwe T1 - Annual Report of Sub-Commission V-A "Radiography-based weld inspection" N2 - A Summary pf the activities of the IIW sub-commission V-A in 2018 for radiographic weld inspection. T2 - Annual Assembly of IIW CY - Bali, Indonesia DA - 15.07.2018 KW - Radiograpgy KW - Weld Inspection KW - International Institute of Welding PY - 2018 AN - OPUS4-47355 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -