TY - JOUR A1 - Thamm, T. A1 - Wett, D. A1 - Bohne, W. A1 - Strub, Erik A1 - Röhrich, J. A1 - Szargan, R. A1 - Marx, G. A1 - Goedel, W.A. T1 - Investigations on PECVD boron carbonitride layers by means of ERDA, XPS and nano-indentation measurements N2 - The deposition of boron carbonitride layers on silicon substrates by a microwave plasma enhanced chemical vapour deposition (MW-PECVD) process using N-trimethylborazine (TMB) and benzene as precursors is presented. As plasma gases argon and nitrogen were used. In this investigation we focus on the influence of the gas composition, substrate temperature and -bias on the layer composition, layer structure as well as the thermal stability. The films were analyzed with respect to their composition and bonding structure using elastic recoil detection analysis (ERDA) and X-ray photoelectron spectroscopy (XPS). Furthermore, nanoindentation measurements before and after annealing tests at 500 and 700°C were performed. The measurements show a strong dependence of the structure and mechanical properties on the substrate temperature. The hydrogen content strongly decreases to 8 at.% with higher substrate temperatures. Simultaneously, the layer hardness and Young’s modulus increase up to 21 and 173 GPa, respectively. The hardness does not decrease after annealing for 1 hour at 700°C. KW - BCN KW - PECVD KW - XPS KW - ERDA KW - Hardness KW - Annealing tests PY - 2006 DO - https://doi.org/10.1007/s00604-006-0702-y SN - 0026-3672 SN - 1436-5073 VL - 156 IS - 1-2 SP - 53 EP - 56 PB - Springer CY - Wien AN - OPUS4-14268 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Traulsen, C. H.-H. A1 - Kunz, V. A1 - Heinrich, Thomas A1 - Richter, S. A1 - Holzweber, Markus A1 - Schulz, A. A1 - von Krbek, L. K. S. A1 - Scheuschner, U. T. J. A1 - Poppenberg, J. A1 - Unger, Wolfgang A1 - Schalley, C. A. T1 - Synthesis and coordinative layer-by-layer deposition of pyridine-functionalized gold nanoparticles and tetralactam macrocycles on silicon substrates N2 - Coordination chemistry was applied to deposit pyridine-functionalized gold nanoparticles on silicon substrates. The particles were synthesized through the Brust/Schiffrin route with a subsequent ligand exchange reaction yielding well-defined particles of two different sizes. Multilayer deposition was carried out on a pyridine-terminated SAM, anchored on a hydroxyl-terminated silicon surface. Analogously, Hunter/Vögtle-type tetralactam macrocycle multilayers were deposited as well as mixed layers containing both either in an alternating sequence or as a macrocycle multilayer with a terminating nanoparticle layer. These composite layers were examined with respect to their ability to bind squaraine axles in the macrocycle cavities. The amount of guest bound is higher for the composite layer with alternating macrocycles and nanoparticles. KW - Layer-by-layer deposition KW - Functionalized Au nanoparticles KW - SEM KW - TEM KW - DLS KW - XPS KW - NEXAFS KW - ToF-SIMS KW - IR KW - UV-vis PY - 2013 DO - https://doi.org/10.1021/la403222x SN - 0743-7463 SN - 1520-5827 VL - 29 IS - 46 SP - 14284 EP - 14292 PB - American Chemical Society CY - Washington, DC AN - OPUS4-29699 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Unger, Wolfgang T1 - International standardization and metrology as tools to address the comparability and reproducibility challenges in XPS measurements N2 - The status of standardization related to x-ray photoelectron spectroscopy (XPS, ESCA) at ASTM International (Subcommittee E42.03) and ISO (TC 201) is presented and commented upon in a structured manner. The survey also identifies other active bodies, here VAMAS Technical Working Area 2 and the Surface Analysis Working Group at the International Meter Convention, contributing to prestandardization Research and metrology of XPS and reports their specific activities. It is concluded that existing standardization is delivering good practices in the use of XPS and has a high potential to avoid the recently observed erroneous use, misapplications, and misinterpretation by new and inexperienced users of the method—which seems to be the main reason for the “reproducibility crisis” in the field of XPS applications. A need for a more proactive publicizing of international documentary standards by experienced XPS users, specifically those who are involved in standardization, is identified. Because the existing portfolio of standards addressing the use of XPS is not complete, future standardization projects planned or already ongoing are mentioned. The way the standardization bodies are identifying future needs is shortly explained. KW - Standardisation KW - Comparability KW - Reproducibility KW - XPS KW - VAMAS KW - Metrology PY - 2020 DO - https://doi.org/10.1116/1.5131074 VL - 38 IS - 2 SP - 021201-1 EP - 021201-8 PB - AVS AN - OPUS4-50560 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Unger, Wolfgang A1 - Beiranvand, Z. A1 - Kakanejadifard, A. A1 - Donskyi, Ievgen A1 - Faghani, A. A1 - Tu, Z. A1 - Lippitz, Andreas A1 - Sasanpour, P. A1 - Maschietto, F. A1 - Paulus, B. A1 - Haag, R. A1 - Adeli, M. T1 - Functionalization of fullerene at room temperature: toward new carbon vectors with improved physicochemical properties N2 - In this work, fullerene has been functionalized with cyanuric Chloride at room temperature by a nitrene mediated [2 + 1] cycloaddition reaction. The adduct after functionalization is inherently in the form of azafulleroid and shows broad UV absorption in the wavelength range of 200–800 nm, as well as photothermal conversion and fluorescence with a high quantum yield. KW - Functionalization of fullerenes KW - XPS KW - NEXAFS PY - 2016 UR - https://nbn-resolving.org/urn:nbn:de:kobv:b43-387076 DO - https://doi.org/10.1039/c6ra23419d SN - 2046-2069 VL - 6 IS - 114 SP - 112771 EP - 112775 PB - Royal Society of Chemistry (RSC) AN - OPUS4-38707 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Unger, Wolfgang A1 - Gross, Thomas A1 - Böse, Olaf A1 - Lippitz, Andreas A1 - Fritz, Thomas A1 - Gelius, U. T1 - VAMAS TWA2 Project A2: evaluation of static charge stabilization and determination methods in XPS on non-conducting samples. Report on an inter-laboratory comparison N2 - First results of an inter-laboratory comparison (27 participants in Europe, Japan and USA) of XPS data obtained with non-conducting samples are presented. Binding energies of Al 2s for alumina, N 1s and imide C 1s for Kapton and Sr 3p3/2 for a strontium titanate film on glass were obtained after static charge referencing with the help of 15 nm gold particles deposited at the surface of the test samples. For the alumina sample C 1s static charge referenced data are also presented. Repeat standard deviations (sr), between standard deviations (sb), reproducibility standard deviations (sR) and total means are evaluated from the experimental data. It can be stated that although the repeat standard deviation is as small as 0.05 eV in the best case, the standard deviation characterizing the reproducibility of the method is obviously not better than 0.15 eV in the best case at the present time. The knowledge of these standard deviations is important for metrology, validations of analytical procedures relying on qualitative photoelectron spectroscopy and XPS databanking. KW - XPS KW - ESCA KW - Binding energy KW - Inter-laboratory comparison PY - 2000 DO - https://doi.org/10.1002/1096-9918(200008)29:8<535::AID-SIA900>3.0.CO;2-5 SN - 0142-2421 SN - 1096-9918 VL - 29 SP - 535 EP - 543 PB - Wiley CY - Chichester AN - OPUS4-6939 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Unger, Wolfgang A1 - Gross, Thomas A1 - Lippitz, Andreas A1 - Güttler, B. T1 - Uncertainty in measurement of overlayer thickness of thermally oxidized silicon using x-ray photoelectron spectroscopy N2 - Overlayers of SiO2 (nominally 4, 6 and 8 nm thick) on silicon, prepared by thermal oxidation, were investigated using x-ray photoelectron spectroscopy (XPS). The thickness of these overlayers was obtained from a measurement of the photoelectron intensities originating from the substrate and the oxide overlayer by applying an appropriate quantitative model. The uncertainty budget of that thickness measurement method is given. The relative combined standard uncertainty of the method was found to be 15%. The effective attenuation lengths or the corresponding electron inelastic mean free paths are of considerable importance for both the estimated values of overlayer thickness and combined standard uncertainties. The XPS results were compared with ellipsometry data. KW - XPS KW - ESCA KW - Uncertainty KW - Overlayer KW - SiO2 PY - 2000 DO - https://doi.org/10.1002/1096-9918(200012)29:12<891::AID-SIA943>3.0.CO;2-A SN - 0142-2421 SN - 1096-9918 IS - 29 SP - 891 EP - 894 PB - Wiley CY - Chichester AN - OPUS4-1075 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Unger, Wolfgang A1 - Kalbe, Henryk A1 - Rades, Steffi T1 - Determining shell thicknesses in stabilised CdSe@ZnS core-shell nanoparticles by quantitative XPS analysis using an infinitesimal columns model N2 - A novel Infinitesimal Columns (IC) simulation model is introduced in this study for the quantitativeanalysis of core-shell nanoparticles (CSNP) by means of XPS, which combines the advantages of exist-ing approaches. The IC model is applied to stabilised Lumidot™CdSe/ZnS 610 CSNP for an extensiveinvestigation of their internal structure, i.e. calculation of the two shell thicknesses (ZnS and stabiliser)and exploration of deviations from the idealised CSNP composition. The observed discrepancies betweendifferent model calculations can be attributed to the presence of excess stabiliser as well as synthesisresidues, demonstrating the necessity of sophisticated purification methods. An excellent agreement isfound in the comparison of the IC model with established models from the existing literature, the Shardmodel and the software SESSA. KW - XPS KW - Quantum dot KW - Core shell nano particle PY - 2016 DO - https://doi.org/10.1016/j.elspec.2016.08.002 SN - 0368-2048 VL - 212 SP - 34 EP - 43 PB - Elsevier B.V. AN - OPUS4-38273 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Unger, Wolfgang A1 - Khani, M. A1 - Mehdipour, E. A1 - Faghani, A. A1 - Guday, G. A1 - Donskyi, Ievgen A1 - Haag, R. A1 - Adeli, M. T1 - Preparation of graphene oxide by cyanuric chloride as an effective and non-corrosive oxidizing agent N2 - In this work, we report a new method for the synthesis of graphene oxide (GO) using cyanuric chloride as a non-corrosive oxidizing agent. The mild conditions, simple purification, and scalability of this method are significant advantages over common approaches in which harsh oxidizing agents are used. Moreover, a major drawback with the Hummers' method, the production of toxic gases, is not an issue with this process. This method is a safe and large-scale alternative for the production of GO under mild conditions. KW - Graphene oxide KW - Synthesis KW - XPS KW - AFM KW - IR KW - TGA PY - 2016 DO - https://doi.org/10.1039/c6ra23702a SN - 2046-2069 VL - 6 IS - 116 SP - 115055 EP - 115057 PB - The Royal Society of Chemistry AN - OPUS4-39111 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Unger, Wolfgang A1 - Schwarz, F. A1 - Heinrich, Thomas A1 - Kaufmann, J. O. A1 - Lippitz, Andreas A1 - Puttreddy, R. A1 - Rissanen, K. A1 - Schalley, C. A. T1 - Photocontrolled on-surface pseudorotaxane formation with well-ordered macrocycle multilayers N2 - The photoinduced pseudorotaxane formation between a photoresponsive axle and a tetralactam macrocycle was investigated in solution and on glass surfaces with immobilized multilayers of macrocycles. In the course of this reaction, a novel photoswitchable binding station with azobenzene as the photoswitchable unit and diketopiperazine as the binding station was synthesized and studied by NMR and UV/Vis spectroscopy. Glass surfaces have been functionalized with pyridine-terminated SAMs and subsequently withmultilayers of macrocycles through layer-by-layer self assembly. A preferred orientation of the macrocycles could be confirmed by NEXAFS spectroscopy. The photocontrolled Deposition of the axle into the surface-bound macrocycle-multilayers was monitored by UV/Vis spectroscopy and led to an increase of the molecular order, as indicated by more substantial linear dichroism effects in angle-resolved NEXAFS spectra. KW - Well-ordered macrocycle multilayers KW - XPS KW - NEXAFS PY - 2016 DO - https://doi.org/10.1002/chem.201603156 SN - 0947-6539 SN - 1521-3765 VL - 22 IS - 40 SP - 14383 EP - 14389 PB - Wiley-VCH Verlag GmbH & Co. KGaA CY - Weinheim AN - OPUS4-38270 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Unger, Wolfgang A1 - Senoner, Mathias A1 - Wirth, Thomas A1 - Bütefisch, S. A1 - Busch, I. T1 - Lateral resolution delivered by imaging surface-analytical instruments as SIMS, AES and XPS: Application of the BAM-L200 Certified Reference Material and related ISO Standards N2 - The certified reference material BAM-L200, a nanoscale stripe pattern for length calibration and specification of lateral resolution, is described. BAM-L200 is prepared from a cross-sectioned epitaxially grown layer stack of AlxGa1-xAs and InxGa1 xAs on a GaAs substrate. The surface of BAM-L200 provides a flat pattern with stripe widths ranging down to 1 nm. Calibration distances, grating periods and stripe widths have been certified by TEM with traceability to the length unit. The combination of gratings, isolated narrow stripes and sharp edges of wide stripes offers a plenty of options for the determination of lateral resolution, sharpness and calibration of length scale at selected settings of imaging surface analytical instruments. The feasibility of the reference material for an analysis of the lateral resolution is demonstrated in detail by evaluation of ToF-SIMS, AES and EDX images. Other applications developed in the community are summarized, too. BAM-L200 fully supports the implementation of the revised International Standard ISO 18516 (in preparation) which is based on knowledge outlined in the Technical Report ISO/TR 19319:2013. KW - Standardization KW - AES KW - XPS KW - SIMS KW - Lateral resolution KW - Certified reference material PY - 2017 SN - 1341-1756 VL - 24 IS - 2 SP - 123 EP - 128 AN - OPUS4-43138 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -