TY - GEN A1 - Baer, D. R. A1 - Cant, D. J. H. A1 - Castner, D. G. A1 - Ceccone, G. A1 - Engelhard, M. H. A1 - Karakoti, A. S. A1 - Müller, Anja ED - Hodoroaba, Vasile-Dan ED - Unger, Wolfgang ED - Shard, A. G. T1 - Preparation of nanoparticles for surface analysis T2 - Characterization of nanoparticles - Measurement processes for nanoparticles N2 - A variety of methods used to prepare nano-objects for surface analysis are described along with information about when they might be best applied. Intrinsic properties of NPs which complicate their characterization and need to be considered when planning for surface or other analyses of NPs are identified, including challenges associated with reproducible synthesis and functionalization of the particles as well as their dynamic nature. The relevant information about the sample preparation processes, along with analysis details and data that need to be added to the collection of material provenance information is identified. Examples of protocols that have been successfully used for preparation of nano-objects for surface analysis are included in an annex. KW - Sample preparation KW - Nanoparticles KW - Surface chemistry KW - XPS KW - Dynamic behavior KW - Nano-object KW - Surface analysis PY - 2020 SN - 978-0-12-814182-3 DO - https://doi.org/10.1016/B978-0-12-814182-3.00018-3 SP - 295 EP - 347 PB - Elsevier CY - Amsterdam AN - OPUS4-50186 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Böhning, Martin A1 - Goering, Harald A1 - Hao, Ning A1 - Mach, Reinhard A1 - Schönhals, Andreas ED - Cassidy, P. T1 - Polycarbonate/SiC nanocomposites - Influence of nanoparticle dispersion on molecular mobility and gas transport T2 - 7th International Symposium on Polymers for Advanced Technologies T2 - 7th International Symposium on Polymers for Advanced Technologies CY - Fort Lauderdale, FL, USA DA - 2005-09-21 KW - Nanocomposites KW - Nanoparticles KW - Polycarbonates KW - Dielectric properties KW - Gas permeation PY - 2005 VL - 16 IS - 2-3 SP - 262 EP - 268 PB - Wiley CY - Chichester AN - OPUS4-7062 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Descalzo López, Ana Belén A1 - Zhu, Shengchao A1 - Fischer, Tobias A1 - Rurack, Knut ED - Demchenko, A.P. T1 - Optimization of the coupling of target recognition and signal generation T2 - Advanced fluorescence reporters in chemistry and biology II: Molecular constructions, polymers and nanoparticles N2 - Fluorescent reporters that literally "light up" upon binding of a target species are particularly interesting from an analytical point of view. This contribution introduces the main signaling concepts in fluorescent probe research, discusses strategies toward their optimization in terms of signal output, and highlights the wealth of alternative protocols that has been realized in the past two decades to create signaling systems with luminescence amplification features. KW - Dyes KW - Fluorescence KW - FRET KW - Molecular Recognition KW - Nanoparticles PY - 2010 SN - 978-3-642-04699-5 DO - https://doi.org/10.1007/978-3-642-04701-5_2 N1 - Serientitel: Springer Series on Fluorescence – Series title: Springer Series on Fluorescence VL - 9 IS - 1 SP - 41 EP - 106 PB - Springer AN - OPUS4-21941 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Mast, J. A1 - Verleysen, E. A1 - Hodoroaba, Vasile-Dan A1 - Kaegi, R. ED - Hodoroaba, Vasile-Dan ED - Unger, Wolfgang ED - Shard, A. G. T1 - Characterization of nanomaterials by transmission electron microscopy - Measurement procedures T2 - Characterization of nanoparticles - Measurement processes for nanoparticles N2 - In this chapter, approaches are proposed for the descriptive and quantitative characterization of nano-objects with nanometer resolution. Measurements are based on the analysis of the characteristics of 2D projections of individual particles visualized on transmission electron micrographs. Incorporation of spectroscopic methods (EDS and EELS) for elemental analysis of nano-objects is recommended to identify subpopulations of nano-objects in mixtures based on their chemical composition. The focus lies on the determination of physicochemical properties which are essential in a legislatory and regulatory context to define the material as a nanomaterial (NM), and to assess its safety and toxicological potential, using widely accessible equipment. KW - Nanoparticles KW - Sample preparation KW - Image analysis KW - Transmission electron microscopy PY - 2020 SN - 978-0-12-814182-3 DO - https://doi.org/10.1016/B978-0-12-814182-3.00004-3 SP - 29 EP - 48 PB - Elsevier CY - Amsterdam AN - OPUS4-50121 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Schaepe, Kaija A1 - Jungnickel, H. A1 - Heinrich, Thomas A1 - Tentschert, J. A1 - Luch, A. A1 - Unger, Wolfgang ED - Hodoroaba, Vasile-Dan ED - Unger, Wolfgang ED - Shard, A. G. T1 - Secondary ion mass spectrometry T2 - Characterization of nanoparticles - Measurement processes for nanoparticles N2 - This chapter provides an introduction in secondary ion mass spectrometry as one of the leading surface chemical analysis and imaging techniques with molecular specificity in the field of material sciences. The physical basics of the technique are explained along with a description of the typical instrumental setups and their modes of operation. The application paragraph specifically focuses on nanoparticle analysis by SIMS in terms of surface spectrometry, imaging, analysis in organic and complex media, and depth profiling. A review of the existing literature is provided, and selected studies are showcased. Limitations and pitfalls as well as current technical developments of SIMS application in nanoparticle surface chemical analysis are equally discussed. KW - Time-of-flight secondary ion mass spectrometry KW - Surface chemical analysis KW - Imaging KW - Nanomaterials KW - Nanoparticles KW - Core-shell PY - 2020 SN - 978-0-12-814182-3 DO - https://doi.org/10.1016/B978-0-12-814182-3.00025-0 SP - 481 EP - 509 PB - Elsevier CY - Amsterdam AN - OPUS4-50187 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Shard, A. G. A1 - Hodoroaba, Vasile-Dan A1 - Unger, Wolfgang ED - Hodoroaba, Vasile-Dan ED - Unger, Wolfgang ED - Shard, A. G. T1 - Introduction T2 - Characterization of nanoparticles - Measurement processes for nanoparticles N2 - The purpose of this book is to provide a comprehensive collection of analytical methods that are commonly used to measure nanoparticles, providing information on one, or more, property of importance. The chapters provide up-to-date information and guidance on the use of these techniques, detailing the manner in which they may be reliably employed. Within this chapter, we detail the rationale and context of the whole book, which is driven by the observation of a low level of reproducibility in nanoparticle research. The aim of the book is to encourage awareness of both the strengths and weaknesses of the various methods used to measure nanoparticles and raise awareness of the range of methods that are available. The editors of the book have, for many years, been engaged in European projects and standardization activities concerned with nanoparticle analysis and have identified authors who are experts in the various methods included within the book. This has produced a book that can be used as a definitive guide to current best practice in nanoparticle measurement. KW - Nanoparticles KW - Size distribution KW - Shape KW - Chemistry KW - Coating KW - Concentration KW - Standards KW - Charge KW - Characterisation PY - 2020 SN - 978-0-12-814182-3 DO - https://doi.org/10.1016/B978-0-12-814182-3.00001-8 SP - 1 EP - 6 PB - Elsevier CY - Amsterdam AN - OPUS4-50166 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Unger, Wolfgang A1 - Wirth, Thomas A1 - Hodoroaba, Vasile-Dan ED - Hodoroaba, Vasile-Dan ED - Unger, Wolfgang ED - Shard, A. G. T1 - Auger electron spectroscopy T2 - Characterization of nanoparticles - Measurement processes for nanoparticles N2 - An introduction in the application of Auger Electron Spectroscopy to surface chemical analysis of nanoparticles is given. Auger Electron Spectroscopy is a mature method in the field of surface chemical analysis. The chapter addresses the physical basis of the method, the principal design of recent instruments together with modes of operation and options for the presentation of spectra, as well as different approaches for qualitative (including identification of chemical species) and quantitative surface analysis of elements. An application paragraph on surface chemical analysis of nanoparticles by AES or SAM introduces the different measurement approaches and sample preparation strategies applied by analysts. The analysis of nanoparticle ensembles, the so-called selected point analysis where a narrow primary electron beam is centered on an individual nanoparticle, and chemical mapping of individual nanoparticles (or a line scan across) are addressed. Existing literature is reviewed and informative case studies presented. Limitations and pitfalls in the application of AES in surface chemical analysis of nanoparticles are also addressed. KW - Auger Electron Spectroscopy KW - Surface chemical analysis KW - Imaging surface chemical analysis KW - Nanoparticles KW - Nanotechnology PY - 2020 SN - 978-0-12-814182-3 DO - https://doi.org/10.1016/B978-0-12-814182-3.00020-1 SP - 373 EP - 395 PB - Elsevier CY - Amsterdam AN - OPUS4-50119 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Vladár, A. E. A1 - Hodoroaba, Vasile-Dan ED - Hodoroaba, Vasile-Dan ED - Unger, Wolfgang ED - Shard, A. G. T1 - Characterization of nanoparticles by scanning electron microscopy T2 - Characterization of nanoparticles - Measurement processes for nanoparticles N2 - In this chapter sample preparation, image acquisition, and nanoparticle size and shape characterization methods using the scanning electron microscope (SEM) in reflective and transmitted working modes are described. These help in obtaining reliable, highly repeatable results. The best solutions vary case-by-case and depend on the raw (powdered or suspension) nanoparticle material, the required measurement uncertainty and on the performance of the SEM. KW - Nanoparticles KW - Sample preparation KW - Electron microscopy KW - SEM KW - Size measurement KW - Shape KW - Threshold PY - 2020 SN - 978-0-12-814182-3 DO - https://doi.org/10.1016/B978-0-12-814182-3.00002-X SP - 7 EP - 27 PB - Elsevier CY - Amsterdam AN - OPUS4-50120 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -