TY - CONF A1 - Müller, Bernd R. T1 - Refraction Enhanced MicroCT for Non-Destructive Materials Characterization T2 - Workshop on X-Ray Micro Imaging of Materials, Devices, and Organisms CY - Dresden, Germany DA - 2008-10-22 PY - 2008 AN - OPUS4-18151 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Müller, Bernd R. T1 - X-Ray Refraction Topography characterizes Internal Nano Interfaces T2 - 16th World Conference on Nondestructive Testing (WCNDT 2004) CY - Montreal, Canada DA - 2004-08-30 PY - 2004 AN - OPUS4-5567 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Müller, Bernd R. T1 - Materialforschung mit Synchrotron-Refraktions-Computer-Tomographie an der BAMline T2 - Vortrag im Sonderkolloquium der DGZfP zu Ehren von Dr. Ing. Klaus Berner, DGZfP-Tagungszentrum, Adlershof CY - Berlin, Germany DA - 2005-02-01 PY - 2005 AN - OPUS4-11402 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Müller, Bernd R. T1 - Sichere Automobil Elektronik durch nanogenaues Synchronotron-Prüfverfahren SyBrATo T2 - DGZfP Jahrestagung 2007 CY - Fürth, Germany DA - 2007-05-14 PY - 2007 AN - OPUS4-14324 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Müller, Bernd R. T1 - Visualisierung gebogener Ics - Wozu? T2 - Industrieforum "Bildgebende Röntgenverfahren, neue Einblicke in kleinste Strukturen" CY - Karlsruhe, Germany DA - 2006-11-17 PY - 2006 AN - OPUS4-15469 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Müller, Bernd R. T1 - First refraction enhanced 3D computed tomography - application to metal matrix composites T2 - International Symposium on Computed Tomography and Image Processing for Industrial Radiology CY - Berlin, Germany DA - 2003-06-23 PY - 2003 AN - OPUS4-4459 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Müller, Bernd R. T1 - Synchrotron based refraction enhanced micro-CT for non-destructive characterisation of biological materials T2 - EUROMAT 2011 European Congress and Exhibition on Advanced Materials and Processes CY - Montpellier, France DA - 2011-09-12 PY - 2011 AN - OPUS4-24903 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Müller, Bernd R. T1 - X-Ray Diffraction Tomography images Materials by Molecular Probe T2 - 16th World Conference on Nondestructive Testing (WCNDT 2004) CY - Montreal, Canada DA - 2004-08-30 PY - 2004 AN - OPUS4-5575 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Müller, Bernd R. T1 - Visualization of Package Induced Deformation of Integrated Circuits T2 - 10th European Conference on Non-Destructive Testing (ECNDT) CY - Moscow, Russia DA - 2010-07-07 PY - 2010 AN - OPUS4-22865 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Müller, Bernd R. T1 - Röntgenrefraktion T2 - BAM Arbeitskreis Synchrotronstrahlung CY - Berlin, Germany DA - 2013-07-25 PY - 2013 AN - OPUS4-29176 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -