TY - CONF A1 - Müller, Bernd R. A1 - Lange, Axel A1 - Hentschel, Manfred P. T1 - Non-Destructive Characterisation of High Performance Composites by use of X-Ray Refraction Topography T2 - SAMPE (Society for the Advancement of Material and Process Engineering) - Fachtagung T2 - SAMPE (Society for the Advancement of Material and Process Engineering) - Fachtagung CY - Long Beach, CA, USA DA - 2003-05-11 PY - 2003 AN - OPUS4-3075 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Müller, Bernd R. A1 - Hentschel, Manfred P. A1 - Lange, Axel T1 - SYRTOPO: Materialcharakterisierung an der BAMline T2 - DGZfP-Jahrestagung 2002: ZfP in Anwendung, Entwicklung und Forschung T2 - DGZfP-Jahrestagung 2002: ZfP in Anwendung, Entwicklung und Forschung CY - Weimar, Germany DA - 2002-05-06 PY - 2002 AN - OPUS4-3082 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Müller, Bernd R. A1 - Lange, Axel A1 - Harwardt, Michael A1 - Hentschel, Manfred P. A1 - Illerhaus, Bernhard A1 - Goebbels, Jürgen A1 - Bamberg, J. A1 - Heutling, F. T1 - 3D Refraction Computed Tomography Applied to Metal Matrix Composites T2 - 35th International SAMPE Technical Conference-2003 T2 - 35th International SAMPE Technical Conference-2003 CY - Dayton, OH, USA DA - 2003-09-28 PY - 2003 AN - OPUS4-3253 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Müller, Bernd R. A1 - Lange, Axel A1 - Harwardt, Michael A1 - Hentschel, Manfred P. T1 - X-ray refraction topography and computer tomography for NDE of light weight materials T2 - ECNDT 2006 T2 - ECNDT 2006 CY - Berlin, Germany DA - 2006-09-25 PY - 2006 AN - OPUS4-12138 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Müller, Bernd R. A1 - Lange, Axel A1 - Harwardt, Michael A1 - Hentschel, Manfred P. A1 - Illerhaus, Bernhard A1 - Goebbels, Jürgen A1 - Bamberg, J. A1 - Heutling, F. T1 - Micro Crack Characterization of Metal Matrix Composites by 3D-Refraction-Computed-Tomography T2 - 16th World Conference on Nondestructive Testing (WCNDT 2004) T2 - 16th World Conference on Nondestructive Testing (WCNDT 2004) CY - Montreal, Canada DA - 2004-08-30 PY - 2004 AN - OPUS4-5572 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Müller, Bernd R. A1 - Hentschel, Manfred P. A1 - Lange, Axel A1 - Schors, Jörg A1 - Wald, Oliver T1 - X-Ray Diffraction Tomography images Materials by Molecular Probe T2 - 16th World Conference on Nondestructive Testing (WCNDT 2004) T2 - 16th World Conference on Nondestructive Testing (WCNDT 2004) CY - Montreal, Canada DA - 2004-08-30 PY - 2004 AN - OPUS4-5575 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Müller, Bernd R. A1 - Hentschel, Manfred P. T1 - Röntgen-Refraktions-Topographie T2 - BAMline - 3.Seminar zur Nutzung des Wellenlängenschieber-Messplatzes bei BESSY T2 - BAMline - 3.Seminar zur Nutzung des Wellenlängenschieber-Messplatzes bei BESSY CY - Berlin, Germany DA - 2004-11-29 PY - 2004 AN - OPUS4-5576 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Müller, Bernd R. T1 - X-Ray Refraction Topography T2 - Seminar Methoden der Röntgen Fluoreszenz Analyse, TU Berlin T2 - Seminar Methoden der Röntgen Fluoreszenz Analyse, TU Berlin CY - Berlin, Germany DA - 2004-02-03 PY - 2004 AN - OPUS4-5565 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Müller, Bernd R. A1 - Lange, Axel A1 - Harwardt, Michael A1 - Hentschel, Manfred P. T1 - Submikrometer-Computer-Tomografie an der BAMline T2 - DACH-Jahrestagung 2004: ZfP in Forschung, Entwicklung und Anwendung T2 - DACH-Jahrestagung 2004: ZfP in Forschung, Entwicklung und Anwendung CY - Salzburg, Austria DA - 2004-05-17 PY - 2004 AN - OPUS4-5566 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Müller, Bernd R. A1 - Hentschel, Manfred P. A1 - Harbich, Karl-Wolfram A1 - Lange, Axel A1 - Schors, Jörg T1 - X-Ray Refraction Topography characterizes Internal Nano Interfaces T2 - 16th World Conference on Nondestructive Testing (WCNDT 2004) T2 - 16th World Conference on Nondestructive Testing (WCNDT 2004) CY - Montreal, Canada DA - 2004-08-30 PY - 2004 AN - OPUS4-5567 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -