TY - JOUR A1 - Knigge, Xenia A1 - Radnik, Jörg T1 - 1-Propyl-3-methyl-imidazolium bis(trifluoromethylsulfonyl)imide (Solarpur®) analyzed by hard x-ray photoelectron spectroscopy JF - Surface Science Spectra N2 - 1-Propyl-3-methyl-imidazolium bis(trifluoromethylsulfonyl)imide (Solarpur®), an ionic liquid was purchased from Merck (formerly Sigma Aldrich), was analyzed using hard x-ray photoelectron spectroscopy (HAXPES). The liquid is UHV stable, vertically and laterally homogeneous, and is easy to clean; thus, it can be used as a reference material. The HAXPES spectra of Solarpur® obtained using monochromatic Cr Kα radiation at 5414.8 eV include a survey scan, high-resolution spectra of C 1s, O 1s, N 1s, S 2p, S 1s, S 2s, F 1s, and S KLL. KW - HAXPES KW - Hard x-ray photoelectron spectroscopy KW - Ionic liquid KW - Solarpur PY - 2021 DO - https://doi.org/10.1116/6.0001414 VL - 28 IS - 2 SP - 1 EP - 8 PB - AVS: Science & Technology of Materials, Interfaces, and Processing AN - OPUS4-54113 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Knigge, Xenia A1 - Radnik, Jörg T1 - 1,3-Dimethyl-imidazolium dimethyl phosphate ([MMIM]+[DMP]−) analyzed by XPS and HAXPES JF - Surface Science Spectra N2 - The ionic liquid 1,3-dimethyl-imidazolium-dimethylphosphate ([MMIM]+[DMP]−) was analyzed using (hard) x-ray photoelectron spectroscopy. Here, XPS and HAXPES spectra are shown in comparison. For the acquisition of the XPS spectra, monochromatic Al Kα radiation at 1486.6 eV was used, while for the acquisition of the HAXPES spectra, monochromatic Cr Kα radiation at 5414.8 eV was applied. Here, survey scans and high-resolution spectra of P 2p, P 2s, C 1s, O 1s, and N 1s for both methods and P 1s, P KL2,3L2,3, and P KL1L2,3 for HAXPES are shown. KW - C7H15N2O4P KW - [MMIM]+[DMP]− KW - Lonic liquid KW - Hard x-ray photoelectron spectroscopy KW - HAXPES KW - XPS PY - 2023 UR - https://nbn-resolving.org/urn:nbn:de:kobv:b43-571604 DO - https://doi.org/10.1116/6.0002297 VL - 30 IS - 1 SP - 1 EP - 20 PB - AIP Publishing AN - OPUS4-57160 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -