TY - JOUR A1 - Al-Falahat, A.M. A1 - Kupsch, Andreas A1 - Hentschel, M.P. A1 - Lange, A. A1 - Kardjilov, N. A1 - Markötter, Henning A1 - Manke, I. T1 - Correction approach of detector backlighting in radiography JF - Review of Scientific Instruments N2 - In various kinds of radiography, deficient transmission imaging may occur due to backlighting inside the detector itself arising from light or radiation scattering. The related intensity mismatches barely disturb the high resolution contrast, but its long range nature results in reduced attenuation levels which are often disregarded. Based on X-ray observations and an empirical formalism, a procedure is developed for a first order correction of detector backlighting. A backlighting factor is modeled as a function of the relative detector coverage by the sample projection. Different cases of sample transmission are regarded at different backlight factors and detector coverage. The additional intensity of backlighting may strongly affect the values of materials’ attenuation up to a few 10%. The presented scenario provides a comfortable procedure for corrections of X-ray or neutron transmission imaging data. KW - X-ray imaging KW - Neutron imaging KW - Radiology KW - Backlighting KW - Digital detector array PY - 2019 DO - https://doi.org/10.1063/1.5097170 SN - 0034-6748 VL - 90 IS - 12 SP - 125108 PB - American Institute of Physics CY - Melville, NY, USA AN - OPUS4-50217 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Kolkoori, Sanjeevareddy A1 - Wrobel, Norma A1 - Zscherpel, Uwe A1 - Ewert, Uwe T1 - A new X-ray backscatter imaging technique for non-destructive testing of aerospace materials JF - NDT & E international N2 - This paper presents a new X-ray backscatter technique (XBT) for non-destructive imaging of aerospace materials with only a single-sided access. It uses a special twisted slit collimator to inspect the whole object by changing the viewing direction of the X-ray backscatter camera. For the first time, the X-ray backscatter measurements were conducted using high-energy (>500 keV) X-ray sources. Experiments were performed on thick complex structured aluminium components, stringers and honeycomb structures to validate the applicability of the present technique to image small changes in the material properties and also to detect low-density material inclusions. In order to reduce the inspection time from hours to several seconds and to improve the image quality of the X-ray backscatter image, the backscattered signals were measured using a digital detector array with high spatial resolution (200 µm). The influence of the energy of the X-ray source and the slit width of the camera on the X-ray backscatter image were also investigated. In the proposed technique, the whole object is irradiated by an un-collimated X-ray beam resulting in a low image acquisition time of 3 min that facilitates the use of XBT for the real time NDT&E of aerospace materials. KW - X-ray backscatter imaging KW - Digital radiography KW - Digital detector array KW - Non-destructive evaluation KW - Aerospace applications PY - 2015 DO - https://doi.org/10.1016/j.ndteint.2014.09.008 SN - 0963-8695 VL - 70 SP - 41 EP - 52 PB - Butterworth-Heinemann CY - Oxford AN - OPUS4-32515 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Zscherpel, Uwe A1 - Schumacher, David A1 - Redmer, Bernhard A1 - Ewert, Uwe A1 - Ullberg, C. A1 - Weber, N. A1 - Pantsar, T. T1 - Digital radiology with photon counting detectors JF - The e-journal of nondestructive testing & ultrasonics N2 - The progress in X-ray detector electronics (sensitivity and speed) allows meanwhile fast single photon detection by a matrix detector. Combined photon counting and energy discrimination is implemented in the electronic circuit of each detector pixel. The company XCounter developed detectors based on CdTe single crystals, which can be tiled to larger areas and have a pixel size of 100ìm. The largest area available in beginning of 2014 is 50x75 mm². These detectors have very promising properties, which make them very suitable for NDT applications: 1. A CdTe attenuation layer of 750 µm thickness allows efficient X-ray detection up to ca. 300 keV. In counting mode only photon noise is important; no other detector noise sources need to be considered. There is no Offset signal without radiation. 2. Each of the detector pixels has two energy thresholds. These can be used for dual energy imaging for materials separation. Also the suppression of scattered radiation by energy thresholding will improve the image contrast sensitivity. First experiments will be presented which demonstrate the advantages of this new detector technology over the conventional charge integrating detectors. A challenge is the development of a modified detector calibration procedure, which becomes critical at longer exposure times. T2 - ECNDT 2014 - 11th European conference on non-destructive testing CY - Prague, Czech Republic DA - 06.10.2014 KW - Materials characterization KW - Radiographic testing (RT) KW - Digital detector array KW - Photo counting KW - Image quality KW - Calibration KW - Dual-energy KW - Energy discrimination KW - Digital radiology KW - Detectors PY - 2014 UR - https://nbn-resolving.org/urn:nbn:de:kobv:b43-323063 UR - https://www.ndt.net/?id=16709 SN - 1435-4934 N1 - Geburtsname von Schumacher, David: Walter, D. - Birth name of Schumacher, David: Walter, D. VL - 19 IS - 12 SP - 1 EP - 8 PB - NDT.net CY - Kirchwald AN - OPUS4-32306 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -