TY - JOUR A1 - Cant, D. J. H. A1 - Müller, Anja A1 - Clifford, C. A. A1 - Unger, Wolfgang A1 - Shard, A. G. T1 - Summary of ISO/TC 201 Technical Report 23173—Surface chemical analysis—Electron spectroscopies—Measurement of the thickness and composition of nanoparticle coatings JF - Surface and Interface Analysis N2 - ISO Technical Report 23173 describes methods by which electron spectroscopies, including X-ray photoelectron spectroscopy (XPS), Auger electron spectroscopy (AES) and synchrotron techniques, can be employed to calculate the Coating thicknesses and compositions of nanoparticles. The document has been developed to review and outline the current state-of-the-art for such measurements. Such analyses of core–shell nanoparticles are common within the literature, however the methods employed are varied; the relative advantages and disadvantages of These methods, and the optimal usage of each may not be clear to the general analyst. ISO Technical Report 23173 aims to clarify the methods that are available, describe them in clear terms, exhibit examples of their use, and highlight potential issues users may face. The information provided should allow analysts of electron spectroscopy data to make clear choices regarding the appropriate analysis of electron spectroscopy data from coated nanoparticle systems and provide a basis for understanding and comparing results from different methods and systems. KW - Electron spectroscopy KW - Core-shell KW - Nanoparticles KW - ISO 23173 KW - XPS KW - Thickness KW - Composition PY - 2021 DO - https://doi.org/10.1002/sia.6987 SN - 0142-2421 VL - 53 IS - 10 SP - 893 EP - 899 PB - John Wiley & Sons Ltd AN - OPUS4-52976 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Guilherme, A. A1 - Hodoroaba, Vasile-Dan A1 - Benemann, Sigrid A1 - Coroado, J. A1 - Carvalho, M.L. T1 - Morphological and compositional features of portuguese polychrome glazed pottery investigated by SEM/EDX - hints about the manufacturing processes JF - Microscopy and microanalysis N2 - The study addresses to the morphological and compositional Features of polychrome glazed ceramic samples from Portugal by means of a SEM/EDX System (scanning electron microscopy with energy-dispersive X-ray spectroscopy). KW - SEM/EDX KW - Portuguese polychrome glazed pottery KW - Manufacturing KW - Morphology KW - Composition PY - 2013 DO - https://doi.org/10.1017/S1431927613009148 SN - 1431-9276 SN - 1435-8115 VL - 19 IS - Suppl. 2 SP - 1430 EP - 1431 PB - Cambridge University Press CY - New York, NY AN - OPUS4-29422 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Kühn, B. A1 - Schadrack, Reinhard T1 - Thermal expansion of synthetic fused silica as a function of OH content and fictive temperature JF - Journal of non-crystalline solids N2 - A matrix of synthetic fused silica samples with OH contents from 30 to 1300 ppm and of a fictive temperature from 1000 to 1300 °C has been characterized regarding their thermal expansion with high precision. The thermal expansion increases with fictive temperature and drops with OH content. Although fictive temperature and OH are coupled due to the influence of OH on the relaxation of the network, an independent influence of the OH content on thermal expansion has been observed. This may provide a deeper insight into the impact of impurities incorporated into the fused silica network. KW - Composition KW - Glasses KW - Silica KW - Thermal properties KW - Structural relaxation KW - Water in glass PY - 2009 DO - https://doi.org/10.1016/j.jnoncrysol.2008.11.005 SN - 0022-3093 VL - 355 IS - 4-5 SP - 323 EP - 326 PB - North-Holland Publ. Co. CY - Amsterdam AN - OPUS4-19049 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Winkelmann, Aimo A1 - Nolze, Gert T1 - Channeling-enhanced EDX for polarity resolved crystal orientation determination JF - Crystal Research and Technology N2 - Using channeling-enhanced energy-dispersive X-ray spectroscopy (EDX), we demonstrate polarity sensitive orientation determination of a non-centrosymmetric crystal in the scanning electron microscope. The authors observe a characteristic asymmetry in the channeling-enhanced, angle-dependent EDX data of a GaAs sample, which is in good agreement to simulations using the dynamical theory of diffraction for the incident electron beam. This allows us to assign the orientation of the GaAs crystal according to the non-centrosymmetric point group. The method shown here overcomes the limitation of a reduced point-group sensitivity of electron backscatter diffraction Patterns and electron channeling patterns for crystalline phases that contain atoms of approximately equal electron scattering cross sections. KW - Channeling KW - EDX KW - EDS KW - Composition KW - GaAs KW - GaP PY - 2016 DO - https://doi.org/10.1002/crat.201600258 SN - 0232-1300 SN - 0023-4753 VL - 51 IS - 12 SP - 752 EP - 756 AN - OPUS4-38098 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -