64766 2025 eng lecture 0 -- -- -- The elemental analysis of solid matter by means of the Energy-Dispersive X-Ray Spectrometry (EDS) is meanwhile posible as a quick (seconds!) and more and more accurate analysis via standardsless (instantaneous) quantification. The sensitivity & quantification accuracy for light elements (C, O,..) has significantly increased in the recent years. The availability via table-top SEMs with incorporated EDS is also enhanced. Further, the EDS analysis at an SEM is well-standardized, see ISO/TC 202 Microbeam Analysis & VAMAS/ TWA 37 Quantitative Microstructural Analysis in good liaisonships with ISO/TC 229 Nanotechnologies. It is demostrated that key parameters such as oxygen-to-carbon atomic-% ratio and impurities can be realibly measured, with XPS as a reference method. Various EDS spectrometers and analysis conditions are tested and the validity of the EDS quantification of an ionic liquid of well-defined chemical composition is demonstrated. Next steps are to launch a corresponding VAMAS interlaboratory comparison and to discuss within ISO/TC 229 towards inclusion of EDS as a routine method for the elemental analysis of GR2M into the ISO/TS 23359 Nanotechnologies — Chemical characterization of GR2Ms in powders and suspensions. Annual Microscopy Community Meeting for the National Research Council in Canada Online meeting 18.11.2025 1 publish false true Vasile-Dan Hodoroaba eng uncontrolled Graphene-related 2D materials (GR2M) eng uncontrolled Elemental analysis eng uncontrolled Light elements eng uncontrolled SEM/EDS eng uncontrolled Standardisation Ingenieurwissenschaften und zugeordnete Tätigkeiten 6 Materialchemie 6.1 Oberflächen- und Dünnschichtanalyse Material Datei im Netzwerk der BAM verfügbar ("Closed Access") Präsentation Advanced Materials