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    <title language="eng">Chamfer distance for non-linear registration of Triply Periodic Minimal Surface lattices</title>
    <abstract language="eng">We present a 3D image registration technique for non-linear deformation estimation in Additive Manufacturing processes. The methodology involves comparing X-ray Computed Tomography (XCT) data with Computer Aided Design (CAD) models for Triply Periodic Minimal Surface (TPMS) lattices and employs the Chamfer distance to refine mesh non-linear deformations.</abstract>
    <parentTitle language="eng">Additive Manufacturing Letters</parentTitle>
    <identifier type="issn">2772-3690</identifier>
    <identifier type="doi">10.1016/j.addlet.2025.100299</identifier>
    <identifier type="urn">urn:nbn:de:kobv:b43-637367</identifier>
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    <author>Michela Lapenna</author>
    <author>Francesco Faglioni</author>
    <author>Keerthana Chand</author>
    <author>Bardia Hejazi</author>
    <author>Rita Fioresi</author>
    <author>Giovanni Bruno</author>
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      <language>eng</language>
      <type>uncontrolled</type>
      <value>X-ray Computed tomography</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Defects</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Machine Learning</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Digital Twin</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Registration</value>
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    <collection role="ddc" number="620">Ingenieurwissenschaften und zugeordnete Tätigkeiten</collection>
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    <collection role="fulltextaccess" number="">Datei für die Öffentlichkeit verfügbar ("Open Access")</collection>
    <collection role="unnumberedseries" number="">Wissenschaftliche Artikel der BAM</collection>
    <collection role="themenfelder" number="">Additive Fertigung</collection>
    <thesisPublisher>Bundesanstalt für Materialforschung und -prüfung (BAM)</thesisPublisher>
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