<?xml version="1.0" encoding="utf-8"?>
<export-example>
  <doc>
    <id>42955</id>
    <completedYear/>
    <publishedYear>2017</publishedYear>
    <thesisYearAccepted/>
    <language>eng</language>
    <pageFirst>974</pageFirst>
    <pageLast>980</pageLast>
    <pageNumber/>
    <edition/>
    <issue>11-12</issue>
    <volume>59</volume>
    <type>article</type>
    <publisherName>Hanser Verlag</publisherName>
    <publisherPlace/>
    <creatingCorporation/>
    <contributingCorporation/>
    <belongsToBibliography>1</belongsToBibliography>
    <completedDate>--</completedDate>
    <publishedDate>--</publishedDate>
    <thesisDateAccepted>--</thesisDateAccepted>
    <title language="eng">Optimizing the visibility of X-ray phase grating interferometry</title>
    <abstract language="eng">The performance of grating interferometers coming up now for Imaging interfaces within materials depends on the efficiency (visibility) of their main component, namely the phase grating. Therefore, experiments with monochromatic synchrotron radiation and corresponding simulations are carried out. The visibility of a Phase grating is optimized by different photon energies, varying detector to grating distances and continuous rotation of the phase grating about the grid lines. Such kind of rotation changes the projected grating shapes, and thereby the distribution profiles of phase shifts. This yields higher visibilities than derived from ideal rectangular shapes. By continuous grating rotation and variation of the propagation distance, we achieve 2D visibility maps. Such maps provide the visibility for a certain combination of grating orientation and detector position. Optimum visibilities occur at considerably smaller distances than in the standard setup.</abstract>
    <parentTitle language="eng">Materials Testing</parentTitle>
    <identifier type="doi">10.3139/120.111097</identifier>
    <identifier type="issn">0025-5300</identifier>
    <enrichment key="date_peer_review">07.12.2017</enrichment>
    <author>Yury Shashev</author>
    <author>Andreas Kupsch</author>
    <author>Axel Lange</author>
    <author>Sergei Evsevleev</author>
    <author>Bernd R. Müller</author>
    <author>Markus Osenberg</author>
    <author>Ingo Manke</author>
    <author>Manfred P. Hentschel</author>
    <author>Giovanni Bruno</author>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Synchrotron, BAMline</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Talbot-Lau interferometer</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>X-ray imaging</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>X-ray refraction</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Grating interferometry</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>X-ray phase contrast</value>
    </subject>
    <collection role="ddc" number="543">Analytische Chemie</collection>
    <collection role="ddc" number="620">Ingenieurwissenschaften und zugeordnete Tätigkeiten</collection>
    <collection role="literaturgattung" number="">Verlagsliteratur</collection>
    <collection role="fulltextaccess" number="">Datei im Netzwerk der BAM verfügbar ("Closed Access")</collection>
  </doc>
</export-example>
