7541 2004 eng 282 294 bookpartcollection Wiley-VCH Weinheim 0 -- -- -- Testing the Lateral Resolution in the Nanometre Range with a New Type of Certified Reference Material Nanoscale calibration standards and methods 7997 3-527-40502-X 10.1002/3527606661.ch21 Sonderstandort: Publica-Schrank NanoScale 2004 Seminar ; 6th Seminar on Quantitative Microscopy ; 2nd Seminar on Nanoscale Calibration Standards and Methods Braunschweig, Germany 2004-03-25 2004-03-26 Mathias Senoner Thomas Wirth Wolfgang Unger Werner Österle I. Kaiander R. L. Sellin D. Bimberg eng uncontrolled Laterale Auflösung eng uncontrolled Nanometrologie eng uncontrolled Nanotechnologie eng uncontrolled Oberflächenanalytik eng uncontrolled Zertifiziertes Referenzmaterial Verlagsliteratur Physisches Exemplar in der Bibliothek der BAM vorhanden ("Hardcopy Access")