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  <doc>
    <id>63336</id>
    <completedYear/>
    <publishedYear>2025</publishedYear>
    <thesisYearAccepted/>
    <language>eng</language>
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    <pageLast/>
    <pageNumber/>
    <edition/>
    <issue/>
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    <type>poster</type>
    <publisherName/>
    <publisherPlace/>
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    <title language="eng">Reliable analysis of the elemental composition of graphene oxide flakes with energy dispersive spectroscopy (SEM/EDS) and x-ray photoelectron spectroscopy (XPS)</title>
    <abstract language="eng">Suspensions of graphene-related 2D materials (GR2M) are broadly used for further applications like printable electronics. The reliable quantification of the composition of graphene-related 2D materials as liquid suspensions is still a challenging task, which can hinder the commercialisation of the products. Specific parameters to be measured are defined, e.g. the oxygen-to-carbon (O/C) concentration ratio, the trace metal impurities, or the functional groups present [1], but reference protocols are still missing. One of the central methods for the quantification is X-ray photoelectron spectroscopy (XPS) as a rather expensive method. Therefore, the development of cheaper alternatives is highly desired. One attractive alternative of XPS is energy-dispersive spectroscopy (EDS) which is usually coupled with scanning electron microscopy (SEM). This combination is one of the most widely used methods in analytical laboratories. In this contribution the results of a systematic study on the capability of SEM/EDS to reliably quantify the O/C ratio in a well-defined and well-characterized graphene oxide material [2] are presented. The robustness of the SEM/EDS results obtained at various measurement conditions (various excitation energies) is tested by comparing the results to the established XPS analysis [3], which has been carried out on the same samples.&#13;
It is demonstrated that for samples prepared by drop-casting on a substrate, both surface-sensitive XPS analysis and bulk-characterising EDS result in very similar elemental composition of oxygen and carbon for thick spots. Further, the effect of untight deposited material enabling co-analysis of the (silicon) substrate, is evaluated for both methods, XPS and EDS. The last results clearly show the influence of the substrate on the analysis of the results and stressed out the importance of the sample preparation.</abstract>
    <enrichment key="eventName">E-MRS Spring Meeting</enrichment>
    <enrichment key="eventPlace">Strasbourg, France</enrichment>
    <enrichment key="eventStart">26.05.2025</enrichment>
    <enrichment key="opus.source">publish</enrichment>
    <enrichment key="opus.doi.autoCreate">false</enrichment>
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    <author>Jörg Radnik</author>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Graphene oxide</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Reliable Analysis</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Ionic Liquid</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Reference Material</value>
    </subject>
    <collection role="ddc" number="620">Ingenieurwissenschaften und zugeordnete Tätigkeiten</collection>
    <collection role="institutes" number="">6 Materialchemie</collection>
    <collection role="institutes" number="">6.1 Oberflächen- und Dünnschichtanalyse</collection>
    <collection role="themenfelder" number="">Material</collection>
    <collection role="fulltextaccess" number="">Datei im Netzwerk der BAM verfügbar ("Closed Access")</collection>
    <collection role="literaturgattung" number="">Präsentation</collection>
    <collection role="themenfelder" number="">Advanced Materials</collection>
  </doc>
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