<?xml version="1.0" encoding="utf-8"?>
<export-example>
  <doc>
    <id>24386</id>
    <completedYear/>
    <publishedYear>2011</publishedYear>
    <thesisYearAccepted/>
    <language>eng</language>
    <pageFirst>1986</pageFirst>
    <pageLast>1989</pageLast>
    <pageNumber/>
    <edition/>
    <issue/>
    <volume>26</volume>
    <type>article</type>
    <publisherName>Royal Society of Chemistry</publisherName>
    <publisherPlace>London</publisherPlace>
    <creatingCorporation/>
    <contributingCorporation/>
    <belongsToBibliography>1</belongsToBibliography>
    <completedDate>--</completedDate>
    <publishedDate>--</publishedDate>
    <thesisDateAccepted>--</thesisDateAccepted>
    <title language="eng">Pushing the limits for fast spatially resolved elemental distribution patterns</title>
    <abstract language="eng">A new setup for fast spatially resolved measurements of elemental trace amounts under total reflection conditions using a new colour X-ray camera is described. Samples prepared on conventional total reflection X-ray fluorescence (TXRF) reflectors were measured at BESSY II synchrotron. A spatial resolution of 50 × 50 µm² was obtained, while the required time for the investigation of a 10 × 10 mm² sample is 30 seconds. The set-up is up to 350 times faster than conventional X-ray fluorescence systems for elemental traces. The major components of the X-ray camera are polycapillary optics and a pn-CCD chip with an active area of 13 × 13 mm². This area is divided into 264 × 264 pixels of 48 × 48 µm². A full X-ray spectrum with a resolution of 152 eV @ 5.9 keV and a chip temperature of 246 K is recorded for each pixel. The chip has a read-out rate of 400 Hz.</abstract>
    <parentTitle language="eng">Journal of analytical atomic spectrometry</parentTitle>
    <identifier type="old">27050</identifier>
    <identifier type="doi">10.1039/c1ja10069f</identifier>
    <identifier type="issn">0267-9477</identifier>
    <identifier type="issn">1364-5544</identifier>
    <enrichment key="date_peer_review">28.09.2011</enrichment>
    <author>Andreas Kühn</author>
    <author>Oliver Scharf</author>
    <author>I. Ordavo</author>
    <author>Heinrich Riesemeier</author>
    <author>Uwe Reinholz</author>
    <author>Martin Radtke</author>
    <author>Achim Berger</author>
    <author>Markus Ostermann</author>
    <author>Ulrich Panne</author>
    <collection role="literaturgattung" number="">Verlagsliteratur</collection>
    <collection role="fulltextaccess" number="">Datei im Netzwerk der BAM verfügbar ("Closed Access")</collection>
  </doc>
</export-example>
