<?xml version="1.0" encoding="utf-8"?>
<export-example>
  <doc>
    <id>54961</id>
    <completedYear/>
    <publishedYear>2022</publishedYear>
    <thesisYearAccepted/>
    <language>eng</language>
    <pageFirst/>
    <pageLast/>
    <pageNumber/>
    <edition/>
    <issue/>
    <volume/>
    <type>lecture</type>
    <publisherName/>
    <publisherPlace/>
    <creatingCorporation/>
    <contributingCorporation/>
    <belongsToBibliography>0</belongsToBibliography>
    <completedDate>--</completedDate>
    <publishedDate>--</publishedDate>
    <thesisDateAccepted>--</thesisDateAccepted>
    <title language="eng">Reliable, and reproducible physico-chemical data of nanomaterials for risk assessment</title>
    <abstract language="eng">Nanoforms with at least one dimension below 100 nm have an important part to play in more and more areas of our daily life. Therefore, risk assessment of these materials is becoming increasingly important. In this context, the European Chemical Agency (ECHA) considered eleven physico-chemical properties as relevant, of which the following six are essential for the registration: chemical composition, crystallinity, particle size, particle shape, surface chemistry and specific surface area. Four of these priority properties can be obtained with electron microscopy and surface analytics like XPS and ToF-SIMS. The reliability of this data must be ensured, especially for their use for grouping and read across approaches. On the other hand, the “reproducibility” crisis has revealed major shortcomings in the reliability of published data.&#13;
In a case study, we show how the quality of the data can be ensured by using existing standards and protocols of each step in the workflow of sample characterization. As exemplary samples, two Al-coated TiO2 samples as nanopowders were selected from the JRC repository, capped either with a hydrophilic or a hydrophobic organic ultrathin shell. SEM results provided the size and shape of the nanoparticles, a first overview about the composition was obtained with EDS. XPS and ToF-SIMS supplied the surface chemistry, especially information about the shell and the coating of the particles. Standards and protocols of all steps of the analytical workflow including preparation and data reduction are discussed regarding reliable and reproducible data. Additionally, uncertainties for the different steps are specified.&#13;
Only such a detailed description of all these factors allows a comprehensive physico-chemical characterization of the nanoparticles with understanding of their potential risk assessment.</abstract>
    <enrichment key="eventName">ECASIA 2022</enrichment>
    <enrichment key="eventPlace">Limerick, Ireland</enrichment>
    <enrichment key="eventStart">29.05.2022</enrichment>
    <enrichment key="eventEnd">03.06.2022</enrichment>
    <enrichment key="opus.source">publish</enrichment>
    <enrichment key="opus.doi.autoCreate">false</enrichment>
    <enrichment key="opus.urn.autoCreate">true</enrichment>
    <enrichment key="InvitedTalks">0</enrichment>
    <author>Jörg Radnik</author>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Reference data</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Risk assessment</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Nanomaterials</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Titania</value>
    </subject>
    <collection role="ddc" number="543">Analytische Chemie</collection>
    <collection role="ddc" number="620">Ingenieurwissenschaften und zugeordnete Tätigkeiten</collection>
    <collection role="institutes" number="">6 Materialchemie</collection>
    <collection role="institutes" number="">6.1 Oberflächen- und Dünnschichtanalyse</collection>
    <collection role="themenfelder" number="">Material</collection>
    <collection role="themenfelder" number="">Chemie und Prozesstechnik</collection>
    <collection role="fulltextaccess" number="">Datei im Netzwerk der BAM verfügbar ("Closed Access")</collection>
    <collection role="literaturgattung" number="">Präsentation</collection>
    <collection role="themenfelder" number="">Advanced Materials</collection>
  </doc>
  <doc>
    <id>54375</id>
    <completedYear/>
    <publishedYear>2022</publishedYear>
    <thesisYearAccepted/>
    <language>eng</language>
    <pageFirst/>
    <pageLast/>
    <pageNumber/>
    <edition/>
    <issue/>
    <volume/>
    <type>lecture</type>
    <publisherName/>
    <publisherPlace/>
    <creatingCorporation/>
    <contributingCorporation/>
    <belongsToBibliography>0</belongsToBibliography>
    <completedDate>--</completedDate>
    <publishedDate>--</publishedDate>
    <thesisDateAccepted>--</thesisDateAccepted>
    <title language="eng">VAMAS ILC of functionalized Graphene by XPS and Graphene Oxide by SEM</title>
    <abstract language="eng">The ideas of the planned VAMAS interlaboratory comparisons of functionalized graphene and graphene oxide are presented.</abstract>
    <enrichment key="eventName">Stakeholder Advisory Board ISO-G-Scope</enrichment>
    <enrichment key="eventPlace">Online meeting</enrichment>
    <enrichment key="eventStart">12.01.2022</enrichment>
    <enrichment key="opus.source">publish</enrichment>
    <enrichment key="InvitedTalks">1</enrichment>
    <author>Jörg Radnik</author>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Graphene</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>XPS</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>SEM</value>
    </subject>
    <collection role="ddc" number="543">Analytische Chemie</collection>
    <collection role="ddc" number="620">Ingenieurwissenschaften und zugeordnete Tätigkeiten</collection>
    <collection role="institutes" number="">6 Materialchemie</collection>
    <collection role="institutes" number="">6.1 Oberflächen- und Dünnschichtanalyse</collection>
    <collection role="themenfelder" number="">Material</collection>
    <collection role="themenfelder" number="">Chemie und Prozesstechnik</collection>
    <collection role="fulltextaccess" number="">Datei im Netzwerk der BAM verfügbar ("Closed Access")</collection>
    <collection role="literaturgattung" number="">Präsentation</collection>
    <collection role="themenfelder" number="">Advanced Materials</collection>
  </doc>
  <doc>
    <id>59497</id>
    <completedYear/>
    <publishedYear>2023</publishedYear>
    <thesisYearAccepted/>
    <language>eng</language>
    <pageFirst/>
    <pageLast/>
    <pageNumber/>
    <edition/>
    <issue/>
    <volume/>
    <type>lecture</type>
    <publisherName/>
    <publisherPlace/>
    <creatingCorporation/>
    <contributingCorporation/>
    <belongsToBibliography>0</belongsToBibliography>
    <completedDate>--</completedDate>
    <publishedDate>--</publishedDate>
    <thesisDateAccepted>--</thesisDateAccepted>
    <title language="eng">Graphene Flagship - Achievements and the way forward</title>
    <abstract language="eng">The activities of the Graphene in the field of standardization will be summarized. The future activities of the Graphene Flagship CSA which was established recently will be presented with the focus on future challenges in standardization and regulation of graphene and other 2D materials.</abstract>
    <identifier type="url">https://macrame-project.eu/macrame-meetings-workshops/ws_hamonisation_standardisation_2023/</identifier>
    <enrichment key="eventName">Harmonisation &amp; Standardisation of Test Methods for Nano- and Advanced Materials</enrichment>
    <enrichment key="eventPlace">Online meeting</enrichment>
    <enrichment key="eventStart">22.11.2023</enrichment>
    <enrichment key="eventEnd">23.11.2023</enrichment>
    <enrichment key="opus.source">publish</enrichment>
    <enrichment key="InvitedTalks">1</enrichment>
    <author>Jörg Radnik</author>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>2D materials</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Regulation</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Standardization</value>
    </subject>
    <collection role="ddc" number="620">Ingenieurwissenschaften und zugeordnete Tätigkeiten</collection>
    <collection role="institutes" number="">6 Materialchemie</collection>
    <collection role="institutes" number="">6.1 Oberflächen- und Dünnschichtanalyse</collection>
    <collection role="themenfelder" number="">Material</collection>
    <collection role="fulltextaccess" number="">Datei im Netzwerk der BAM verfügbar ("Closed Access")</collection>
    <collection role="literaturgattung" number="">Präsentation</collection>
    <collection role="themenfelder" number="">Advanced Materials</collection>
  </doc>
  <doc>
    <id>60537</id>
    <completedYear/>
    <publishedYear>2024</publishedYear>
    <thesisYearAccepted/>
    <language>eng</language>
    <pageFirst/>
    <pageLast/>
    <pageNumber/>
    <edition/>
    <issue/>
    <volume/>
    <type>lecture</type>
    <publisherName/>
    <publisherPlace/>
    <creatingCorporation/>
    <contributingCorporation/>
    <belongsToBibliography>0</belongsToBibliography>
    <completedDate>--</completedDate>
    <publishedDate>--</publishedDate>
    <thesisDateAccepted>--</thesisDateAccepted>
    <title language="eng">Standardisation needs for regulatory testing of graphene and related 2D materials. phy-chem properties</title>
    <abstract language="eng">The main properties and main methods which are needed for the physico-chemical characterisation of graphene related 2D materials are discussed. As expample for standardization, protocols for the measurement of the chemical composition with XPS are discussed. The results of an interlaboratory comparisons led to new recommendations for the reliable measurments protocols.</abstract>
    <enrichment key="eventName">Materials Week 2024</enrichment>
    <enrichment key="eventPlace">Limassol, Cyprus</enrichment>
    <enrichment key="eventStart">17.06.2024</enrichment>
    <enrichment key="eventEnd">21.06.2024</enrichment>
    <enrichment key="InvitedTalks">1</enrichment>
    <enrichment key="opus.source">publish</enrichment>
    <enrichment key="opus.doi.autoCreate">false</enrichment>
    <enrichment key="opus.urn.autoCreate">true</enrichment>
    <author>Jörg Radnik</author>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Standardisation</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Functionalized graphene</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Interlaboratory comparison</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Endpoints</value>
    </subject>
    <collection role="ddc" number="620">Ingenieurwissenschaften und zugeordnete Tätigkeiten</collection>
    <collection role="institutes" number="">6 Materialchemie</collection>
    <collection role="institutes" number="">6.1 Oberflächen- und Dünnschichtanalyse</collection>
    <collection role="themenfelder" number="">Material</collection>
    <collection role="fulltextaccess" number="">Datei im Netzwerk der BAM verfügbar ("Closed Access")</collection>
    <collection role="literaturgattung" number="">Präsentation</collection>
    <collection role="themenfelder" number="">Advanced Materials</collection>
  </doc>
  <doc>
    <id>63529</id>
    <completedYear/>
    <publishedYear>2025</publishedYear>
    <thesisYearAccepted/>
    <language>eng</language>
    <pageFirst>1</pageFirst>
    <pageLast>64</pageLast>
    <pageNumber/>
    <edition/>
    <issue/>
    <volume>83</volume>
    <type>report</type>
    <publisherName>Umweltbundesamt</publisherName>
    <publisherPlace>Dessau-Roßlau</publisherPlace>
    <creatingCorporation/>
    <contributingCorporation/>
    <belongsToBibliography>0</belongsToBibliography>
    <completedDate>--</completedDate>
    <publishedDate>--</publishedDate>
    <thesisDateAccepted>--</thesisDateAccepted>
    <title language="eng">Advanced materials for the energy transition</title>
    <abstract language="eng">The climate crisis is the burning issue of our time. In order to avert the impending consequences, global efforts are being made in a wide variety of social and scientific fields. This report looks at a small part of these efforts, a technical aspect, namely the question of which AdMa are currently considered in techniques to support the energy transition. AdMa, i.e. materials that are rationally designed to have new or enhanced properties, and/or targeted or enhanced structural features, are used in all sectors of the energy transition. Questions of energy generation, storage and saving are considered here. This report is based on literature research and contains a general compilation of various AdMa that are used in the energy transition or are being researched for this purpose. From this compilation, ten materials that are considered particularly relevant for various reasons were selected and examined in more detail in relation to their use. The specific question here lies in the conflicting objective that the development of technologies for the energy transition is welcomed, but the use of AdMa may entail possible challenges in view of chemical safety as well as sustainability and circular economy.</abstract>
    <identifier type="issn">1862-4804</identifier>
    <identifier type="doi">10.60810/openumwelt-7853</identifier>
    <enrichment key="opus.source">publish</enrichment>
    <enrichment key="opus.doi.autoCreate">false</enrichment>
    <enrichment key="opus.urn.autoCreate">true</enrichment>
    <author>Xenia Knigge</author>
    <author>Jörg Radnik</author>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Energy generation</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Energy saving</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Eneergy storage</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Energy transportation</value>
    </subject>
    <collection role="ddc" number="620">Ingenieurwissenschaften und zugeordnete Tätigkeiten</collection>
    <collection role="ddc" number="621">Angewandte Physik</collection>
    <collection role="institutes" number="">6 Materialchemie</collection>
    <collection role="institutes" number="">6.1 Oberflächen- und Dünnschichtanalyse</collection>
    <collection role="themenfelder" number="">Energie</collection>
    <collection role="themenfelder" number="">Elektrische Energiespeicher und -umwandlung</collection>
    <collection role="themenfelder" number="">Material</collection>
    <collection role="fulltextaccess" number="">Datei im Netzwerk der BAM verfügbar ("Closed Access")</collection>
    <collection role="literaturgattung" number="">Graue Literatur</collection>
    <collection role="themenfelder" number="">Advanced Materials</collection>
  </doc>
  <doc>
    <id>63334</id>
    <completedYear/>
    <publishedYear>2025</publishedYear>
    <thesisYearAccepted/>
    <language>eng</language>
    <pageFirst/>
    <pageLast/>
    <pageNumber/>
    <edition/>
    <issue/>
    <volume/>
    <type>lecture</type>
    <publisherName/>
    <publisherPlace/>
    <creatingCorporation/>
    <contributingCorporation/>
    <belongsToBibliography>0</belongsToBibliography>
    <completedDate>--</completedDate>
    <publishedDate>--</publishedDate>
    <thesisDateAccepted>--</thesisDateAccepted>
    <title language="eng">Investigation of Fe-Ni-O nanoparticles for water splitting</title>
    <abstract language="eng">This study investigates the effect of varying iron-to-nickel ratios on the catalytic performance of Fe-Ni oxide nanoparticles (NPs) for the oxygen evolution reaction (OER). Addressing the issue of high energy wastage due to large overpotentials in OER, we synthesized and characterized different NP catalysts with different Fe: Ni oxide ratios. Transmission Electron Microscopy (TEM), Energy Dispersive X-ray Spectroscopy (EDS), and X-ray Diffraction (XRD) were employed to determine the morphology, elemental and phase composition of the NPs. Furthermore, in-depth profiling with X-rayPhotoelectron Spectroscopy (XPS) and Hard X-ray Photoelectron Spectroscopy (HAXPES) revealedthat iron predominantly exists as oxide, while nickel exhibits both metallic and oxidic forms depending on the Fe content. XPS indicated an enrichment of iron at the NP surface, whereas HAXPES and EDSdata agreed on the bulk stoichiometry.</abstract>
    <enrichment key="eventName">PhI European User Meeting 2025</enrichment>
    <enrichment key="eventPlace">Eibelstadt, Germany</enrichment>
    <enrichment key="eventStart">29.04.2025</enrichment>
    <enrichment key="eventEnd">30.04.2025</enrichment>
    <enrichment key="InvitedTalks">0</enrichment>
    <enrichment key="opus.source">publish</enrichment>
    <enrichment key="opus.doi.autoCreate">false</enrichment>
    <enrichment key="opus.urn.autoCreate">true</enrichment>
    <author>Jörg Radnik</author>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Oxygen evolution reaction</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>In depth analysis</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>(Hard) X-ray  Photoelectron Spectroscopy</value>
    </subject>
    <collection role="ddc" number="621">Angewandte Physik</collection>
    <collection role="institutes" number="">6 Materialchemie</collection>
    <collection role="institutes" number="">6.1 Oberflächen- und Dünnschichtanalyse</collection>
    <collection role="themenfelder" number="">Energie</collection>
    <collection role="themenfelder" number="">Material</collection>
    <collection role="fulltextaccess" number="">Datei im Netzwerk der BAM verfügbar ("Closed Access")</collection>
    <collection role="literaturgattung" number="">Präsentation</collection>
    <collection role="themenfelder" number="">Advanced Materials</collection>
    <collection role="themenfelder" number="">Wasserstoff</collection>
  </doc>
  <doc>
    <id>61920</id>
    <completedYear/>
    <publishedYear>2024</publishedYear>
    <thesisYearAccepted/>
    <language>eng</language>
    <pageFirst/>
    <pageLast/>
    <pageNumber/>
    <edition/>
    <issue/>
    <volume/>
    <type>lecture</type>
    <publisherName/>
    <publisherPlace/>
    <creatingCorporation/>
    <contributingCorporation/>
    <belongsToBibliography>0</belongsToBibliography>
    <completedDate>--</completedDate>
    <publishedDate>--</publishedDate>
    <thesisDateAccepted>--</thesisDateAccepted>
    <title language="eng">Methodological Challenges and Gaps:  Physico-Chemical Characterisation</title>
    <abstract language="eng">The methodological challenges and gaps in the physico-chemical characterisation of graphene related 2D Materials (GR2M) are discussed. Solutions for filling the gaps are presented.</abstract>
    <enrichment key="eventName">OECD Graphene Expert Workshop</enrichment>
    <enrichment key="eventPlace">Paris, France</enrichment>
    <enrichment key="eventStart">26.11.2024</enrichment>
    <enrichment key="eventEnd">27.11.2024</enrichment>
    <enrichment key="InvitedTalks">1</enrichment>
    <enrichment key="opus.source">publish</enrichment>
    <enrichment key="opus.doi.autoCreate">false</enrichment>
    <enrichment key="opus.urn.autoCreate">true</enrichment>
    <author>Jörg Radnik</author>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Graphene related 2D materials</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Structure activity relationsships</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Classification</value>
    </subject>
    <collection role="ddc" number="621">Angewandte Physik</collection>
    <collection role="institutes" number="">6 Materialchemie</collection>
    <collection role="institutes" number="">6.1 Oberflächen- und Dünnschichtanalyse</collection>
    <collection role="themenfelder" number="">Material</collection>
    <collection role="fulltextaccess" number="">Datei im Netzwerk der BAM verfügbar ("Closed Access")</collection>
    <collection role="literaturgattung" number="">Präsentation</collection>
    <collection role="themenfelder" number="">Advanced Materials</collection>
  </doc>
  <doc>
    <id>59589</id>
    <completedYear/>
    <publishedYear>2024</publishedYear>
    <thesisYearAccepted/>
    <language>eng</language>
    <pageFirst/>
    <pageLast/>
    <pageNumber/>
    <edition/>
    <issue/>
    <volume/>
    <type>lecture</type>
    <publisherName/>
    <publisherPlace/>
    <creatingCorporation/>
    <contributingCorporation/>
    <belongsToBibliography>0</belongsToBibliography>
    <completedDate>--</completedDate>
    <publishedDate>--</publishedDate>
    <thesisDateAccepted>--</thesisDateAccepted>
    <title language="eng">(hard) x ray photoelectron spectroscopy as tool in nano-analytics</title>
    <abstract language="eng">Selected samples are used to show, that photoelectron spectroscopy is an important tool for measuring nano-objects, especially for determing the chemical composition and structure on the nanosacle. XPS with different energies offers new possibilities in depth-profiling.</abstract>
    <enrichment key="eventName">SFB 1073 Colloquium</enrichment>
    <enrichment key="eventPlace">Göttingen, Germany</enrichment>
    <enrichment key="eventStart">22.02.2024</enrichment>
    <enrichment key="opus.source">publish</enrichment>
    <enrichment key="InvitedTalks">1</enrichment>
    <author>Jörg Radnik</author>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>X-ray photoelectron spectroscopy</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Core-shell nanoparticle</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Graphene related 2D materials</value>
    </subject>
    <collection role="ddc" number="620">Ingenieurwissenschaften und zugeordnete Tätigkeiten</collection>
    <collection role="institutes" number="">6 Materialchemie</collection>
    <collection role="institutes" number="">6.1 Oberflächen- und Dünnschichtanalyse</collection>
    <collection role="themenfelder" number="">Material</collection>
    <collection role="fulltextaccess" number="">Datei im Netzwerk der BAM verfügbar ("Closed Access")</collection>
    <collection role="literaturgattung" number="">Präsentation</collection>
    <collection role="themenfelder" number="">Advanced Materials</collection>
  </doc>
  <doc>
    <id>63661</id>
    <completedYear/>
    <publishedYear>2025</publishedYear>
    <thesisYearAccepted/>
    <language>eng</language>
    <pageFirst/>
    <pageLast/>
    <pageNumber/>
    <edition/>
    <issue/>
    <volume/>
    <type>poster</type>
    <publisherName/>
    <publisherPlace/>
    <creatingCorporation/>
    <contributingCorporation/>
    <belongsToBibliography>0</belongsToBibliography>
    <completedDate>--</completedDate>
    <publishedDate>--</publishedDate>
    <thesisDateAccepted>--</thesisDateAccepted>
    <title language="eng">Raman Spectroscopy and X-ray Photoelectron Spectroscopy of Commercial Functionalized Graphene</title>
    <abstract language="eng">Graphene has found widespread commercial use, particularly in flexible electronics and coatings for substrates such as paper and textiles, in the form of suspensions and inks (Zhang et al., 2017). Functionalization of graphene allows fine-tuning of properties like electrical conductivity. Structural and chemical features of graphene materials are typically analyzed by Raman spectroscopy and X-ray photoelectron spectroscopy (XPS). While Raman spectroscopy plays a critical role in identifying the presence of graphene and characterizing its structural defects (Pollard et al., 2017), XPS examines the chemistry of graphene. This study investigates three types of graphene materials — graphene (unfunctionalized, G-graphene), fluorine-functionalized graphene (F-graphene), and nitrogen-functionalized graphene (N-graphene) — across three physical forms: powders, suspensions, and embedded in inks. Functionalization was performed via plasma treatment of G-graphene with fluorine or ammonia gases. Suspensions were obtained by dispersing powders in distilled water, while inks were formulated using diacetone alcohol, carbon black, and graphene. Raman spectroscopy analysis confirmed the graphitic nature of all materials and revealed differences in defect density across different forms. The characteristic D, G, and D’ bands varied in relative intensity, offering insight into structural integrity and functionalization effects. XPS measurements examined core-level spectra (C 1s, F 1s, N 1s), revealing chemical bonding environments and hybridization states, including the sp² and sp³ states. A notable decline in fluorine content in F-graphene suspensions and inks, relative to powders, was observed. Existence of organic fluorine and total absence of metallic fluorine were observed. Raman spectroscopy and XPS data provided a correlated view of structural and chemical evolution through the graphene production chain.</abstract>
    <identifier type="url">https://macrame-project.eu/macrame-meetings-workshops/jointrras/#Agenda</identifier>
    <enrichment key="eventName">Joint Regulatory Risk Assessors Summit – Advancing Safety &amp; Sustainability Assessments of Advanced Materials</enrichment>
    <enrichment key="eventPlace">Paris, France</enrichment>
    <enrichment key="eventStart">19.06.2025</enrichment>
    <enrichment key="eventEnd">20.06.2025</enrichment>
    <enrichment key="opus.source">publish</enrichment>
    <enrichment key="opus.doi.autoCreate">false</enrichment>
    <enrichment key="opus.urn.autoCreate">true</enrichment>
    <author>Loay Akmal Madbouly</author>
    <author>Vasile-Dan Hodoroaba</author>
    <author>Jörg Radnik</author>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Graphene-related 2D materials (GR2M)</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Inks</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Raman Spectroscopy</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>XPS</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Functionalized graphene</value>
    </subject>
    <collection role="ddc" number="620">Ingenieurwissenschaften und zugeordnete Tätigkeiten</collection>
    <collection role="institutes" number="">6 Materialchemie</collection>
    <collection role="institutes" number="">6.1 Oberflächen- und Dünnschichtanalyse</collection>
    <collection role="themenfelder" number="">Material</collection>
    <collection role="fulltextaccess" number="">Datei im Netzwerk der BAM verfügbar ("Closed Access")</collection>
    <collection role="literaturgattung" number="">Präsentation</collection>
    <collection role="themenfelder" number="">Advanced Materials</collection>
  </doc>
  <doc>
    <id>65451</id>
    <completedYear/>
    <publishedYear>2026</publishedYear>
    <thesisYearAccepted/>
    <language>eng</language>
    <pageFirst/>
    <pageLast/>
    <pageNumber/>
    <edition/>
    <issue/>
    <volume/>
    <type>lecture</type>
    <publisherName/>
    <publisherPlace/>
    <creatingCorporation/>
    <contributingCorporation/>
    <belongsToBibliography>0</belongsToBibliography>
    <completedDate>--</completedDate>
    <publishedDate>--</publishedDate>
    <thesisDateAccepted>--</thesisDateAccepted>
    <title language="eng">The role of Critical Raw Materials in Advanced Materials for the Energy Transition</title>
    <abstract language="eng">Based on the UBA report “Advanced materials for energy transition” by Xenia Knigge and Jörg Radnik the role of critical raw materials is discussed. Critical raw materials are needed in main fields of the energy transition, like photovoltaic, fuel cells, wind energy, and batteries. For the optimisation of the use of these materials different scenarios are discussed like (i) decreasing the needed amount of raw materials, (ii) searching for alternatives, (iii) using technologies which do not require critical raw materials, (iv) increasing the recycling rates, and (v) expanding the raw material sources.</abstract>
    <enrichment key="eventName">IRISS policy dialogue</enrichment>
    <enrichment key="eventPlace">Online meeting</enrichment>
    <enrichment key="eventStart">12.01.2026</enrichment>
    <enrichment key="InvitedTalks">1</enrichment>
    <enrichment key="opus.source">publish</enrichment>
    <enrichment key="opus.doi.autoCreate">false</enrichment>
    <enrichment key="opus.urn.autoCreate">true</enrichment>
    <author>Jörg Radnik</author>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Solar Cells</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Fuel cells</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Batteries</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Multi-use materials</value>
    </subject>
    <collection role="ddc" number="620">Ingenieurwissenschaften und zugeordnete Tätigkeiten</collection>
    <collection role="ddc" number="621">Angewandte Physik</collection>
    <collection role="institutes" number="">6 Materialchemie</collection>
    <collection role="institutes" number="">6.1 Oberflächen- und Dünnschichtanalyse</collection>
    <collection role="themenfelder" number="">Energie</collection>
    <collection role="themenfelder" number="">Elektrische Energiespeicher und -umwandlung</collection>
    <collection role="themenfelder" number="">Material</collection>
    <collection role="fulltextaccess" number="">Datei im Netzwerk der BAM verfügbar ("Closed Access")</collection>
    <collection role="literaturgattung" number="">Präsentation</collection>
    <collection role="themenfelder" number="">Advanced Materials</collection>
  </doc>
  <doc>
    <id>65476</id>
    <completedYear/>
    <publishedYear>2026</publishedYear>
    <thesisYearAccepted/>
    <language>eng</language>
    <pageFirst>1</pageFirst>
    <pageLast>10</pageLast>
    <pageNumber/>
    <edition/>
    <issue/>
    <volume/>
    <type>article</type>
    <publisherName>Wiley VHC-Verlag</publisherName>
    <publisherPlace/>
    <creatingCorporation/>
    <contributingCorporation/>
    <belongsToBibliography>1</belongsToBibliography>
    <completedDate>--</completedDate>
    <publishedDate>--</publishedDate>
    <thesisDateAccepted>--</thesisDateAccepted>
    <title language="eng">Correlative Chemical Imaging to Reveal the Nature of Different Commercial Graphene Materials</title>
    <abstract language="eng">Proper physicochemical characterization of advanced materials and complex industrial composites remains a significant challenge, particularly for nanomaterials, whose nanoscale dimensions and mostly complex chemistry challenge the analysis. In this work, we employed a correlative analytical approach that integrates atomic force microscopy (AFM), scanning electron microscopy (SEM) coupled with energy‐dispersive X‐ray spectroscopy (EDS), time‐of‐flight secondary ion mass spectrometry (ToF‐SIMS), Auger electron spectroscopy (AES), and Raman spectroscopy. This combination enables detailed chemical and structural characterization with sub‐micrometer spatial resolution. Three commercial graphene‐based materials of varying complexity were selected and investigated to test the analytical performance of this approach. Furthermore, one of the commercial graphene oxide samples was chemically functionalized via amination and fluorination. This allowed us to assess how surface modifications influence both the material properties and the limits of the applied analytical techniques.</abstract>
    <parentTitle language="eng">Small Methods</parentTitle>
    <identifier type="issn">2366-9608</identifier>
    <identifier type="doi">10.1002/smtd.202502344</identifier>
    <identifier type="urn">urn:nbn:de:kobv:b43-654765</identifier>
    <enrichment key="opus_doi_flag">true</enrichment>
    <enrichment key="local_crossrefDocumentType">journal-article</enrichment>
    <enrichment key="local_crossrefLicence">http://creativecommons.org/licenses/by/4.0/</enrichment>
    <enrichment key="local_import_origin">crossref</enrichment>
    <enrichment key="local_doiImportPopulated">PersonAuthorFirstName_1,PersonAuthorLastName_1,PersonAuthorFirstName_2,PersonAuthorLastName_2,PersonAuthorFirstName_3,PersonAuthorLastName_3,PersonAuthorFirstName_4,PersonAuthorLastName_4,PersonAuthorFirstName_5,PersonAuthorLastName_5,PersonAuthorFirstName_6,PersonAuthorLastName_6,PersonAuthorFirstName_7,PersonAuthorLastName_7,PersonAuthorFirstName_8,PersonAuthorLastName_8,PersonAuthorFirstName_9,PersonAuthorLastName_9,PersonAuthorIdentifierOrcid_9,PersonAuthorFirstName_10,PersonAuthorLastName_10,PersonAuthorIdentifierOrcid_10,PublisherName,TitleMain_1,Language,TitleAbstract_1,TitleParent_1,ArticleNumber,PublishedYear,IdentifierIssn,Enrichmentlocal_crossrefLicence</enrichment>
    <enrichment key="opus.source">doi-import</enrichment>
    <enrichment key="date_peer_review">09.02.2026</enrichment>
    <enrichment key="opus.doi.autoCreate">false</enrichment>
    <enrichment key="opus.urn.autoCreate">true</enrichment>
    <licence>Creative Commons - CC BY - Namensnennung 4.0 International</licence>
    <author>Robert Schusterbauer</author>
    <author>Paul Mrkwitschka</author>
    <author>Mario Sahre</author>
    <author>Elena Corrao</author>
    <author>Amaia Zurutuza</author>
    <author>Alexander Doolin</author>
    <author>Francesco Pellegrino</author>
    <author>Jörg Radnik</author>
    <author>Ievgen S. Donskyi</author>
    <author>Vasile-Dan Hodoroaba</author>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Analytical methods</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Commercial products</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Correlative analysis</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Graphene</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Surface imaging</value>
    </subject>
    <collection role="institutes" number="">6 Materialchemie</collection>
    <collection role="institutes" number="">6.1 Oberflächen- und Dünnschichtanalyse</collection>
    <collection role="themenfelder" number="">Material</collection>
    <collection role="literaturgattung" number="">Verlagsliteratur</collection>
    <collection role="fulltextaccess" number="">Datei für die Öffentlichkeit verfügbar ("Open Access")</collection>
    <collection role="unnumberedseries" number="">Wissenschaftliche Artikel der BAM</collection>
    <collection role="themenfelder" number="">Advanced Materials</collection>
    <thesisPublisher>Bundesanstalt für Materialforschung und -prüfung (BAM)</thesisPublisher>
    <file>https://opus4.kobv.de/opus4-bam/files/65476/SchusterbauerEtAl_Small Methods_2026_CorrChemImagingCommercialG.pdf</file>
    <file>https://opus4.kobv.de/opus4-bam/files/65476/smtd70529_sup_0001_suppmat.pdf</file>
  </doc>
  <doc>
    <id>63335</id>
    <completedYear/>
    <publishedYear>2025</publishedYear>
    <thesisYearAccepted/>
    <language>eng</language>
    <pageFirst/>
    <pageLast/>
    <pageNumber/>
    <edition/>
    <issue/>
    <volume/>
    <type>researchdata</type>
    <publisherName>Zenodo</publisherName>
    <publisherPlace>Geneva</publisherPlace>
    <creatingCorporation>Bundesanstalt für Materialforschung und -prüfung (BAM)</creatingCorporation>
    <contributingCorporation/>
    <belongsToBibliography>0</belongsToBibliography>
    <completedDate>--</completedDate>
    <publishedDate>--</publishedDate>
    <thesisDateAccepted>--</thesisDateAccepted>
    <title language="eng">CV, TEM, XRD and XPS/HAXPES datasets of FeNi-based nanoparticles for the oxygen evolution reaction</title>
    <abstract language="eng">The datasets from Cyclic Voltammetry, Transmision Electron Microscopy, X-ray Diffraction, and (Hard Energy) X-ray Photoelectron Spectroscopy are related to the publication &#13;
&#13;
 H. Habibimarkani, S.-L. Abram, A. Guilherme Buzanich, C. Prinz, M. Sahre, V.-D. Hodoroaba and J. Radnik &#13;
&#13;
"In-depth analysis of FeNi-based nanoparticles for the oxygen evolution reaction"&#13;
&#13;
Scientific Reports (2025), https://doi.org/10.1038/s41598-025-92720-3&#13;
&#13;
Details of the materials and the experimental procedures are described in this publications.</abstract>
    <identifier type="doi">10.5281/zenodo.14975964</identifier>
    <enrichment key="ScientificResourceTypeGeneral">Datensatz</enrichment>
    <enrichment key="opus.source">publish</enrichment>
    <enrichment key="opus.doi.autoCreate">false</enrichment>
    <enrichment key="opus.urn.autoCreate">true</enrichment>
    <licence>Creative Commons - CC BY - Namensnennung 4.0 International</licence>
    <author>Heydar Habibimarkani</author>
    <author>Carsten Prinz</author>
    <author>Mario Sahre</author>
    <author>Vasile-Dan Hodoroaba</author>
    <author>Jörg Radnik</author>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Oxygen evolution reaction</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Fe-Ni nanopartices</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Comprehensive analysis</value>
    </subject>
    <collection role="ddc" number="621">Angewandte Physik</collection>
    <collection role="institutes" number="">6 Materialchemie</collection>
    <collection role="institutes" number="">6.1 Oberflächen- und Dünnschichtanalyse</collection>
    <collection role="institutes" number="">6.3 Strukturanalytik</collection>
    <collection role="themenfelder" number="">Energie</collection>
    <collection role="themenfelder" number="">Material</collection>
    <collection role="fulltextaccess" number="">Datei für die Öffentlichkeit verfügbar ("Open Access")</collection>
    <collection role="literaturgattung" number="">Graue Literatur</collection>
    <collection role="themenfelder" number="">Advanced Materials</collection>
    <collection role="unnumberedseries" number="">Forschungsdatensätze der BAM</collection>
    <collection role="themenfelder" number="">Wasserstoff</collection>
  </doc>
  <doc>
    <id>62693</id>
    <completedYear/>
    <publishedYear>2025</publishedYear>
    <thesisYearAccepted/>
    <language>eng</language>
    <pageFirst>1</pageFirst>
    <pageLast>17</pageLast>
    <pageNumber/>
    <edition/>
    <issue>1</issue>
    <volume>15</volume>
    <type>article</type>
    <publisherName>Springer Nature</publisherName>
    <publisherPlace/>
    <creatingCorporation/>
    <contributingCorporation/>
    <belongsToBibliography>1</belongsToBibliography>
    <completedDate>--</completedDate>
    <publishedDate>--</publishedDate>
    <thesisDateAccepted>--</thesisDateAccepted>
    <title language="eng">In-depth analysis of FeNi-based nanoparticles for the oxygen evolution reaction</title>
    <abstract language="eng">This study investigates the effect of varying iron-to-nickel ratios on the catalytic performance of Fe-Ni oxide nanoparticles (NPs) for the oxygen evolution reaction (OER). Addressing the issue of high energy wastage due to large overpotentials in OER, we synthesized and characterized different NP catalysts with different Fe: Ni oxide ratios. Transmission Electron Microscopy (TEM), Energy Dispersive X-ray Spectroscopy (EDS), and X-ray Diffraction (XRD) were employed to determine the morphology, elemental and phase composition of the NPs. Furthermore, in-depth profiling with X-ray Photoelectron Spectroscopy (XPS) and Hard X-ray Photoelectron Spectroscopy (HAXPES) revealed that iron predominantly exists as oxide, while nickel exhibits both metallic and oxidic forms depending on the Fe content. XPS indicated an enrichment of iron at the NP surface, whereas HAXPES and EDS data agreed on the bulk stoichiometry. The assessment of the catalytic activity via cyclic voltammetry (CV) showed that the Fe: Ni ratio of 2:3 exhibited superior performance, characterized by lower overpotential and a smaller Tafel slope.</abstract>
    <parentTitle language="eng">Scientific Reports</parentTitle>
    <identifier type="url">https://www.nature.com/articles/s41598-025-92720-3</identifier>
    <identifier type="doi">10.1038/s41598-025-92720-3</identifier>
    <identifier type="urn">urn:nbn:de:kobv:b43-626932</identifier>
    <enrichment key="opus.source">publish</enrichment>
    <enrichment key="date_peer_review">24.03.2025</enrichment>
    <licence>Creative Commons - CC BY - Namensnennung 4.0 International</licence>
    <author>Heydar Habibimarkani</author>
    <author>Sarah-Luise Abram</author>
    <author>Ana de Oliveira Guilherme Buzanich</author>
    <author>Carsten Prinz</author>
    <author>Mario Sahre</author>
    <author>Vasile-Dan Hodoroaba</author>
    <author>Jörg Radnik</author>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Fe-Ni oxide</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Nanoparticles</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>OER</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Catalytic performance</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Cyclic voltammetry</value>
    </subject>
    <collection role="ddc" number="620">Ingenieurwissenschaften und zugeordnete Tätigkeiten</collection>
    <collection role="ddc" number="621">Angewandte Physik</collection>
    <collection role="institutes" number="">1 Analytische Chemie; Referenzmaterialien</collection>
    <collection role="institutes" number="">1.2 Biophotonik</collection>
    <collection role="institutes" number="">6 Materialchemie</collection>
    <collection role="institutes" number="">6.1 Oberflächen- und Dünnschichtanalyse</collection>
    <collection role="institutes" number="">6.3 Strukturanalytik</collection>
    <collection role="themenfelder" number="">Energie</collection>
    <collection role="themenfelder" number="">Elektrische Energiespeicher und -umwandlung</collection>
    <collection role="themenfelder" number="">Material</collection>
    <collection role="literaturgattung" number="">Verlagsliteratur</collection>
    <collection role="fulltextaccess" number="">Datei für die Öffentlichkeit verfügbar ("Open Access")</collection>
    <collection role="unnumberedseries" number="">Wissenschaftliche Artikel der BAM</collection>
    <collection role="themenfelder" number="">Advanced Materials</collection>
    <thesisPublisher>Bundesanstalt für Materialforschung und -prüfung (BAM)</thesisPublisher>
    <file>https://opus4.kobv.de/opus4-bam/files/62693/s41598-025-92720-3.pdf</file>
  </doc>
  <doc>
    <id>65254</id>
    <completedYear/>
    <publishedYear>2025</publishedYear>
    <thesisYearAccepted/>
    <language>eng</language>
    <pageFirst>22033</pageFirst>
    <pageLast>22040</pageLast>
    <pageNumber/>
    <edition/>
    <issue>50</issue>
    <volume>129</volume>
    <type>article</type>
    <publisherName>American Chemical Society (ACS)</publisherName>
    <publisherPlace/>
    <creatingCorporation/>
    <contributingCorporation/>
    <belongsToBibliography>1</belongsToBibliography>
    <completedDate>--</completedDate>
    <publishedDate>--</publishedDate>
    <thesisDateAccepted>--</thesisDateAccepted>
    <title language="eng">Chemical Analysis of Commercial Functionalized Graphene Nanoplatelets along the Production Process with Raman Spectroscopy and X-ray Photoelectron Spectroscopy</title>
    <abstract language="eng">Commercial applications increasingly rely on functionalized graphene nanoplatelets (GNPs) supplied as powders, aqueous suspensions, and printable inks, yet their process−structure−property relationships across the production chain remain to be fully mapped. Here we apply a correlative Raman spectroscopy (Raman) and X-ray photoelectron spectroscopy (XPS) workflow to nine independent industrial graphene batches spanning three surface chemistries, raw (R), fluorinated (F), and nitrogen-functionalized (N), in all three physical forms which are powders, suspensions, and inks.&#13;
Raman mapping (with a 532 nm excitation laser) showed that I2D/IG is highest for N samples and lowest for R-ink. A 2D-vs-G correlation places all samples on a trajectory parallel to the pure-doping vector, which can correlate to holes in the graphene lattice. The mean point-defect spacing is LD = 8.4−10.0 nm. High-resolution XPS resolves the accompanying chemical changes: F-powder exhibits distinct C−F (289 eV), C−F2 (292 eV), and C−F3 (293 eV) components and loses roughly half its F content upon dispersion in deionized water or ink formulation; inks of all chemistries show a pronounced O−C=O peak near 289−290 eV originated from the ink compounds. N-functionalized samples showed a prominent C−N (285.5 eV) only for the ink formulated N-functionalized sample. This study establishes a process-aware blueprint linking the functionalization route and formulation step to lattice disorder and surface chemistry, offering transferable quality-control metrics for graphene supply chains in industrial products/applications such as coatings, storage devices, and printed electronics.</abstract>
    <parentTitle language="eng">The Journal of Physical Chemistry C</parentTitle>
    <identifier type="issn">1932-7447</identifier>
    <identifier type="doi">10.1021/acs.jpcc.5c06820</identifier>
    <identifier type="urn">urn:nbn:de:kobv:b43-652548</identifier>
    <enrichment key="opus_doi_flag">true</enrichment>
    <enrichment key="local_crossrefDocumentType">journal-article</enrichment>
    <enrichment key="local_crossrefLicence">https://creativecommons.org/licenses/by/4.0/</enrichment>
    <enrichment key="local_import_origin">crossref</enrichment>
    <enrichment key="local_doiImportPopulated">PersonAuthorFirstName_1,PersonAuthorLastName_1,PersonAuthorFirstName_2,PersonAuthorLastName_2,PersonAuthorIdentifierOrcid_2,PersonAuthorFirstName_3,PersonAuthorLastName_3,PersonAuthorFirstName_4,PersonAuthorLastName_4,PersonAuthorIdentifierOrcid_4,PersonAuthorFirstName_5,PersonAuthorLastName_5,PersonAuthorIdentifierOrcid_5,PublisherName,TitleMain_1,Language,TitleParent_1,PageFirst,PageLast,Issue,Volume,PublishedYear,IdentifierIssn,Enrichmentlocal_crossrefLicence</enrichment>
    <enrichment key="opus.source">doi-import</enrichment>
    <enrichment key="date_peer_review">22.12.2025</enrichment>
    <enrichment key="opus.doi.autoCreate">false</enrichment>
    <enrichment key="opus.urn.autoCreate">true</enrichment>
    <licence>Creative Commons - CC BY - Namensnennung 4.0 International</licence>
    <author>Loay Akmal Madbouly</author>
    <author>Heinz Sturm</author>
    <author>Alexander Doolin</author>
    <author>Vasile-Dan Hodoroaba</author>
    <author>Jörg Radnik</author>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Functionalized graphene</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Raman Spectroscopy</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>XPS</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Chemical analysis</value>
    </subject>
    <collection role="ddc" number="620">Ingenieurwissenschaften und zugeordnete Tätigkeiten</collection>
    <collection role="institutes" number="">6 Materialchemie</collection>
    <collection role="institutes" number="">6.1 Oberflächen- und Dünnschichtanalyse</collection>
    <collection role="themenfelder" number="">Material</collection>
    <collection role="literaturgattung" number="">Verlagsliteratur</collection>
    <collection role="fulltextaccess" number="">Datei für die Öffentlichkeit verfügbar ("Open Access")</collection>
    <collection role="unnumberedseries" number="">Wissenschaftliche Artikel der BAM</collection>
    <collection role="themenfelder" number="">Advanced Materials</collection>
    <thesisPublisher>Bundesanstalt für Materialforschung und -prüfung (BAM)</thesisPublisher>
    <file>https://opus4.kobv.de/opus4-bam/files/65254/MadboulyEtAl_2025_JPC C_RamanXPSonfG.pdf</file>
  </doc>
  <doc>
    <id>58878</id>
    <completedYear/>
    <publishedYear>2023</publishedYear>
    <thesisYearAccepted/>
    <language>eng</language>
    <pageFirst/>
    <pageLast/>
    <pageNumber/>
    <edition/>
    <issue/>
    <volume/>
    <type>lecture</type>
    <publisherName/>
    <publisherPlace/>
    <creatingCorporation/>
    <contributingCorporation/>
    <belongsToBibliography>0</belongsToBibliography>
    <completedDate>--</completedDate>
    <publishedDate>--</publishedDate>
    <thesisDateAccepted>--</thesisDateAccepted>
    <title language="eng">Maskless Micropatterning of Polydopamine for versatile surface functionalization</title>
    <abstract language="eng">Inspired by the chemistry of mussel adhesive proteins, polydopamine (PDA has been shown as one of the most versatile platforms for altering the properties and incorporating new functionalities to nearby any material surface despite its nature. Rich chemistry of PDA enables broad variety of surface modification and diverse secondary reactions that makes it extremely interesting for a wide range of application including biomedical field, e.g., drug delivery, adhesives, cell adhesion, biosensing. Despite high potential of polydopamine, the lack of deposition control and precision in existed methods limits their applications in microdevices and miniaturized functional systems like, for example, MEMS, microfluidic and sensorics.&#13;
Herein, we demonstrate a novel maskless approach for surface micropatterning with polydopamine based on Multiphoton Lithography that overcomes present limitations. Neither strong oxidants, metal ions nor adjustment of pH to alkaline is required by this technique. The spatial resolution down to 0.8 µm has been achieved which is at least an order of magnitude smaller than shown by other existed methods. We are able to control the morphology and thickness of the micropattern by altering fabrication parameters allowing structure gradient.&#13;
Apart from the glass substrate, we achieved PDA patterning at surfaces of different nature such as polychlorotrifluoroethylene, polydimethylsiloxane, polyethylene terephthalate, silicon wafers, and fluorinated glass coverslips. Post-modification of polydopamine micropatterns with protein enzyme like trypsin is demonstrated to highlight its sensing potential. &#13;
Presented in this work microfabrication technique empowers advanced applications of mussel-inspired materials in single-molecule bioassays, sensors and other complex microdevices.</abstract>
    <enrichment key="eventName">International Conference on Precision Engineering and Sustainable Manufacturing</enrichment>
    <enrichment key="eventPlace">Okinawa, Japan</enrichment>
    <enrichment key="eventStart">18.07.2023</enrichment>
    <enrichment key="opus.source">publish</enrichment>
    <enrichment key="opus.doi.autoCreate">false</enrichment>
    <enrichment key="opus.urn.autoCreate">true</enrichment>
    <enrichment key="InvitedTalks">0</enrichment>
    <author>Ievgeniia Topolniak</author>
    <author>Xenia Knigge</author>
    <author>Jörg Radnik</author>
    <author>Heinz Sturm</author>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Multiphoton lithography</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Polydopamine</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Micropatterning</value>
    </subject>
    <collection role="ddc" number="620">Ingenieurwissenschaften und zugeordnete Tätigkeiten</collection>
    <collection role="institutes" number="">6 Materialchemie</collection>
    <collection role="institutes" number="">6.1 Oberflächen- und Dünnschichtanalyse</collection>
    <collection role="institutes" number="">6.6 Digitale Materialchemie</collection>
    <collection role="themenfelder" number="">Material</collection>
    <collection role="fulltextaccess" number="">Datei im Netzwerk der BAM verfügbar ("Closed Access")</collection>
    <collection role="literaturgattung" number="">Präsentation</collection>
    <collection role="themenfelder" number="">Advanced Materials</collection>
    <collection role="themenfelder" number="">Materialdesign</collection>
    <collection role="themenfelder" number="">Additive Fertigung</collection>
  </doc>
  <doc>
    <id>60534</id>
    <completedYear/>
    <publishedYear>2024</publishedYear>
    <thesisYearAccepted/>
    <language>eng</language>
    <pageFirst/>
    <pageLast/>
    <pageNumber/>
    <edition/>
    <issue/>
    <volume/>
    <type>poster</type>
    <publisherName/>
    <publisherPlace/>
    <creatingCorporation/>
    <contributingCorporation/>
    <belongsToBibliography>0</belongsToBibliography>
    <completedDate>--</completedDate>
    <publishedDate>--</publishedDate>
    <thesisDateAccepted>--</thesisDateAccepted>
    <title language="eng">Comparative chemical analysis of Ni-Fe oxide nanoparticles</title>
    <abstract language="eng">Ni-Fe oxide nanoparticles have gained a lot of interest because of their high activity in the oxygen evolution reaction (OER) which is crucial for water splitting. [1] Although there have been great efforts in the last years, the understanding of the synergistic effect between Fe and Ni is still under discussion. &#13;
Therefore, we prepared different Ni-Fe oxide nanoparticles with different compositions from pure iron oxide to pure nickel oxide adapting a known procedure. [2,3] Size and morphology of the nanoparticles depend on the composition which was shown with Transmission Electron Microscopy (TEM). The compositions of the nanoparticles were measured with a comparative approach using X-ray Photoelectron Spectroscopy (XPS), Hard X-ray Photoelectron Spectroscopy (HAXPES), and Energy Dispersive X-Ray Spectroscopy (EDS) coupled with the TEM providing detailed chemical information of the nanoparticles in different sample regions. EDS reveals that the different sample regions are dominated by one of the components, Fe or Ni, but a slight mixing between the components can be found (see Figure 1), which was confirmed with X-ray Diffraction (XRD). XPS indicates the enrichment of Fe at the sample surface, while HAXPES and EDS data agree on the stoichiometry of the bulk. High-resolution XPS and HAXPES exhibit some differences in the valence states of Fe and Ni, whereas Ni seems to be easier to reduce than Fe. Further investigations combining these different techniques and additionally Secondary Ion Mass Spectrometry (ToF-SIMS) are ongoing by using in situ approaches and coupling cyclic voltammetry to the analytical techniques.</abstract>
    <enrichment key="eventName">ECASIA 2024</enrichment>
    <enrichment key="eventPlace">Gothenburg, Sweden</enrichment>
    <enrichment key="eventStart">09.06.2024</enrichment>
    <enrichment key="eventEnd">14.06.2024</enrichment>
    <enrichment key="opus.source">publish</enrichment>
    <enrichment key="opus.doi.autoCreate">false</enrichment>
    <enrichment key="opus.urn.autoCreate">true</enrichment>
    <author>Jörg Radnik</author>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Oxygen evolution reaction</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Transmission Electron Microscopy</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>(Hard) X-ray  Photoelectron Spectroscopy</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Synergistic effects</value>
    </subject>
    <collection role="ddc" number="621">Angewandte Physik</collection>
    <collection role="institutes" number="">1 Analytische Chemie; Referenzmaterialien</collection>
    <collection role="institutes" number="">1.2 Biophotonik</collection>
    <collection role="institutes" number="">6 Materialchemie</collection>
    <collection role="institutes" number="">6.1 Oberflächen- und Dünnschichtanalyse</collection>
    <collection role="institutes" number="">6.3 Strukturanalytik</collection>
    <collection role="themenfelder" number="">Energie</collection>
    <collection role="themenfelder" number="">Elektrische Energiespeicher und -umwandlung</collection>
    <collection role="themenfelder" number="">Material</collection>
    <collection role="fulltextaccess" number="">Datei im Netzwerk der BAM verfügbar ("Closed Access")</collection>
    <collection role="literaturgattung" number="">Präsentation</collection>
    <collection role="themenfelder" number="">Advanced Materials</collection>
  </doc>
  <doc>
    <id>57886</id>
    <completedYear/>
    <publishedYear>2023</publishedYear>
    <thesisYearAccepted/>
    <language>eng</language>
    <pageFirst>1</pageFirst>
    <pageLast>8</pageLast>
    <pageNumber/>
    <edition/>
    <issue/>
    <volume/>
    <type>article</type>
    <publisherName>Wiley VCH</publisherName>
    <publisherPlace/>
    <creatingCorporation/>
    <contributingCorporation/>
    <belongsToBibliography>1</belongsToBibliography>
    <completedDate>--</completedDate>
    <publishedDate>--</publishedDate>
    <thesisDateAccepted>--</thesisDateAccepted>
    <title language="eng">Influence of the Morphology on the Functionalization of Graphene Nanoplatelets Analyzed by Comparative Photoelectron Spectroscopy with Soft and Hard X-Rays</title>
    <abstract language="eng">Since its isolation, graphene has received growing attention from academia and industry due to its unique properties. However, the “what is my material” barrier hinders further commercialization. X-ray photoelectron spectroscopy (XPS) is considered as a method of choice for the determination of the elemental and chemical composition. In this work the influence of the morphology of graphene particles on the XPS results is studied and investigated as a function of X-ray energy, using conventional XPS with Al K𝜶 radiation and hard X-ray photoemission spectroscopy (HAXPES) using Cr K𝜶 radiation. Thereby, the information depth is varied between 10 and 30 nm. For this purpose, two commercial powders containing graphene nanoplatelets with lateral dimensions of either ≈100 nm or in the micrometer range are compared. These larger ones exist as stack of graphene layers which is inspected with scanning electron microscopy. Both kinds of particles are then functionalized with either oxygen or fluorine. The size of the graphene particles is found to influence the degree of functionalization. Only the combination of XPS and HAXPES allows to detect the functionalization at the outermost surface of the particles or even of the stacks and to provide new insights into the functionalization process.</abstract>
    <parentTitle language="eng">Advance Materials Interfaces</parentTitle>
    <identifier type="doi">10.1002/admi.202300116</identifier>
    <identifier type="issn">2196-7350</identifier>
    <identifier type="urn">urn:nbn:de:kobv:b43-578860</identifier>
    <enrichment key="opus.source">publish</enrichment>
    <enrichment key="date_peer_review">10.07.2023</enrichment>
    <enrichment key="PaperofMonth">1</enrichment>
    <licence>Creative Commons - CC BY - Namensnennung 4.0 International</licence>
    <author>Giovanni Chemello</author>
    <author>Xenia Knigge</author>
    <author>Dmitri Ciornii</author>
    <author>B.P. Reed</author>
    <author>A.J. Pollard</author>
    <author>C.A. Clifford</author>
    <author>T. Howe</author>
    <author>N. Vyas</author>
    <author>Vasile-Dan Hodoroaba</author>
    <author>Jörg Radnik</author>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Functionalized graphene</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Hard-energy X-ray photoelectron spectroscopy</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>X-ray photoelectron spectroscopy</value>
    </subject>
    <collection role="ddc" number="543">Analytische Chemie</collection>
    <collection role="ddc" number="620">Ingenieurwissenschaften und zugeordnete Tätigkeiten</collection>
    <collection role="institutes" number="">6 Materialchemie</collection>
    <collection role="institutes" number="">6.1 Oberflächen- und Dünnschichtanalyse</collection>
    <collection role="themenfelder" number="">Material</collection>
    <collection role="themenfelder" number="">Chemie und Prozesstechnik</collection>
    <collection role="literaturgattung" number="">Verlagsliteratur</collection>
    <collection role="fulltextaccess" number="">Datei für die Öffentlichkeit verfügbar ("Open Access")</collection>
    <collection role="unnumberedseries" number="">Wissenschaftliche Artikel der BAM</collection>
    <collection role="themenfelder" number="">Advanced Materials</collection>
    <thesisPublisher>Bundesanstalt für Materialforschung und -prüfung (BAM)</thesisPublisher>
    <file>https://opus4.kobv.de/opus4-bam/files/57886/Adv Materials Inter - 2023 - Chemello.pdf</file>
  </doc>
  <doc>
    <id>65061</id>
    <completedYear/>
    <publishedYear>2025</publishedYear>
    <thesisYearAccepted/>
    <language>eng</language>
    <pageFirst>S281</pageFirst>
    <pageLast>S282</pageLast>
    <pageNumber/>
    <edition/>
    <issue/>
    <volume>411</volume>
    <type>article</type>
    <publisherName>Elsevier B.V.</publisherName>
    <publisherPlace/>
    <creatingCorporation/>
    <contributingCorporation/>
    <belongsToBibliography>0</belongsToBibliography>
    <completedDate>--</completedDate>
    <publishedDate>--</publishedDate>
    <thesisDateAccepted>--</thesisDateAccepted>
    <title language="eng">Knowledge Infrastructure supporting image-based characterisation of 2D graphene materials</title>
    <abstract language="eng">As part of the European Horizon ACCORDs project, advanced methods are being developed for the image-based characterisation of 2D nanomaterials. Given the complexity of this task, robust  nd wellorganised data management is critical to ensuring high-quality outcomes. To support this, we have established a knowledge infrastructure that serves as the central repository for protocols, images and experimental data which are stored in a standardised, harmonised manner and in accordance with the FAIR principles – Findable, Accessible, Interoperable and Reusable and open science. This machine-readable framework enables the systematic and computationally automated correlation of image features with experimental descriptors, facilitating accurate material characterisation and transparent reporting which is all integrated in the ACCORDs KI.</abstract>
    <parentTitle language="eng">Toxicology Letters</parentTitle>
    <identifier type="issn">0378-4274</identifier>
    <identifier type="doi">10.1016/j.toxlet.2025.07.660</identifier>
    <enrichment key="opus_doi_flag">true</enrichment>
    <enrichment key="local_crossrefDocumentType">journal-article</enrichment>
    <enrichment key="local_crossrefLicence">https://www.elsevier.com/tdm/userlicense/1.0/</enrichment>
    <enrichment key="local_import_origin">crossref</enrichment>
    <enrichment key="local_doiImportPopulated">PersonAuthorFirstName_1,PersonAuthorLastName_1,PersonAuthorFirstName_2,PersonAuthorLastName_2,PersonAuthorFirstName_3,PersonAuthorLastName_3,PersonAuthorFirstName_4,PersonAuthorLastName_4,PersonAuthorFirstName_5,PersonAuthorLastName_5,PersonAuthorFirstName_6,PersonAuthorLastName_6,PersonAuthorFirstName_7,PersonAuthorLastName_7,PersonAuthorFirstName_8,PersonAuthorLastName_8,PersonAuthorFirstName_9,PersonAuthorLastName_9,PersonAuthorFirstName_10,PersonAuthorLastName_10,PersonAuthorFirstName_11,PersonAuthorLastName_11,PersonAuthorFirstName_12,PersonAuthorLastName_12,PersonAuthorFirstName_13,PersonAuthorLastName_13,PersonAuthorFirstName_14,PersonAuthorLastName_14,PersonAuthorFirstName_15,PersonAuthorLastName_15,PersonAuthorFirstName_16,PersonAuthorLastName_16,PersonAuthorFirstName_17,PersonAuthorLastName_17,PersonAuthorFirstName_18,PersonAuthorLastName_18,PersonAuthorFirstName_19,PersonAuthorLastName_19,PersonAuthorFirstName_20,PersonAuthorLastName_20,PersonAuthorFirstName_21,PersonAuthorLastName_21,PersonAuthorFirstName_22,PersonAuthorLastName_22,PersonAuthorFirstName_23,PersonAuthorLastName_23,PersonAuthorFirstName_24,PersonAuthorLastName_24,PersonAuthorFirstName_25,PersonAuthorLastName_25,PersonAuthorFirstName_26,PersonAuthorLastName_26,PersonAuthorFirstName_27,PersonAuthorLastName_27,PersonAuthorFirstName_28,PersonAuthorLastName_28,PersonAuthorFirstName_29,PersonAuthorLastName_29,PersonAuthorFirstName_30,PersonAuthorLastName_30,PersonAuthorFirstName_31,PersonAuthorLastName_31,PersonAuthorFirstName_32,PersonAuthorLastName_32,PersonAuthorFirstName_33,PersonAuthorLastName_33,PersonAuthorFirstName_34,PersonAuthorLastName_34,PersonAuthorFirstName_35,PersonAuthorLastName_35,PersonAuthorFirstName_36,PersonAuthorLastName_36,PublisherName,TitleMain_1,Language,TitleParent_1,Volume,PublishedYear,IdentifierIssn,Enrichmentlocal_crossrefLicence</enrichment>
    <enrichment key="opus.source">doi-import</enrichment>
    <enrichment key="opus.doi.autoCreate">false</enrichment>
    <enrichment key="opus.urn.autoCreate">true</enrichment>
    <author>P. P. Ankli</author>
    <author>A. A. Abdelwahab</author>
    <author>A. Logachov</author>
    <author>R. Bugiel</author>
    <author>D. Drobne</author>
    <author>S. Novak</author>
    <author>E. Kranjc</author>
    <author>S. Saje</author>
    <author>F. Pellegrino</author>
    <author>E. Alladio</author>
    <author>F. Sordello</author>
    <author>E. Corrao</author>
    <author>Vasile-Dan Hodoroaba</author>
    <author>Jörg Radnik</author>
    <author>Paul Mrkwitschka</author>
    <author>Loay Akmaal Madbouly</author>
    <author>Yücel Akdemir</author>
    <author>M. Gulumian</author>
    <author>V. Wepener</author>
    <author>C. Andraos</author>
    <author>K. Boodhia</author>
    <author>E. Jones</author>
    <author>A. Doolin</author>
    <author>K. Leuchtenberg</author>
    <author>E. Valsami Jones</author>
    <author>C. Rocca</author>
    <author>B. Ibrahim</author>
    <author>D. Singh</author>
    <author>S. Chakraborty</author>
    <author>K. Jurkschat</author>
    <author>C. Johnston</author>
    <author>M. Van Der Zande</author>
    <author>D. Fernandez</author>
    <author>P. Queipo</author>
    <author>C. Clifford</author>
    <author>B. Hardy</author>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Graphene-related 2D materials (GR2M)</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>2D materials</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Knowledge infrastructure</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Characterisation</value>
    </subject>
    <collection role="ddc" number="620">Ingenieurwissenschaften und zugeordnete Tätigkeiten</collection>
    <collection role="institutes" number="">6 Materialchemie</collection>
    <collection role="institutes" number="">6.1 Oberflächen- und Dünnschichtanalyse</collection>
    <collection role="themenfelder" number="">Material</collection>
    <collection role="literaturgattung" number="">Verlagsliteratur</collection>
    <collection role="fulltextaccess" number="">Datei im Netzwerk der BAM verfügbar ("Closed Access")</collection>
    <collection role="themenfelder" number="">Advanced Materials</collection>
  </doc>
  <doc>
    <id>63812</id>
    <completedYear/>
    <publishedYear>2025</publishedYear>
    <thesisYearAccepted/>
    <language>eng</language>
    <pageFirst>1</pageFirst>
    <pageLast>8</pageLast>
    <pageNumber/>
    <edition/>
    <issue>4</issue>
    <volume>12</volume>
    <type>article</type>
    <publisherName>IOP Publishing</publisherName>
    <publisherPlace/>
    <creatingCorporation/>
    <contributingCorporation/>
    <belongsToBibliography>1</belongsToBibliography>
    <completedDate>--</completedDate>
    <publishedDate>--</publishedDate>
    <thesisDateAccepted>--</thesisDateAccepted>
    <title language="eng">Reliable physico–chemical characterisation of graphene-related and other 2D materials: present and future</title>
    <abstract language="eng">In the path of commercialisation of graphene-related and other 2D materials the consolidation has begun. In this phase, it is important to build trust between the individual partners in the product value chain. This requires trustworthy statements based on reliable and reproducible material characterisation. The first steps have been taken to measure graphene and other related 2D materials (GR2Ms) under well-defined conditions. Measurands and protocols for key methods were made available for this purpose. But there are still some challenges to overcome such as (i) reference materials, (ii) reference data, (iii) reproducibility throughout the workflow, (iv) credible structure-activity relationships, bringing the standards to (v) the factory floor and to (vi) real-word products. In addition, 2D materials beyond graphene should also be considered exploiting the knowledge gained from the characterisation of GR2M.</abstract>
    <parentTitle language="eng">2D Materials</parentTitle>
    <identifier type="issn">2053-1583</identifier>
    <identifier type="doi">10.1088/2053-1583/aded9d</identifier>
    <identifier type="urn">urn:nbn:de:kobv:b43-638122</identifier>
    <enrichment key="opus_doi_flag">true</enrichment>
    <enrichment key="opus_import_data">{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,7,25]],"date-time":"2025-07-25T00:05:53Z","timestamp":1753401953418,"version":"3.41.2"},"reference-count":46,"publisher":"IOP Publishing","issue":"4","license":[{"start":{"date-parts":[[2025,7,24]],"date-time":"2025-07-24T00:00:00Z","timestamp":1753315200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by\/4.0\/"},{"start":{"date-parts":[[2025,7,24]],"date-time":"2025-07-24T00:00:00Z","timestamp":1753315200000},"content-version":"tdm","delay-in-days":0,"URL":"https:\/\/iopscience.iop.org\/info\/page\/text-and-data-mining"}],"funder":[{"DOI":"10.13039\/100018693","name":"Horizon Europe","doi-asserted-by":"crossref","award":["101119461"],"id":[{"id":"10.13039\/100018693","id-type":"DOI","asserted-by":"crossref"}]}],"content-domain":{"domain":["iopscience.iop.org"],"crossmark-restriction":false},"short-container-title":["2D Mater."],"published-print":{"date-parts":[[2025,10,1]]},"abstract":"&lt;jats:title&gt;Abstract&lt;\/jats:title&gt;\n               &lt;jats:p&gt;In the path of commercialisation of graphene-related and other 2D materials the consolidation has begun. In this phase, it is important to build trust between the individual partners in the product value chain. This requires trustworthy statements based on reliable and reproducible material characterisation. The first steps have been taken to measure graphene and other related 2D materials (GR2Ms) under well-defined conditions. Measurands and protocols for key methods were made available for this purpose. But there are still some challenges to overcome such as (i) reference materials, (ii) reference data, (iii) reproducibility throughout the workflow, (iv) credible structure-activity relationships, bringing the standards to (v) the factory floor and to (vi) real-word products. In addition, 2D materials beyond graphene should also be considered exploiting the knowledge gained from the characterisation of GR2M.&lt;\/jats:p&gt;","DOI":"10.1088\/2053-1583\/aded9d","type":"journal-article","created":{"date-parts":[[2025,7,10]],"date-time":"2025-07-10T08:11:06Z","timestamp":1752135066000},"page":"043002","update-policy":"https:\/\/doi.org\/10.1088\/crossmark-policy","source":"Crossref","is-referenced-by-count":0,"title":["Reliable physico\u2013chemical characterisation of graphene-related and other 2D materials: present and future"],"prefix":"10.1088","volume":"12","author":[{"ORCID":"https:\/\/orcid.org\/0000-0003-0302-6815","authenticated-orcid":true,"given":"J\u00f6rg","family":"Radnik","sequence":"first","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0002-7901-6114","authenticated-orcid":true,"given":"Vasile-Dan","family":"Hodoroaba","sequence":"additional","affiliation":[]}],"member":"266","published-online":{"date-parts":[[2025,7,24]]},"reference":[{"key":"tdmaded9dbib1","doi-asserted-by":"publisher","first-page":"666","DOI":"10.1126\/science.1102896","article-title":"Electric field effect in atomically thin carbon films","volume":"306","author":"Novoselov","year":"2004","journal-title":"Science"},{"key":"tdmaded9dbib2","doi-asserted-by":"publisher","first-page":"192","DOI":"10.1038\/nature11458","article-title":"A roadmap for graphene","volume":"490","author":"Novoselov","year":"2012","journal-title":"Nature"},{"key":"tdmaded9dbib3","doi-asserted-by":"publisher","first-page":"904","DOI":"10.1038\/s41565-019-0556-1","article-title":"Graphene: the hype versus commercial reality","volume":"14","author":"Barkan","year":"2019","journal-title":"Nat. Nanotechnol."},{"key":"tdmaded9dbib4","doi-asserted-by":"publisher","DOI":"10.1088\/2053-1583\/ad1e78","article-title":"Graphene roadmap briefs (No. 3): meta market analysis 2023","volume":"11","author":"Schmaltz","year":"2024","journal-title":"2D Mater"},{"key":"tdmaded9dbib5","doi-asserted-by":"publisher","DOI":"10.1088\/2053-1583\/abddcd","article-title":"Graphene roadmap briefs (No. 2): industrilization status and prospects 2020","volume":"8","author":"D\u00f6scher","year":"2021","journal-title":"2D Mater"},{"key":"tdmaded9dbib6","doi-asserted-by":"publisher","first-page":"646","DOI":"10.1038\/s42254-024-00754-9","article-title":"Mapping the landscape for graphene commercialization","volume":"6","author":"Barkan","year":"2024","journal-title":"Nat. Rev. Phys."},{"key":"tdmaded9dbib7","doi-asserted-by":"publisher","first-page":"233","DOI":"10.1038\/s42254-021-00278-6","article-title":"The importance of international standards for the graphene community","volume":"3","author":"Clifford","year":"2021","journal-title":"Nat. Rev. Phys."},{"article-title":"ISO: Global standards for trusted goods and services","year":"2025","author":"International Organization for Standardization (ISO)","key":"tdmaded9dbib8"},{"year":"2025","author":"International Electrotechnical Commission","key":"tdmaded9dbib9"},{"key":"tdmaded9dbib10","first-page":"L396\/1-L396\/849","article-title":"Regulation (EC) No 1907\/2006 of the European parliament and of the council of 18 December 2006 concerning the registration, evaluation, authorisation and restriction of chemicals (REACH)","volume":"396","author":"European Commission","year":"2006","journal-title":"Off. J. Eur.Union"},{"author":"Organisation for Economic Co-operation and Development (OECD)","key":"tdmaded9dbib11"},{"key":"tdmaded9dbib12","doi-asserted-by":"publisher","DOI":"10.59161\/JCGM200-2012","author":"Joint Committee for Guides in Metrology","year":"2012","edition":"3rd edn"},{"author":"Versailles Project on Advanced Materials and Standards (VAMAS)","key":"tdmaded9dbib13"},{"key":"tdmaded9dbib14","doi-asserted-by":"publisher","first-page":"1455","DOI":"10.1007\/s11051-013-1455-2","article-title":"Reference materials and representative test materials: the nanotechnology case","volume":"15","author":"Roebben","year":"2013","journal-title":"J. Nanopart. Res."},{"key":"tdmaded9dbib15","doi-asserted-by":"publisher","first-page":"353","DOI":"10.1515\/pac-2018-1010","article-title":"Glossary of terms used in physical organic chemistry (IUPAC recommendations 2021)","volume":"94","author":"Perrin","year":"2022","journal-title":"Pure Appl. Chem."},{"article-title":"Nanotechnologies\u2014Vocabulary: Part 13. Graphene and Other Two-Dimensional (2D) Materials","year":"2024","author":"ISO TS 80004\u201313","key":"tdmaded9dbib16"},{"article-title":"Nanotechnologies\u2014Structural Characterization of Graphene Part 1: Graphene From Powders and Dispersions","year":"2021","author":"ISO TS 21356\u20131","key":"tdmaded9dbib17"},{"key":"tdmaded9dbib18","first-page":"L308\/1","article-title":"Authorisation and Restriction of Chemicals (REACH) as regards Annexes I, III, VI, VII, VIII, IX, X, XI, and XII to address nanoforms of substances","volume":"308","author":"European Commission","year":"2018","journal-title":"Off. J. Eur. Union"},{"article-title":"Graphene classification framework","year":"2021","author":"The Graphene Council","key":"tdmaded9dbib19"},{"article-title":"Nanotechnologies\u2014Classification Framework for Graphene-Related 2D Materials","year":"2022","author":"ISO\/TS 9651","key":"tdmaded9dbib20"},{"author":"ISO\/CD TS 21356\u20132","key":"tdmaded9dbib21","article-title":"Nanotechnologies\u2014Structural Characterization of Graphene Part 2: Graphene Sheets on a Substrate"},{"author":"ISO\/CD TS 23879","key":"tdmaded9dbib22","article-title":"Nanotechnologies-\u2014Structural Characterization of Graphene Oxide Flakes: Thickness and Lateral Size Measurement Using AFM and SEM"},{"author":"ISO\/DTS 23359","key":"tdmaded9dbib23","article-title":"Nanotechnologies\u2014Chemical Characterization of Graphene Related Two Dimensional Materials From Powders and Liquid Dispersion"},{"article-title":"VAMAS TWA 41 Project 14: measurement of spatial homogeneity in two-dimensional semiconductors","year":"2022","author":"Versailles Project on Advanced Materials and Standards","key":"tdmaded9dbib24"},{"article-title":"Reference Materials\u2014Approaches for Characterization and Assessment of Homogeneity and Stability","year":"2024","author":"ISO 33405","key":"tdmaded9dbib25"},{"key":"tdmaded9dbib26","doi-asserted-by":"publisher","first-page":"639","DOI":"10.3390\/nano11030639","article-title":"Reliable surface analysis data of nanomaterials in support of risk assessment based on minimum information requirements","volume":"11","author":"Radnik","year":"2020","journal-title":"Nanomaterials"},{"key":"tdmaded9dbib27","doi-asserted-by":"publisher","DOI":"10.1016\/j.carbon.2023.118054","article-title":"The influence of sample preparation on XPS quantification of oxygen functionalised graphene nanoplatelets","volume":"211","author":"Reed","year":"2023","journal-title":"Carbon"},{"article-title":"Surface Chemical Analysis\u2014Guidelines to Sample Handling, Preparation and Mounting Part 4: Reporting Information Related to the History, Preparation, Handling and Mounting of Nano-Objects Prior to Surface Analysis","year":"2018","author":"ISO 20579\u20134","key":"tdmaded9dbib28"},{"key":"tdmaded9dbib29","doi-asserted-by":"publisher","DOI":"10.3791\/61758","article-title":"Preparation of nanoparticles for ToF-SIMS and XPS analysis","volume":"163","author":"Bennet","year":"2020","journal-title":"J. Vis. Exp."},{"key":"tdmaded9dbib30","doi-asserted-by":"publisher","first-page":"985","DOI":"10.3390\/molecules27030985","article-title":"Automation and standardization\u2014a coupled approach towards reproducible sample preparation protocols for nanomaterial analysis","volume":"27","author":"Radnik","year":"2022","journal-title":"Molecules"},{"key":"tdmaded9dbib31","doi-asserted-by":"publisher","DOI":"10.1088\/1742-6596\/1953\/1\/012002","article-title":"Towards a method for quantitative evaluation of nanoparticle from suspension via microarray printing and SEM analysis","volume":"1953","author":"Bennet","year":"2021","journal-title":"J. Phys.: Conf. Ser."},{"key":"tdmaded9dbib32","doi-asserted-by":"publisher","first-page":"4942","DOI":"10.1038\/s41598-021-84287-6","article-title":"Workflow towards automated segmentation of agglomerated, non-spherical particles from electron microscopy images using artificial neural networks","volume":"11","author":"R\u00fchle","year":"2021","journal-title":"Sci. Rep."},{"key":"tdmaded9dbib33","doi-asserted-by":"publisher","DOI":"10.1088\/2632-959X\/adae28","article-title":"Approaches for the measurement of lateral dimensions of graphene oxide flakes using scanning electron microscopy","volume":"6","author":"Chemello","year":"2025","journal-title":"Nano Express"},{"key":"tdmaded9dbib34","doi-asserted-by":"publisher","DOI":"10.1038\/s41598-025-92266-4","article-title":"Assessing particle count in electron microscopy measurements of nanomaterials to support regulatory guidance","volume":"15","author":"Wouters","year":"2025","journal-title":"Sci. Rep."},{"key":"tdmaded9dbib35","doi-asserted-by":"publisher","first-page":"6038","DOI":"10.1021\/acsnano.3c09699","article-title":"Environmental and health impacts of graphene and other two-dimensional materials: a graphene flagship perspective","volume":"18","author":"Lin","year":"2024","journal-title":"ACS Nano"},{"key":"tdmaded9dbib36","doi-asserted-by":"publisher","first-page":"6259","DOI":"10.1126\/science.aad0768","article-title":"How safe are nanomaterials","volume":"350","author":"Valsami-Jones","year":"2015","journal-title":"Science"},{"key":"tdmaded9dbib37","doi-asserted-by":"publisher","DOI":"10.1016\/j.impact.2022.100436","article-title":"Structure-activity relationship of graphene-related materials. A meta-analysis based on mammalian in vitro toxicity data","volume":"28","author":"Romeo","year":"2022","journal-title":"NanoImpact"},{"key":"tdmaded9dbib38","doi-asserted-by":"publisher","DOI":"10.1002\/smll.202404570","article-title":"Safety assessment of graphene-based materials","volume":"21","author":"Fadeel","year":"2025","journal-title":"Small"},{"key":"tdmaded9dbib39","doi-asserted-by":"publisher","first-page":"1726","DOI":"10.1002\/ejic.201800093","article-title":"Design of graphene nanoplatelet\/graphitic carbon nitride heterojunctions by vacuum tube with enhanced photocatalytic and electrochemical response","volume":"2018","author":"Muhmood","year":"2018","journal-title":"Eur. J. Inorg. Chem."},{"key":"tdmaded9dbib40","doi-asserted-by":"publisher","first-page":"300","DOI":"10.1002\/sia.7386","article-title":"Comparative elemental analysis of commercial functionalized graphene nanoplatelets along the production chain with x-ray photoelectron and energy-dispersive x-ray spectroscopy","volume":"57","author":"Madbouly","year":"2025","journal-title":"Surf. Interface Anal."},{"key":"tdmaded9dbib41","doi-asserted-by":"publisher","DOI":"10.1016\/j.envint.2025.109345","article-title":"The safe and sustainable by design framework applied to graphene-based materials","volume":"197","author":"Pitaro","year":"2025","journal-title":"Environ. Int."},{"author":"International Electrotechnical Commission","key":"tdmaded9dbib42","article-title":"IEC TS 62607-6-36 ED1 nanomanufacturing\u2014key control characteristics\u2014part 6\u201336: graphene-related products\u2014reduction degree of reduced graphene oxide: UV-Vis absorption spectroscopy"},{"article-title":"Good practice guide No. 145 characterisation of the structure of graphene","year":"2017","author":"(National Physical Laboratory and University of Manchester)","key":"tdmaded9dbib43"},{"key":"tdmaded9dbib44","doi-asserted-by":"publisher","first-page":"2898","DOI":"10.1021\/nn400280c","article-title":"Progress, challenges, and opportunities in two-dimensional materials beyond graphene","volume":"7","author":"Butler","year":"2013","journal-title":"ACS Nano"},{"key":"tdmaded9dbib45","doi-asserted-by":"publisher","first-page":"10983","DOI":"10.1039\/c9cs00821g","article-title":"Emerging beyond-graphene elemental 2D materials for energy and catalysis applications","volume":"50","author":"Fan","year":"2021","journal-title":"Chem. Soc. Rev."},{"key":"tdmaded9dbib46","doi-asserted-by":"publisher","DOI":"10.1016\/j.nantod.2020.100941","article-title":"A framework for group and read-across of nanomaterials-supporting innovation and risk assessment","volume":"35","author":"Stone","year":"2020","journal-title":"Nano Today"}],"container-title":["2D Materials"],"original-title":[],"link":[{"URL":"https:\/\/iopscience.iop.org\/article\/10.1088\/2053-1583\/aded9d","content-type":"text\/html","content-version":"am","intended-application":"text-mining"},{"URL":"https:\/\/iopscience.iop.org\/article\/10.1088\/2053-1583\/aded9d\/pdf","content-type":"application\/pdf","content-version":"am","intended-application":"text-mining"},{"URL":"https:\/\/iopscience.iop.org\/article\/10.1088\/2053-1583\/aded9d","content-type":"text\/html","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/iopscience.iop.org\/article\/10.1088\/2053-1583\/aded9d\/pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/iopscience.iop.org\/article\/10.1088\/2053-1583\/aded9d\/pdf","content-type":"application\/pdf","content-version":"am","intended-application":"syndication"},{"URL":"https:\/\/iopscience.iop.org\/article\/10.1088\/2053-1583\/aded9d\/pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"syndication"},{"URL":"https:\/\/iopscience.iop.org\/article\/10.1088\/2053-1583\/aded9d\/pdf","content-type":"application\/pdf","content-version":"am","intended-application":"similarity-checking"},{"URL":"https:\/\/iopscience.iop.org\/article\/10.1088\/2053-1583\/aded9d\/pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,7,24]],"date-time":"2025-07-24T09:53:39Z","timestamp":1753350819000},"score":1,"resource":{"primary":{"URL":"https:\/\/iopscience.iop.org\/article\/10.1088\/2053-1583\/aded9d"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025,7,24]]},"references-count":46,"journal-issue":{"issue":"4","published-online":{"date-parts":[[2025,7,24]]},"published-print":{"date-parts":[[2025,10,1]]}},"URL":"https:\/\/doi.org\/10.1088\/2053-1583\/aded9d","relation":{},"ISSN":["2053-1583"],"issn-type":[{"type":"electronic","value":"2053-1583"}],"subject":[],"published":{"date-parts":[[2025,7,24]]},"assertion":[{"value":"Reliable physico\u2013chemical characterisation of graphene-related and other 2D materials: present and future","name":"article_title","label":"Article Title"},{"value":"2D Materials","name":"journal_title","label":"Journal Title"},{"value":"paper","name":"article_type","label":"Article Type"},{"value":"\u00a9 2025 The Author(s). Published by IOP Publishing Ltd","name":"copyright_information","label":"Copyright Information"},{"value":"2025-05-01","name":"date_received","label":"Date Received","group":{"name":"publication_dates","label":"Publication dates"}},{"value":"2025-07-09","name":"date_accepted","label":"Date Accepted","group":{"name":"publication_dates","label":"Publication dates"}},{"value":"2025-07-24","name":"date_epub","label":"Online publication date","group":{"name":"publication_dates","label":"Publication dates"}}]}}</enrichment>
    <enrichment key="local_crossrefDocumentType">journal-article</enrichment>
    <enrichment key="local_crossrefLicence">https://creativecommons.org/licenses/by/4.0/</enrichment>
    <enrichment key="local_import_origin">crossref</enrichment>
    <enrichment key="local_doiImportPopulated">PersonAuthorFirstName_1,PersonAuthorLastName_1,PersonAuthorIdentifierOrcid_1,PersonAuthorFirstName_2,PersonAuthorLastName_2,PersonAuthorIdentifierOrcid_2,PublisherName,TitleMain_1,TitleAbstract_1,TitleParent_1,ArticleNumber,Issue,Volume,PublishedYear,IdentifierIssn,Enrichmentlocal_crossrefLicence</enrichment>
    <enrichment key="opus.source">doi-import</enrichment>
    <enrichment key="date_peer_review">18.08.2025</enrichment>
    <licence>Creative Commons - CC BY - Namensnennung 4.0 International</licence>
    <author>Jörg Radnik</author>
    <author>Vasile-Dan Hodoroaba</author>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>2D Materials</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Commercialisation</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Standardisation</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Trust</value>
    </subject>
    <collection role="institutes" number="">6 Materialchemie</collection>
    <collection role="institutes" number="">6.1 Oberflächen- und Dünnschichtanalyse</collection>
    <collection role="themenfelder" number="">Material</collection>
    <collection role="literaturgattung" number="">Verlagsliteratur</collection>
    <collection role="fulltextaccess" number="">Datei für die Öffentlichkeit verfügbar ("Open Access")</collection>
    <collection role="unnumberedseries" number="">Wissenschaftliche Artikel der BAM</collection>
    <collection role="themenfelder" number="">Advanced Materials</collection>
    <thesisPublisher>Bundesanstalt für Materialforschung und -prüfung (BAM)</thesisPublisher>
    <file>https://opus4.kobv.de/opus4-bam/files/63812/Radnik_2025_2D_Mater._12_043002.pdf</file>
  </doc>
  <doc>
    <id>63048</id>
    <completedYear/>
    <publishedYear>2025</publishedYear>
    <thesisYearAccepted/>
    <language>eng</language>
    <pageFirst>1</pageFirst>
    <pageLast>15</pageLast>
    <pageNumber/>
    <edition/>
    <issue/>
    <volume>238</volume>
    <type>article</type>
    <publisherName>Elsevier Ltd.</publisherName>
    <publisherPlace/>
    <creatingCorporation/>
    <contributingCorporation/>
    <belongsToBibliography>0</belongsToBibliography>
    <completedDate>--</completedDate>
    <publishedDate>--</publishedDate>
    <thesisDateAccepted>--</thesisDateAccepted>
    <title language="eng">The Mitsunobu reaction for the gentle covalent attachment of biomolecules to graphene oxide</title>
    <abstract language="eng">Graphene oxide (GO) has emerged as a promising biomaterial as it is easily and cheaply synthesized, strong, cytocompatible, osteoinductive, and has a well-characterized aqueous degradation pathway. It is also a great substrate for functionalization with biomolecules such as proteins, peptides, and small molecules that can enhance or add bioactivity. Covalent chemical linkages as opposed to typical noncovalent association methods are preferable so that the biomolecules do not quickly diffuse away or face replacement by other proteins, which is critical in long time scale applications like bone regeneration. However, covalent chemistry tends to carry a drawback of harsh reaction conditions that can damage the structure, conformation, and therefore function of a delicate biomolecule like a protein. Here, the Mitsunobu reaction is introduced as a novel method of covalently attaching proteins to graphene oxide. It features gentle reaction conditions and has the added benefit of utilizing the plentiful basal plane alcohol functionalities on graphene oxide, allowing for high yield protein functionalization. The amino acid Glycine (G), the protein bovine serum albumin (BSA), and the small molecule SVAK-12 are utilized to create the three Mitsunobu Graphene (MG) materials G-MG, BSA-MG, and SVAK-MG that demonstrate the wide applicability of this functionalization method.</abstract>
    <parentTitle language="eng">Carbon</parentTitle>
    <identifier type="doi">10.1016/j.carbon.2025.120221</identifier>
    <identifier type="urn">urn:nbn:de:kobv:b43-630483</identifier>
    <enrichment key="opus_doi_flag">false</enrichment>
    <enrichment key="opus_import_data">&lt;div class="errorPage"&gt;    &lt;h2&gt;Anwendungsfehler&lt;/h2&gt;        &lt;div class="exceptionMessage"&gt;        Unable to Connect to ssl://api.crossref.org:443. Error #110: Connection timed out    &lt;/div&gt;        &lt;/div&gt;</enrichment>
    <enrichment key="opus.source">publish</enrichment>
    <enrichment key="opus.doi.autoCreate">false</enrichment>
    <enrichment key="opus.urn.autoCreate">true</enrichment>
    <licence>Creative Commons - CC BY - Namensnennung 4.0 International</licence>
    <author>M. E. Wolf</author>
    <author>W. M. Vickery</author>
    <author>W. Swift-Ramirez</author>
    <author>A. M. Arnold</author>
    <author>J. D. Orlando</author>
    <author>S. J. Schmidt</author>
    <author>Y. Liu</author>
    <author>Jasmin Er</author>
    <author>Robert Schusterbauer</author>
    <author>R. Ahmed</author>
    <author>Philip Nickl</author>
    <author>Jörg Radnik</author>
    <author>Ievgen Donskyi</author>
    <author>S. A. Sydlik</author>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Graphene oxide</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Mitsunobu reaction</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Covalent attachment</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Bovine serum albumin</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Macrophage polarization</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Osteogenesis</value>
    </subject>
    <collection role="ddc" number="620">Ingenieurwissenschaften und zugeordnete Tätigkeiten</collection>
    <collection role="institutes" number="">6 Materialchemie</collection>
    <collection role="institutes" number="">6.1 Oberflächen- und Dünnschichtanalyse</collection>
    <collection role="themenfelder" number="">Material</collection>
    <collection role="literaturgattung" number="">Verlagsliteratur</collection>
    <collection role="fulltextaccess" number="">Datei für die Öffentlichkeit verfügbar ("Open Access")</collection>
    <collection role="unnumberedseries" number="">Wissenschaftliche Artikel der BAM</collection>
    <collection role="themenfelder" number="">Advanced Materials</collection>
    <thesisPublisher>Bundesanstalt für Materialforschung und -prüfung (BAM)</thesisPublisher>
    <file>https://opus4.kobv.de/opus4-bam/files/63048/1-s2.0-S0008622325002374-main.pdf</file>
  </doc>
  <doc>
    <id>64729</id>
    <completedYear/>
    <publishedYear>2025</publishedYear>
    <thesisYearAccepted/>
    <language>eng</language>
    <pageFirst>1</pageFirst>
    <pageLast>7</pageLast>
    <pageNumber/>
    <edition/>
    <issue/>
    <volume/>
    <type>article</type>
    <publisherName>American Chemical Society (ACS)</publisherName>
    <publisherPlace/>
    <creatingCorporation/>
    <contributingCorporation/>
    <belongsToBibliography>1</belongsToBibliography>
    <completedDate>--</completedDate>
    <publishedDate>--</publishedDate>
    <thesisDateAccepted>--</thesisDateAccepted>
    <title language="eng">XPS–SEM/EDS Tandem Analysis for the Elemental Composition of Functionalized Graphene Nanoplatelets</title>
    <abstract language="eng">Over the past decade, energy-dispersive X-ray spectrometry (EDS) with scanning electron microscopy (SEM) has advanced to enable the accurate analysis of light elements such as C, N, or O. For this reason, EDS is becoming increasingly interesting as an analytical method for the elemental analysis of functionalized graphene and could be an attractive alternative to Xray photoelectron spectroscopy (XPS), which is considered the most important method for elemental analysis. In this study, comparative XPS and EDS investigations under different excitation conditions are carried out on commercially available powders containing graphene particles with different morphologies. The slightly different XPS/HAXPES and EDS results can be explained by the different information depths of the methods and the functionalization of the particle surfaces. For the material with smaller graphene particles and higher O/C ratios, all methods reported a lower O/C ratio in pellets compared with the unpressed powder samples. This clearly shows that sample preparation has a significant influence on the quantification results, especially for such a type of morphology. Overall, the study demonstrates that EDS is a reliable and fast alternative to XPS for the elemental quantification of functionalized graphene particles, provided that differences in the information depth are taken into account. Particle morphology can be examined in parallel with quantitative element analysis, since EDS spectrometers are typically coupled with SEM, which are available in a huge number of analytical laboratories.</abstract>
    <parentTitle language="eng">ACS Omega</parentTitle>
    <identifier type="issn">2470-1343</identifier>
    <identifier type="doi">10.1021/acsomega.5c07830</identifier>
    <identifier type="urn">urn:nbn:de:kobv:b43-647294</identifier>
    <enrichment key="opus_doi_flag">true</enrichment>
    <enrichment key="local_crossrefDocumentType">journal-article</enrichment>
    <enrichment key="local_crossrefLicence">https://creativecommons.org/licenses/by/4.0/</enrichment>
    <enrichment key="local_import_origin">crossref</enrichment>
    <enrichment key="local_doiImportPopulated">PersonAuthorFirstName_1,PersonAuthorLastName_1,PersonAuthorFirstName_2,PersonAuthorLastName_2,PersonAuthorIdentifierOrcid_2,PersonAuthorFirstName_3,PersonAuthorLastName_3,PersonAuthorIdentifierOrcid_3,PublisherName,TitleMain_1,Language,TitleParent_1,ArticleNumber,PublishedYear,IdentifierIssn,Enrichmentlocal_crossrefLicence</enrichment>
    <enrichment key="opus.source">doi-import</enrichment>
    <enrichment key="date_peer_review">17.11.2025</enrichment>
    <licence>Creative Commons - CC BY - Namensnennung 4.0 International</licence>
    <author>Giovanni Chemello</author>
    <author>Jörg Radnik</author>
    <author>Vasile-Dan Hodoroaba</author>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Graphene oxide</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>SEM/EDS</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>XPS/HAXPES</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Elemental composition</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Functionalization</value>
    </subject>
    <collection role="ddc" number="620">Ingenieurwissenschaften und zugeordnete Tätigkeiten</collection>
    <collection role="institutes" number="">6 Materialchemie</collection>
    <collection role="institutes" number="">6.1 Oberflächen- und Dünnschichtanalyse</collection>
    <collection role="themenfelder" number="">Material</collection>
    <collection role="literaturgattung" number="">Verlagsliteratur</collection>
    <collection role="fulltextaccess" number="">Datei für die Öffentlichkeit verfügbar ("Open Access")</collection>
    <collection role="unnumberedseries" number="">Wissenschaftliche Artikel der BAM</collection>
    <collection role="themenfelder" number="">Advanced Materials</collection>
    <thesisPublisher>Bundesanstalt für Materialforschung und -prüfung (BAM)</thesisPublisher>
    <file>https://opus4.kobv.de/opus4-bam/files/64729/ChemelloEtal_2025_ACSO_XPS-SEM-EDSTandem.pdf</file>
  </doc>
  <doc>
    <id>54977</id>
    <completedYear/>
    <publishedYear>2022</publishedYear>
    <thesisYearAccepted/>
    <language>eng</language>
    <pageFirst/>
    <pageLast/>
    <pageNumber/>
    <edition/>
    <issue/>
    <volume/>
    <type>poster</type>
    <publisherName/>
    <publisherPlace/>
    <creatingCorporation/>
    <contributingCorporation/>
    <belongsToBibliography>0</belongsToBibliography>
    <completedDate>--</completedDate>
    <publishedDate>--</publishedDate>
    <thesisDateAccepted>--</thesisDateAccepted>
    <title language="eng">Morpho-Chemical Characterisation of Me-TiO2 Nanoparticles for Enhanced Photocatalytical Activity</title>
    <abstract language="eng">The conversion of solar energy into electricity and solar fuels is of crucial importance for a green and sustainable future. Water splitting using semiconductor photo-catalysts is considered a sustainable method to produce clean hydrogen (H2) fuel. Nevertheless, H2 photo-production efficiency remains still low, although extensive research works to understand better the mechanisms of the Hydrogen Evolution Reaction (HER) and the Oxygen Evolution Reaction (OER) are being carried out. In this respect, TiO2 is a key photoactive material, usually employed with a co-catalyst deposited onto the surface to enhance charge carriers’ separation and catalyze surface charge transfer reactions. The deposition of a co-catalyst on the TiO2 nanoparticle surface represents one successful way to enhance the activity of the photocatalyst through a modification of its surface and redox properties. In this context, high-resolution scanning electron microscopy coupled with elemental analysis by energy-dispersive X-ray spectroscopy (EDS) is fundamental for studying and understanding the effect of the nanoparticle morphology on the functional properties of shape-controlled TiO2 crystals (bipyramides, platelets, and elongated particles). Different types of metal-semiconductor combinations, TiO2 shapes and dopant metals (Ag, Pt, etc) and metal concentrations will be discussed.</abstract>
    <enrichment key="eventName">ECASIA 2022</enrichment>
    <enrichment key="eventPlace">Limerick, Ireland</enrichment>
    <enrichment key="eventStart">29.05.2022</enrichment>
    <enrichment key="eventEnd">03.06.2022</enrichment>
    <enrichment key="opus.source">publish</enrichment>
    <author>Jörg Radnik</author>
    <author>Vasile-Dan Hodoroaba</author>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Titania nanoparticles</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Photocatalysis</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Scanning electron microscopy</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Energy dispersive X-ray spectroscopy</value>
    </subject>
    <collection role="ddc" number="543">Analytische Chemie</collection>
    <collection role="ddc" number="620">Ingenieurwissenschaften und zugeordnete Tätigkeiten</collection>
    <collection role="ddc" number="621">Angewandte Physik</collection>
    <collection role="institutes" number="">6 Materialchemie</collection>
    <collection role="institutes" number="">6.1 Oberflächen- und Dünnschichtanalyse</collection>
    <collection role="themenfelder" number="">Energie</collection>
    <collection role="themenfelder" number="">Material</collection>
    <collection role="themenfelder" number="">Chemie und Prozesstechnik</collection>
    <collection role="fulltextaccess" number="">Datei im Netzwerk der BAM verfügbar ("Closed Access")</collection>
    <collection role="literaturgattung" number="">Präsentation</collection>
    <collection role="themenfelder" number="">Advanced Materials</collection>
  </doc>
  <doc>
    <id>63792</id>
    <completedYear/>
    <publishedYear>2025</publishedYear>
    <thesisYearAccepted/>
    <language>eng</language>
    <pageFirst>531</pageFirst>
    <pageLast>532</pageLast>
    <pageNumber/>
    <edition/>
    <issue>7</issue>
    <volume>31</volume>
    <type>article</type>
    <publisherName>Oxford Aacademic</publisherName>
    <publisherPlace/>
    <creatingCorporation/>
    <contributingCorporation/>
    <belongsToBibliography>0</belongsToBibliography>
    <completedDate>--</completedDate>
    <publishedDate>--</publishedDate>
    <thesisDateAccepted>--</thesisDateAccepted>
    <title language="eng">Standardized Chemical Composition Analysis of Graphene Oxide Flakes with SEM/EDS and XPS Works Reliably</title>
    <abstract language="eng">Suspensions of graphene-related 2D materials (GR2M) are broadly used for further applications like printable electronics. The reliable quantification of the composition of graphene-related 2D materials as liquid suspensions is still a challenging task, which can hinder the commercialisation of the products. Specific parameters to be measured are defined, e.g. the oxygen-to-carbon (O/C) concentration ratio, the trace metal impurities, or the functional groups present, but reference protocols are still missing. One of the central methods for the quantification is X-ray photoelectron spectroscopy (XPS) as a rather expensive method. Therefore, the development of cheaper alternatives is highly desired. One attractive alternative of XPS is energy-dispersive spectroscopy (EDS) which is usually coupled with scanning electron microscopy (SEM). This combination is one of the most widely used methods in analytical laboratories. In this contribution the results of a systematic study on the capability of SEM/EDS to reliably quantify the O/C ratio in a well-defined and well-characterized graphene oxide material are presented. The robustness of the SEM/EDS results obtained at various measurement conditions (various excitation energies) is tested by comparing the results to the established XPS analysis, which has been carried out on the same samples.&#13;
It is demonstrated that for samples prepared by drop-casting on a substrate, both surface-sensitive XPS analysis and bulk-characterising EDS result in very similar elemental composition of oxygen and carbon for thick spots. Further, the effect of untight deposited material enabling co-analysis of the (silicon) substrate, is evaluated for both methods, XPS and EDS. The last results clearly show the influence of the substrate on the analysis of the results and stressed out the importance of the sample preparation.</abstract>
    <parentTitle language="eng">Microscopy and Microanalysis</parentTitle>
    <identifier type="doi">10.1093/mam/ozaf048.267</identifier>
    <enrichment key="opus.source">publish</enrichment>
    <enrichment key="opus.doi.autoCreate">false</enrichment>
    <enrichment key="opus.urn.autoCreate">true</enrichment>
    <author>Paul Mrkwitschka</author>
    <author>Mario Sahre</author>
    <author>Amaia Zurutuza</author>
    <author>Jörg Radnik</author>
    <author>Vasile-Dan Hodoroaba</author>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>EDS</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Light elements</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>XPS/HAXPES</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Graphene oxide</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Quantification</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Standardisation</value>
    </subject>
    <collection role="ddc" number="620">Ingenieurwissenschaften und zugeordnete Tätigkeiten</collection>
    <collection role="institutes" number="">6 Materialchemie</collection>
    <collection role="institutes" number="">6.1 Oberflächen- und Dünnschichtanalyse</collection>
    <collection role="themenfelder" number="">Material</collection>
    <collection role="literaturgattung" number="">Verlagsliteratur</collection>
    <collection role="fulltextaccess" number="">Datei im Netzwerk der BAM verfügbar ("Closed Access")</collection>
    <collection role="themenfelder" number="">Advanced Materials</collection>
  </doc>
  <doc>
    <id>57764</id>
    <completedYear/>
    <publishedYear>2023</publishedYear>
    <thesisYearAccepted/>
    <language>eng</language>
    <pageFirst/>
    <pageLast/>
    <pageNumber/>
    <edition/>
    <issue/>
    <volume/>
    <type>researchdata</type>
    <publisherName>Zenodo</publisherName>
    <publisherPlace>Geneva</publisherPlace>
    <creatingCorporation>Bundesanstalt für Materialforschung und -prüfung (BAM)</creatingCorporation>
    <contributingCorporation/>
    <belongsToBibliography>0</belongsToBibliography>
    <completedDate>--</completedDate>
    <publishedDate>--</publishedDate>
    <thesisDateAccepted>--</thesisDateAccepted>
    <title language="eng">Physico-chemical characterization of sterile Fe3O4 nanoparticles by XPS / HAXPES / SEM</title>
    <abstract language="eng">Here a dataset of XPS, HAXPES and SEM measurements for the physico-chemical characterization of sterile Fe3O4 nanoparticles is presented. The measurements are part of the H2020 project “NanoSolveIT”.</abstract>
    <identifier type="doi">10.5281/zenodo.7990301</identifier>
    <enrichment key="ScientificResourceTypeGeneral">Datensatz</enrichment>
    <enrichment key="opus.source">publish</enrichment>
    <enrichment key="ScientificGeolocation">Berlin, Germany</enrichment>
    <licence>Creative Commons - Namensnennung - Nicht kommerziell 3.0</licence>
    <author>Xenia Knigge</author>
    <author>Jörg Radnik</author>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>HAXPES</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>XPS</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>SEM</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Fe3O4</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Nanoparticles</value>
    </subject>
    <collection role="ddc" number="620">Ingenieurwissenschaften und zugeordnete Tätigkeiten</collection>
    <collection role="institutes" number="">6 Materialchemie</collection>
    <collection role="institutes" number="">6.1 Oberflächen- und Dünnschichtanalyse</collection>
    <collection role="themenfelder" number="">Material</collection>
    <collection role="fulltextaccess" number="">Datei für die Öffentlichkeit verfügbar ("Open Access")</collection>
    <collection role="literaturgattung" number="">Graue Literatur</collection>
    <collection role="themenfelder" number="">Advanced Materials</collection>
    <collection role="unnumberedseries" number="">Forschungsdatensätze der BAM</collection>
  </doc>
  <doc>
    <id>52880</id>
    <completedYear/>
    <publishedYear>2021</publishedYear>
    <thesisYearAccepted/>
    <language>eng</language>
    <pageFirst/>
    <pageLast/>
    <pageNumber/>
    <edition/>
    <issue/>
    <volume/>
    <type>researchdata</type>
    <publisherName>Zenodo</publisherName>
    <publisherPlace>Geneva</publisherPlace>
    <creatingCorporation>Bundesanstalt für Materialforschung und -prüfung (BAM)</creatingCorporation>
    <contributingCorporation/>
    <belongsToBibliography>0</belongsToBibliography>
    <completedDate>--</completedDate>
    <publishedDate>--</publishedDate>
    <thesisDateAccepted>--</thesisDateAccepted>
    <title language="eng">BAM reference data - XPS raw data of Al-coated titania nanoparticles (JRCNM62001a and JRCNM62002a)</title>
    <abstract language="eng">XPS raw data of Al-coated titania nanoparticles (JRCNM62001 and JRCNM62002a) provided by the JRC repository are provided.</abstract>
    <identifier type="doi">10.5281/zenodo.4986068</identifier>
    <enrichment key="ScientificResourceTypeGeneral">Datensatz</enrichment>
    <enrichment key="RelatedIdentifier">https://nbn-resolving.org/urn:nbn:de:kobv:b43-522683</enrichment>
    <enrichment key="opus.source">publish</enrichment>
    <enrichment key="ScientificNote">The raw data are given as VAMAS-File. The measurement condtions are given in the file. The C1s-fits are provided as ascii-files.</enrichment>
    <enrichment key="RelatedIdentifier">https://opus4.kobv.de/opus4-bam/frontdoor/index/index/docId/52833</enrichment>
    <enrichment key="RelatedIdentifier">https://opus4.kobv.de/opus4-bam/frontdoor/index/index/docId/52836</enrichment>
    <licence>Creative Commons - CC BY - Namensnennung 4.0 International</licence>
    <author>Jörg Radnik</author>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>XPS</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Titania nanoparticles</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>BAM reference data</value>
    </subject>
    <collection role="ddc" number="543">Analytische Chemie</collection>
    <collection role="ddc" number="620">Ingenieurwissenschaften und zugeordnete Tätigkeiten</collection>
    <collection role="institutes" number="">6 Materialchemie</collection>
    <collection role="institutes" number="">6.1 Oberflächen- und Dünnschichtanalyse</collection>
    <collection role="themenfelder" number="">Material</collection>
    <collection role="themenfelder" number="">Chemie und Prozesstechnik</collection>
    <collection role="fulltextaccess" number="">Datei für die Öffentlichkeit verfügbar ("Open Access")</collection>
    <collection role="literaturgattung" number="">Graue Literatur</collection>
    <collection role="themenfelder" number="">Advanced Materials</collection>
    <collection role="unnumberedseries" number="">Forschungsdatensätze der BAM</collection>
  </doc>
  <doc>
    <id>54113</id>
    <completedYear/>
    <publishedYear>2021</publishedYear>
    <thesisYearAccepted/>
    <language>eng</language>
    <pageFirst>1</pageFirst>
    <pageLast>8</pageLast>
    <pageNumber/>
    <edition/>
    <issue>2</issue>
    <volume>28</volume>
    <type>article</type>
    <publisherName>AVS: Science &amp; Technology of Materials, Interfaces, and Processing</publisherName>
    <publisherPlace/>
    <creatingCorporation/>
    <contributingCorporation/>
    <belongsToBibliography>1</belongsToBibliography>
    <completedDate>--</completedDate>
    <publishedDate>--</publishedDate>
    <thesisDateAccepted>--</thesisDateAccepted>
    <title language="eng">1-Propyl-3-methyl-imidazolium bis(trifluoromethylsulfonyl)imide (Solarpur®) analyzed by hard x-ray photoelectron spectroscopy</title>
    <abstract language="eng">1-Propyl-3-methyl-imidazolium bis(trifluoromethylsulfonyl)imide (Solarpur®), an ionic liquid was purchased from Merck (formerly Sigma Aldrich), was analyzed using hard x-ray photoelectron spectroscopy (HAXPES). The liquid is UHV stable, vertically and laterally homogeneous, and is easy to clean; thus, it can be used as a reference material. The HAXPES spectra of Solarpur® obtained using monochromatic Cr Kα radiation at 5414.8 eV include a survey scan, high-resolution spectra of C 1s, O 1s, N 1s, S 2p, S 1s, S 2s, F 1s, and S KLL.</abstract>
    <parentTitle language="eng">Surface Science Spectra</parentTitle>
    <identifier type="doi">10.1116/6.0001414</identifier>
    <enrichment key="opus.source">publish</enrichment>
    <enrichment key="date_peer_review">04.04.2022</enrichment>
    <author>Xenia Knigge</author>
    <author>Jörg Radnik</author>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>HAXPES</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Hard x-ray photoelectron spectroscopy</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Ionic liquid</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Solarpur</value>
    </subject>
    <collection role="ddc" number="543">Analytische Chemie</collection>
    <collection role="ddc" number="620">Ingenieurwissenschaften und zugeordnete Tätigkeiten</collection>
    <collection role="institutes" number="">6 Materialchemie</collection>
    <collection role="institutes" number="">6.1 Oberflächen- und Dünnschichtanalyse</collection>
    <collection role="themenfelder" number="">Material</collection>
    <collection role="themenfelder" number="">Chemie und Prozesstechnik</collection>
    <collection role="literaturgattung" number="">Verlagsliteratur</collection>
    <collection role="fulltextaccess" number="">Datei im Netzwerk der BAM verfügbar ("Closed Access")</collection>
    <collection role="themenfelder" number="">Advanced Materials</collection>
  </doc>
  <doc>
    <id>54831</id>
    <completedYear/>
    <publishedYear>2022</publishedYear>
    <thesisYearAccepted/>
    <language>eng</language>
    <pageFirst/>
    <pageLast/>
    <pageNumber/>
    <edition/>
    <issue/>
    <volume/>
    <type>lecture</type>
    <publisherName/>
    <publisherPlace/>
    <creatingCorporation/>
    <contributingCorporation/>
    <belongsToBibliography>0</belongsToBibliography>
    <completedDate>--</completedDate>
    <publishedDate>--</publishedDate>
    <thesisDateAccepted>--</thesisDateAccepted>
    <title language="eng">VAMAS-Enabling international standardisation for increasing the take up of Emerging Materials</title>
    <abstract language="eng">VAMAS (Versailles Project on Advanced Materials and Standards) supports world trade in products dependent on advanced materials technologies by providing technical basis for harmonized measurements, testing, specification, reference materials and standards. The major tools for fulfilling this task are interlaboratory comparisons (ILC). The organisation structure of VAMAS is presented. It is discussed, how a new technical activity can initiate.</abstract>
    <enrichment key="eventName">DIN NA062-08-16 Oberflächenanalytik Frühjahrstreffen</enrichment>
    <enrichment key="eventPlace">Berlin, Germany</enrichment>
    <enrichment key="eventStart">11.05.2022</enrichment>
    <enrichment key="opus.source">publish</enrichment>
    <enrichment key="InvitedTalks">0</enrichment>
    <author>Jörg Radnik</author>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Advanced Materials</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Standards</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Interlaboratory Comparisons</value>
    </subject>
    <collection role="ddc" number="543">Analytische Chemie</collection>
    <collection role="ddc" number="620">Ingenieurwissenschaften und zugeordnete Tätigkeiten</collection>
    <collection role="institutes" number="">6 Materialchemie</collection>
    <collection role="institutes" number="">6.1 Oberflächen- und Dünnschichtanalyse</collection>
    <collection role="themenfelder" number="">Material</collection>
    <collection role="themenfelder" number="">Chemie und Prozesstechnik</collection>
    <collection role="fulltextaccess" number="">Datei im Netzwerk der BAM verfügbar ("Closed Access")</collection>
    <collection role="literaturgattung" number="">Präsentation</collection>
    <collection role="themenfelder" number="">Advanced Materials</collection>
  </doc>
  <doc>
    <id>54834</id>
    <completedYear/>
    <publishedYear>2022</publishedYear>
    <thesisYearAccepted/>
    <language>eng</language>
    <pageFirst/>
    <pageLast/>
    <pageNumber/>
    <edition/>
    <issue/>
    <volume/>
    <type>lecture</type>
    <publisherName/>
    <publisherPlace/>
    <creatingCorporation/>
    <contributingCorporation/>
    <belongsToBibliography>0</belongsToBibliography>
    <completedDate>--</completedDate>
    <publishedDate>--</publishedDate>
    <thesisDateAccepted>--</thesisDateAccepted>
    <title language="eng">ISO-G-Scope Standardisation of structural and chemical properties of graphene</title>
    <abstract language="eng">The objectives and tasks of the EMPIR project ISO-G-Scope are presented. The last results was shown. Esspecially, the interlaboratory comparison about XPS of functionalized graphene is presented.</abstract>
    <enrichment key="eventName">DIN NA062-08-16 Oberflächenanalytik Frühjahrstreffen</enrichment>
    <enrichment key="eventPlace">Berlin, Germany</enrichment>
    <enrichment key="eventStart">11.05.2022</enrichment>
    <enrichment key="opus.source">publish</enrichment>
    <enrichment key="opus.doi.autoCreate">false</enrichment>
    <enrichment key="opus.urn.autoCreate">true</enrichment>
    <enrichment key="InvitedTalks">0</enrichment>
    <author>Jörg Radnik</author>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Graphene</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Standardization</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Structural characterisation</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Chemical composition</value>
    </subject>
    <collection role="ddc" number="543">Analytische Chemie</collection>
    <collection role="ddc" number="620">Ingenieurwissenschaften und zugeordnete Tätigkeiten</collection>
    <collection role="institutes" number="">6 Materialchemie</collection>
    <collection role="institutes" number="">6.1 Oberflächen- und Dünnschichtanalyse</collection>
    <collection role="themenfelder" number="">Material</collection>
    <collection role="themenfelder" number="">Chemie und Prozesstechnik</collection>
    <collection role="fulltextaccess" number="">Datei im Netzwerk der BAM verfügbar ("Closed Access")</collection>
    <collection role="literaturgattung" number="">Präsentation</collection>
    <collection role="themenfelder" number="">Advanced Materials</collection>
  </doc>
  <doc>
    <id>59496</id>
    <completedYear/>
    <publishedYear>2023</publishedYear>
    <thesisYearAccepted/>
    <language>eng</language>
    <pageFirst/>
    <pageLast/>
    <pageNumber/>
    <edition/>
    <issue/>
    <volume/>
    <type>lecture</type>
    <publisherName/>
    <publisherPlace/>
    <creatingCorporation/>
    <contributingCorporation/>
    <belongsToBibliography>0</belongsToBibliography>
    <completedDate>--</completedDate>
    <publishedDate>--</publishedDate>
    <thesisDateAccepted>--</thesisDateAccepted>
    <title language="eng">Xps/Haxpes at (core shell) nanoparticles</title>
    <abstract language="eng">The principles of (Hard) X-ray photoelectron spectroscopy and some application in the field of (core-shell) nanoparticles will be presented. The presentation should answer hoe to get reliable results. Furthermore, examples of the correlation between physical-chemical measurments and toxicological results are given which are crucial for the risk assessment of nanoparticles.</abstract>
    <enrichment key="eventName">Training Course Metrological Determination of Micro and Nano Contaminants in Food</enrichment>
    <enrichment key="eventPlace">Berne, Switzerland</enrichment>
    <enrichment key="eventStart">05.09.2023</enrichment>
    <enrichment key="eventEnd">06.09.2023</enrichment>
    <enrichment key="opus.source">publish</enrichment>
    <enrichment key="InvitedTalks">1</enrichment>
    <author>Jörg Radnik</author>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>X-ray photoelectron spectroscopy</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Core-shell nanoparticles</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Reliabiilty</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Risk assessment</value>
    </subject>
    <collection role="ddc" number="543">Analytische Chemie</collection>
    <collection role="institutes" number="">6 Materialchemie</collection>
    <collection role="institutes" number="">6.1 Oberflächen- und Dünnschichtanalyse</collection>
    <collection role="themenfelder" number="">Material</collection>
    <collection role="themenfelder" number="">Chemie und Prozesstechnik</collection>
    <collection role="themenfelder" number="">Chemische Charakterisierung und Spurenanalytik</collection>
    <collection role="fulltextaccess" number="">Datei im Netzwerk der BAM verfügbar ("Closed Access")</collection>
    <collection role="literaturgattung" number="">Präsentation</collection>
    <collection role="themenfelder" number="">Advanced Materials</collection>
  </doc>
  <doc>
    <id>54376</id>
    <completedYear/>
    <publishedYear>2022</publishedYear>
    <thesisYearAccepted/>
    <language>eng</language>
    <pageFirst/>
    <pageLast/>
    <pageNumber/>
    <edition/>
    <issue/>
    <volume/>
    <type>lecture</type>
    <publisherName/>
    <publisherPlace/>
    <creatingCorporation/>
    <contributingCorporation/>
    <belongsToBibliography>0</belongsToBibliography>
    <completedDate>--</completedDate>
    <publishedDate>--</publishedDate>
    <thesisDateAccepted>--</thesisDateAccepted>
    <title language="eng">Colours, nano and surface</title>
    <abstract language="eng">The basic ideas of colours and pigments are presented. The correlation between nanomaterials and colours are explained. Different methods are presented for investigating nanoparticles and their surface. At the end a case study is presented explaining the importance of coating for the properties of nanoparticles.</abstract>
    <enrichment key="eventName">Eingeladener Vortrag im Deutschen Lackmuseum (Münster)</enrichment>
    <enrichment key="eventPlace">Online meeting</enrichment>
    <enrichment key="eventStart">11.02.2022</enrichment>
    <enrichment key="opus.source">publish</enrichment>
    <enrichment key="InvitedTalks">1</enrichment>
    <author>Jörg Radnik</author>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Pigments</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Surface Analytics</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Coatings</value>
    </subject>
    <collection role="ddc" number="62">Ingenieurwissenschaften</collection>
    <collection role="ddc" number="543">Analytische Chemie</collection>
    <collection role="institutes" number="">6 Materialchemie</collection>
    <collection role="institutes" number="">6.1 Oberflächen- und Dünnschichtanalyse</collection>
    <collection role="themenfelder" number="">Material</collection>
    <collection role="themenfelder" number="">Chemie und Prozesstechnik</collection>
    <collection role="fulltextaccess" number="">Datei im Netzwerk der BAM verfügbar ("Closed Access")</collection>
    <collection role="literaturgattung" number="">Präsentation</collection>
    <collection role="themenfelder" number="">Advanced Materials</collection>
  </doc>
  <doc>
    <id>57757</id>
    <completedYear/>
    <publishedYear>2023</publishedYear>
    <thesisYearAccepted/>
    <language>eng</language>
    <pageFirst/>
    <pageLast/>
    <pageNumber/>
    <edition/>
    <issue/>
    <volume/>
    <type>researchdata</type>
    <publisherName>Zenodo</publisherName>
    <publisherPlace>Geneva</publisherPlace>
    <creatingCorporation>Bundesanstalt für Materialforschung und -prüfung (BAM)</creatingCorporation>
    <contributingCorporation/>
    <belongsToBibliography>0</belongsToBibliography>
    <completedDate>--</completedDate>
    <publishedDate>--</publishedDate>
    <thesisDateAccepted>--</thesisDateAccepted>
    <title language="eng">Physico-chemical characterization of sterilized AlOOH nanoparticles by XPS / HAXPES / SEM</title>
    <abstract language="eng">Here a dataset of XPS, HAXPES and SEM measurements for the physico-chemical characterization of sterilized AlOOH nanoparticles is presented. The measurements are part of the H2020 project “NanoSolveIT”.</abstract>
    <identifier type="doi">10.5281/zenodo.7966245</identifier>
    <enrichment key="ScientificResourceTypeGeneral">Datensatz</enrichment>
    <enrichment key="opus.source">publish</enrichment>
    <enrichment key="ScientificGeolocation">Berlin, Germany</enrichment>
    <licence>Creative Commons - Namensnennung - Nicht kommerziell 3.0</licence>
    <author>Xenia Knigge</author>
    <author>Jörg Radnik</author>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>HAXPES</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>XPS</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>SEM</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>AlOOH</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Nanoparticles</value>
    </subject>
    <collection role="ddc" number="620">Ingenieurwissenschaften und zugeordnete Tätigkeiten</collection>
    <collection role="institutes" number="">6 Materialchemie</collection>
    <collection role="institutes" number="">6.1 Oberflächen- und Dünnschichtanalyse</collection>
    <collection role="themenfelder" number="">Material</collection>
    <collection role="fulltextaccess" number="">Datei für die Öffentlichkeit verfügbar ("Open Access")</collection>
    <collection role="literaturgattung" number="">Graue Literatur</collection>
    <collection role="themenfelder" number="">Advanced Materials</collection>
    <collection role="unnumberedseries" number="">Forschungsdatensätze der BAM</collection>
  </doc>
  <doc>
    <id>52268</id>
    <completedYear/>
    <publishedYear>2021</publishedYear>
    <thesisYearAccepted/>
    <language>eng</language>
    <pageFirst>639</pageFirst>
    <pageLast/>
    <pageNumber/>
    <edition/>
    <issue>3</issue>
    <volume>11</volume>
    <type>article</type>
    <publisherName>MDPI</publisherName>
    <publisherPlace/>
    <creatingCorporation/>
    <contributingCorporation/>
    <belongsToBibliography>1</belongsToBibliography>
    <completedDate>--</completedDate>
    <publishedDate>--</publishedDate>
    <thesisDateAccepted>--</thesisDateAccepted>
    <title language="eng">Reliable Surface Analysis Data of Nanomaterials in Support of Risk Assessment Based on Minimum Information Requirements</title>
    <abstract language="eng">The minimum information requirements needed to guarantee high-quality surface Analysis data of nanomaterials are described with the aim to provide reliable and traceable Information about size, shape, elemental composition and surface chemistry for risk assessment approaches.&#13;
The widespread surface analysis methods electron microscopy (SEM), energy dispersive X-ray spectroscopy (EDS), X-ray photoelectron spectroscopy (XPS) and secondary ion mass spectrometry (SIMS) were considered. The complete analysis sequence from sample preparation, over measurements, to data analysis and data format for reporting and archiving is outlined. All selected methods are used in surface analysis since many years so that many aspects of the analysis (including (meta)data formats) are already standardized. As a practical analysis use case, two coated TiO2 reference nanoparticulate samples, which are available on the Joint Research Centre (JRC) repository, were selected. The added value of the complementary analysis is highlighted based on the minimum information requirements, which are well-defined for the analysis methods selected. The present paper is supposed to serve primarily as a source of understanding of the high standardization level already available for the high-quality data in surface analysis of nanomaterials as reliable input for the nanosafety community.</abstract>
    <parentTitle language="eng">nanomaterials</parentTitle>
    <identifier type="doi">10.3390/nano11030639</identifier>
    <identifier type="urn">urn:nbn:de:kobv:b43-522683</identifier>
    <enrichment key="opus.source">publish</enrichment>
    <enrichment key="date_peer_review">12.04.2021</enrichment>
    <enrichment key="RelatedIdentifier">https://opus4.kobv.de/opus4-bam/frontdoor/index/index/docId/52833</enrichment>
    <enrichment key="RelatedIdentifier">https://opus4.kobv.de/opus4-bam/frontdoor/index/index/docId/52836</enrichment>
    <enrichment key="RelatedIdentifier">https://opus4.kobv.de/opus4-bam/frontdoor/index/index/docId/52880</enrichment>
    <licence>Creative Commons - CC BY - Namensnennung 4.0 International</licence>
    <author>Jörg Radnik</author>
    <author>R. Kersting</author>
    <author>B. Hagenhoff</author>
    <author>Francesca Bennet</author>
    <author>Dmitri Ciornii</author>
    <author>P. Nymark</author>
    <author>R. Grafström</author>
    <author>Vasile-Dan Hodoroaba</author>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Electron microscopy</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>X-ray photoelectron spectroscopy</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Secondary ion mass spectrometry</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Energy dispersive X-ray spectroscopy</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Standardization</value>
    </subject>
    <collection role="ddc" number="543">Analytische Chemie</collection>
    <collection role="ddc" number="620">Ingenieurwissenschaften und zugeordnete Tätigkeiten</collection>
    <collection role="institutes" number="">6 Materialchemie</collection>
    <collection role="institutes" number="">6.1 Oberflächen- und Dünnschichtanalyse</collection>
    <collection role="themenfelder" number="">Material</collection>
    <collection role="themenfelder" number="">Chemie und Prozesstechnik</collection>
    <collection role="literaturgattung" number="">Verlagsliteratur</collection>
    <collection role="fulltextaccess" number="">Datei für die Öffentlichkeit verfügbar ("Open Access")</collection>
    <collection role="unnumberedseries" number="">Wissenschaftliche Artikel der BAM</collection>
    <collection role="themenfelder" number="">Advanced Materials</collection>
    <thesisPublisher>Bundesanstalt für Materialforschung und -prüfung (BAM)</thesisPublisher>
    <file>https://opus4.kobv.de/opus4-bam/files/52268/nanomaterials-11-00639.pdf</file>
  </doc>
  <doc>
    <id>63676</id>
    <completedYear/>
    <publishedYear>2025</publishedYear>
    <thesisYearAccepted/>
    <language>eng</language>
    <pageFirst/>
    <pageLast/>
    <pageNumber/>
    <edition/>
    <issue/>
    <volume/>
    <type>poster</type>
    <publisherName/>
    <publisherPlace/>
    <creatingCorporation/>
    <contributingCorporation/>
    <belongsToBibliography>0</belongsToBibliography>
    <completedDate>--</completedDate>
    <publishedDate>--</publishedDate>
    <thesisDateAccepted>--</thesisDateAccepted>
    <title language="eng">Unveiling Order in Graphene Oxide Synthesis Through A Design of Experiment and Chemometric Strategy Based on Tour’s Method</title>
    <abstract language="eng">Graphene oxide (GO), a derivative of graphene containing oxygen functional groups, shows significant potential for a wide range of applications due to its unique electrical, mechanical, and chemical properties. Traditional synthesis methods, such as Tour's method, often rely on trial-and-error, leading to variations in product quality and yield. To address these challenges, we applied Design of Experiments (DoE) to systematically investigate the effects of key synthesis parameters, including reaction temperature, reaction time, and oxidant concentration. We identified the most significant factors influencing GO characteristics using a Plackett-Burman design and chemometric analysis. Our results highlight that the oxidation level is the most critical factor, impacting outcomes observed through various characterization techniques, such as UV-Vis spectroscopy and X-Ray Diffraction. Principal Component Analysis (PCA) and Multiple Linear Regression (MLR) provided insights into the synthetic parameters most strongly affecting material properties. While some findings aligned with expectations, others were counterintuitive. For instance, oxidation temperature had a minimal effect on the final material characteristics and may not need to be prioritized in the synthesis process. On the other hand, stirring was found to enhance the homogeneity of the material and promote more uniform oxidation. This study demonstrates the effectiveness of DoE in the controlled production of graphene oxide, offering a reliable framework for manufacturing high-quality GO tailored to specific applications. By minimizing time and resource consumption, this approach is increasingly relevant in the context of materials science, which demands higher quality, safety and sustainability standards.</abstract>
    <identifier type="url">https://macrame-project.eu/macrame-meetings-workshops/jointrras/#Agenda</identifier>
    <enrichment key="eventName">Joint Regulatory Risk Assessors Summit – Advancing Safety &amp; Sustainability Assessments of Advanced Materials</enrichment>
    <enrichment key="eventPlace">Paris, France</enrichment>
    <enrichment key="eventStart">19.06.2025</enrichment>
    <enrichment key="eventEnd">20.06.2025</enrichment>
    <enrichment key="opus.source">publish</enrichment>
    <enrichment key="opus.doi.autoCreate">false</enrichment>
    <enrichment key="opus.urn.autoCreate">true</enrichment>
    <author>F. Pellegrino</author>
    <author>Vasile-Dan Hodoroaba</author>
    <author>Jörg Radnik</author>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Graphene oxide</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Chemometry</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>UV-Vis</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>XRD</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>XPS</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>EDX</value>
    </subject>
    <collection role="ddc" number="620">Ingenieurwissenschaften und zugeordnete Tätigkeiten</collection>
    <collection role="institutes" number="">6 Materialchemie</collection>
    <collection role="institutes" number="">6.1 Oberflächen- und Dünnschichtanalyse</collection>
    <collection role="themenfelder" number="">Material</collection>
    <collection role="fulltextaccess" number="">Datei im Netzwerk der BAM verfügbar ("Closed Access")</collection>
    <collection role="literaturgattung" number="">Präsentation</collection>
    <collection role="themenfelder" number="">Advanced Materials</collection>
  </doc>
  <doc>
    <id>57898</id>
    <completedYear/>
    <publishedYear>2023</publishedYear>
    <thesisYearAccepted/>
    <language>eng</language>
    <pageFirst/>
    <pageLast/>
    <pageNumber/>
    <edition/>
    <issue/>
    <volume/>
    <type>researchdata</type>
    <publisherName>Zenodo</publisherName>
    <publisherPlace>Geneva</publisherPlace>
    <creatingCorporation>Bundesanstalt für Materialforschung und -prüfung (BAM)</creatingCorporation>
    <contributingCorporation/>
    <belongsToBibliography>0</belongsToBibliography>
    <completedDate>--</completedDate>
    <publishedDate>--</publishedDate>
    <thesisDateAccepted>--</thesisDateAccepted>
    <title language="eng">XPS, HAXPES, XRD and SEM datasets of functionalized graphene nanoplateletes</title>
    <abstract language="eng">The datasets from (Hard Energy) X-ray photoelectron spectroscopy, X-ray diffraction and Scanning Electron Microsopy are related to the publication &#13;
&#13;
G. Chemello, X. Knigge, D. Ciornii, B.P. Reed, A.J. Pollard, C.A. Clifford, T. Howe, N. Vyas, V.-D. Hodoroaba, J. Radnik&#13;
&#13;
"Influence of the morphology on the functionalization of graphene nanoplatelets analyzed by comparative photoelectron spectroscopy with soft and hard X-rays"&#13;
&#13;
Advanced Materials Interfaces (2023), DOI: 10.1002/admi.202300116.</abstract>
    <identifier type="doi">10.5281/zenodo.7956497</identifier>
    <enrichment key="ScientificResourceTypeGeneral">Datensatz</enrichment>
    <enrichment key="ScientificGeolocation">Berlin, Germany</enrichment>
    <enrichment key="ScientificNote">The data are given as tif-files for SEM (*tif). as asc ii files for XRD (*.xy) and the fitted XPS/HAXPES-spectra (*.dat) and as vamas data files for the XPS/HAXPES raw-data (*.npl).</enrichment>
    <enrichment key="RelatedIdentifier">https://opus4.kobv.de/opus4-bam/frontdoor/index/index/docId/57886</enrichment>
    <enrichment key="opus.source">publish</enrichment>
    <enrichment key="opus.doi.autoCreate">false</enrichment>
    <enrichment key="opus.urn.autoCreate">true</enrichment>
    <licence>Creative Commons - CC BY - Namensnennung 4.0 International</licence>
    <author>Jörg Radnik</author>
    <author>Giovanni Chemello</author>
    <author>Xenia Knigge</author>
    <author>Dominik Al-Sabbgh</author>
    <author>Vasile-Dan Hodoroaba</author>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Graphene related 2D materials</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>X-ray photoelectron spectroscopy</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Hard-energy X-ray photoelectron spectroscopy</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Scanning electron microscopy</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Powder X-ray diffraction</value>
    </subject>
    <collection role="ddc" number="543">Analytische Chemie</collection>
    <collection role="ddc" number="620">Ingenieurwissenschaften und zugeordnete Tätigkeiten</collection>
    <collection role="institutes" number="">6 Materialchemie</collection>
    <collection role="institutes" number="">6.1 Oberflächen- und Dünnschichtanalyse</collection>
    <collection role="institutes" number="">6.3 Strukturanalytik</collection>
    <collection role="themenfelder" number="">Material</collection>
    <collection role="themenfelder" number="">Chemie und Prozesstechnik</collection>
    <collection role="fulltextaccess" number="">Datei für die Öffentlichkeit verfügbar ("Open Access")</collection>
    <collection role="literaturgattung" number="">Graue Literatur</collection>
    <collection role="themenfelder" number="">Advanced Materials</collection>
    <collection role="unnumberedseries" number="">Forschungsdatensätze der BAM</collection>
  </doc>
  <doc>
    <id>65294</id>
    <completedYear/>
    <publishedYear>2025</publishedYear>
    <thesisYearAccepted/>
    <language>eng</language>
    <pageFirst>1</pageFirst>
    <pageLast>22</pageLast>
    <pageNumber/>
    <edition/>
    <issue/>
    <volume/>
    <type>preprint</type>
    <publisherName>Cornell University</publisherName>
    <publisherPlace>Ithaca, NY</publisherPlace>
    <creatingCorporation/>
    <contributingCorporation/>
    <belongsToBibliography>0</belongsToBibliography>
    <completedDate>--</completedDate>
    <publishedDate>--</publishedDate>
    <thesisDateAccepted>--</thesisDateAccepted>
    <title language="eng">Scalable covalently functionalized black phosphorus hybrids for broadspectrum virucidal activity</title>
    <abstract language="eng">At the onset of viral outbreaks, broad-spectrum antiviral materials are crucial before specific therapeutics become available. We report scalable, biodegradable black phosphorus (BP) hybrids that provide mutation-resilient virucidal protection. BP sheets, produced via an optimized mechanochemical process, are covalently functionalized with 2-azido-4,6-dichloro- 1,3,5-triazine to form P=N bonds. Fucoidan, a sulfated polysaccharide with intrinsic antiviral activity, and hydrophobic chains are then incorporated to achieve irreversible viral deactivation. The material exhibits strong antiviral inhibition and complete virucidal activity against multiple viruses, including recent severe acute respiratory syndrome coronavirus-2 (SARS-CoV-2) variants. It maintains high biocompatibility, remains effective against viral mutations, and is shelf stable for at least five month. The combination of biodegradability, scalable synthesis, and synergistic antiviral and virucidal mechanisms establishes BP-conjugates as a new class of highly efficient antivirals. They offer a broad spectrum antiviral solutions that could bridge the gap between antiviral medicines and general antiseptics.</abstract>
    <parentTitle language="eng">arxiv.org</parentTitle>
    <identifier type="doi">10.48550/arXiv.2510.12854</identifier>
    <identifier type="issn">2331-8422</identifier>
    <identifier type="urn">urn:nbn:de:kobv:b43-652941</identifier>
    <enrichment key="opus.source">publish</enrichment>
    <enrichment key="opus.doi.autoCreate">false</enrichment>
    <enrichment key="opus.urn.autoCreate">true</enrichment>
    <licence>Allgemeines Deutsches Urheberrecht</licence>
    <author>Na Xing</author>
    <author>Jasmin Er</author>
    <author>Ricardo M. Vidal</author>
    <author>Sandhya Khadka</author>
    <author>Robert Schusterbauer</author>
    <author>Maik Rosentreter</author>
    <author>Ranen Etouki</author>
    <author>Rameez Ahmed</author>
    <author>Taylor Page</author>
    <author>Philip Nickl</author>
    <author>Obida Bawadkji</author>
    <author>Anja Wiesner</author>
    <author>Jörg Radnik</author>
    <author>Vasile-Dan Hodoroaba</author>
    <author>Kai Ludwig</author>
    <author>Jakob Trimpert</author>
    <author>Ievgen Donskyi</author>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Black phosphorus</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Antiviral materials</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Functionalization</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Biodegradability</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Sheets</value>
    </subject>
    <collection role="ddc" number="620">Ingenieurwissenschaften und zugeordnete Tätigkeiten</collection>
    <collection role="institutes" number="">6 Materialchemie</collection>
    <collection role="institutes" number="">6.1 Oberflächen- und Dünnschichtanalyse</collection>
    <collection role="themenfelder" number="">Material</collection>
    <collection role="fulltextaccess" number="">Datei für die Öffentlichkeit verfügbar ("Open Access")</collection>
    <collection role="literaturgattung" number="">Graue Literatur</collection>
    <collection role="themenfelder" number="">Advanced Materials</collection>
    <collection role="unnumberedseries" number="">Preprints der BAM</collection>
    <thesisPublisher>Bundesanstalt für Materialforschung und -prüfung (BAM)</thesisPublisher>
    <file>https://opus4.kobv.de/opus4-bam/files/65294/2510.12854v1.pdf</file>
    <file>https://opus4.kobv.de/opus4-bam/files/65294/12_12_SI.pdf</file>
  </doc>
  <doc>
    <id>65257</id>
    <completedYear/>
    <publishedYear>2026</publishedYear>
    <thesisYearAccepted/>
    <language>eng</language>
    <pageFirst>1</pageFirst>
    <pageLast>9</pageLast>
    <pageNumber/>
    <edition/>
    <issue/>
    <volume>55</volume>
    <type>article</type>
    <publisherName>Elsevier B.V.</publisherName>
    <publisherPlace/>
    <creatingCorporation/>
    <contributingCorporation/>
    <belongsToBibliography>1</belongsToBibliography>
    <completedDate>--</completedDate>
    <publishedDate>--</publishedDate>
    <thesisDateAccepted>--</thesisDateAccepted>
    <title language="eng">Multivariate optimization and characterization of graphene oxide via design of experiments and chemometric analysis</title>
    <abstract language="eng">Controlling the structure and properties of graphene oxide (GO) remains a challenge due to the poor reproducibility of conventional synthetic protocols and limited understanding of parameter-property relationships. In this study, we present an integrated analytical framework that combines Design of Experiments (DoE) with chemometric modelling to systematically assess the effects of eight synthesis variables on GO’s physicochemical and functional features. A Plackett–Burman experimental design enabled efficient screening of synthesis conditions, while comprehensive characterization (spanning UV–Vis spectroscopy, XPS, SEM–EDX, TEM–EDX,  and XRD) was coupled with multivariate tools (Principal Component Analysis and Multiple Linear Regression) to identify statistically significant correlations between synthetic inputs and material responses. Notably, we demonstrate that UV–Vis spectra can serve as a robust proxy for oxidation state, offering a rapid and accessible alternative to surface-sensitive methods. The approach yields a predictive analytical toolkit for guiding GO synthesis and highlights a generalizable strategy for the rational design of flat nanomaterials. This work supports reproducible, resource-efficient material development aligned with Safe and Sustainable by Design (SSbD) principles.</abstract>
    <parentTitle language="eng">FlatChem</parentTitle>
    <identifier type="issn">2452-2627</identifier>
    <identifier type="doi">10.1016/j.flatc.2025.100988</identifier>
    <identifier type="urn">urn:nbn:de:kobv:b43-652576</identifier>
    <enrichment key="opus_doi_flag">true</enrichment>
    <enrichment key="local_crossrefDocumentType">journal-article</enrichment>
    <enrichment key="local_crossrefLicence">https://www.elsevier.com/tdm/userlicense/1.0/</enrichment>
    <enrichment key="local_import_origin">crossref</enrichment>
    <enrichment key="local_doiImportPopulated">PersonAuthorFirstName_1,PersonAuthorLastName_1,PersonAuthorFirstName_2,PersonAuthorLastName_2,PersonAuthorFirstName_3,PersonAuthorLastName_3,PersonAuthorFirstName_4,PersonAuthorLastName_4,PersonAuthorFirstName_5,PersonAuthorLastName_5,PersonAuthorFirstName_6,PersonAuthorLastName_6,PersonAuthorFirstName_7,PersonAuthorLastName_7,PersonAuthorFirstName_8,PersonAuthorLastName_8,PersonAuthorFirstName_9,PersonAuthorLastName_9,PersonAuthorFirstName_10,PersonAuthorLastName_10,PersonAuthorFirstName_11,PersonAuthorLastName_11,PersonAuthorFirstName_12,PersonAuthorLastName_12,PersonAuthorFirstName_13,PersonAuthorLastName_13,PersonAuthorFirstName_14,PersonAuthorLastName_14,PersonAuthorFirstName_15,PersonAuthorLastName_15,PersonAuthorFirstName_16,PersonAuthorLastName_16,PublisherName,TitleMain_1,Language,TitleParent_1,ArticleNumber,Volume,PublishedYear,IdentifierIssn,Enrichmentlocal_crossrefLicence</enrichment>
    <enrichment key="opus.source">doi-import</enrichment>
    <enrichment key="date_peer_review">05.01.2026</enrichment>
    <licence>Creative Commons - CC BY - Namensnennung 4.0 International</licence>
    <author>Andrea Rossi</author>
    <author>Elena Corrao</author>
    <author>Eugenio Alladio</author>
    <author>Damjana Drobne</author>
    <author>Vasile-Dan Hodoroaba</author>
    <author>Kerstin Jurkschat</author>
    <author>Veno Kononenko</author>
    <author>Loay Akmal Madbouly</author>
    <author>Paul Mrkwitschka</author>
    <author>Nakhli Yasamin</author>
    <author>Sara Novak</author>
    <author>Jörg Radnik</author>
    <author>Špela Saje</author>
    <author>Rosangela Santalucia</author>
    <author>Fabrizio Sordello</author>
    <author>Francesco Pellegrino</author>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Graphene oxide</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>2D-materials</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Design of Experiment</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Synthesis</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Chemometric analysis</value>
    </subject>
    <collection role="ddc" number="620">Ingenieurwissenschaften und zugeordnete Tätigkeiten</collection>
    <collection role="institutes" number="">6 Materialchemie</collection>
    <collection role="institutes" number="">6.1 Oberflächen- und Dünnschichtanalyse</collection>
    <collection role="themenfelder" number="">Material</collection>
    <collection role="literaturgattung" number="">Verlagsliteratur</collection>
    <collection role="fulltextaccess" number="">Datei für die Öffentlichkeit verfügbar ("Open Access")</collection>
    <collection role="unnumberedseries" number="">Wissenschaftliche Artikel der BAM</collection>
    <collection role="themenfelder" number="">Advanced Materials</collection>
    <thesisPublisher>Bundesanstalt für Materialforschung und -prüfung (BAM)</thesisPublisher>
    <file>https://opus4.kobv.de/opus4-bam/files/65257/1-s2.0-S2452262725001825-main.pdf</file>
  </doc>
  <doc>
    <id>50571</id>
    <completedYear/>
    <publishedYear>2020</publishedYear>
    <thesisYearAccepted/>
    <language>deu</language>
    <pageFirst/>
    <pageLast/>
    <pageNumber/>
    <edition/>
    <issue/>
    <volume/>
    <type>lecture</type>
    <publisherName/>
    <publisherPlace/>
    <creatingCorporation/>
    <contributingCorporation/>
    <belongsToBibliography>0</belongsToBibliography>
    <completedDate>--</completedDate>
    <publishedDate>--</publishedDate>
    <thesisDateAccepted>--</thesisDateAccepted>
    <title language="deu">Minimale Anforderungen an Referenzdaten anhand von Beispielen aus der Elektronenmikroskopie und Oberflächenanalytik</title>
    <abstract language="deu">In dem Vortrag werden, anhand ausgewählten Beispielen aus der Elektronenmikroskopie und Oberflächenanalytik (EDX und XPS), die minimalen Anforderungen an Referenzdaten für zuverlässige und reproduzierbare Ergebnisse (z.B. Partikelgrößenverteilung, Elementzusammensetzung) vorgestellt und diskutiert.</abstract>
    <enrichment key="eventName">Workshop "Referenzdaten"</enrichment>
    <enrichment key="eventPlace">Berlin, Germany</enrichment>
    <enrichment key="eventStart">13.03.2020</enrichment>
    <enrichment key="eventEnd">13.03.2020</enrichment>
    <enrichment key="opus.doi.autoCreate">false</enrichment>
    <enrichment key="opus.urn.autoCreate">true</enrichment>
    <enrichment key="InvitedTalks">0</enrichment>
    <author>Vasile-Dan Hodoroaba</author>
    <author>Jörg Radnik</author>
    <subject>
      <language>deu</language>
      <type>uncontrolled</type>
      <value>Referenzdaten</value>
    </subject>
    <subject>
      <language>deu</language>
      <type>uncontrolled</type>
      <value>Nanopartikel</value>
    </subject>
    <subject>
      <language>deu</language>
      <type>uncontrolled</type>
      <value>Elektronenmikroskopie</value>
    </subject>
    <subject>
      <language>deu</language>
      <type>uncontrolled</type>
      <value>Oberflächenanalytik</value>
    </subject>
    <subject>
      <language>deu</language>
      <type>uncontrolled</type>
      <value>Standardarbeitsanweisung</value>
    </subject>
    <subject>
      <language>deu</language>
      <type>uncontrolled</type>
      <value>SOP</value>
    </subject>
    <subject>
      <language>deu</language>
      <type>uncontrolled</type>
      <value>Standardisierung</value>
    </subject>
    <collection role="ddc" number="543">Analytische Chemie</collection>
    <collection role="ddc" number="620">Ingenieurwissenschaften und zugeordnete Tätigkeiten</collection>
    <collection role="institutes" number="">6 Materialchemie</collection>
    <collection role="institutes" number="">6.1 Oberflächen- und Dünnschichtanalyse</collection>
    <collection role="themenfelder" number="">Material</collection>
    <collection role="themenfelder" number="">Chemie und Prozesstechnik</collection>
    <collection role="fulltextaccess" number="">Datei im Netzwerk der BAM verfügbar ("Closed Access")</collection>
    <collection role="literaturgattung" number="">Präsentation</collection>
    <collection role="themenfelder" number="">Advanced Materials</collection>
  </doc>
  <doc>
    <id>58683</id>
    <completedYear/>
    <publishedYear>2023</publishedYear>
    <thesisYearAccepted/>
    <language>eng</language>
    <pageFirst/>
    <pageLast/>
    <pageNumber/>
    <edition/>
    <issue/>
    <volume/>
    <type>lecture</type>
    <publisherName/>
    <publisherPlace/>
    <creatingCorporation/>
    <contributingCorporation/>
    <belongsToBibliography>0</belongsToBibliography>
    <completedDate>--</completedDate>
    <publishedDate>--</publishedDate>
    <thesisDateAccepted>--</thesisDateAccepted>
    <title language="eng">An interlaboratory comparison on measuring the chemical composition of functionalized graphene nanoplatelets</title>
    <abstract language="eng">The results of the international interlaboratory comparison ""Chemical Composition of functionalized graphene with X-ray photoelectron spectroscopy (XPS) under the auspice of VAMAS TWA 2 (Surface Chemical Analysis) will be presented.</abstract>
    <enrichment key="eventName">Kratos German User Meeting 2023</enrichment>
    <enrichment key="eventPlace">Berlin, Germany</enrichment>
    <enrichment key="eventStart">25.10.2023</enrichment>
    <enrichment key="opus.source">publish</enrichment>
    <enrichment key="opus.doi.autoCreate">false</enrichment>
    <enrichment key="opus.urn.autoCreate">true</enrichment>
    <enrichment key="InvitedTalks">0</enrichment>
    <author>Jörg Radnik</author>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Graphene</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Interlaboratory Comparison</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>X-ray photoelectron spectroscopy</value>
    </subject>
    <collection role="ddc" number="620">Ingenieurwissenschaften und zugeordnete Tätigkeiten</collection>
    <collection role="institutes" number="">6 Materialchemie</collection>
    <collection role="institutes" number="">6.1 Oberflächen- und Dünnschichtanalyse</collection>
    <collection role="themenfelder" number="">Material</collection>
    <collection role="themenfelder" number="">Chemie und Prozesstechnik</collection>
    <collection role="fulltextaccess" number="">Datei im Netzwerk der BAM verfügbar ("Closed Access")</collection>
    <collection role="literaturgattung" number="">Präsentation</collection>
    <collection role="themenfelder" number="">Advanced Materials</collection>
  </doc>
  <doc>
    <id>58176</id>
    <completedYear/>
    <publishedYear>2023</publishedYear>
    <thesisYearAccepted/>
    <language>eng</language>
    <pageFirst>12223</pageFirst>
    <pageLast>12231</pageLast>
    <pageNumber/>
    <edition/>
    <issue>33</issue>
    <volume>95</volume>
    <type>article</type>
    <publisherName>American Chemical Society</publisherName>
    <publisherPlace>Columbus, Ohio</publisherPlace>
    <creatingCorporation/>
    <contributingCorporation/>
    <belongsToBibliography>1</belongsToBibliography>
    <completedDate>--</completedDate>
    <publishedDate>--</publishedDate>
    <thesisDateAccepted>--</thesisDateAccepted>
    <title language="eng">Iron Oxide Nanocubes as a New Certified Reference Material for Nanoparticle Size Measurements</title>
    <abstract language="eng">The rational design and increasing industrial use of nanomaterials require a reliable characterization of their physicochemical key properties like size, size distribution, shape, and surface chemistry. This calls for nanoscale reference materials (nanoRMs) for the validation and standardization of commonly used characterization methods closely matching real-world nonspherical nano-objects. This encouraged us to develop a nonspherical nanoRM of very small size consisting of 8 nm iron oxide nanocubes (BAM-N012) to complement spherical gold, silica, and polymer nanoRMs. In the following, the development and production of this nanoRM are highlighted including the characterization by transmission electron microscopy (TEM) and small-angle X-ray scattering (SAXS) as complementary methods for size and shape parameters, homogeneity and stability studies, and calculation of a complete uncertainty budget of the size features. The determination of the nanocubes’ edge length by TEM and SAXS allows a method comparison. In addition, SAXS measurements can also provide the mean particle number density and the mass concentration. The certified size parameters, area equivalent circular diameter and square edge length, determined by TEM with a relative expanded uncertainty below 9%, are metrologically traceable to a natural constant for length, the very precisely known (111) lattice spacing of silicon. Cubic BAM-N012 qualifies as a certified nanoRM for estimating the precision and trueness, validation, and quality assurance of particle size and shape measurements with electron microscopy and SAXS as well as other sizing methods suitable for nanomaterials. The production of this new iron oxide nanocube RM presents an important achievement for the nanomaterial community, nanomaterial manufacturers, and regulators.</abstract>
    <parentTitle language="eng">Analytical chemistry</parentTitle>
    <identifier type="doi">10.1021/acs.analchem.3c00749</identifier>
    <identifier type="issn">0003-2700</identifier>
    <enrichment key="opus.source">publish</enrichment>
    <enrichment key="date_peer_review">11.09.2023</enrichment>
    <enrichment key="PaperofMonth">1</enrichment>
    <author>Sarah-Luise Abram</author>
    <author>Paul Mrkwitschka</author>
    <author>Andreas Thünemann</author>
    <author>Jörg Radnik</author>
    <author>I. Häusler</author>
    <author>Harald Bresch</author>
    <author>Vasile-Dan Hodoroaba</author>
    <author>Ute Resch-Genger</author>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Certification</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>SAXS</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Homogeneity</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Nano</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Particle</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Iron oxide</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Quality assurance</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Reference material</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Size</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Electron microscopy</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Stability</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Shape</value>
    </subject>
    <collection role="ddc" number="543">Analytische Chemie</collection>
    <collection role="ddc" number="620">Ingenieurwissenschaften und zugeordnete Tätigkeiten</collection>
    <collection role="institutes" number="">1 Analytische Chemie; Referenzmaterialien</collection>
    <collection role="institutes" number="">1.2 Biophotonik</collection>
    <collection role="themenfelder" number="">Material</collection>
    <collection role="themenfelder" number="">Chemie und Prozesstechnik</collection>
    <collection role="literaturgattung" number="">Verlagsliteratur</collection>
    <collection role="fulltextaccess" number="">Datei im Netzwerk der BAM verfügbar ("Closed Access")</collection>
    <collection role="themenfelder" number="">Advanced Materials</collection>
  </doc>
  <doc>
    <id>61011</id>
    <completedYear/>
    <publishedYear>2024</publishedYear>
    <thesisYearAccepted/>
    <language>eng</language>
    <pageFirst>S271</pageFirst>
    <pageLast/>
    <pageNumber/>
    <edition/>
    <issue/>
    <volume>399</volume>
    <type>article</type>
    <publisherName>Elsevier B.V.</publisherName>
    <publisherPlace/>
    <creatingCorporation/>
    <contributingCorporation/>
    <belongsToBibliography>1</belongsToBibliography>
    <completedDate>--</completedDate>
    <publishedDate>--</publishedDate>
    <thesisDateAccepted>--</thesisDateAccepted>
    <title language="eng">Data management for image-based characterisation of 2D nano-materials</title>
    <abstract language="eng">The ACCORDs project, funded through Horizon Europe, is pioneering a novel approach to investigate Graphene Family Materials (GFMs) through image analysis. Our aim is to unveil how these materials might influence health and the environment. To achieve this, we are developing a platform designed for the easy retrieval, access, sharing, and utilisation of GFM data and the coordination between biological and physico-chemical data formats. Integral to this platform is an OMERO-based library for image storage, alongside data collection forms and image analysis tools. Efforts are underway to streamline the process for researchers to upload and disseminate their findings, manage information within a database and navigate the data with ease. Adhering to REMBI guidelines, which set the standard for annotating biological images with metadata, we ensure our data collection is comprehensive and adheres to established best practices. Initially, we are employing thresholding and basic machine learning techniques for image segmentation, laying the groundwork for advanced analysis through deep learning to gain more profound insights. Upon completion, the project will deliver a comprehensive platform facilitating efficient data and image management concerning GFMs. This platform will enable the straightforward discovery and use of protocols and results, all organised in accordance with the FAIR principles – Findable, Accessible, Interoperable, and Reusable.&#13;
This initiative is poised to significantly impact materials science, enhancing our comprehension of the safety and environmental implications of 2D materials.</abstract>
    <parentTitle language="eng">Toxicology Letters</parentTitle>
    <identifier type="doi">10.1016/j.toxlet.2024.07.655</identifier>
    <enrichment key="opus_doi_flag">true</enrichment>
    <enrichment key="opus_import_data">{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,3]],"date-time":"2024-09-03T00:19:43Z","timestamp":1725322783860},"reference-count":3,"publisher":"Elsevier BV","license":[{"start":{"date-parts":[[2024,9,1]],"date-time":"2024-09-01T00:00:00Z","timestamp":1725148800000},"content-version":"tdm","delay-in-days":0,"URL":"https:\/\/www.elsevier.com\/tdm\/userlicense\/1.0\/"},{"start":{"date-parts":[[2024,9,1]],"date-time":"2024-09-01T00:00:00Z","timestamp":1725148800000},"content-version":"tdm","delay-in-days":0,"URL":"https:\/\/www.elsevier.com\/legal\/tdmrep-license"}],"content-domain":{"domain":["elsevier.com","sciencedirect.com"],"crossmark-restriction":true},"short-container-title":["Toxicology Letters"],"published-print":{"date-parts":[[2024,9]]},"DOI":"10.1016\/j.toxlet.2024.07.655","type":"journal-article","created":{"date-parts":[[2024,9,2]],"date-time":"2024-09-02T08:57:31Z","timestamp":1725267451000},"page":"S271","update-policy":"http:\/\/dx.doi.org\/10.1016\/elsevier_cm_policy","source":"Crossref","is-referenced-by-count":0,"special_numbering":"S2","title":["P19-45 Data management for image-based characterisation of 2D nano-materials"],"prefix":"10.1016","volume":"399","author":[{"given":"P.P.","family":"Ankli","sequence":"first","affiliation":[]},{"given":"A.","family":"Ali","sequence":"additional","affiliation":[]},{"given":"S.","family":"Hodzic","sequence":"additional","affiliation":[]},{"given":"A.","family":"Logachov","sequence":"additional","affiliation":[]},{"given":"K.","family":"Maciejczuk","sequence":"additional","affiliation":[]},{"given":"A.","family":"Milochiv","sequence":"additional","affiliation":[]},{"given":"S.","family":"Hardy","sequence":"additional","affiliation":[]},{"given":"B.","family":"Hardy","sequence":"additional","affiliation":[]},{"given":"S.","family":"Novak","sequence":"additional","affiliation":[]},{"given":"E.","family":"Kranjc","sequence":"additional","affiliation":[]},{"given":"V.","family":"Kononenko","sequence":"additional","affiliation":[]},{"given":"S.","family":"Saje","sequence":"additional","affiliation":[]},{"given":"D.","family":"Hodoroaba","sequence":"additional","affiliation":[]},{"given":"J.","family":"Radnik","sequence":"additional","affiliation":[]},{"given":"L.","family":"Akmal","sequence":"additional","affiliation":[]},{"given":"P.","family":"Mrkwitschka","sequence":"additional","affiliation":[]},{"given":"F.","family":"Pellegrino","sequence":"additional","affiliation":[]},{"given":"A.","family":"Rossi","sequence":"additional","affiliation":[]},{"given":"E.","family":"Alladio","sequence":"additional","affiliation":[]},{"given":"F.","family":"Sordello","sequence":"additional","affiliation":[]},{"given":"M.","family":"Gulumian","sequence":"additional","affiliation":[]},{"given":"E.","family":"Valsami-Jones","sequence":"additional","affiliation":[]},{"given":"C.","family":"Andraos","sequence":"additional","affiliation":[]},{"given":"V.","family":"Wepener","sequence":"additional","affiliation":[]},{"given":"K.","family":"Jurkschat","sequence":"additional","affiliation":[]},{"given":"E.","family":"Jones","sequence":"additional","affiliation":[]},{"given":"D.","family":"Singh","sequence":"additional","affiliation":[]},{"given":"B.","family":"Ibrahim","sequence":"additional","affiliation":[]},{"given":"M.","family":"van der Zande","sequence":"additional","affiliation":[]},{"given":"D.","family":"Fernandez-Poulussen","sequence":"additional","affiliation":[]},{"given":"P.","family":"Queipo","sequence":"additional","affiliation":[]},{"given":"D.","family":"Drobne","sequence":"additional","affiliation":[]}],"member":"78","reference":[{"key":"10.1016\/j.toxlet.2024.07.655_bib1","author":"Allan"},{"key":"10.1016\/j.toxlet.2024.07.655_bib2","author":"Sarkans"},{"key":"10.1016\/j.toxlet.2024.07.655_bib3","doi-asserted-by":"crossref","first-page":"160018","DOI":"10.1038\/sdata.2016.18","article-title":"The FAIR Guiding Principles for Scientific Data Management and Stewardship","volume":"3","author":"Wilkinson","year":"2016","journal-title":"Sci Data"}],"container-title":["Toxicology Letters"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/api.elsevier.com\/content\/article\/PII:S0378427424017351?httpAccept=text\/xml","content-type":"text\/xml","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/api.elsevier.com\/content\/article\/PII:S0378427424017351?httpAccept=text\/plain","content-type":"text\/plain","content-version":"vor","intended-application":"text-mining"}],"deposited":{"date-parts":[[2024,9,2]],"date-time":"2024-09-02T08:57:34Z","timestamp":1725267454000},"score":1,"resource":{"primary":{"URL":"https:\/\/linkinghub.elsevier.com\/retrieve\/pii\/S0378427424017351"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024,9]]},"references-count":3,"alternative-id":["S0378427424017351"],"URL":"http:\/\/dx.doi.org\/10.1016\/j.toxlet.2024.07.655","relation":{},"ISSN":["0378-4274"],"issn-type":[{"value":"0378-4274","type":"print"}],"subject":[],"published":{"date-parts":[[2024,9]]},"assertion":[{"value":"Elsevier","name":"publisher","label":"This article is maintained by"},{"value":"P19-45 Data management for image-based characterisation of 2D nano-materials","name":"articletitle","label":"Article Title"},{"value":"Toxicology Letters","name":"journaltitle","label":"Journal Title"},{"value":"https:\/\/doi.org\/10.1016\/j.toxlet.2024.07.655","name":"articlelink","label":"CrossRef DOI link to publisher maintained version"},{"value":"simple-article","name":"content_type","label":"Content Type"},{"value":"Copyright \u00a9 2024 Elsevier B.V. All rights are reserved, including those for text and data mining, AI training, and similar technologies.","name":"copyright","label":"Copyright"}]}}</enrichment>
    <enrichment key="local_crossrefDocumentType">journal-article</enrichment>
    <enrichment key="opus.source">publish</enrichment>
    <enrichment key="date_peer_review">11.11.2024</enrichment>
    <author>P.P. Ankli</author>
    <author>A. Ali</author>
    <author>S. Hodzic</author>
    <author>A. Logachov</author>
    <author>K. Maciejczuk</author>
    <author>A. Milochiv</author>
    <author>S. Hardy</author>
    <author>B. Hardy</author>
    <author>S. Novak</author>
    <author>E. Kranjc</author>
    <author>V. Kononenko</author>
    <author>S. Saje</author>
    <author>Vasile-Dan Hodoroaba</author>
    <author>Jörg Radnik</author>
    <author>Loay Akmal</author>
    <author>Paul Mrkwitschka</author>
    <author>F. Pellegrino</author>
    <author>A. Rossi</author>
    <author>E. Alladio</author>
    <author>F. Sordello</author>
    <author>M. Gulumian</author>
    <author>E. Valsami-Jones</author>
    <author>C. Andraos</author>
    <author>V. Wepener</author>
    <author>K. Jurkschat</author>
    <author>E. Jones</author>
    <author>D. Singh</author>
    <author>B. Ibrahim</author>
    <author>M. van der Zande</author>
    <author>D. Fernandez-Poulussen</author>
    <author>P. Queipo</author>
    <author>D. Drobne</author>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Graphene</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Image analysis</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Data management</value>
    </subject>
    <collection role="ddc" number="620">Ingenieurwissenschaften und zugeordnete Tätigkeiten</collection>
    <collection role="institutes" number="">6 Materialchemie</collection>
    <collection role="institutes" number="">6.1 Oberflächen- und Dünnschichtanalyse</collection>
    <collection role="themenfelder" number="">Material</collection>
    <collection role="literaturgattung" number="">Verlagsliteratur</collection>
    <collection role="fulltextaccess" number="">Datei im Netzwerk der BAM verfügbar ("Closed Access")</collection>
    <collection role="themenfelder" number="">Advanced Materials</collection>
  </doc>
  <doc>
    <id>58990</id>
    <completedYear/>
    <publishedYear>2023</publishedYear>
    <thesisYearAccepted/>
    <language>eng</language>
    <pageFirst>1</pageFirst>
    <pageLast>12</pageLast>
    <pageNumber/>
    <edition/>
    <issue>15</issue>
    <volume>221</volume>
    <type>article</type>
    <publisherName>Wiley-VCH GmbH</publisherName>
    <publisherPlace>Weinheim</publisherPlace>
    <creatingCorporation/>
    <contributingCorporation/>
    <belongsToBibliography>1</belongsToBibliography>
    <completedDate>--</completedDate>
    <publishedDate>--</publishedDate>
    <thesisDateAccepted>--</thesisDateAccepted>
    <title language="eng">Chemical and topographical changes upon sub-100-nm laser-induced periodic surface structure formation on titanium alloy: the influence of laser pulse repetition rate and number of over-scans</title>
    <abstract language="eng">Titanium and its alloys are known to allow the straightforward laser-based manufacturing of ordered surface nanostructures, so-called high spatial frequency laser-induced periodic surface structures (HSFL). These structures exhibit sub-100 nm spatial periods – far below the optical diffraction limit. The resulting surface functionalities are usually enabled by both, topographic and chemical alterations of the nanostructured surfaces. For exploring these effects, multi-method characterizations were performed here for HSFL processed on Ti–6Al–4V alloy upon irradiation with near-infrared ps-laser pulses (1030 nm, ≈1 ps pulse duration, 1–400 kHz) under different laser scan processing conditions, i.e., by systematically varying the pulse repetition frequency and the number of laser irradiation passes. The sample characterization involved morphological and topographical investigations by scanning electron microscopy (SEM), atomic force microscopy (AFM), tactile stylus profilometry, as well as near-surface chemical analyses hard X-ray photoelectron spectroscopy (HAXPES) and depth-profiling time-of-flight secondary ion mass spectrometry (ToF-SIMS). This provides a quantification of the laser ablation depth, the geometrical HSFL characteristics and enables new insights into the depth extent and the nature of the non-ablative laser-induced near-surface oxidation accompanying these nanostructures. This allows to answer the questions how the processing of HSFL can be industrially scaled up, and whether the latter is limited by heat-accumulation effects.</abstract>
    <parentTitle language="eng">Physica Status Solidi A</parentTitle>
    <identifier type="issn">1862-6319</identifier>
    <identifier type="url">https://onlinelibrary.wiley.com/doi/full/10.1002/pssa.202300719</identifier>
    <identifier type="doi">10.1002/pssa.202300719</identifier>
    <identifier type="urn">urn:nbn:de:kobv:b43-589902</identifier>
    <enrichment key="eventName">2023 E-MRS Spring Meeting, Symposium L "Making light matter: lasers in material sciences and photonics"</enrichment>
    <enrichment key="eventPlace">Strasbourg, France</enrichment>
    <enrichment key="eventStart">29.05.2023</enrichment>
    <enrichment key="eventEnd">02.06.2023</enrichment>
    <enrichment key="opus.source">publish</enrichment>
    <enrichment key="PaperofMonth">1</enrichment>
    <enrichment key="date_peer_review">19.08.2024</enrichment>
    <licence>Creative Commons - CC BY - Namensnennung 4.0 International</licence>
    <author>Kai Müller</author>
    <author>Francesca Mirabella</author>
    <author>Xenia Knigge</author>
    <author>Marek Mezera</author>
    <author>Matthias Weise</author>
    <author>Mario Sahre</author>
    <author>Karsten Wasmuth</author>
    <author>Heike Voss</author>
    <author>Andreas Hertwig</author>
    <author>Jörg Krüger</author>
    <author>Jörg Radnik</author>
    <author>Vasile-Dan Hodoroaba</author>
    <author>Jörn Bonse</author>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Laser-induced periodic surface structures (LIPSS)</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Ultrashort laser pulses</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Laser processing</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Hard X-ray photoelectron spectroscopy (HAXPES)</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Time-of-flight secondary ion mass spectrometry (ToF-SIMS)</value>
    </subject>
    <collection role="ddc" number="620">Ingenieurwissenschaften und zugeordnete Tätigkeiten</collection>
    <collection role="ddc" number="621">Angewandte Physik</collection>
    <collection role="institutes" number="">6 Materialchemie</collection>
    <collection role="institutes" number="">6.1 Oberflächen- und Dünnschichtanalyse</collection>
    <collection role="institutes" number="">6.2 Material- und Oberflächentechnologien</collection>
    <collection role="themenfelder" number="">Energie</collection>
    <collection role="themenfelder" number="">Material</collection>
    <collection role="literaturgattung" number="">Verlagsliteratur</collection>
    <collection role="fulltextaccess" number="">Datei für die Öffentlichkeit verfügbar ("Open Access")</collection>
    <collection role="unnumberedseries" number="">Wissenschaftliche Artikel der BAM</collection>
    <collection role="themenfelder" number="">Advanced Materials</collection>
    <thesisPublisher>Bundesanstalt für Materialforschung und -prüfung (BAM)</thesisPublisher>
    <file>https://opus4.kobv.de/opus4-bam/files/58990/2023-Mueller_PSSA220_2300719.pdf</file>
  </doc>
  <doc>
    <id>61657</id>
    <completedYear/>
    <publishedYear>2024</publishedYear>
    <thesisYearAccepted/>
    <language>eng</language>
    <pageFirst>1</pageFirst>
    <pageLast>6</pageLast>
    <pageNumber/>
    <edition/>
    <issue/>
    <volume/>
    <type>article</type>
    <publisherName>Wiley</publisherName>
    <publisherPlace/>
    <creatingCorporation/>
    <contributingCorporation/>
    <belongsToBibliography>1</belongsToBibliography>
    <completedDate>--</completedDate>
    <publishedDate>--</publishedDate>
    <thesisDateAccepted>--</thesisDateAccepted>
    <title language="eng">A New XPS Test Material for More Reliable Analysis of Microstructures</title>
    <abstract language="eng">A reference material is required for small‐area XPS because it has been used more frequently for surface control in recent years and many operators use incorrect field of views. To address this problem, we developed a test material starting in 2019. We optimised this XPS test material dedicated to the control of analysis position on the sample, with respect to the following factors: type of XPS instruments available on the market, the manufacturing process and sample handling. Test structures are now aligned along lines instead of on a circle radius, so that the individual structures can be accessed more quickly and easily. In addition, a larger test structure of 300 μm and another one in an intermediate size of 18 μm were added. Smaller test structures under 50 μm have been annotated with finder grids/arrows around them so that they are easier to find. Further, the manufacturing process was changed from e‐beam lithography to a mask process to be able to offer the test material at a favourable price. The use of masks also had to be adapted for the new manufacturing process so that the smallest square structures are also realised as such and do not show any distortion of the structure boundaries. The quality control using a metrological SEM confirmed a very reproducible manufacturing process. It is demonstrated that the test material can be successfully employed to find the most suitable beam size of the XPS system used for the analysis of small (μm range) surface features.</abstract>
    <parentTitle language="eng">Surface and Interface Analysis</parentTitle>
    <identifier type="doi">10.1002/sia.7367</identifier>
    <identifier type="urn">urn:nbn:de:kobv:b43-616577</identifier>
    <enrichment key="opus_doi_flag">true</enrichment>
    <enrichment key="opus_import_data">{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,11,14]],"date-time":"2024-11-14T05:29:23Z","timestamp":1731562163930,"version":"3.28.0"},"reference-count":17,"publisher":"Wiley","license":[{"start":{"date-parts":[[2024,11,13]],"date-time":"2024-11-13T00:00:00Z","timestamp":1731456000000},"content-version":"vor","delay-in-days":0,"URL":"http:\/\/creativecommons.org\/licenses\/by\/4.0\/"}],"content-domain":{"domain":["analyticalsciencejournals.onlinelibrary.wiley.com"],"crossmark-restriction":true},"short-container-title":["Surface &amp;amp; Interface Analysis"],"abstract":"&lt;jats:title&gt;ABSTRACT&lt;\/jats:title&gt;&lt;jats:p&gt;A reference material is required for small\u2010area XPS because it has been used more frequently for surface control in recent years and many operators use incorrect field of views. To address this problem, we developed a test material starting in 2019. We optimised this XPS test material dedicated to the control of analysis position on the sample, with respect to the following factors: type of XPS instruments available on the market, the manufacturing process and sample handling. Test structures are now aligned along lines instead of on a circle radius, so that the individual structures can be accessed more quickly and easily. In addition, a larger test structure of 300\u2009\u03bcm and another one in an intermediate size of 18\u2009\u03bcm were added. Smaller test structures under 50\u2009\u03bcm have been annotated with finder grids\/arrows around them so that they are easier to find. Further, the manufacturing process was changed from e\u2010beam lithography to a mask process to be able to offer the test material at a favourable price. The use of masks also had to be adapted for the new manufacturing process so that the smallest square structures are also realised as such and do not show any distortion of the structure boundaries. The quality control using a metrological SEM confirmed a very reproducible manufacturing process. It is demonstrated that the test material can be successfully employed to find the most suitable beam size of the XPS system used for the analysis of small (\u03bcm range) surface features.&lt;\/jats:p&gt;","DOI":"10.1002\/sia.7367","type":"journal-article","created":{"date-parts":[[2024,11,14]],"date-time":"2024-11-14T00:40:57Z","timestamp":1731544857000},"update-policy":"http:\/\/dx.doi.org\/10.1002\/crossmark_policy","source":"Crossref","is-referenced-by-count":0,"title":["A New XPS Test Material for More Reliable Analysis of Microstructures"],"prefix":"10.1002","author":[{"ORCID":"http:\/\/orcid.org\/0000-0001-5856-5504","authenticated-orcid":false,"given":"J\u00f6rg\u00a0M.","family":"Stockmann","sequence":"first","affiliation":[{"name":"Division 6.1 Surface and Thin Film Analysis Bundesanstalt f\u00fcr Materialforschung und\u2010pr\u00fcfung (BAM)  Berlin Germany"}]},{"ORCID":"http:\/\/orcid.org\/0000-0003-0302-6815","authenticated-orcid":false,"given":"J\u00f6rg","family":"Radnik","sequence":"additional","affiliation":[{"name":"Division 6.1 Surface and Thin Film Analysis Bundesanstalt f\u00fcr Materialforschung und\u2010pr\u00fcfung (BAM)  Berlin Germany"}]},{"given":"Sebastian","family":"B\u00fctefisch","sequence":"additional","affiliation":[{"name":"Physikalisch\u2010Technische Bundesanstalt (PTB), Scanning Probe Metrology  Braunschweig Germany"}]},{"given":"Thomas","family":"Weimann","sequence":"additional","affiliation":[{"name":"Physikalisch\u2010Technische Bundesanstalt (PTB), Nanostructuring and Clean Room Center Infrastructure  Braunschweig Germany"}]},{"ORCID":"http:\/\/orcid.org\/0000-0002-7901-6114","authenticated-orcid":false,"given":"Vasile\u2010Dan","family":"Hodoroaba","sequence":"additional","affiliation":[{"name":"Division 6.1 Surface and Thin Film Analysis Bundesanstalt f\u00fcr Materialforschung und\u2010pr\u00fcfung (BAM)  Berlin Germany"}]}],"member":"311","published-online":{"date-parts":[[2024,11,13]]},"reference":[{"key":"e_1_2_6_2_1","doi-asserted-by":"publisher","DOI":"10.1016\/0169-4332(90)90002-H"},{"key":"e_1_2_6_3_1","doi-asserted-by":"publisher","DOI":"10.1016\/j.spmi.2008.10.002"},{"key":"e_1_2_6_4_1","doi-asserted-by":"publisher","DOI":"10.1002\/sia.2904"},{"key":"e_1_2_6_5_1","doi-asserted-by":"publisher","DOI":"10.1016\/j.elspec.2017.12.008"},{"key":"e_1_2_6_6_1","doi-asserted-by":"publisher","DOI":"10.1002\/sia.1201"},{"key":"e_1_2_6_7_1","doi-asserted-by":"publisher","DOI":"10.1016\/j.elspec.2018.03.002"},{"key":"e_1_2_6_8_1","doi-asserted-by":"publisher","DOI":"10.1002\/sia.6456"},{"key":"e_1_2_6_9_1","doi-asserted-by":"publisher","DOI":"10.3390\/met10111504"},{"key":"e_1_2_6_10_1","doi-asserted-by":"publisher","DOI":"10.1002\/sia.7277"},{"key":"e_1_2_6_11_1","doi-asserted-by":"publisher","DOI":"10.1017\/S1431927621005766"},{"key":"e_1_2_6_12_1","doi-asserted-by":"publisher","DOI":"10.1002\/sia.2731"},{"key":"e_1_2_6_13_1","doi-asserted-by":"publisher","DOI":"10.1116\/6.0000873"},{"key":"e_1_2_6_14_1","doi-asserted-by":"publisher","DOI":"10.1002\/1096-9918(200011)29:11&lt;766::AID-SIA927&gt;3.0.CO;2-Y"},{"key":"e_1_2_6_15_1","doi-asserted-by":"publisher","DOI":"10.1002\/sia.2662"},{"key":"e_1_2_6_16_1","doi-asserted-by":"publisher","DOI":"10.1116\/6.0000398"},{"key":"e_1_2_6_17_1","doi-asserted-by":"publisher","DOI":"10.1002\/sia.6831"},{"key":"e_1_2_6_18_1","unstructured":"ISO 15472:2010 Surface Chemical Analysis \u2014 X\u2010Ray Photoelectron Spectrometers \u2014Calibration of Energy Scales. Geneva 2010."}],"container-title":["Surface and Interface Analysis"],"original-title":[],"language":"en","deposited":{"date-parts":[[2024,11,14]],"date-time":"2024-11-14T00:40:59Z","timestamp":1731544859000},"score":1,"resource":{"primary":{"URL":"https:\/\/analyticalsciencejournals.onlinelibrary.wiley.com\/doi\/10.1002\/sia.7367"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024,11,13]]},"references-count":17,"alternative-id":["10.1002\/sia.7367"],"URL":"http:\/\/dx.doi.org\/10.1002\/sia.7367","archive":["Portico"],"relation":{},"ISSN":["0142-2421","1096-9918"],"issn-type":[{"value":"0142-2421","type":"print"},{"value":"1096-9918","type":"electronic"}],"subject":[],"published":{"date-parts":[[2024,11,13]]},"assertion":[{"value":"2024-07-18","order":0,"name":"received","label":"Received","group":{"name":"publication_history","label":"Publication History"}},{"value":"2024-09-16","order":2,"name":"accepted","label":"Accepted","group":{"name":"publication_history","label":"Publication History"}},{"value":"2024-11-13","order":3,"name":"published","label":"Published","group":{"name":"publication_history","label":"Publication History"}}]}}</enrichment>
    <enrichment key="local_crossrefDocumentType">journal-article</enrichment>
    <enrichment key="opus.source">publish</enrichment>
    <enrichment key="date_peer_review">02.12.2024</enrichment>
    <licence>Creative Commons - CC BY - Namensnennung 4.0 International</licence>
    <author>Jörg Manfred Stockmann</author>
    <author>Jörg Radnik</author>
    <author>Sebastian Bütefisch</author>
    <author>Thomas Weimann</author>
    <author>Vasile-Dan Hodoroaba</author>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Small-area measurements</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Test material</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>XPS</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>XPS imaging</value>
    </subject>
    <collection role="ddc" number="620">Ingenieurwissenschaften und zugeordnete Tätigkeiten</collection>
    <collection role="institutes" number="">6 Materialchemie</collection>
    <collection role="institutes" number="">6.1 Oberflächen- und Dünnschichtanalyse</collection>
    <collection role="themenfelder" number="">Material</collection>
    <collection role="literaturgattung" number="">Verlagsliteratur</collection>
    <collection role="fulltextaccess" number="">Datei für die Öffentlichkeit verfügbar ("Open Access")</collection>
    <collection role="unnumberedseries" number="">Wissenschaftliche Artikel der BAM</collection>
    <collection role="themenfelder" number="">Advanced Materials</collection>
    <thesisPublisher>Bundesanstalt für Materialforschung und -prüfung (BAM)</thesisPublisher>
    <file>https://opus4.kobv.de/opus4-bam/files/61657/SIA_2024_StockmannEtAl_XPSTM.pdf</file>
    <file>https://opus4.kobv.de/opus4-bam/files/61657/sia7367_sup0001_SI.pdf</file>
  </doc>
  <doc>
    <id>64290</id>
    <completedYear/>
    <publishedYear>2025</publishedYear>
    <thesisYearAccepted/>
    <language>eng</language>
    <pageFirst/>
    <pageLast/>
    <pageNumber/>
    <edition/>
    <issue/>
    <volume/>
    <type>lecture</type>
    <publisherName/>
    <publisherPlace/>
    <creatingCorporation/>
    <contributingCorporation/>
    <belongsToBibliography>0</belongsToBibliography>
    <completedDate>--</completedDate>
    <publishedDate>--</publishedDate>
    <thesisDateAccepted>--</thesisDateAccepted>
    <title language="eng">The role of Critical Raw Materials in Advanced Materials for the Energy Transition</title>
    <abstract language="eng">The energy transition needs advanced materials, especially for batteries, solar cells, and fuel cells. Therefore, critical raw materials are necessary. In this presentation the use of critcal raw materials and strategies for the optimisation of their use are discussed.</abstract>
    <enrichment key="eventName">Critical Raw Material Workshop during VAMAS Annual Meeting</enrichment>
    <enrichment key="eventPlace">Teddington, United Kingdom</enrichment>
    <enrichment key="eventStart">17.09.2025</enrichment>
    <enrichment key="InvitedTalks">1</enrichment>
    <enrichment key="opus.source">publish</enrichment>
    <enrichment key="opus.doi.autoCreate">false</enrichment>
    <enrichment key="opus.urn.autoCreate">true</enrichment>
    <author>Jörg Radnik</author>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Advanced solar cells</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Iridium oxide</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Aerogels</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Advanced carbon materials</value>
    </subject>
    <collection role="ddc" number="620">Ingenieurwissenschaften und zugeordnete Tätigkeiten</collection>
    <collection role="institutes" number="">6 Materialchemie</collection>
    <collection role="institutes" number="">6.1 Oberflächen- und Dünnschichtanalyse</collection>
    <collection role="themenfelder" number="">Energie</collection>
    <collection role="themenfelder" number="">Elektrische Energiespeicher und -umwandlung</collection>
    <collection role="themenfelder" number="">Material</collection>
    <collection role="fulltextaccess" number="">Datei im Netzwerk der BAM verfügbar ("Closed Access")</collection>
    <collection role="literaturgattung" number="">Präsentation</collection>
    <collection role="themenfelder" number="">Advanced Materials</collection>
  </doc>
  <doc>
    <id>63804</id>
    <completedYear/>
    <publishedYear>2025</publishedYear>
    <thesisYearAccepted/>
    <language>eng</language>
    <pageFirst>442</pageFirst>
    <pageLast>443</pageLast>
    <pageNumber/>
    <edition/>
    <issue>7</issue>
    <volume>31</volume>
    <type>article</type>
    <publisherName>Oxford Academic</publisherName>
    <publisherPlace/>
    <creatingCorporation/>
    <contributingCorporation/>
    <belongsToBibliography>0</belongsToBibliography>
    <completedDate>--</completedDate>
    <publishedDate>--</publishedDate>
    <thesisDateAccepted>--</thesisDateAccepted>
    <title language="eng">Morphological Analysis of Graphene Oxide by Scanning Electron Microscopy and Correlative Field-flow Fractionation Coupled with Multi-angle Light Scattering</title>
    <abstract language="eng">In this paper graphene related 2D materials (GR2M) arre investigated by centrifugal field flow fractioning (CF3) and SEM. Three materials were selected as case studies (CS): graphene „HD-G (CS I), graphene oxide UniTo“ (CS II), and graphene oxide „Graphenea“ (CS III). For CS I particles were evaluated as constituent particles in agglomerates, for the other two materials only isolated (non aggregated/agglomerated) flakes were considered for determination of the area equivalent circular diameter (ECD).&#13;
Size analysis of all three materials was carried out by CF3 coupled with MALS (Multi-Angle Light Scattering). For evaluation, it was found that the data obtained was best suited to a disc model.  Results are in good agreement when compared to the sizes obtained before CF3 analysis. CS II material is too heterogenous to accurately determine flake size by imaging. CF3 coupled with MALS enables to assess fractions within the highly heterogenous material of CS II.&#13;
Imaging of the material in CS III after CF3 measurement indicates that the procedure is non-destructive. This could not be verified for the CS‘s I &amp; II  &#13;
As a next step we plan to analyse the fractionated samples by imaging them within a SEM wet-cell.</abstract>
    <parentTitle language="eng">Microscopy and Microanalysis</parentTitle>
    <identifier type="doi">10.1093/mam/ozaf048.222</identifier>
    <enrichment key="opus.source">publish</enrichment>
    <enrichment key="opus.doi.autoCreate">false</enrichment>
    <enrichment key="opus.urn.autoCreate">true</enrichment>
    <author>Paul Mrkwitschka</author>
    <author>Michaela Mühlbauer</author>
    <author>Andrea Rossi</author>
    <author>Francesco Pellegrino</author>
    <author>Amaia Zurutuza</author>
    <author>Jörg Radnik</author>
    <author>Florian Meier</author>
    <author>Vasile-Dan Hodoroaba</author>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>2D Materials</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>SEM</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Centrifugal field flow fractionation (CF3)</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Imaging</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Size distribution</value>
    </subject>
    <collection role="ddc" number="620">Ingenieurwissenschaften und zugeordnete Tätigkeiten</collection>
    <collection role="institutes" number="">6 Materialchemie</collection>
    <collection role="institutes" number="">6.1 Oberflächen- und Dünnschichtanalyse</collection>
    <collection role="themenfelder" number="">Material</collection>
    <collection role="literaturgattung" number="">Verlagsliteratur</collection>
    <collection role="fulltextaccess" number="">Datei im Netzwerk der BAM verfügbar ("Closed Access")</collection>
    <collection role="themenfelder" number="">Advanced Materials</collection>
  </doc>
  <doc>
    <id>64959</id>
    <completedYear/>
    <publishedYear>2025</publishedYear>
    <thesisYearAccepted/>
    <language>eng</language>
    <pageFirst/>
    <pageLast/>
    <pageNumber/>
    <edition/>
    <issue/>
    <volume/>
    <type>lecture</type>
    <publisherName/>
    <publisherPlace/>
    <creatingCorporation/>
    <contributingCorporation/>
    <belongsToBibliography>0</belongsToBibliography>
    <completedDate>--</completedDate>
    <publishedDate>--</publishedDate>
    <thesisDateAccepted>--</thesisDateAccepted>
    <title language="eng">Methodologies implemented to measure key properties of graphene and other 2D materials</title>
    <abstract language="eng">The key properties and suitable measurement methods for the characterization of graphene-related 2D materials are presented. A case study will be discussed about the chemical characterisation of functionalised graphene used in inks along the production chain.</abstract>
    <enrichment key="eventName">European-African Graphene Workshop</enrichment>
    <enrichment key="eventPlace">Parys, South Africa</enrichment>
    <enrichment key="eventStart">26.11.2025</enrichment>
    <enrichment key="eventEnd">27.11.2025</enrichment>
    <enrichment key="InvitedTalks">1</enrichment>
    <enrichment key="opus.source">publish</enrichment>
    <enrichment key="opus.doi.autoCreate">false</enrichment>
    <enrichment key="opus.urn.autoCreate">true</enrichment>
    <author>Jörg Radnik</author>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>X-ray photoelectron spectroscoyp</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Raman spectroscopy</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Defects</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Surface Chemistry</value>
    </subject>
    <collection role="ddc" number="620">Ingenieurwissenschaften und zugeordnete Tätigkeiten</collection>
    <collection role="institutes" number="">6 Materialchemie</collection>
    <collection role="institutes" number="">6.1 Oberflächen- und Dünnschichtanalyse</collection>
    <collection role="themenfelder" number="">Material</collection>
    <collection role="fulltextaccess" number="">Datei im Netzwerk der BAM verfügbar ("Closed Access")</collection>
    <collection role="literaturgattung" number="">Präsentation</collection>
    <collection role="themenfelder" number="">Advanced Materials</collection>
  </doc>
  <doc>
    <id>57652</id>
    <completedYear/>
    <publishedYear>2023</publishedYear>
    <thesisYearAccepted/>
    <language>eng</language>
    <pageFirst/>
    <pageLast/>
    <pageNumber/>
    <edition/>
    <issue/>
    <volume/>
    <type>lecture</type>
    <publisherName/>
    <publisherPlace/>
    <creatingCorporation/>
    <contributingCorporation/>
    <belongsToBibliography>0</belongsToBibliography>
    <completedDate>--</completedDate>
    <publishedDate>--</publishedDate>
    <thesisDateAccepted>--</thesisDateAccepted>
    <title language="eng">Reliable Chemical Characterization Protocols for Industrial Graphene-Related Materials</title>
    <abstract language="eng">Since its isolation, graphene has received growing attention from academia and industry due to its unique properties. Promising opportunities for applications are discussed in different field like electronics and optoelectronics, detection, and sensing devices, biosystems or chemical and environmental corrosion inhibition. Here, functionalization with elements like oxygen, nitrogen or fluorine can broaden the application, for example in composite materials. However, lack of generally accepted operation procedures hinders the commercialization, the so-called “what is my material” barrier. Therefore, first efforts were done to develop common, reliable, and reproducible ways to characterize the morphological and chemical properties of the industrially produced material. &#13;
In this contribution, our efforts in the development of reliable chemical characterizations protocols for functionalized graphene are presented. An ISO standard for the chemical characterization of graphene-related (GRM) is under development with X-ray photoelectron spectroscopy (XPS) having a prominent role. With its information depth of around 10 nm, which is the similar length scale as the thickness of particles of 2D materials consisting of a few monolayers, XPS seems to be highly suitable for the quantitative analysis of (functionalized) GRM. Thereby, different sample preparation methods like pressing the powders onto adhesive tapes, into recesses, or into solid pellets result in inconsistencies in the quantification. Furthermore, different morphologies like stacks of graphene layers (left figure) or irregular particles (right figure) lead to different analysis results for the chemical composition. &#13;
For the validation of the quantification with XPS and the further development of standards an international interlaboratory comparison was initiated under the head of the “Versailles Project on Advanced Materials and Standards” (VAMAS). First results are reported showing the suitability of the protocols. Finally, the XPS results are compared with the elemental composition results obtained after quantification with energy-dispersive X-ray spectroscopy (EDS) as a fast analytical method which is usually combined with electron microscopy.</abstract>
    <enrichment key="eventName">nanoSAFE 2023</enrichment>
    <enrichment key="eventPlace">Grenoble, France</enrichment>
    <enrichment key="eventStart">05.06.2023</enrichment>
    <enrichment key="eventEnd">08.06.2023</enrichment>
    <enrichment key="opus.source">publish</enrichment>
    <enrichment key="opus.doi.autoCreate">false</enrichment>
    <enrichment key="opus.urn.autoCreate">true</enrichment>
    <enrichment key="InvitedTalks">0</enrichment>
    <author>Jörg Radnik</author>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>X-ray photoelectron spectroscopy</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Functionalized graphene</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Interlaboratory comparison</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>VAMAS</value>
    </subject>
    <collection role="ddc" number="543">Analytische Chemie</collection>
    <collection role="ddc" number="620">Ingenieurwissenschaften und zugeordnete Tätigkeiten</collection>
    <collection role="institutes" number="">6 Materialchemie</collection>
    <collection role="institutes" number="">6.1 Oberflächen- und Dünnschichtanalyse</collection>
    <collection role="themenfelder" number="">Material</collection>
    <collection role="themenfelder" number="">Chemie und Prozesstechnik</collection>
    <collection role="fulltextaccess" number="">Datei im Netzwerk der BAM verfügbar ("Closed Access")</collection>
    <collection role="literaturgattung" number="">Präsentation</collection>
    <collection role="themenfelder" number="">Advanced Materials</collection>
  </doc>
  <doc>
    <id>63733</id>
    <completedYear/>
    <publishedYear>2025</publishedYear>
    <thesisYearAccepted/>
    <language>eng</language>
    <pageFirst/>
    <pageLast/>
    <pageNumber/>
    <edition/>
    <issue/>
    <volume/>
    <type>lecture</type>
    <publisherName/>
    <publisherPlace/>
    <creatingCorporation/>
    <contributingCorporation/>
    <belongsToBibliography>0</belongsToBibliography>
    <completedDate>--</completedDate>
    <publishedDate>--</publishedDate>
    <thesisDateAccepted>--</thesisDateAccepted>
    <title language="eng">Deep Insights into Functionalised Nanoparticles with Photoelectron Spectroscopy</title>
    <abstract language="eng">Modern instrumentation X-ray photoelectron instrumentation combines soft and hard X-rays. Additonally, in the last years methods were developed for the analysis of the measurement data to elucidate the composition and thickness of coatings of nanoparticles. In this presentation four examples will be presented: quantum dots, silica-coated iron-oxide nanoparticles, mixed Fe-Ni-O nanoparticles and amine-functionalized silica nanoparticles. These different nanoparticles are used for displays, for biomedicine, for water splitting, and as additives and fillers.</abstract>
    <enrichment key="eventName">United Kingdom Surface Analysis Forum Meeting 2025</enrichment>
    <enrichment key="eventPlace">Teddington, UK</enrichment>
    <enrichment key="eventStart">15.07.2025</enrichment>
    <enrichment key="eventEnd">16.07.2025</enrichment>
    <enrichment key="InvitedTalks">1</enrichment>
    <enrichment key="opus.source">publish</enrichment>
    <enrichment key="opus.doi.autoCreate">false</enrichment>
    <enrichment key="opus.urn.autoCreate">true</enrichment>
    <author>Jörg Radnik</author>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Simulation</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Oxygen evolution reaction</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Transmission electron microscopy</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Quantitative nuclear magnetic resonance (qNMR)</value>
    </subject>
    <collection role="ddc" number="620">Ingenieurwissenschaften und zugeordnete Tätigkeiten</collection>
    <collection role="institutes" number="">6 Materialchemie</collection>
    <collection role="institutes" number="">6.1 Oberflächen- und Dünnschichtanalyse</collection>
    <collection role="themenfelder" number="">Material</collection>
    <collection role="fulltextaccess" number="">Datei im Netzwerk der BAM verfügbar ("Closed Access")</collection>
    <collection role="literaturgattung" number="">Präsentation</collection>
    <collection role="themenfelder" number="">Advanced Materials</collection>
  </doc>
  <doc>
    <id>57650</id>
    <completedYear/>
    <publishedYear>2023</publishedYear>
    <thesisYearAccepted/>
    <language>eng</language>
    <pageFirst/>
    <pageLast/>
    <pageNumber/>
    <edition/>
    <issue/>
    <volume/>
    <type>lecture</type>
    <publisherName/>
    <publisherPlace/>
    <creatingCorporation/>
    <contributingCorporation/>
    <belongsToBibliography>0</belongsToBibliography>
    <completedDate>--</completedDate>
    <publishedDate>--</publishedDate>
    <thesisDateAccepted>--</thesisDateAccepted>
    <title language="eng">VAMAS Project A33: Chemical composition of functionalized graphene with X ray photoelectron spectroscopy (XPS)</title>
    <abstract language="eng">The results of the interlaboratory comparison about the chemical composition of functionalized graphene are presented.</abstract>
    <enrichment key="eventName">DIN Meeting  NA 062-08-16 AA</enrichment>
    <enrichment key="eventPlace">Berlin, Germany</enrichment>
    <enrichment key="eventStart">25.05.2023</enrichment>
    <enrichment key="opus.source">publish</enrichment>
    <enrichment key="opus.doi.autoCreate">false</enrichment>
    <enrichment key="opus.urn.autoCreate">true</enrichment>
    <enrichment key="InvitedTalks">0</enrichment>
    <author>Jörg Radnik</author>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>X-ray photoelectron spectroscopy</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Functionalized graphene</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Interlaboratory comparison</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>VAMAS</value>
    </subject>
    <collection role="ddc" number="543">Analytische Chemie</collection>
    <collection role="ddc" number="620">Ingenieurwissenschaften und zugeordnete Tätigkeiten</collection>
    <collection role="institutes" number="">6 Materialchemie</collection>
    <collection role="institutes" number="">6.1 Oberflächen- und Dünnschichtanalyse</collection>
    <collection role="themenfelder" number="">Material</collection>
    <collection role="themenfelder" number="">Chemie und Prozesstechnik</collection>
    <collection role="fulltextaccess" number="">Datei im Netzwerk der BAM verfügbar ("Closed Access")</collection>
    <collection role="literaturgattung" number="">Präsentation</collection>
    <collection role="themenfelder" number="">Advanced Materials</collection>
  </doc>
  <doc>
    <id>57670</id>
    <completedYear/>
    <publishedYear>2023</publishedYear>
    <thesisYearAccepted/>
    <language>eng</language>
    <pageFirst/>
    <pageLast/>
    <pageNumber/>
    <edition/>
    <issue/>
    <volume/>
    <type>researchdata</type>
    <publisherName>Zenodo</publisherName>
    <publisherPlace>Geneva</publisherPlace>
    <creatingCorporation>Bundesanstalt für Materialforschung und -prüfung (BAM)</creatingCorporation>
    <contributingCorporation/>
    <belongsToBibliography>0</belongsToBibliography>
    <completedDate>--</completedDate>
    <publishedDate>--</publishedDate>
    <thesisDateAccepted>--</thesisDateAccepted>
    <title language="eng">Physico-chemical characterization of sterilized Ce0.5Zr0.5O2 nanoparticles by XPS / HAXPES / SEM</title>
    <abstract language="eng">Here a dataset of XPS, HAXPES and SEM measurements for the physico-chemical characterization of sterilized Ce0.5Zr0.5O2 nanoparticles is presented. The measurements are part of the H2020 project “NanoSolveIT”.</abstract>
    <identifier type="doi">10.5281/zenodo.7965445</identifier>
    <enrichment key="ScientificResourceTypeGeneral">Datensatz</enrichment>
    <enrichment key="ScientificGeolocation">Berlin, Germany</enrichment>
    <enrichment key="ScientificNote">XPS / HAXPES data in VAMAS format; SEM data in tif format</enrichment>
    <enrichment key="opus.source">publish</enrichment>
    <enrichment key="opus.doi.autoCreate">false</enrichment>
    <enrichment key="opus.urn.autoCreate">false</enrichment>
    <licence>Creative Commons - Namensnennung - Nicht kommerziell 3.0</licence>
    <author>Xenia Knigge</author>
    <author>Jörg Radnik</author>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>XPS</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>HAXPES</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>SEM</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>NanoSolveIT</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Ce0.5Zr0.5O2 nanoparticles</value>
    </subject>
    <collection role="ddc" number="620">Ingenieurwissenschaften und zugeordnete Tätigkeiten</collection>
    <collection role="institutes" number="">6 Materialchemie</collection>
    <collection role="institutes" number="">6.1 Oberflächen- und Dünnschichtanalyse</collection>
    <collection role="themenfelder" number="">Material</collection>
    <collection role="fulltextaccess" number="">Datei für die Öffentlichkeit verfügbar ("Open Access")</collection>
    <collection role="literaturgattung" number="">Graue Literatur</collection>
    <collection role="themenfelder" number="">Advanced Materials</collection>
    <collection role="unnumberedseries" number="">Forschungsdatensätze der BAM</collection>
  </doc>
  <doc>
    <id>63732</id>
    <completedYear/>
    <publishedYear>2025</publishedYear>
    <thesisYearAccepted/>
    <language>eng</language>
    <pageFirst/>
    <pageLast/>
    <pageNumber/>
    <edition/>
    <issue/>
    <volume/>
    <type>lecture</type>
    <publisherName/>
    <publisherPlace/>
    <creatingCorporation/>
    <contributingCorporation/>
    <belongsToBibliography>0</belongsToBibliography>
    <completedDate>--</completedDate>
    <publishedDate>--</publishedDate>
    <thesisDateAccepted>--</thesisDateAccepted>
    <title language="eng">Analysis of Nanoparticles</title>
    <abstract language="eng">The determination of the thickness and composition of the coating is crucial for the understanding of the properties of nanoparticles. Four different approaches will be presented: (i) numerical methods, (ii) descriptive formulae, (iii) the simulation of spectra with Monte-Carlo methods, and (iv) inelastic background analysis. The advantages and limits of these methods will be discussed.</abstract>
    <enrichment key="eventName">XPS Workshop</enrichment>
    <enrichment key="eventPlace">Teddington, United Kingdom</enrichment>
    <enrichment key="eventStart">14.07.2025</enrichment>
    <enrichment key="InvitedTalks">0</enrichment>
    <enrichment key="opus.source">publish</enrichment>
    <enrichment key="opus.doi.autoCreate">false</enrichment>
    <enrichment key="opus.urn.autoCreate">true</enrichment>
    <author>Jörg Radnik</author>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Numerical simulation</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Emperical formulae</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Simulation</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Inelastic background analysis</value>
    </subject>
    <collection role="ddc" number="620">Ingenieurwissenschaften und zugeordnete Tätigkeiten</collection>
    <collection role="institutes" number="">6 Materialchemie</collection>
    <collection role="institutes" number="">6.1 Oberflächen- und Dünnschichtanalyse</collection>
    <collection role="themenfelder" number="">Material</collection>
    <collection role="fulltextaccess" number="">Datei im Netzwerk der BAM verfügbar ("Closed Access")</collection>
    <collection role="literaturgattung" number="">Präsentation</collection>
    <collection role="themenfelder" number="">Advanced Materials</collection>
  </doc>
  <doc>
    <id>53365</id>
    <completedYear/>
    <publishedYear>2021</publishedYear>
    <thesisYearAccepted/>
    <language>eng</language>
    <pageFirst/>
    <pageLast/>
    <pageNumber/>
    <edition/>
    <issue/>
    <volume/>
    <type>lecture</type>
    <publisherName/>
    <publisherPlace/>
    <creatingCorporation/>
    <contributingCorporation/>
    <belongsToBibliography>0</belongsToBibliography>
    <completedDate>--</completedDate>
    <publishedDate>--</publishedDate>
    <thesisDateAccepted>--</thesisDateAccepted>
    <title language="eng">Correlating HR-TEM and XPS to elucidate the core-shell structure of ultrabright CdSE/CdS semiconductor quantum dots</title>
    <abstract language="eng">Controlling the thickness and tightness of surface passivation shells is crucial for many applications of core-shell nanoparticles (NP). Usually, to determine shell thickness, core and core/shell particle are measured individually requiring the availability of both nanoobjects. This is often not fulfilled for functional nanomaterials such as many photoluminescent semiconductor quantum dots (QD) used for bioimaging, solid state lighting, and display technologies as the core does not show the application-relevant functionality like a high photoluminescence (PL) quantum yield. This calls for a whole nanoobject approach. Moreover, the thickness of the organic coating remains often unclear.&#13;
By combining high-resolution transmission electron microscopy (HR-TEM) and X-ray photoelectron spectroscopy (XPS), a novel whole nanoobject approach is developed representatively for an ultrabright oleic acid-stabilized, thick shell CdSe/CdS QD with a PL quantum yield close to unity. The size of this spectroscopically assessed QD, is in the range of the information depth of usual laboratory XPS. Information on particle size and monodispersity were validated with dynamic light scattering (DLS) and small angle X-ray scattering (SAXS) and compared to data derived from optical measurements. The results of the different methods match very well within the different measurement uncertainties. Additionally, results obtained with energy-resolved XPS using excitation energies between 200 eV and 800 eV are discussed with respect to a potential core/shell intermixing. &#13;
Moreover, the future application potential of this approach correlating different sizing and structural methods is discussed considering the method-inherent uncertainties and other core/multi-shell nanostructures.</abstract>
    <enrichment key="eventName">E-MRS Fall Meeting</enrichment>
    <enrichment key="eventPlace">Online meeting</enrichment>
    <enrichment key="eventStart">20.09.2021</enrichment>
    <enrichment key="eventEnd">23.09.2021</enrichment>
    <enrichment key="opus.source">publish</enrichment>
    <enrichment key="opus.doi.autoCreate">false</enrichment>
    <enrichment key="opus.urn.autoCreate">true</enrichment>
    <enrichment key="InvitedTalks">0</enrichment>
    <author>Jörg Radnik</author>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Core-shell nanoparticles</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Quantum dots</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>High-resolution transmission electron microscopy</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>X-ray Photoelectron Spectroscopy</value>
    </subject>
    <collection role="ddc" number="543">Analytische Chemie</collection>
    <collection role="ddc" number="620">Ingenieurwissenschaften und zugeordnete Tätigkeiten</collection>
    <collection role="institutes" number="">1 Analytische Chemie; Referenzmaterialien</collection>
    <collection role="institutes" number="">1.2 Biophotonik</collection>
    <collection role="institutes" number="">6 Materialchemie</collection>
    <collection role="institutes" number="">6.1 Oberflächen- und Dünnschichtanalyse</collection>
    <collection role="themenfelder" number="">Material</collection>
    <collection role="themenfelder" number="">Chemie und Prozesstechnik</collection>
    <collection role="fulltextaccess" number="">Datei im Netzwerk der BAM verfügbar ("Closed Access")</collection>
    <collection role="literaturgattung" number="">Präsentation</collection>
    <collection role="themenfelder" number="">Advanced Materials</collection>
  </doc>
  <doc>
    <id>57760</id>
    <completedYear/>
    <publishedYear>2023</publishedYear>
    <thesisYearAccepted/>
    <language>eng</language>
    <pageFirst/>
    <pageLast/>
    <pageNumber/>
    <edition/>
    <issue/>
    <volume/>
    <type>researchdata</type>
    <publisherName>Zenodo</publisherName>
    <publisherPlace>Geneva</publisherPlace>
    <creatingCorporation>Bundesanstalt für Materialforschung und -prüfung (BAM)</creatingCorporation>
    <contributingCorporation/>
    <belongsToBibliography>0</belongsToBibliography>
    <completedDate>--</completedDate>
    <publishedDate>--</publishedDate>
    <thesisDateAccepted>--</thesisDateAccepted>
    <title language="eng">Physico-chemical characterization of CeO2/Co3O4 nanoparticles by XPS / HAXPES / SEM</title>
    <abstract language="eng">Here a dataset of XPS, HAXPES and SEM measurements for the physico-chemical characterization of CeO2/Co3O4 nanoparticles is presented. The measurements are part of the H2020 project “NanoSolveIT”.</abstract>
    <identifier type="doi">10.5281/zenodo.7989698</identifier>
    <enrichment key="ScientificResourceTypeGeneral">Datensatz</enrichment>
    <enrichment key="opus.source">publish</enrichment>
    <enrichment key="ScientificGeolocation">Berlin, Germany</enrichment>
    <enrichment key="opus.doi.autoCreate">false</enrichment>
    <enrichment key="opus.urn.autoCreate">false</enrichment>
    <licence>Creative Commons - Namensnennung - Nicht kommerziell 3.0</licence>
    <author>Xenia Knigge</author>
    <author>Jörg Radnik</author>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>HAXPES</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>XPS</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>SEM</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Nanoparticles</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>CeO2/Co3O4</value>
    </subject>
    <collection role="ddc" number="620">Ingenieurwissenschaften und zugeordnete Tätigkeiten</collection>
    <collection role="institutes" number="">6 Materialchemie</collection>
    <collection role="institutes" number="">6.1 Oberflächen- und Dünnschichtanalyse</collection>
    <collection role="themenfelder" number="">Material</collection>
    <collection role="fulltextaccess" number="">Datei für die Öffentlichkeit verfügbar ("Open Access")</collection>
    <collection role="literaturgattung" number="">Graue Literatur</collection>
    <collection role="themenfelder" number="">Advanced Materials</collection>
    <collection role="unnumberedseries" number="">Forschungsdatensätze der BAM</collection>
  </doc>
  <doc>
    <id>57759</id>
    <completedYear/>
    <publishedYear>2023</publishedYear>
    <thesisYearAccepted/>
    <language>eng</language>
    <pageFirst/>
    <pageLast/>
    <pageNumber/>
    <edition/>
    <issue/>
    <volume/>
    <type>researchdata</type>
    <publisherName>Zenodo</publisherName>
    <publisherPlace>Geneva</publisherPlace>
    <creatingCorporation>Bundesanstalt für Materialforschung und -prüfung (BAM)</creatingCorporation>
    <contributingCorporation/>
    <belongsToBibliography>0</belongsToBibliography>
    <completedDate>--</completedDate>
    <publishedDate>--</publishedDate>
    <thesisDateAccepted>--</thesisDateAccepted>
    <title language="eng">Physico-chemical characterization of Fe3O4 nanoparticles by XPS / HAXPES / SEM</title>
    <abstract language="deu">Here a dataset of XPS, HAXPES and SEM measurements for the physico-chemical characterization of Fe3O4 nanoparticles is presented. The measurements are part of the H2020 project “NanoSolveIT”.</abstract>
    <identifier type="doi">10.5281/zenodo.7990085</identifier>
    <enrichment key="ScientificResourceTypeGeneral">Datensatz</enrichment>
    <enrichment key="opus.source">publish</enrichment>
    <enrichment key="ScientificGeolocation">Berlin, Germany</enrichment>
    <enrichment key="opus.doi.autoCreate">false</enrichment>
    <enrichment key="opus.urn.autoCreate">false</enrichment>
    <licence>Creative Commons - Namensnennung - Nicht kommerziell 3.0</licence>
    <author>Xenia Knigge</author>
    <author>Jörg Radnik</author>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>HAXPES</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>XPS</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>SEM</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Fe3O4</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Nanoparticles</value>
    </subject>
    <collection role="ddc" number="620">Ingenieurwissenschaften und zugeordnete Tätigkeiten</collection>
    <collection role="institutes" number="">6 Materialchemie</collection>
    <collection role="institutes" number="">6.1 Oberflächen- und Dünnschichtanalyse</collection>
    <collection role="themenfelder" number="">Material</collection>
    <collection role="fulltextaccess" number="">Datei für die Öffentlichkeit verfügbar ("Open Access")</collection>
    <collection role="literaturgattung" number="">Graue Literatur</collection>
    <collection role="themenfelder" number="">Advanced Materials</collection>
    <collection role="unnumberedseries" number="">Forschungsdatensätze der BAM</collection>
  </doc>
</export-example>
