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    <title language="eng">Data Acquisition System for Single Particle Inductively Coupled Plasma Mass Spectrometry (spICP-MS) with Nanosecond Time Resolution</title>
    <abstract language="eng">This study presents our data acquisition system prototype for spICP-MS with nanosecond time resolution (nanoDAQ) and a matching data processing approach for nanosecond resolved single particle spICP-MS data. The system continuously samples the secondary electron multiplier (SEM) detector signal with a dwell time of approximately 2 ns and enables the detection of gold nanoparticles (AuNP) as small as 7.5 nm[1] with a commercial single quadrupole ICP-MS instrument.&#13;
The acquired transient data is processed based on the temporal distance between detector events and the event density. It was shown that the inverse logarithm of the distance between detector events is proportional to the particle size and that the number of detector events corresponding to a particle signal distribution can be used to calibrate and determine the particle number concentration (PNC) of a nanoparticle dispersion.[1] The high data acquisition frequency of the systems allows recording of a statistically significant number of data points in 60 s or less, which leads to the main time limitation for analyses being merely the sample uptake time and rinsing step between analyte solutions.</abstract>
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    <author>Johannes Schmitt</author>
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    <title language="eng">Single particle inductively coupled plasma mass spectrometry with nanosecond time resolution</title>
    <abstract language="eng">In this proof-of-principle study, we present our contribution to single particle inductively coupled plasma mass spectrometry (spICP-MS) developments with a novel in-house built data acquisition system with nanosecond time resolution (nanoDAQ) and a matching data processing approach. The new system can continuously sample the secondary electron multiplier (SEM) detector signal and enables the detection of gold nanoparticles (AuNP) as small as 7.5 nm with the commercial single quadrupole ICP-MS instrument used in this study. Recording of the SEM signal by the nanoDAQ is performed with a dwell time of approximately 4 ns. A tailored method was developed to process this type of transient data, which is based on determining the temporal distance between detector events that is denoted as event gap (EG). We found that the inverse logarithm of EG is proportional to the particle size and that the number of detector events corresponding to a particle signal distribution can be used to calibrate and determine the particle number concentration (PNC) of a nanoparticle dispersion. Due to the high data acquisition frequency, a statistically significant number of data points can be obtained in 60 s or less and the main time limitation for analyses is merely the sample uptake time and rinsing step between analyte solutions. At this stage, the data processing method provides average information on complete data sets only and will be adapted to enable particle-by-particle analysis with future hardware/software revision.</abstract>
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    <author>Annika Schardt</author>
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    <title language="eng">Cover image for the article "Single particle inductively coupled plasma mass spectrometry with nanosecond time resolution"</title>
    <abstract language="eng">Image for the front cover of the issue 39(2) of the JAAS (Journal of Analytical Atomic Spectrometry). See Annika Schardt et al., pp. 389–400. Image reproduced by permission of Annika Schardt, Johannes Schmitt and Carsten Engelhard.</abstract>
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    <title language="eng">Data acquisition system for single particle inductively coupled plasma mass spectrometry (spICP-MS) with nanosecond time resolution</title>
    <abstract language="eng">This study presents our data acquisition system prototype for single particle inductively coupled plasma mass spectrometry (spICP-MS) with nanosecond time resolution (nanoDAQ) and a matching data processing approach for time-resolved data in the nanosecond range. The system continuously samples the secondary electron multiplier (SEM) detector signal with a dwell time of approximately 2 ns and enables detection of gold nanoparticles (AuNP) as small as 7.5 nm with a commercial single quadrupole ICP-MS instrument. [1]&#13;
&#13;
Analysis of acquired transient data is based on the temporal distance between detector events and a derived ion event density. It was shown that the inverse logarithm of the distance between detector events is proportional to particle size. Also, the number of detector events per particle can be used to calibrate and determine the particle number concentration (PNC) of a nanoparticle dispersion.&#13;
&#13;
Particle-by-particle-based analysis of ion event density and other parameters derived from nanosecond time resolution show promising results. High data acquisition frequency of the systems allows recording of a statistically significant number of data points in 60 s or less, which leaves only the sample uptake and rinsing steps as remaining factors for limiting the total measurement time.</abstract>
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    <author>Johannes Schmitt</author>
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    <title language="eng">Data acquisition system for single particle inductively coupled plasma mass spectrometry (spICP-MS) with nanosecond time resolution</title>
    <abstract language="eng">This study presents our data acquisition system prototype for single particle inductively coupled plasma mass spectrometry (spICP-MS) with nanosecond time resolution (nanoDAQ) and a matching data processing approach for time-resolved data in the nanosecond range. The system continuously samples the secondary electron multiplier (SEM) detector signal with a dwell time of approximately 2 ns and enables detection of gold nanoparticles (AuNP) as small as 7.5 nm with a commercial single quadrupole ICP-MS instrument. [1]&#13;
&#13;
Analysis of acquired transient data is based on the temporal distance between detector events and a derived ion event density. It was shown that the inverse logarithm of the distance between detector events is proportional to particle size. Also, the number of detector events per particle can be used to calibrate and determine the particle number concentration (PNC) of a nanoparticle dispersion. [1]&#13;
&#13;
Particle-by-particle-based analysis of ion event density and other parameters derived from nanosecond time resolution show promising results. High data acquisition frequency of the systems allows recording of a statistically significant number of data points in 60 s or less, which leaves only the sample uptake and rinsing steps as remaining factors for limiting the total measurement time.</abstract>
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