<?xml version="1.0" encoding="utf-8"?>
<export-example>
  <doc>
    <id>29318</id>
    <completedYear/>
    <publishedYear>2013</publishedYear>
    <thesisYearAccepted/>
    <language>eng</language>
    <pageFirst>1</pageFirst>
    <pageLast>36</pageLast>
    <pageNumber/>
    <edition/>
    <issue>1919</issue>
    <volume>15</volume>
    <type>article</type>
    <publisherName>Kluwer</publisherName>
    <publisherPlace>Dordrecht</publisherPlace>
    <creatingCorporation/>
    <contributingCorporation/>
    <belongsToBibliography>1</belongsToBibliography>
    <completedDate>--</completedDate>
    <publishedDate>--</publishedDate>
    <thesisDateAccepted>--</thesisDateAccepted>
    <title language="eng">Size characterization of airborne SiO2 nanoparticles with on-line and off-line measurement techniques: an interlaboratory comparison study</title>
    <abstract language="eng">Results of an interlaboratory comparison on size characterization of SiO2 airborne nanoparticles using on-line and off-line measurement techniques are discussed. This study was performed in the framework of Technical Working Area (TWA) 34—'Properties of Nanoparticle Populations' of the Versailles Project on Advanced Materials and Standards (VAMAS) in the project no. 3 'Techniques for characterizing size distribution of airborne nanoparticles'. Two types of nano-aerosols, consisting of (1) one population of nanoparticles with a mean diameter between 30.3 and 39.0 nm and (2) two populations of non-agglomerated nanoparticles with mean diameters between, respectively, 36.2–46.6 nm and 80.2–89.8 nm, were generated for characterization measurements. Scanning mobility particle size spectrometers (SMPS) were used for on-line measurements of size distributions of the produced nano-aerosols. Transmission electron microscopy, scanning electron microscopy, and atomic force microscopy were used as off-line measurement techniques for nanoparticles characterization. Samples were deposited on appropriate supports such as grids, filters, and mica plates by electrostatic precipitation and a filtration technique using SMPS controlled generation upstream. The results of the main size distribution parameters (mean and mode diameters), obtained from several laboratories, were compared based on metrological approaches including metrological traceability, calibration, and evaluation of the measurement uncertainty. Internationally harmonized measurement procedures for airborne SiO2 nanoparticles characterization are proposed.</abstract>
    <parentTitle language="eng">Journal of nanoparticle research</parentTitle>
    <identifier type="old">32230</identifier>
    <identifier type="doi">10.1007/s11051-013-1919-4</identifier>
    <identifier type="issn">1388-0764</identifier>
    <identifier type="issn">1572-896X</identifier>
    <enrichment key="date_peer_review">24.10.2013</enrichment>
    <author>C. Motzkus</author>
    <author>T. Macé</author>
    <author>F. Gaie-Levrel</author>
    <author>S. Ducourtieux</author>
    <author>A. Delvallee</author>
    <author>K. Dirscherl</author>
    <author>Vasile-Dan Hodoroaba</author>
    <author>I. Popov</author>
    <author>I. Kuselman</author>
    <author>O. Popov</author>
    <author>K. Takahata</author>
    <author>K. Ehara</author>
    <author>P. Ausset</author>
    <author>M. Maillé</author>
    <author>N. Michielsen</author>
    <author>S. Bondiguel</author>
    <author>F. Gensdarmes</author>
    <author>L. Morawska</author>
    <author>G.R. Johnson</author>
    <author>E.M. Faghihi</author>
    <author>C.S. Kim</author>
    <author>Y.H. Kim</author>
    <author>M.C. Chu</author>
    <author>J.A. Guardado</author>
    <author>A. Salas</author>
    <author>G. Capannelli</author>
    <author>C. Costa</author>
    <author>T. Bostrom</author>
    <author>A.K. Jämting</author>
    <author>M.A. Lawn</author>
    <author>L. Adlem</author>
    <author>S. Vaslin-Reimann</author>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Scanning and transmission electron microscopies</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Atomic force microscopy</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Scanning mobility particle size spectrometers</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Metrological traceability</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>SiO2 nano-aerosol size distribution</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Interlaboratory comparison</value>
    </subject>
    <collection role="literaturgattung" number="">Verlagsliteratur</collection>
    <collection role="fulltextaccess" number="">Datei im Netzwerk der BAM verfügbar ("Closed Access")</collection>
  </doc>
  <doc>
    <id>30612</id>
    <completedYear/>
    <publishedYear>2014</publishedYear>
    <thesisYearAccepted/>
    <language>eng</language>
    <pageFirst>602</pageFirst>
    <pageLast>612</pageLast>
    <pageNumber/>
    <edition/>
    <issue>2</issue>
    <volume>20</volume>
    <type>article</type>
    <publisherName>Cambridge University Press</publisherName>
    <publisherPlace>New York, NY</publisherPlace>
    <creatingCorporation>Microscopy Society of America</creatingCorporation>
    <contributingCorporation/>
    <belongsToBibliography>1</belongsToBibliography>
    <completedDate>--</completedDate>
    <publishedDate>--</publishedDate>
    <thesisDateAccepted>--</thesisDateAccepted>
    <title language="eng">Performance of high-resolution SEM/EDX systems equipped with transmission mode (TSEM) for imaging and measurement of size and size distribution of spherical nanoparticles</title>
    <abstract language="eng">The analytical performance of high-resolution scanning electron microscopy/energy dispersive X-ray spectroscopy (SEM/EDX) for accurate determination of the size, size distribution, qualitative elemental analysis of nanoparticles (NPs) was systematically investigated. It is demonstrated how powerful high-resolution SEM is by using both mono- and bi-modal distributions of SiO2 airborne NPs collected on appropriate substrates after their generation from colloidal suspension. The transmission mode of the SEM (TSEM) is systematically employed for NPs prepared on thin film substrates such as transmission electron microscopy grids. Measurements in the transmission mode were performed by using a 'single-unit' TSEM transmission setup as manufactured and patented by Zeiss. This alternative to the 'conventional' STEM detector consists of a special sample holder that is used in conjunction with the in-place EverhartThornley detector. In addition, the EDX capabilities for imaging NPs, highlighting the promising potential with respect to exploitation of the sensitivity of the new large area silicon drift detector energy dispersive X-ray spectrometers were also investigated. The work was carried out in the frame of a large prenormative VAMAS (Versailles Project on Advanced Materials and Standards) project, dedicated to finding appropriate methods and procedures for traceable characterization of NP size and size distribution.</abstract>
    <parentTitle language="eng">Microscopy and microanalysis</parentTitle>
    <identifier type="old">33588</identifier>
    <identifier type="doi">10.1017/S1431927614000014</identifier>
    <identifier type="issn">1431-9276</identifier>
    <identifier type="issn">1435-8115</identifier>
    <enrichment key="date_peer_review">28.04.2014</enrichment>
    <author>Vasile-Dan Hodoroaba</author>
    <author>C. Motzkus</author>
    <author>T. Macé</author>
    <author>S. Vaslin-Reimann</author>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Transmission scanning electron microscopy/microscope (TSEM, T-SEM, STEM)</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>High-resolution scanning electron microscope (SEM)</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Transmission</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>SiO2</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Nanoparticles</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Size</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Size distribution</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>EDX</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Large area SDD</value>
    </subject>
    <collection role="literaturgattung" number="">Verlagsliteratur</collection>
    <collection role="fulltextaccess" number="">Datei im Netzwerk der BAM verfügbar ("Closed Access")</collection>
  </doc>
  <doc>
    <id>26749</id>
    <completedYear/>
    <publishedYear>2012</publishedYear>
    <thesisYearAccepted/>
    <language>eng</language>
    <pageFirst>1750</pageFirst>
    <pageLast>1751</pageLast>
    <pageNumber/>
    <edition/>
    <issue>Suppl. 2</issue>
    <volume>18</volume>
    <type>article</type>
    <publisherName>Cambridge University Press</publisherName>
    <publisherPlace>New York, NY</publisherPlace>
    <creatingCorporation>Microscopy Society of America</creatingCorporation>
    <contributingCorporation/>
    <belongsToBibliography>1</belongsToBibliography>
    <completedDate>--</completedDate>
    <publishedDate>--</publishedDate>
    <thesisDateAccepted>--</thesisDateAccepted>
    <title language="eng">Advanced analysis of spherical SiO2 aerosol nanoparticles with a high-resolution SEM</title>
    <abstract language="eng">Inspection of the morphology of nano-objects in a conventional SEM constitutes a challenging task when the particles are below 100 nm and the material contrast is poor. SiO2 nanoparticles (nPs) can be considered as a good representative example.</abstract>
    <parentTitle language="eng">Microscopy and microanalysis</parentTitle>
    <identifier type="old">29531</identifier>
    <identifier type="doi">10.1017/S1431927612010604</identifier>
    <identifier type="issn">1431-9276</identifier>
    <identifier type="issn">1435-8115</identifier>
    <enrichment key="date_peer_review">22.10.2012</enrichment>
    <author>Vasile-Dan Hodoroaba</author>
    <author>Sigrid Benemann</author>
    <author>C. Motzkus</author>
    <author>T. Macé</author>
    <author>P. Palmas</author>
    <author>S. Vaslin-Reimann</author>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Spherical nanoparticles</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>SiO2</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>SEM</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Transmission-SEM</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>VAMAS</value>
    </subject>
    <collection role="literaturgattung" number="">Verlagsliteratur</collection>
    <collection role="fulltextaccess" number="">Datei im Netzwerk der BAM verfügbar ("Closed Access")</collection>
  </doc>
</export-example>
