<?xml version="1.0" encoding="utf-8"?>
<export-example>
  <doc>
    <id>31944</id>
    <completedYear/>
    <publishedYear>2014</publishedYear>
    <thesisYearAccepted/>
    <language>eng</language>
    <pageFirst>IT-5-P-1842, 1-2</pageFirst>
    <pageLast/>
    <pageNumber/>
    <edition/>
    <issue/>
    <volume/>
    <type>conferenceobject</type>
    <publisherName/>
    <publisherPlace/>
    <creatingCorporation/>
    <contributingCorporation/>
    <belongsToBibliography>0</belongsToBibliography>
    <completedDate>--</completedDate>
    <publishedDate>--</publishedDate>
    <thesisDateAccepted>--</thesisDateAccepted>
    <title language="eng">Advanced SEM/EDS analysis using an annular silicon drift detector (SDD): Applications in nano, life, earth and planetary sciences below micrometer scale</title>
    <abstract language="deu">Analysis of fine-scale structures requires low accelerating voltages. Consequently, only low to intermediate energy X-ray lines with many peak overlaps can be evaluated which requires deconvolution. Examination of nano-scale structures also requires low probe currents which would give low X-ray count rates with traditional EDX detectors. The additional time required to acquire sufficient data for deconvolution risks altering the specimen as a result of beam-sample interaction or sample contamination. The BRUKER XFIash 5060F SDD has allowed us to overcome these limitations and offers additional benefits as we demonstrate&#13;
here.</abstract>
    <parentTitle language="eng">IMC 2014 - 18th International microscopy congress (Proceedings)</parentTitle>
    <identifier type="old">35002</identifier>
    <identifier type="isbn">978-80-260-6720-7</identifier>
    <enrichment key="eventName">IMC 2014 - 18th International microscopy congress</enrichment>
    <enrichment key="eventPlace">Prague, Czech Republic</enrichment>
    <enrichment key="eventStart">07.09.2014</enrichment>
    <enrichment key="eventEnd">12.09.2014</enrichment>
    <author>T. Salge</author>
    <author>R. Terborg</author>
    <author>A. D. Ball</author>
    <author>G.R. Broad</author>
    <author>A.T. Kearsley</author>
    <author>C.G. Jones</author>
    <author>C. Smith</author>
    <author>Steffi Rades</author>
    <author>Vasile-Dan Hodoroaba</author>
    <collection role="literaturgattung" number="">Verlagsliteratur</collection>
    <collection role="fulltextaccess" number="">Datei im Netzwerk der BAM verfügbar ("Closed Access")</collection>
  </doc>
  <doc>
    <id>34923</id>
    <completedYear/>
    <publishedYear>2015</publishedYear>
    <thesisYearAccepted/>
    <language>eng</language>
    <pageFirst>Paper 0855, 1713</pageFirst>
    <pageLast>1714</pageLast>
    <pageNumber/>
    <edition/>
    <issue>Suppl. 3</issue>
    <volume>21</volume>
    <type>article</type>
    <publisherName>Cambridge University Press</publisherName>
    <publisherPlace>New York, NY</publisherPlace>
    <creatingCorporation>Microscopy Society of America</creatingCorporation>
    <contributingCorporation/>
    <belongsToBibliography>1</belongsToBibliography>
    <completedDate>--</completedDate>
    <publishedDate>--</publishedDate>
    <thesisDateAccepted>--</thesisDateAccepted>
    <title language="eng">Improved spatial resolution of EDX/SEM for the elemental analysis of nanoparticles</title>
    <abstract language="eng">The interest in nanoparticles remains at a high level in fundamental research since many years and increasingly, nanoparticles are incorporated into consumer products to enhance their performance. Consequently, the accurate and rapid characterization of nanoparticles is more and more demanded. Electron microscopy (SEM, TSEM and TEM) is one of the few techniques which are able to image individual nanoparticles. It was demonstrated recently that the transmission electron microscopy at a SEM can successfully be applied as a standard method to characterize accurately the size (distribution) and shape of nanoparticles down to less than 10 nm.</abstract>
    <parentTitle language="eng">Microscopy and microanalysis</parentTitle>
    <identifier type="old">38073</identifier>
    <identifier type="doi">10.1017/S1431927615009344</identifier>
    <identifier type="issn">1431-9276</identifier>
    <identifier type="issn">1435-8115</identifier>
    <enrichment key="date_peer_review">23.11.2015</enrichment>
    <author>Johannes Mielke</author>
    <author>Steffi Rades</author>
    <author>Erik Ortel</author>
    <author>T. Salge</author>
    <author>Vasile-Dan Hodoroaba</author>
    <collection role="literaturgattung" number="">Verlagsliteratur</collection>
    <collection role="fulltextaccess" number="">Datei im Netzwerk der BAM verfügbar ("Closed Access")</collection>
  </doc>
  <doc>
    <id>35562</id>
    <completedYear/>
    <publishedYear>2016</publishedYear>
    <thesisYearAccepted/>
    <language>eng</language>
    <pageFirst>012006-1</pageFirst>
    <pageLast>012006-12</pageLast>
    <pageNumber/>
    <edition/>
    <issue/>
    <volume>109</volume>
    <type>article</type>
    <publisherName>IOP Publishing Ltd</publisherName>
    <publisherPlace>Bristol, UK</publisherPlace>
    <creatingCorporation>IOP Publishing Ltd</creatingCorporation>
    <contributingCorporation/>
    <belongsToBibliography>1</belongsToBibliography>
    <completedDate>--</completedDate>
    <publishedDate>--</publishedDate>
    <thesisDateAccepted>--</thesisDateAccepted>
    <title language="eng">Characterisation of nanoparticles by means of high-resolution SEM/EDS in transmission mode</title>
    <abstract language="eng">Advances in scanning electron microscopy (SEM) enable the high-resolution imaging of single nanoparticles (NPs) with sizes well below 10 nm. The SEM analysis in transmission mode (T-SEM) of NPs on thin film supports has many benefits when compared to the analysis of NPs on bulk substrates. The enhanced material (mass – thickness) contrast of the T-SEM imaging mode is well suited for in-depth and, particularly valuable, to very accurate, traceable, lateral dimensional measurements of NPs. Compared to samples prepared on bulk substrates, T-SEM with energy dispersive X-ray spectroscopy (EDS) achieves a drastically improved spatial resolution of the emitted X-rays. The poor signal-to-noise ratio of the X-ray spectra emitted by a single nanoparticle (NP) can be improved by the use of high-sensitivity (high collection solid angle) silicon drift (SDD), energy-dispersive X-ray spectrometers (EDS). The EDS spectral imaging of a single NP with a spatial resolution below 10 nm has become possible. This is demonstrated by means of various examples of nanostructures. Advanced data processing of T-SEM/EDS results sets the stage for the automated classification of NPs by feature analysis. This method combines the detection of morphological structures of interest by image processing of T-SEM micrographs with the chemical classification by EDS.</abstract>
    <parentTitle language="eng">IOP Conf. Series: Materials Science and Engineering</parentTitle>
    <identifier type="doi">10.1088/1757-899X/109/1/012006</identifier>
    <identifier type="url">http://iopscience.iop.org/article/10.1088/1757-899X/109/1/012006</identifier>
    <identifier type="issn">1757-899X</identifier>
    <identifier type="urn">urn:nbn:de:kobv:b43-355628</identifier>
    <enrichment key="eventName">European Microbeam Analysis Society’s 14th European Workshop on Modern Developments and Applications in Microbeam Analysis (EMAS 2015)</enrichment>
    <enrichment key="eventPlace">Portorož, Slovenia</enrichment>
    <enrichment key="eventStart">03.05.2015</enrichment>
    <enrichment key="eventEnd">07.05.2015</enrichment>
    <enrichment key="date_peer_review">30.09.2016</enrichment>
    <licence>Creative Commons - Namensnennung 3.0</licence>
    <author>Vasile-Dan Hodoroaba</author>
    <author>Steffi Rades</author>
    <author>T. Salge</author>
    <author>Johannes Mielke</author>
    <author>Erik Ortel</author>
    <author>R. Schmidt</author>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>High-resolution</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>SEM</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>T-SEM</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>EDX</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Nanoparticles</value>
    </subject>
    <collection role="ddc" number="543">Analytische Chemie</collection>
    <collection role="ddc" number="620">Ingenieurwissenschaften und zugeordnete Tätigkeiten</collection>
    <collection role="literaturgattung" number="">Verlagsliteratur</collection>
    <collection role="fulltextaccess" number="">Datei für die Öffentlichkeit verfügbar ("Open Access")</collection>
    <collection role="unnumberedseries" number="">Wissenschaftliche Artikel der BAM</collection>
    <thesisPublisher>Bundesanstalt für Materialforschung und -prüfung (BAM)</thesisPublisher>
    <file>https://opus4.kobv.de/opus4-bam/files/35562/Hodoroaba_EMAS2015.pdf</file>
  </doc>
  <doc>
    <id>33258</id>
    <completedYear/>
    <publishedYear>2015</publishedYear>
    <thesisYearAccepted/>
    <language>eng</language>
    <pageFirst>NUR code:972 - Materials Science, 187-199</pageFirst>
    <pageLast/>
    <pageNumber/>
    <edition/>
    <issue/>
    <volume/>
    <type>conferenceobject</type>
    <publisherName/>
    <publisherPlace/>
    <creatingCorporation>European microbeam analysis society (EMAS)</creatingCorporation>
    <contributingCorporation/>
    <belongsToBibliography>1</belongsToBibliography>
    <completedDate>--</completedDate>
    <publishedDate>--</publishedDate>
    <thesisDateAccepted>--</thesisDateAccepted>
    <title language="eng">Characterisation of nanoparticles by means of high-resolution SEM/EDS</title>
    <abstract language="eng">Advances in scanning electron microscopy (SEM) enable the high-resolution imaging of single nanoparticles (NPs) with sizes well below 10 nm. The SEM analysis in transmission mode (T-SEM) of NPs on thin film supports has many benefits when compared to the analysis of NPs on bulk substrates. The enhanced material (mass - thickness) contrast of the T-SEM imaging mode is well suited for in-depth and, particularly valuable, to very accurate, traceable, lateral dimensional measurements of NPs. Compared to samples prepared on bulk substrates, T-SEM with energy dispersive X-ray spectroscopy (EDS) achieves a drastically improved spatial resolution of the emitted X-rays. The poor signal-to-noise ratio of the X-ray spectra emitted by a single nanoparticle (NP) can be improved by the use of high-sensitivity (high collection solid angle) silicon drift (SDD), energy-dispersive X-ray spectrometers (EDS). The EDS spectral imaging of a single NP with a spatial resolution below 10 nm has become possible. This is demonstrated by means of various examples of nanostructures. Advanced data processing of T-SEM/EDS results sets the stage for the automated classification of NPs by feature analysis. This method combines the detection of morphological structures of interest by image processing of T-SEM micrographs with the chemical classification by EDS.</abstract>
    <parentTitle language="eng">EMAS 2015 - 14th European workshop on modern developments and applications in microbeam analysis</parentTitle>
    <identifier type="old">36347</identifier>
    <identifier type="isbn">978-90-8227-691-6</identifier>
    <identifier type="doi">10.1088/1757-899X/109/1/012006</identifier>
    <enrichment key="eventName">EMAS 2015 - 14th European workshop on modern developments and applications in microbeam analysis</enrichment>
    <enrichment key="eventPlace">Portoroz, Slovenia</enrichment>
    <enrichment key="eventStart">03.05.2015</enrichment>
    <enrichment key="eventEnd">07.05.2015</enrichment>
    <enrichment key="date_peer_review">28.05.2015</enrichment>
    <author>Vasile-Dan Hodoroaba</author>
    <author>Steffi Rades</author>
    <author>T. Salge</author>
    <author>Johannes Mielke</author>
    <author>Erik Ortel</author>
    <author>R. Schmidt</author>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>SEM</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>T-SEM</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>EDX</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Nanoparticles</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>High-resolution</value>
    </subject>
    <collection role="literaturgattung" number="">Verlagsliteratur</collection>
    <collection role="fulltextaccess" number="">Datei im Netzwerk der BAM verfügbar ("Closed Access")</collection>
  </doc>
  <doc>
    <id>31629</id>
    <completedYear/>
    <publishedYear>2014</publishedYear>
    <thesisYearAccepted/>
    <language>eng</language>
    <pageFirst>49577</pageFirst>
    <pageLast>49587</pageLast>
    <pageNumber/>
    <edition/>
    <issue>91</issue>
    <volume>4</volume>
    <type>article</type>
    <publisherName>RSC Publishing</publisherName>
    <publisherPlace>London</publisherPlace>
    <creatingCorporation/>
    <contributingCorporation/>
    <belongsToBibliography>1</belongsToBibliography>
    <completedDate>--</completedDate>
    <publishedDate>--</publishedDate>
    <thesisDateAccepted>--</thesisDateAccepted>
    <title language="eng">High-resolution imaging with SEM/T-SEM, EDX and SAM as a combined methodical approach for morphological and elemental analyses of single engineered nanoparticles</title>
    <abstract language="eng">The combination of complementary characterization techniques such as SEM (Scanning Electron Microscopy), T-SEM (Scanning Electron Microscopy in Transmission Mode), EDX (Energy Dispersive X-ray Spectroscopy) and SAM (Scanning Auger Microscopy) has been proven to be a powerful and relatively quick characterization strategy for comprehensive morphological and chemical characterization of individual silica and titania nanoparticles. The selected real life test materials, silica and titania, are listed in the OECD guidance manual as representative examples because they are often used as commercial nanomaterials. Imaging by high resolution SEM and in the transmission mode by T-SEM allows almost simultaneous surface and in-depth inspection of the same particle using the same instrument. EDX and SAM enable the chemical characterization of bulk and surface of individual nanoparticles. The core–shell properties of silica based materials are addressed as well. Titania nominally coated by silane purchased from an industrial source has been found to be inhomogeneous in terms of chemical composition.</abstract>
    <parentTitle language="eng">RSC Advances</parentTitle>
    <identifier type="old">34658</identifier>
    <identifier type="doi">10.1039/c4ra05092d</identifier>
    <identifier type="issn">2046-2069</identifier>
    <identifier type="urn">urn:nbn:de:kobv:b43-316296</identifier>
    <enrichment key="date_peer_review">16.10.2014</enrichment>
    <licence>Creative Commons - Namensnennung 3.0</licence>
    <author>Steffi Rades</author>
    <author>Vasile-Dan Hodoroaba</author>
    <author>T. Salge</author>
    <author>Thomas Wirth</author>
    <author>M.P. Lobera</author>
    <author>R.H. Labrador</author>
    <author>Kishore Natte</author>
    <author>Thomas Behnke</author>
    <author>Thomas Gross</author>
    <author>Wolfgang Unger</author>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>surface and in-depth inspection</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>silica nanoparticles</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>titania nanoparticles</value>
    </subject>
    <collection role="ddc" number="543">Analytische Chemie</collection>
    <collection role="literaturgattung" number="">Verlagsliteratur</collection>
    <collection role="fulltextaccess" number="">Datei für die Öffentlichkeit verfügbar ("Open Access")</collection>
    <collection role="unnumberedseries" number="">Wissenschaftliche Artikel der BAM</collection>
    <thesisPublisher>Bundesanstalt für Materialforschung und -prüfung (BAM)</thesisPublisher>
    <file>https://opus4.kobv.de/opus4-bam/files/31629/High-resolution imaging with SEM,T-SEM, EDX and SAM as a combined methodical approach for morphological and elemental analysis of single engineered nanoparticles_Rades.pdf</file>
  </doc>
  <doc>
    <id>31389</id>
    <completedYear/>
    <publishedYear>2014</publishedYear>
    <thesisYearAccepted/>
    <language>eng</language>
    <pageFirst>662</pageFirst>
    <pageLast>663</pageLast>
    <pageNumber/>
    <edition/>
    <issue>Suppl. S 3</issue>
    <volume>20</volume>
    <type>article</type>
    <publisherName>Cambridge University Press</publisherName>
    <publisherPlace>New York, NY</publisherPlace>
    <creatingCorporation>Microscopy Society of America</creatingCorporation>
    <contributingCorporation/>
    <belongsToBibliography>1</belongsToBibliography>
    <completedDate>--</completedDate>
    <publishedDate>--</publishedDate>
    <thesisDateAccepted>--</thesisDateAccepted>
    <title language="eng">Need for large-area EDS detectors for imaging nanoparticles in a SEM operating in transmission mode</title>
    <abstract language="deu">Accurate characterization of nanoparticles (NPs) with a high-resolution SEM with respect to morphology, shape and size distribution is carried out meanwhile routinely in more and more laboratories [1,2]. The valuable result of the metrological measurement of the NP size distribution -including traceability to the SI length unit - was also recently demonstrated by exploiting the transmission mode in a SEM, i.e. TSEM [1,3]. Especially for NPs prepared on thin foil supports like the typical TEM grids the transmission mode at low voltages (up to 30 kV) supplies a high imaging contrast so that sharp boarders of the NPs enable accurate lateral dimensional measurements of NPs size. There are just a few analytical methods which are able to characterize physico-chemical properties of individual NPs. In most cases a SEM has attached an EDS detector so that Information on the elemental composition of the sample to be analyzed becomes possible. The addressed sample volume typically in the micrometer ränge for bulk specimens is considerably reduced if thin, electron transparent Support films are used. Hence, one improves the spatial resolution however, at the cost of lower signal-to-noise ratios of the X-ray spectra, due to the tiny amount of substance excited [2,4,5]. One decisive technological development in the manufacturing of EDS detectors, namely the large-area SDD EDS, meanwhile available commercially in various designs, compensates this analytical drawback. If collection solid angles of 1-2 msr have been typically available for almost four decades, recent technological improvements in SDD EDS size and design have resulted in solid angles in the sr ränge.</abstract>
    <parentTitle language="eng">Microscopy and microanalysis</parentTitle>
    <identifier type="old">34404</identifier>
    <identifier type="doi">10.1017/S1431927614005030</identifier>
    <identifier type="issn">1431-9276</identifier>
    <identifier type="issn">1435-8115</identifier>
    <enrichment key="date_peer_review">18.09.2014</enrichment>
    <author>Steffi Rades</author>
    <author>T. Salge</author>
    <author>R. Schmidt</author>
    <author>Vasile-Dan Hodoroaba</author>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>EDS</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>EDX</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Nanoparticles</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>High-resolution</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>SEM</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>T-SEM</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Large-area EDS</value>
    </subject>
    <collection role="literaturgattung" number="">Verlagsliteratur</collection>
    <collection role="fulltextaccess" number="">Datei im Netzwerk der BAM verfügbar ("Closed Access")</collection>
  </doc>
</export-example>
