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    <completedYear/>
    <publishedYear>2024</publishedYear>
    <thesisYearAccepted/>
    <language>eng</language>
    <pageFirst>S271</pageFirst>
    <pageLast/>
    <pageNumber/>
    <edition/>
    <issue/>
    <volume>399</volume>
    <type>article</type>
    <publisherName>Elsevier B.V.</publisherName>
    <publisherPlace/>
    <creatingCorporation/>
    <contributingCorporation/>
    <belongsToBibliography>1</belongsToBibliography>
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    <title language="eng">Data management for image-based characterisation of 2D nano-materials</title>
    <abstract language="eng">The ACCORDs project, funded through Horizon Europe, is pioneering a novel approach to investigate Graphene Family Materials (GFMs) through image analysis. Our aim is to unveil how these materials might influence health and the environment. To achieve this, we are developing a platform designed for the easy retrieval, access, sharing, and utilisation of GFM data and the coordination between biological and physico-chemical data formats. Integral to this platform is an OMERO-based library for image storage, alongside data collection forms and image analysis tools. Efforts are underway to streamline the process for researchers to upload and disseminate their findings, manage information within a database and navigate the data with ease. Adhering to REMBI guidelines, which set the standard for annotating biological images with metadata, we ensure our data collection is comprehensive and adheres to established best practices. Initially, we are employing thresholding and basic machine learning techniques for image segmentation, laying the groundwork for advanced analysis through deep learning to gain more profound insights. Upon completion, the project will deliver a comprehensive platform facilitating efficient data and image management concerning GFMs. This platform will enable the straightforward discovery and use of protocols and results, all organised in accordance with the FAIR principles – Findable, Accessible, Interoperable, and Reusable.&#13;
This initiative is poised to significantly impact materials science, enhancing our comprehension of the safety and environmental implications of 2D materials.</abstract>
    <parentTitle language="eng">Toxicology Letters</parentTitle>
    <identifier type="doi">10.1016/j.toxlet.2024.07.655</identifier>
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All rights are reserved, including those for text and data mining, AI training, and similar technologies.","name":"copyright","label":"Copyright"}]}}</enrichment>
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    <enrichment key="opus.source">publish</enrichment>
    <enrichment key="date_peer_review">11.11.2024</enrichment>
    <author>P.P. Ankli</author>
    <author>A. Ali</author>
    <author>S. Hodzic</author>
    <author>A. Logachov</author>
    <author>K. Maciejczuk</author>
    <author>A. Milochiv</author>
    <author>S. Hardy</author>
    <author>B. Hardy</author>
    <author>S. Novak</author>
    <author>E. Kranjc</author>
    <author>V. Kononenko</author>
    <author>S. Saje</author>
    <author>Vasile-Dan Hodoroaba</author>
    <author>Jörg Radnik</author>
    <author>Loay Akmal</author>
    <author>Paul Mrkwitschka</author>
    <author>F. Pellegrino</author>
    <author>A. Rossi</author>
    <author>E. Alladio</author>
    <author>F. Sordello</author>
    <author>M. Gulumian</author>
    <author>E. Valsami-Jones</author>
    <author>C. Andraos</author>
    <author>V. Wepener</author>
    <author>K. Jurkschat</author>
    <author>E. Jones</author>
    <author>D. Singh</author>
    <author>B. Ibrahim</author>
    <author>M. van der Zande</author>
    <author>D. Fernandez-Poulussen</author>
    <author>P. Queipo</author>
    <author>D. Drobne</author>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Graphene</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Image analysis</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Data management</value>
    </subject>
    <collection role="ddc" number="620">Ingenieurwissenschaften und zugeordnete Tätigkeiten</collection>
    <collection role="institutes" number="">6 Materialchemie</collection>
    <collection role="institutes" number="">6.1 Oberflächen- und Dünnschichtanalyse</collection>
    <collection role="themenfelder" number="">Material</collection>
    <collection role="literaturgattung" number="">Verlagsliteratur</collection>
    <collection role="fulltextaccess" number="">Datei im Netzwerk der BAM verfügbar ("Closed Access")</collection>
    <collection role="themenfelder" number="">Advanced Materials</collection>
  </doc>
  <doc>
    <id>60196</id>
    <completedYear/>
    <publishedYear>2024</publishedYear>
    <thesisYearAccepted/>
    <language>eng</language>
    <pageFirst>1</pageFirst>
    <pageLast>11</pageLast>
    <pageNumber/>
    <edition/>
    <issue/>
    <volume/>
    <type>article</type>
    <publisherName>Wiley-VCH GmbH</publisherName>
    <publisherPlace>Weinheim</publisherPlace>
    <creatingCorporation/>
    <contributingCorporation/>
    <belongsToBibliography>1</belongsToBibliography>
    <completedDate>--</completedDate>
    <publishedDate>--</publishedDate>
    <thesisDateAccepted>--</thesisDateAccepted>
    <title language="eng">Picosecond laser processing of hierarchical micro–nanostructures on titanium alloy upon pre- and postanodization: morphological, structural, and chemical effects</title>
    <abstract language="eng">Recent publications indicate that the order of electrochemical anodization (before or after the laser processing step) plays an important role for the response of bone-forming osteoblasts—an effect that can be utilized for improving permanent dental or removable bone implants. For exploring these different surface functionalities, multimethod morphological, structural, and chemical characterizations are performed in combination with electrochemical pre- and postanodization for two different characteristic microspikes covered by nanometric laser-induced periodic surface structures on Ti–6Al–4V upon irradiation with near-infrared ps-laser pulses (1030 nm wavelength, ≈1 ps pulse duration, 67 and 80 kHz pulse repetition frequency) at two distinct sets of laser fluence and beam scanning parameters. This work involves morphological and topographical investigations by scanning electron microscopy and white light interference microscopy, structural material examinations via X-ray diffraction, and micro-Raman spectroscopy, as well as near-surface chemical analyses by X-ray photoelectron spectroscopy and hard X-ray photoelectron spectroscopy. The results allow to qualify the mean laser ablation depth, assess the spike geometry and surface roughness parameters, and provide new detailed insights into the near-surface oxidation that may affect the different cell growth behavior for pre- or postanodized medical implants.</abstract>
    <parentTitle language="eng">Physica Status Solidi A</parentTitle>
    <identifier type="issn">1862-6319</identifier>
    <identifier type="doi">10.1002/pssa.202300920</identifier>
    <identifier type="urn">urn:nbn:de:kobv:b43-601962</identifier>
    <enrichment key="eventName">2023 E-MRS Spring Meeting, Symposium L "Making light matter: lasers in material sciences and photonics"</enrichment>
    <enrichment key="eventPlace">Strasbourg, France</enrichment>
    <enrichment key="eventStart">29.05.2023</enrichment>
    <enrichment key="eventEnd">02.06.2023</enrichment>
    <enrichment key="opus.source">publish</enrichment>
    <enrichment key="date_peer_review">19.06.2024</enrichment>
    <licence>Creative Commons - CC BY - Namensnennung 4.0 International</licence>
    <author>Heike Voss</author>
    <author>Xenia Knigge</author>
    <author>D. Knapic</author>
    <author>Matthias Weise</author>
    <author>Mario Sahre</author>
    <author>Andreas Hertwig</author>
    <author>A. Sacco</author>
    <author>A. M. Rossi</author>
    <author>Jörg Radnik</author>
    <author>Kai Müller</author>
    <author>Karsten Wasmuth</author>
    <author>Jörg Krüger</author>
    <author>A. W. Hassel</author>
    <author>Vasile-Dan Hodoroaba</author>
    <author>Jörn Bonse</author>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Hierarchical micro-nanostructures</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Laser-induced periodic surface structures (LIPSS)</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Ultrashort laser pulses</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Ti-6Al-4V alloy</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>X-ray photoelectron spectroscopy</value>
    </subject>
    <collection role="ddc" number="620">Ingenieurwissenschaften und zugeordnete Tätigkeiten</collection>
    <collection role="institutes" number="">6 Materialchemie</collection>
    <collection role="institutes" number="">6.1 Oberflächen- und Dünnschichtanalyse</collection>
    <collection role="institutes" number="">6.2 Material- und Oberflächentechnologien</collection>
    <collection role="themenfelder" number="">Material</collection>
    <collection role="literaturgattung" number="">Verlagsliteratur</collection>
    <collection role="fulltextaccess" number="">Datei für die Öffentlichkeit verfügbar ("Open Access")</collection>
    <collection role="unnumberedseries" number="">Wissenschaftliche Artikel der BAM</collection>
    <collection role="themenfelder" number="">Advanced Materials</collection>
    <thesisPublisher>Bundesanstalt für Materialforschung und -prüfung (BAM)</thesisPublisher>
    <file>https://opus4.kobv.de/opus4-bam/files/60196/Physica Status Solidi a - 2024 - Voss.pdf</file>
  </doc>
  <doc>
    <id>50990</id>
    <completedYear/>
    <publishedYear>2020</publishedYear>
    <thesisYearAccepted/>
    <language>eng</language>
    <pageFirst>890</pageFirst>
    <pageLast>894</pageLast>
    <pageNumber/>
    <edition/>
    <issue>12</issue>
    <volume>52</volume>
    <type>article</type>
    <publisherName>John Wiley &amp; Sons Ltd</publisherName>
    <publisherPlace/>
    <creatingCorporation/>
    <contributingCorporation/>
    <belongsToBibliography>1</belongsToBibliography>
    <completedDate>--</completedDate>
    <publishedDate>--</publishedDate>
    <thesisDateAccepted>--</thesisDateAccepted>
    <title language="eng">A new test specimen for the determination of the field of view of small-area X-ray photoelectron spectrometers</title>
    <abstract language="eng">Small-area/spot photoelectron spectroscopy (SAXPS) is a powerful tool for the investigation of small surface features like microstructures of electronic devices, sensors or other functional surfaces, and so forth. For evaluating the quality of such microstructures, it is often crucial to know whether a small signal in a spectrum is an unwanted contamination of the field of view (FoV), defined by the instrument settings, or it originated from outside. To address this issue, the d80/20 parameter of a line scan across a chemical edge is often used. However, the typical d80/20 parameter does not give information on contributions from the long tails of the X-ray beam intensity distribution or the electron-optical system as defined by apertures. In the VAMAS TWA2 A22 project “Applying planar, patterned, multi-metallic samples to assess the impact of analysis area in surface-chemical analysis,” new test specimen was developed and tested. The here presented testing material consists of a silicon wafer substrate with an Au-film and embedded Cr circular and square spots with decreasing dimensions from 200 μm down to 5 μm. The spot sizes are traceable to the length unit due to size measurements with a metrological SEM. For the evaluation of the FoV, we determined the Au4f intensities measured with the center of the FoV aligned with the center of the spot and normalized to the Au4f intensity determined on the Au-film. With this test specimen, it was possible to characterize, as an example, the FoV of a Kratos AXIS Ultra DLD XPS instrument.</abstract>
    <parentTitle language="eng">Surface and Interface Analysis</parentTitle>
    <identifier type="doi">10.1002/sia.6831</identifier>
    <identifier type="issn">1096-9918</identifier>
    <identifier type="urn">urn:nbn:de:kobv:b43-509902</identifier>
    <enrichment key="eventName">ECASIA 2019</enrichment>
    <enrichment key="eventPlace">Dresden, Germany</enrichment>
    <enrichment key="eventStart">15.09.2019</enrichment>
    <enrichment key="eventEnd">20.09.2019</enrichment>
    <enrichment key="date_peer_review">13.07.2020</enrichment>
    <licence>Creative Commons - CC BY - Namensnennung 4.0 International</licence>
    <author>Jörg M. Stockmann</author>
    <author>Jörg Radnik</author>
    <author>S. Bütefisch</author>
    <author>I. Busch</author>
    <author>T. Weimann</author>
    <author>C. Passiu</author>
    <author>A. Rossi</author>
    <author>Wolfgang Unger</author>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Field of view</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Reference material</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Selected area XPS</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Small-area XPS</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Small-spot XPS</value>
    </subject>
    <collection role="ddc" number="543">Analytische Chemie</collection>
    <collection role="institutes" number="">6 Materialchemie</collection>
    <collection role="institutes" number="">6.1 Oberflächen- und Dünnschichtanalyse</collection>
    <collection role="themenfelder" number="">Chemie und Prozesstechnik</collection>
    <collection role="literaturgattung" number="">Verlagsliteratur</collection>
    <collection role="fulltextaccess" number="">Datei für die Öffentlichkeit verfügbar ("Open Access")</collection>
    <collection role="unnumberedseries" number="">Wissenschaftliche Artikel der BAM</collection>
    <thesisPublisher>Bundesanstalt für Materialforschung und -prüfung (BAM)</thesisPublisher>
    <file>https://opus4.kobv.de/opus4-bam/files/50990/sia.6831.pdf</file>
    <file>https://opus4.kobv.de/opus4-bam/files/50990/ECASIA_Supporting Information_Sia.6831.pdf</file>
  </doc>
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