<?xml version="1.0" encoding="utf-8"?>
<export-example>
  <doc>
    <id>63804</id>
    <completedYear/>
    <publishedYear>2025</publishedYear>
    <thesisYearAccepted/>
    <language>eng</language>
    <pageFirst>442</pageFirst>
    <pageLast>443</pageLast>
    <pageNumber/>
    <edition/>
    <issue>7</issue>
    <volume>31</volume>
    <type>article</type>
    <publisherName>Oxford Academic</publisherName>
    <publisherPlace/>
    <creatingCorporation/>
    <contributingCorporation/>
    <belongsToBibliography>0</belongsToBibliography>
    <completedDate>--</completedDate>
    <publishedDate>--</publishedDate>
    <thesisDateAccepted>--</thesisDateAccepted>
    <title language="eng">Morphological Analysis of Graphene Oxide by Scanning Electron Microscopy and Correlative Field-flow Fractionation Coupled with Multi-angle Light Scattering</title>
    <abstract language="eng">In this paper graphene related 2D materials (GR2M) arre investigated by centrifugal field flow fractioning (CF3) and SEM. Three materials were selected as case studies (CS): graphene „HD-G (CS I), graphene oxide UniTo“ (CS II), and graphene oxide „Graphenea“ (CS III). For CS I particles were evaluated as constituent particles in agglomerates, for the other two materials only isolated (non aggregated/agglomerated) flakes were considered for determination of the area equivalent circular diameter (ECD).&#13;
Size analysis of all three materials was carried out by CF3 coupled with MALS (Multi-Angle Light Scattering). For evaluation, it was found that the data obtained was best suited to a disc model.  Results are in good agreement when compared to the sizes obtained before CF3 analysis. CS II material is too heterogenous to accurately determine flake size by imaging. CF3 coupled with MALS enables to assess fractions within the highly heterogenous material of CS II.&#13;
Imaging of the material in CS III after CF3 measurement indicates that the procedure is non-destructive. This could not be verified for the CS‘s I &amp; II  &#13;
As a next step we plan to analyse the fractionated samples by imaging them within a SEM wet-cell.</abstract>
    <parentTitle language="eng">Microscopy and Microanalysis</parentTitle>
    <identifier type="doi">10.1093/mam/ozaf048.222</identifier>
    <enrichment key="opus.source">publish</enrichment>
    <enrichment key="opus.doi.autoCreate">false</enrichment>
    <enrichment key="opus.urn.autoCreate">true</enrichment>
    <author>Paul Mrkwitschka</author>
    <author>Michaela Mühlbauer</author>
    <author>Andrea Rossi</author>
    <author>Francesco Pellegrino</author>
    <author>Amaia Zurutuza</author>
    <author>Jörg Radnik</author>
    <author>Florian Meier</author>
    <author>Vasile-Dan Hodoroaba</author>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>2D Materials</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>SEM</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Centrifugal field flow fractionation (CF3)</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Imaging</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Size distribution</value>
    </subject>
    <collection role="ddc" number="620">Ingenieurwissenschaften und zugeordnete Tätigkeiten</collection>
    <collection role="institutes" number="">6 Materialchemie</collection>
    <collection role="institutes" number="">6.1 Oberflächen- und Dünnschichtanalyse</collection>
    <collection role="themenfelder" number="">Material</collection>
    <collection role="literaturgattung" number="">Verlagsliteratur</collection>
    <collection role="fulltextaccess" number="">Datei im Netzwerk der BAM verfügbar ("Closed Access")</collection>
    <collection role="themenfelder" number="">Advanced Materials</collection>
  </doc>
  <doc>
    <id>63821</id>
    <completedYear/>
    <publishedYear>2025</publishedYear>
    <thesisYearAccepted/>
    <language>eng</language>
    <pageFirst>436</pageFirst>
    <pageLast>437</pageLast>
    <pageNumber/>
    <edition/>
    <issue>7</issue>
    <volume>31</volume>
    <type>article</type>
    <publisherName>Oxford Academic</publisherName>
    <publisherPlace/>
    <creatingCorporation/>
    <contributingCorporation/>
    <belongsToBibliography>0</belongsToBibliography>
    <completedDate>--</completedDate>
    <publishedDate>--</publishedDate>
    <thesisDateAccepted>--</thesisDateAccepted>
    <title language="eng">Wire-Print as a Sample Preparation Procedure Suitable for Accurate Morphological Characterization of Constituent Particles for Graphene-Related 2D-Materials</title>
    <abstract language="eng">In this study we have systematically tested the efficacy of a new deposition procedure for graphene-related 2D materials (GR2M’s) from liquid suspension onto a substrate for quantitative analysis of their size and shape distribution with electron microscopy.&#13;
The technique is an extension of the conventional drop-casting method, and we have designated it “wire-print” deposition. It consists of two steps, first one being usual drop-casting on a copper substrate and second one involving a thin copper wire with a sub-mm diameter being dipped into the deposited droplet and retracted with a corresponding half-spherical droplet attached on its tip and final deposition of this entire nL-amount of suspension onto e.g. a silicon wafer for microscopical, detailed analysis. 11 series of such a wire-print deposition for a graphene-based ink have been considered, whereby various conditions (treatment of the starting suspension) have been experimented with a repetition of up to 10 times per condition, all together 86 spots on a silicon wafer of 10 mm x 10 mm. The evaluation of one series of 8 repeated wire-print depositions reveal that the deposited spots are visualized with SEM. The weak presence of coffee-rings, irregular spot shape, and presence of agglomerates should be noticed. Both the mean value of the 8 ECD distributions and the total number of flakes deposited in each spot  show a variance in the range of 17% and 22%, respectively. In the context of accurate analysis of such challenging complex materials these numbers can be considered as excellent and demonstrate the high benefit of the wire-print deposition for accurate morphological measurements on GR2M’s.</abstract>
    <parentTitle language="eng">Microscopy and Microanalysis</parentTitle>
    <identifier type="doi">10.1093/mam/ozaf048.219</identifier>
    <enrichment key="opus.source">publish</enrichment>
    <enrichment key="opus.doi.autoCreate">false</enrichment>
    <enrichment key="opus.urn.autoCreate">true</enrichment>
    <author>Paul Mrkwitschka</author>
    <author>Mario Sahre</author>
    <author>Elena Corrao</author>
    <author>Francesco Pellegrino</author>
    <author>Vasile-Dan Hodoroaba</author>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Sample preparation</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Imaging</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>2D materials</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Morphology</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Size distribution</value>
    </subject>
    <collection role="ddc" number="620">Ingenieurwissenschaften und zugeordnete Tätigkeiten</collection>
    <collection role="institutes" number="">6 Materialchemie</collection>
    <collection role="institutes" number="">6.1 Oberflächen- und Dünnschichtanalyse</collection>
    <collection role="themenfelder" number="">Material</collection>
    <collection role="literaturgattung" number="">Verlagsliteratur</collection>
    <collection role="fulltextaccess" number="">Datei im Netzwerk der BAM verfügbar ("Closed Access")</collection>
    <collection role="themenfelder" number="">Advanced Materials</collection>
  </doc>
</export-example>
