<?xml version="1.0" encoding="utf-8"?>
<export-example>
  <doc>
    <id>43024</id>
    <completedYear/>
    <publishedYear>2018</publishedYear>
    <thesisYearAccepted/>
    <language>eng</language>
    <pageFirst>627</pageFirst>
    <pageLast>641</pageLast>
    <pageNumber/>
    <edition/>
    <issue>Supplement C</issue>
    <volume>144</volume>
    <type>article</type>
    <publisherName>Elsevier B.V.</publisherName>
    <publisherPlace/>
    <creatingCorporation/>
    <contributingCorporation/>
    <belongsToBibliography>1</belongsToBibliography>
    <completedDate>--</completedDate>
    <publishedDate>--</publishedDate>
    <thesisDateAccepted>--</thesisDateAccepted>
    <title language="eng">Stress-induced microcrack density evolution in β-eucryptite ceramics: Experimental observations and possible route to strain hardening</title>
    <abstract language="eng">In order to investigate their microcracking behaviour, the microstructures of several β-eucryptite ceramics, obtained from glass precursor and cerammed to yield different grain sizes and microcrack densities, were characterized by laboratory and synchrotron x-ray refraction and tomography. Results were compared with those obtained from scanning electron microscopy (SEM). In SEM images, the characterized materials appeared fully dense but computed tomography showed the presence of pore clusters. Uniaxial tensile testing was performed on specimens while strain maps were recorded and analyzed by Digital Image Correlation (DIC). X-ray refraction techniques were applied on specimens before and after tensile testing to measure the amount of the internal specific surface (i.e., area per unit volume). X-ray refraction revealed that (a) the small grain size (SGS) material contained a large specific surface, originating from the grain boundaries and the interfaces of TiO2 precipitates; (b) the medium (MGS) and large grain size (LGS) materials possessed higher amounts of specific surface compared to SGS material due to microcracks, which decreased after tensile loading; (c) the precursor glass had negligible internal surface. The unexpected decrease in the internal surface of MGS and LGS after tensile testing is explained by the presence of compressive regions in the DIC strain maps and further by theoretical arguments. It is suggested that while some microcracks merge via propagation, more close mechanically, thereby explaining the observed X-ray refraction results. The mechanisms proposed would allow the development of a strain hardening route in ceramics.</abstract>
    <parentTitle language="eng">Acta Materialia</parentTitle>
    <identifier type="doi">10.1016/j.actamat.2017.10.030</identifier>
    <identifier type="url">http://www.sciencedirect.com/science/article/pii/S1359645417308881</identifier>
    <identifier type="issn">1359-6454</identifier>
    <identifier type="issn">1873-2453</identifier>
    <enrichment key="date_peer_review">22.02.2018</enrichment>
    <author>Bernd R. Müller</author>
    <author>R.C. Cooper</author>
    <author>Axel Lange</author>
    <author>Andreas Kupsch</author>
    <author>M. Wheeler</author>
    <author>Manfred P. Hentschel</author>
    <author>Andreas Staude</author>
    <author>A. Pandey</author>
    <author>A. Shyam</author>
    <author>Giovanni Bruno</author>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Beta-eucryptite</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Microcracked ceramics</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>X-ray refraction</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Tensile load</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Strain hardening</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Synchrotron</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>BAMline</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Computed Tomography</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>CT</value>
    </subject>
    <collection role="ddc" number="543">Analytische Chemie</collection>
    <collection role="ddc" number="620">Ingenieurwissenschaften und zugeordnete Tätigkeiten</collection>
    <collection role="literaturgattung" number="">Verlagsliteratur</collection>
    <collection role="fulltextaccess" number="">Datei im Netzwerk der BAM verfügbar ("Closed Access")</collection>
  </doc>
  <doc>
    <id>39113</id>
    <completedYear/>
    <publishedYear>2016</publishedYear>
    <thesisYearAccepted/>
    <language>eng</language>
    <pageFirst/>
    <pageLast/>
    <pageNumber/>
    <edition/>
    <issue/>
    <volume/>
    <type>poster</type>
    <publisherName/>
    <publisherPlace/>
    <creatingCorporation/>
    <contributingCorporation/>
    <belongsToBibliography>0</belongsToBibliography>
    <completedDate>--</completedDate>
    <publishedDate>--</publishedDate>
    <thesisDateAccepted>--</thesisDateAccepted>
    <title language="eng">Characterizing damage evolution in metal matrix composites with X-ray refraction topography and in situ tensile loading</title>
    <abstract language="eng">In this study a metal-matrix-composite with aluminum matrix and Al2O3 particles was investigated with x-ray refraction topography and in-situ tensile loading. It could be observed that after reaching a certain load the specific surface increased steadily. However, the classical radiographs taken for comparison show no damage in the sample.</abstract>
    <enrichment key="eventName">8th Joint BER II and BESSY II User Meeting</enrichment>
    <enrichment key="eventPlace">Berlin, Germany</enrichment>
    <enrichment key="eventStart">07.12.2016</enrichment>
    <enrichment key="eventEnd">09.12.2016</enrichment>
    <author>René Laquai</author>
    <author>Bernd R. Müller</author>
    <author>Andreas Kupsch</author>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>X-ray refraction</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Metal matrix composites</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>In-situ loading</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Synchrotron</value>
    </subject>
    <collection role="ddc" number="543">Analytische Chemie</collection>
    <collection role="ddc" number="620">Ingenieurwissenschaften und zugeordnete Tätigkeiten</collection>
    <collection role="fulltextaccess" number="">Datei im Netzwerk der BAM verfügbar ("Closed Access")</collection>
    <collection role="literaturgattung" number="">Präsentation</collection>
  </doc>
  <doc>
    <id>33081</id>
    <completedYear/>
    <publishedYear>2015</publishedYear>
    <thesisYearAccepted/>
    <language>eng</language>
    <pageFirst>043702-1</pageFirst>
    <pageLast>043702-6</pageLast>
    <pageNumber/>
    <edition/>
    <issue>4</issue>
    <volume>86</volume>
    <type>article</type>
    <publisherName>American Institute of Physics</publisherName>
    <publisherPlace>Melville, NY, USA</publisherPlace>
    <creatingCorporation/>
    <contributingCorporation/>
    <belongsToBibliography>1</belongsToBibliography>
    <completedDate>--</completedDate>
    <publishedDate>--</publishedDate>
    <thesisDateAccepted>--</thesisDateAccepted>
    <title language="eng">A dedicated compression device for high resolution X-ray tomography of compressed gas diffusion layers</title>
    <abstract language="eng">We present an experimental approach to study the three-dimensional microstructure of gas diffusion layer (GDL) materials under realistic compression conditions. A dedicated compression device was designed that allows for synchrotron-tomographic investigation of circular samples under well-defined compression conditions. The tomographic data provide the experimental basis for stochastic modeling of nonwoven GDL materials. A plain compression tool is used to study the fiber courses in the material at different compression stages. Transport relevant geometrical parameters, such as porosity, pore size, and tortuosity distributions, are exemplarily evaluated for a GDL sample in the uncompressed state and for a compression of 30 vol.%. To mimic the geometry of the flow-field, we employed a compression punch with an integrated channel-rib-profile. It turned out that the GDL material is homogeneously compressed under the ribs, however, much less compressed underneath the channel. GDL fibers extend far into the channel volume where they might interfere with the convective gas transport and the removal of liquid water from the cell.</abstract>
    <parentTitle language="eng">Review of scientific instruments</parentTitle>
    <identifier type="old">36160</identifier>
    <identifier type="doi">10.1063/1.4918291</identifier>
    <identifier type="issn">0034-6748</identifier>
    <identifier type="issn">1089-7623</identifier>
    <enrichment key="date_peer_review">23.04.2015</enrichment>
    <author>C. Tötzke</author>
    <author>I. Manke</author>
    <author>G. Gaiselmann</author>
    <author>J. Bohner</author>
    <author>Bernd R. Müller</author>
    <author>Andreas Kupsch</author>
    <author>Manfred P. Hentschel</author>
    <author>V. Schmidt</author>
    <author>J. Banhart</author>
    <author>W. Lehnert</author>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>PEM fuel cell</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Gas diffusion layer (GDL)</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Compression device</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>X-ray tomography</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Synchrotron</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Tortuosity</value>
    </subject>
    <collection role="literaturgattung" number="">Verlagsliteratur</collection>
    <collection role="fulltextaccess" number="">Datei im Netzwerk der BAM verfügbar ("Closed Access")</collection>
  </doc>
  <doc>
    <id>18662</id>
    <completedYear/>
    <publishedYear>2008</publishedYear>
    <thesisYearAccepted/>
    <language>eng</language>
    <pageFirst>541</pageFirst>
    <pageLast>546</pageLast>
    <pageNumber/>
    <edition/>
    <issue/>
    <volume/>
    <type>bookpartcollection</type>
    <publisherName/>
    <publisherPlace/>
    <creatingCorporation>Institute of Electrical and Electronics Engineers (IEEE)</creatingCorporation>
    <contributingCorporation/>
    <belongsToBibliography>0</belongsToBibliography>
    <completedDate>--</completedDate>
    <publishedDate>--</publishedDate>
    <thesisDateAccepted>--</thesisDateAccepted>
    <title language="eng">Refraction enhanced micro-CT for non-destructive materials characterization</title>
    <parentTitle language="eng">IEEE Nuclear Science Symposium, October 19-25, 2008, Dresden</parentTitle>
    <identifier type="old">20822</identifier>
    <identifier type="isbn">978-1-4244-2715-4</identifier>
    <identifier type="issn">1082-2654</identifier>
    <enrichment key="bibliotheksstandort">Sonderstandort: Publica-Schrank</enrichment>
    <enrichment key="eventName">IEEE Nuclear Science Symposium</enrichment>
    <enrichment key="eventPlace">Dresden, Germany</enrichment>
    <enrichment key="eventStart">2008-10-19</enrichment>
    <enrichment key="eventEnd">2008-10-25</enrichment>
    <author>Bernd R. Müller</author>
    <author>Axel Lange</author>
    <author>Michael Harwardt</author>
    <author>Manfred P. Hentschel</author>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Synchrotron</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Micro-CT</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Refraction</value>
    </subject>
    <collection role="literaturgattung" number="">Verlagsliteratur</collection>
    <collection role="fulltextaccess" number="">Physisches Exemplar in der Bibliothek der BAM vorhanden ("Hardcopy Access")</collection>
  </doc>
  <doc>
    <id>18248</id>
    <completedYear/>
    <publishedYear>2008</publishedYear>
    <thesisYearAccepted/>
    <language>deu</language>
    <pageFirst>580</pageFirst>
    <pageLast>587</pageLast>
    <pageNumber/>
    <edition/>
    <issue>10</issue>
    <volume>50</volume>
    <type>article</type>
    <publisherName>Hanser</publisherName>
    <publisherPlace>München</publisherPlace>
    <creatingCorporation>Bundesanstalt für Materialforschung und -prüfung</creatingCorporation>
    <contributingCorporation/>
    <belongsToBibliography>1</belongsToBibliography>
    <completedDate>--</completedDate>
    <publishedDate>--</publishedDate>
    <thesisDateAccepted>--</thesisDateAccepted>
    <title language="deu">Vom Synchrotron ins Labor - Konversion von Einkristall-Techniken für Röntgenröhren</title>
    <parentTitle language="deu">MP materials testing</parentTitle>
    <identifier type="old">20371</identifier>
    <identifier type="issn">0025-5300</identifier>
    <enrichment key="bibliotheksstandort">Sonderstandort: Publica-Schrank</enrichment>
    <enrichment key="date_peer_review">13.11.2008</enrichment>
    <author>Andreas Kupsch</author>
    <author>Axel Lange</author>
    <author>Jörg Schors</author>
    <author>Bernd R. Müller</author>
    <author>Michael Harwardt</author>
    <subject>
      <language>deu</language>
      <type>uncontrolled</type>
      <value>Einkristall</value>
    </subject>
    <subject>
      <language>deu</language>
      <type>uncontrolled</type>
      <value>Röntgenbeugung</value>
    </subject>
    <subject>
      <language>deu</language>
      <type>uncontrolled</type>
      <value>Synchrotron</value>
    </subject>
    <subject>
      <language>deu</language>
      <type>uncontrolled</type>
      <value>Divergenz</value>
    </subject>
    <collection role="literaturgattung" number="">Eigenverlag BAM</collection>
    <collection role="fulltextaccess" number="">Physisches Exemplar in der Bibliothek der BAM vorhanden ("Hardcopy Access")</collection>
  </doc>
  <doc>
    <id>47856</id>
    <completedYear/>
    <publishedYear>2019</publishedYear>
    <thesisYearAccepted/>
    <language>eng</language>
    <pageFirst/>
    <pageLast/>
    <pageNumber/>
    <edition/>
    <issue/>
    <volume/>
    <type>lecture</type>
    <publisherName/>
    <publisherPlace/>
    <creatingCorporation/>
    <contributingCorporation/>
    <belongsToBibliography>0</belongsToBibliography>
    <completedDate>--</completedDate>
    <publishedDate>--</publishedDate>
    <thesisDateAccepted>--</thesisDateAccepted>
    <title language="eng">Division 8.5 - Micro NDE - Key Competence Areas</title>
    <abstract language="deu">Der Vortrag gibt einen Überblick über die Kernkompetenzen des Fachbereichs 8.5  Mikro-ZfP (CT Apparaturen, Röntgen-Refraktion, WAXS - Texturanalyse, Datenkorrektur, Rekonstruktionsalgorithmen, Bildanalyse, dimensionelle Kontrolle, Multi-Source Datenfusion und Kombination, micromechanische Eigenschaften mittels Neutronen Diffraktion), im Hinblick auf die Charakterisierung von Leichtbauwerkstoffen (Faserverbunde, Aluminium und Titan MMCs), die in der Luftfahrt verwendet werden. Der Schwerpunkt liegt dabei auf der Charakterisierung mittels Synchrotron und Röntgen Refraktionstechniken sowie Computertomographie.</abstract>
    <abstract language="eng">The lecture gives an overview of the core competencies of the department 8.5 Micro NDT (CT equipment, X-Ray Refraction, WAXS - Texture analysis, Data correction, Reconstruction algorithms, Image analysis, Dimensional control, Multi-Source Data Fusion and Combination, Micromechanical Properties by Neutron Diffraction) with regard to the characterization of lightweight materials (fibre composites, aluminum and titanium MMCs) used in aviation. The focus is on characterization by synchrotron and X-ray refraction techniques as well as computed tomography.</abstract>
    <enrichment key="eventName">DGZfP Fachausschuss Luftfahrt</enrichment>
    <enrichment key="eventPlace">BAM - Berlin, Germany</enrichment>
    <enrichment key="eventStart">18.04.2019</enrichment>
    <enrichment key="eventEnd">18.04.2019</enrichment>
    <enrichment key="opus.doi.autoCreate">false</enrichment>
    <enrichment key="opus.urn.autoCreate">true</enrichment>
    <enrichment key="InvitedTalks">0</enrichment>
    <author>Bernd R. Müller</author>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Synchrotron</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Refraction</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Microstructure Characterization</value>
    </subject>
    <collection role="ddc" number="620">Ingenieurwissenschaften und zugeordnete Tätigkeiten</collection>
    <collection role="fulltextaccess" number="">Datei im Netzwerk der BAM verfügbar ("Closed Access")</collection>
    <collection role="literaturgattung" number="">Präsentation</collection>
  </doc>
  <doc>
    <id>29939</id>
    <completedYear/>
    <publishedYear>2013</publishedYear>
    <thesisYearAccepted/>
    <language>eng</language>
    <pageFirst>169</pageFirst>
    <pageLast>176</pageLast>
    <pageNumber/>
    <edition/>
    <issue>4</issue>
    <volume>4</volume>
    <type>article</type>
    <publisherName>Göller</publisherName>
    <publisherPlace>Baden-Baden</publisherPlace>
    <creatingCorporation/>
    <contributingCorporation/>
    <belongsToBibliography>0</belongsToBibliography>
    <completedDate>--</completedDate>
    <publishedDate>--</publishedDate>
    <thesisDateAccepted>--</thesisDateAccepted>
    <title language="eng">Evaluating porosity in cordierite diesel particulate filter materials, part 1 X-ray refraction</title>
    <abstract language="eng">Bi-continuous porous ceramics for filtration applications possess a particularly complicated microstructure, with porosity and solid matter being intermingled. Mechanical, thermal, and filtration properties can only be precisely estimated if the morphology of both solid matter and porosity can be quantitatively determined. Using x-ray absorption and refraction, we quantitatively evaluate porosity and pore orientation in cordierite diesel particulate filter ceramics. Porosity values turn out to agree with mercury intrusion measurements, while pore orientation factors agree with published crystallographic texture data.</abstract>
    <parentTitle language="eng">Journal of ceramic science and technology</parentTitle>
    <identifier type="old">32876</identifier>
    <identifier type="doi">10.4416/JCST2013-00021</identifier>
    <identifier type="issn">2190-9385</identifier>
    <author>Andreas Kupsch</author>
    <author>Axel Lange</author>
    <author>Manfred P. Hentschel</author>
    <author>Yener Onel</author>
    <author>Thomas Wolk</author>
    <author>Andreas Staude</author>
    <author>Karsten Ehrig</author>
    <author>Bernd R. Müller</author>
    <author>Giovanni Bruno</author>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Porous ceramics</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Pore orientation</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>X-ray refraction</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Synchrotron</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Interface</value>
    </subject>
    <collection role="literaturgattung" number="">Verlagsliteratur</collection>
    <collection role="fulltextaccess" number="">Datei im Netzwerk der BAM verfügbar ("Closed Access")</collection>
  </doc>
  <doc>
    <id>38278</id>
    <completedYear/>
    <publishedYear>2015</publishedYear>
    <thesisYearAccepted/>
    <language>eng</language>
    <pageFirst/>
    <pageLast/>
    <pageNumber/>
    <edition/>
    <issue/>
    <volume/>
    <type>poster</type>
    <publisherName/>
    <publisherPlace/>
    <creatingCorporation/>
    <contributingCorporation/>
    <belongsToBibliography>0</belongsToBibliography>
    <completedDate>--</completedDate>
    <publishedDate>--</publishedDate>
    <thesisDateAccepted>--</thesisDateAccepted>
    <title language="eng">3D imaging of hydrogen assisted cracking using analyser-based imaging</title>
    <abstract language="eng">To better understand the mechanism of hydrogen assisted cracking (HAC), it is important to investigate the 3D structure of the cracks non-destructively. Since, cracks introduced by HAC are usually very small, conventional x-ray imaging methods often lack the required spatial resolution.&#13;
However, the detection of those cracks can be enhanced by taking advantage of refraction at interfaces within the sample.&#13;
To image this refractive deflection we employ analyser based imaging (ABI). In this work we aim at proving the enhanced crack detection of ABI by investigating an alluminum alloy weld.</abstract>
    <enrichment key="eventName">BESSY User Meeting 2015</enrichment>
    <enrichment key="eventPlace">Berlin, Germany</enrichment>
    <enrichment key="eventStart">09.12.2015</enrichment>
    <enrichment key="eventEnd">11.12.2015</enrichment>
    <author>René Laquai</author>
    <author>Thomas Schaupp</author>
    <author>Bernd R. Müller</author>
    <author>Axel Griesche</author>
    <author>Giovanni Bruno</author>
    <author>Thomas Kannengießer</author>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>X-ray refraction</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Synchrotron</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Analyser-based imaging</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Hydrogen assisted cracking</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Welding</value>
    </subject>
    <collection role="ddc" number="620">Ingenieurwissenschaften und zugeordnete Tätigkeiten</collection>
    <collection role="fulltextaccess" number="">Datei im Netzwerk der BAM verfügbar ("Closed Access")</collection>
    <collection role="literaturgattung" number="">Präsentation</collection>
  </doc>
</export-example>
