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    <issue>11</issue>
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    <title language="eng">Development and application of reference and routine analytical methods providing SI-traceable results for the determination of technology-critical elements in PCB from WEEE</title>
    <abstract language="eng">The recovery and reprocessing of technology-critical elements (TCE) present in printed circuit boards (PCB) from electrical and electronic waste is essential both for recycling valuable materials subject to supply risk and for reducing the environmental impact. Although the quantitative knowledge of TCE amounts in endof- life PCB plays a key role, there are neither matrix certified reference materials nor harmonized analytical methods available to establish the traceability of the results to the International System of Units. To fill these gaps, we developed and applied five reference analytical methods based on ICP-MS standard addition calibrations and INAA k0- and relative calibrations suitable to certify reference materials. In addition, we developed and tested six analytical methods based on more commonly used ICP-MS external standard calibrations to provide industry with routine analysis methods. Twenty TCE (Ag, Au, Co, Cu, Dy, Ga, Gd, Ge, In, La, Li, Nd, Ni, Pd, Pr, Pt, Rh, Sm, Ta and Ti) were selected as target analytes and a batch of powdered PCB was used as measurement material. An overall mutual agreement was observed among data collected by reference methods at a few percent relative uncertainty levels. Moreover, all but one of the methods developed for routine analysis demonstrated their suitability in industrial applications by producing data within ± 20% of the values established with reference methods.</abstract>
    <parentTitle language="eng">Journal of Analytical Atomic Spectrometry</parentTitle>
    <identifier type="doi">10.1039/d4ja00235k</identifier>
    <identifier type="issn">1364-5544</identifier>
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    <enrichment key="date_peer_review">08.10.2024</enrichment>
    <licence>Creative Commons - CC BY - Namensnennung 4.0 International</licence>
    <author>Giancarlo D'Agostino</author>
    <author>Marcus Oelze</author>
    <author>Jochen Vogl</author>
    <author>Jean-Philippe Ghestem</author>
    <author>Nicolas Lafaurie</author>
    <author>Ole Klein</author>
    <author>Daniel Pröfrock</author>
    <author>Marco Di Luzio</author>
    <author>Luigi Bergamaschi</author>
    <author>Radojko Jaćimović</author>
    <author>Caroline Oster</author>
    <author>Johanna Irrgeher</author>
    <author>Shaun T. Lancaster</author>
    <author>Anna Walch</author>
    <author>Anita Röthke</author>
    <author>Lena Michaliszyn</author>
    <author>Axel Pramann</author>
    <author>Olaf Rienitz</author>
    <author>Timo Sara-Aho</author>
    <author>Oktay Cankur</author>
    <author>Derya Kutan</author>
    <author>Johanna Noireaux</author>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Technology critical elements</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Electronic waste</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Printed circuit boards</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Traceability</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Uncertainty</value>
    </subject>
    <collection role="ddc" number="628">Sanitär- und Kommunaltechnik; Umwelttechnik</collection>
    <collection role="institutes" number="">1 Analytische Chemie; Referenzmaterialien</collection>
    <collection role="institutes" number="">1.1 Anorganische Spurenanalytik</collection>
    <collection role="themenfelder" number="">Umwelt</collection>
    <collection role="themenfelder" number="">Circular Economy</collection>
    <collection role="literaturgattung" number="">Verlagsliteratur</collection>
    <collection role="fulltextaccess" number="">Datei für die Öffentlichkeit verfügbar ("Open Access")</collection>
    <collection role="unnumberedseries" number="">Wissenschaftliche Artikel der BAM</collection>
    <thesisPublisher>Bundesanstalt für Materialforschung und -prüfung (BAM)</thesisPublisher>
    <file>https://opus4.kobv.de/opus4-bam/files/61241/Dagostino-et-al_Reference-methods-TCE-in-PCB_JAAS-2024.pdf</file>
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    <pageFirst>496</pageFirst>
    <pageLast>505</pageLast>
    <pageNumber/>
    <edition/>
    <issue/>
    <volume>190</volume>
    <type>article</type>
    <publisherName>Elsevier B.V.</publisherName>
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    <belongsToBibliography>1</belongsToBibliography>
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    <title language="eng">Evaluation of X-ray fluorescence for analysing critical elements in three electronic waste matrices: A comprehensive comparison of analytical techniques</title>
    <abstract language="eng">As the drive towards recycling electronic waste increases, demand for rapid and reliable analytical methodology to analyse the metal content of the waste is increasing, e.g. to assess the value of the waste and to decide the correct recycling routes. Here, we comprehensively assess the suitability of different x-ray fluorescence spectroscopy (XRF)-based techniques as rapid analytical tools for the determination of critical raw materials, such as Al, Ti, Mn, Fe, Co, Ni, Cu, Zn, Nb, Pd and Au, in three electronic waste matrices: printed circuit boards (PCB), light emitting diodes (LED), and lithium (Li)-ion batteries. As validated reference methods and materials to establish metrological traceability are lacking, several laboratories measured test samples of each matrix using XRF as well as other independent complementary techniques (instrumental neutron activation analysis (INAA), inductively coupled plasma mass spectrometry (ICP-MS) and ICP optical emission spectrometry (OES)) as an inter-laboratory comparison (ILC). Results highlighted key aspects of sample preparation, limits of detection, and spectral interferences that affect the reliability of XRF, while additionally highlighting that XRF can provide more reliable data for certain elements compared to digestion-based approaches followed by ICP-MS analysis (e.g. group 4 and 5 metals). A clear distinction was observed in data processing methodologies for wavelength&#13;
dispersive XRF, highlighting that considering the metals present as elements (rather than oxides) induces overestimations of the mass fractions when compared to other techniques. Eventually, the effect of sample particle size was studied and indicated that smaller particle size (&lt;200 μm) is essential for reliable determinations.</abstract>
    <parentTitle language="eng">Waste Management</parentTitle>
    <identifier type="doi">10.1016/j.wasman.2024.10.015</identifier>
    <identifier type="urn">urn:nbn:de:kobv:b43-614060</identifier>
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    <author>Shaun T. Lancaster</author>
    <author>Eskil Sahlin</author>
    <author>Marcus Oelze</author>
    <author>Markus Ostermann</author>
    <author>Jochen Vogl</author>
    <author>Valérie Laperche</author>
    <author>Solène Touze</author>
    <author>Jean-Philippe Ghestem</author>
    <author>Claire Dalencourt</author>
    <author>Régine Gendre</author>
    <author>Jessica Stammeier</author>
    <author>Ole Klein</author>
    <author>Daniel Pröfrock</author>
    <author>Gala Košarac</author>
    <author>Aida Jotanovic</author>
    <author>Luigi Bergamaschi</author>
    <author>Marco Di Luzio</author>
    <author>Giancarlo D’Agostino</author>
    <author>Radojko Jaćimović</author>
    <author>Melissa Eberhard</author>
    <author>Laura Feiner</author>
    <author>Simone Trimmel</author>
    <author>Alessandra Rachetti</author>
    <author>Timo Sara-Aho</author>
    <author>Anita Roethke</author>
    <author>Lena Michaliszyn</author>
    <author>Axel Pramann</author>
    <author>Olaf Rienitz</author>
    <author>Johanna Irrgeher</author>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>XRF</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>WEEE</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>PCB</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Battery</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>LED</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Recycling</value>
    </subject>
    <collection role="ddc" number="543">Analytische Chemie</collection>
    <collection role="ddc" number="628">Sanitär- und Kommunaltechnik; Umwelttechnik</collection>
    <collection role="institutes" number="">1 Analytische Chemie; Referenzmaterialien</collection>
    <collection role="institutes" number="">1.1 Anorganische Spurenanalytik</collection>
    <collection role="themenfelder" number="">Umwelt</collection>
    <collection role="themenfelder" number="">Circular Economy</collection>
    <collection role="themenfelder" number="">Chemie und Prozesstechnik</collection>
    <collection role="themenfelder" number="">Chemische Charakterisierung und Spurenanalytik</collection>
    <collection role="literaturgattung" number="">Verlagsliteratur</collection>
    <collection role="fulltextaccess" number="">Datei für die Öffentlichkeit verfügbar ("Open Access")</collection>
    <collection role="unnumberedseries" number="">Wissenschaftliche Artikel der BAM</collection>
    <thesisPublisher>Bundesanstalt für Materialforschung und -prüfung (BAM)</thesisPublisher>
    <file>https://opus4.kobv.de/opus4-bam/files/61406/Lancaster-et-al_XRF-of-TCE-in-electronical-waste_Waste-Management-2024.pdf</file>
  </doc>
</export-example>
