<?xml version="1.0" encoding="utf-8"?>
<export-example>
  <doc>
    <id>23895</id>
    <completedYear/>
    <publishedYear>2011</publishedYear>
    <thesisYearAccepted/>
    <language>eng</language>
    <pageFirst>541</pageFirst>
    <pageLast>548</pageLast>
    <pageNumber/>
    <edition/>
    <issue/>
    <volume>1335</volume>
    <type>conferenceobject</type>
    <publisherName>American Institute of Physics</publisherName>
    <publisherPlace>Melville, NY, USA</publisherPlace>
    <creatingCorporation/>
    <contributingCorporation/>
    <belongsToBibliography>1</belongsToBibliography>
    <completedDate>--</completedDate>
    <publishedDate>--</publishedDate>
    <thesisDateAccepted>--</thesisDateAccepted>
    <title language="eng">Time of flight diffraction (ToFD) with THz radiation - an alternative to the ultra sound - ToFD technique for non-metallic materials</title>
    <abstract language="eng">A time domain spectrometer in the range of 0.5–2 THz was used for time of flight (ToF) measurements of THz pulses for imperfection detection in non metallic materials. The measurements were performed in comparison to the established ultra sound pulse echo (PE) and time of flight diffraction (ToFD) technique. No coupling agent and no contact to the surface is required for THz ToFD measurements. Plastic test specimen with notches, voids and drilled side holes were used to study reflected and diffracted response signals. No major differences were observed between the UT and THz ToFD records for the first surface of the notches, voids and holes. Additionally to the UT records also signals were obtained from its back side and a second raw of holes. The THz measurement is fast and has the potential to substitute UT applications in some industrial areas. Within the German project 'Handheld' the potential for miniaturization of the time domain equipment is explored for efficient application.</abstract>
    <parentTitle language="eng">AIP Conference proceedings 1335</parentTitle>
    <identifier type="old">26503</identifier>
    <identifier type="doi">10.1063/1.3591898</identifier>
    <identifier type="issn">0094-243X</identifier>
    <enrichment key="date_peer_review">23.06.2011</enrichment>
    <author>Uwe Ewert</author>
    <author>Jörg Beckmann</author>
    <author>Lars von Chrzanowski</author>
    <author>Gerhard Brekow</author>
    <author>Daniel Brackrock</author>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Spectrometers</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Ultrasonic diffraction</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Acoustic signal processing</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Voids (solid)</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Terahertz time domain spectroscopy</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Ultrasonic</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Time of flight diffraction</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Non destructive testing</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Polymers</value>
    </subject>
    <collection role="literaturgattung" number="">Verlagsliteratur</collection>
    <collection role="fulltextaccess" number="">Datei im Netzwerk der BAM verfügbar ("Closed Access")</collection>
  </doc>
</export-example>
