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  <doc>
    <id>38436</id>
    <completedYear/>
    <publishedYear>2016</publishedYear>
    <thesisYearAccepted/>
    <language>eng</language>
    <pageFirst>1846</pageFirst>
    <pageLast>1847</pageLast>
    <pageNumber/>
    <edition/>
    <issue>Suppl 3</issue>
    <volume>22</volume>
    <type>article</type>
    <publisherName>Cambridge</publisherName>
    <publisherPlace/>
    <creatingCorporation/>
    <contributingCorporation/>
    <belongsToBibliography>0</belongsToBibliography>
    <completedDate>--</completedDate>
    <publishedDate>--</publishedDate>
    <thesisDateAccepted>--</thesisDateAccepted>
    <title language="eng">Electrospray deposition of nanoparticles on TEM grids</title>
    <abstract language="eng">The authors have tested the prototype of an electrospray deposition system developed by the company RAMEM under its trademark IONER. To test the prototype and assess its performance, several materials have been sprayed onto TEM grids and the resulting particle distributions were compared to more traditional sample preparation strategies like the “drop on grid” method. Operation parameters such as the sample flow-rate, capillary – substrate distance, electric field strength and sampling period length have been optimized. It was found that the particles deposited by electrospray generally show a much more homogeneous spatial distribution on the substrate and a substantial increase of the number of single particles, which are much better suited to an automatic image evaluation procedure than the agglomerated particles observed otherwise. The applicability of the technique to a broad range of materials is demonstrated by various examples, but also the influence of the substrate, the choice of the particular TEM grid, on the obtained spatial particle distribution is assessed.</abstract>
    <parentTitle language="eng">Microscopy and Microanalysis</parentTitle>
    <identifier type="doi">10.1017/S1431927616010072</identifier>
    <identifier type="url">https://www.cambridge.org/core/journals/microscopy-and-microanalysis/article/electrospray-deposition-of-nanoparticles-on-tem-grids/459E634B7F74D474A19E15E69DA82E5D</identifier>
    <identifier type="issn">1431-9276</identifier>
    <identifier type="issn">1435-8115</identifier>
    <author>Johannes Mielke</author>
    <author>P. Dohányosová</author>
    <author>S. Lopez</author>
    <author>Vasile-Dan Hodoroaba</author>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Electrspray deposition</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Electron microscopy</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Nanoparticles</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Sample preparation</value>
    </subject>
    <collection role="ddc" number="543">Analytische Chemie</collection>
    <collection role="literaturgattung" number="">Verlagsliteratur</collection>
    <collection role="fulltextaccess" number="">Datei im Netzwerk der BAM verfügbar ("Closed Access")</collection>
  </doc>
  <doc>
    <id>39244</id>
    <completedYear/>
    <publishedYear>2017</publishedYear>
    <thesisYearAccepted/>
    <language>eng</language>
    <pageFirst>163</pageFirst>
    <pageLast>172</pageLast>
    <pageNumber/>
    <edition/>
    <issue>1</issue>
    <volume>23</volume>
    <type>article</type>
    <publisherName>Cambridge University Press</publisherName>
    <publisherPlace/>
    <creatingCorporation/>
    <contributingCorporation/>
    <belongsToBibliography>1</belongsToBibliography>
    <completedDate>--</completedDate>
    <publishedDate>--</publishedDate>
    <thesisDateAccepted>--</thesisDateAccepted>
    <title language="eng">Evaluation of electrospray as a sample preparation tool for electron microscopic investigations: Toward quantitative evaluation of nanoparticles</title>
    <abstract language="eng">The potential of electrospray deposition, for the controlled preparation of particles for imaging in electron microscopes, is evaluated on various materials: from mono-modal suspensions of spherical particles to multimodal suspensions and to real-world industrial materials. It is shown that agglomeration is reduced substantially on the sample carrier, compared with conventional sample preparation techniques. For the first time, it is possible to assess the number concentration of a tri-modal polystyrene suspension by electron microscopy, due to the high Deposition efficiency of the electrospray. We discovered that some suspension stabilizing surfactants form artifact particles during electrospraying. These can be avoided by optimizing the sprayed suspension.</abstract>
    <parentTitle language="eng">Microscopy and Microanalysis</parentTitle>
    <identifier type="doi">10.1017/S1431927616012587</identifier>
    <identifier type="issn">1431-9276</identifier>
    <identifier type="issn">1435-8115</identifier>
    <enrichment key="date_peer_review">01.12.2017</enrichment>
    <author>Johannes Mielke</author>
    <author>P. Dohányosová</author>
    <author>P. Müller</author>
    <author>S. López-Vidal</author>
    <author>Vasile-Dan Hodoroaba</author>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Electrospary</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Nanoparticles</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Sample preparation</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>TEM grid</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>SEM</value>
    </subject>
    <collection role="ddc" number="543">Analytische Chemie</collection>
    <collection role="literaturgattung" number="">Verlagsliteratur</collection>
    <collection role="fulltextaccess" number="">Datei im Netzwerk der BAM verfügbar ("Closed Access")</collection>
  </doc>
  <doc>
    <id>42453</id>
    <completedYear/>
    <publishedYear>2017</publishedYear>
    <thesisYearAccepted/>
    <language>eng</language>
    <pageFirst>1896</pageFirst>
    <pageLast>1897</pageLast>
    <pageNumber/>
    <edition/>
    <issue>S1 (July)</issue>
    <volume>23</volume>
    <type>article</type>
    <publisherName>Cambridge University Press</publisherName>
    <publisherPlace>New York, NY, U.S.A.</publisherPlace>
    <creatingCorporation/>
    <contributingCorporation/>
    <belongsToBibliography>0</belongsToBibliography>
    <completedDate>--</completedDate>
    <publishedDate>--</publishedDate>
    <thesisDateAccepted>--</thesisDateAccepted>
    <title language="eng">Electrospray as a sample preparation tool for electron microscopic investigations: Toward quantitative evaluation of nanoparticles</title>
    <abstract language="eng">The potential of electrospray deposition, for the controlled preparation of particles for imaging in electron microscopes, is evaluated on various materials: from mono-modal suspensions of spherical particles to multimodal suspensions and to real-world industrial materials. It is shown that agglomeration is reduced substantially on the sample carrier, compared with conventional sample preparation techniques. For the first time, it is possible to assess the number concentration of a tri-modal polystyrene suspension by electron microscopy, due to the high deposition efficiency of the electrospray. We discovered that some suspension stabilizing surfactants form artifact particles during electrospraying. These can be avoided by optimizing the sprayed suspension.</abstract>
    <parentTitle language="eng">Microscopy and Microanalysis</parentTitle>
    <identifier type="doi">10.1017/S1431927617010145</identifier>
    <identifier type="url">https://www.cambridge.org/core/journals/microscopy-and-microanalysis/article/electrospray-as-a-sample-preparation-tool-for-electron-microscopic-investigations-toward-quantitative-evaluation-of-nanoparticles/483B212FF290B7EC001A212A19E4E72A</identifier>
    <identifier type="issn">1435-8115</identifier>
    <identifier type="issn">1431-9276</identifier>
    <author>Johannes Mielke</author>
    <author>P. Dohányosová</author>
    <author>P. Müller</author>
    <author>S. Lopez</author>
    <author>Vasile-Dan Hodoroaba</author>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Electrospray deposition</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Nanoparticles</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>SEM</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>TEM</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Sample preparation</value>
    </subject>
    <collection role="ddc" number="543">Analytische Chemie</collection>
    <collection role="literaturgattung" number="">Verlagsliteratur</collection>
    <collection role="fulltextaccess" number="">Datei im Netzwerk der BAM verfügbar ("Closed Access")</collection>
  </doc>
</export-example>
