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  <doc>
    <id>35481</id>
    <completedYear/>
    <publishedYear>2016</publishedYear>
    <thesisYearAccepted/>
    <language>eng</language>
    <pageFirst>Paper ID17, 1</pageFirst>
    <pageLast>7</pageLast>
    <pageNumber/>
    <edition/>
    <issue/>
    <volume/>
    <type>conferenceobject</type>
    <publisherName/>
    <publisherPlace/>
    <creatingCorporation/>
    <contributingCorporation/>
    <belongsToBibliography>0</belongsToBibliography>
    <completedDate>--</completedDate>
    <publishedDate>--</publishedDate>
    <thesisDateAccepted>--</thesisDateAccepted>
    <title language="eng">Numerical measurement uncertainty determination for dimensional measurements of microparts with CT</title>
    <abstract language="eng">Up to now, the only standardized method to determine the measurement uncertainty for computed tomography (CT) is to use calibrated workpieces as specified in the Guideline VDI/VDE 2630 Part 2.1. This paper discusses a promising numerical method for uncertainty determination with help of a virtual metrological CT (VMCT). It gives an explanation of the adjustments, the input parameters and the execution of the simulation. Furthermore, it discusses the first results of uncertainty determination compared to the method of using calibrated workpieces with the aid of two example cases.</abstract>
    <parentTitle language="eng">6th Conference on Industrial Computed Tomography (iCT) 2016, 9-12 February 2016, Wels, Austria</parentTitle>
    <identifier type="url">http://www.ndt.net/article/ctc2016/papers/ICT2016_paper_id17.pdf</identifier>
    <enrichment key="eventName">6th Conference on Industrial Computed Tomography (iCT)</enrichment>
    <enrichment key="eventPlace">Wels, Austria</enrichment>
    <enrichment key="eventStart">09.02.2016</enrichment>
    <enrichment key="eventEnd">12.02.2016</enrichment>
    <author>E. Helmecke</author>
    <author>M. Fleßner</author>
    <author>M. Kaufmann</author>
    <author>Andreas Staude</author>
    <author>T. Hausotte</author>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>simulation</value>
    </subject>
    <subject>
      <language>deu</language>
      <type>uncontrolled</type>
      <value>Simulation</value>
    </subject>
    <subject>
      <language>deu</language>
      <type>uncontrolled</type>
      <value>Computertomographie</value>
    </subject>
    <subject>
      <language>deu</language>
      <type>uncontrolled</type>
      <value>Dimensionelle Metrologie</value>
    </subject>
    <subject>
      <language>deu</language>
      <type>uncontrolled</type>
      <value>Normung</value>
    </subject>
    <subject>
      <language>deu</language>
      <type>uncontrolled</type>
      <value>numerische Messunsicherheitsbestimmung</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>computed tomography</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>dimensional metrology</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>standardization</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>numerical uncertainty determination</value>
    </subject>
    <collection role="ddc" number="543">Analytische Chemie</collection>
    <collection role="fulltextaccess" number="">Datei im Netzwerk der BAM verfügbar ("Closed Access")</collection>
    <collection role="literaturgattung" number="">Graue Literatur</collection>
  </doc>
</export-example>
