<?xml version="1.0" encoding="utf-8"?>
<export-example>
  <doc>
    <id>17553</id>
    <completedYear/>
    <publishedYear>2008</publishedYear>
    <thesisYearAccepted/>
    <language>eng</language>
    <pageFirst>2418</pageFirst>
    <pageLast>2423</pageLast>
    <pageNumber/>
    <edition/>
    <issue>10</issue>
    <volume>266</volume>
    <type>article</type>
    <publisherName>Elsevier</publisherName>
    <publisherPlace>Amsterdam</publisherPlace>
    <creatingCorporation/>
    <contributingCorporation/>
    <belongsToBibliography>1</belongsToBibliography>
    <completedDate>--</completedDate>
    <publishedDate>--</publishedDate>
    <thesisDateAccepted>--</thesisDateAccepted>
    <title language="eng">A thin-layer reference material for hydrogen analysis</title>
    <abstract language="eng">In many areas of material sciences, hydrogen analysis is of particular importance. For example, hydrogen is most abundant as impurity in thin film materials  depending on the deposition process  and has great influence on the chemical, physical and electrical properties of many materials. Existing bulk reference materials (RMs) are not suited for surface sensitive analytical methods like elastic recoil detection analysis (ERDA) or nuclear reaction analysis (NRA). To overcome this serious lack of (certified) thin-layer reference materials for the determination of hydrogen in the near-surface region (12 µm depth), we produced stable, homogeneous amorphous silicon layers on Si-wafers (aSi:HSi) by means of chemical vapour deposition (CVD), while about 10% of hydrogen was incorporated in the Si-layer. Homogeneity and stability were proved by NRA whereas traceability of reference values has been assured by an international interlaboratory comparison.</abstract>
    <parentTitle language="eng">Nuclear instruments and methods in physics research B</parentTitle>
    <identifier type="old">19620</identifier>
    <identifier type="doi">10.1016/j.nimb.2008.03.015</identifier>
    <identifier type="issn">0168-583X</identifier>
    <identifier type="issn">1872-9584</identifier>
    <enrichment key="bibliotheksstandort">Sonderstandort: Publica-Schrank</enrichment>
    <enrichment key="date_peer_review">05.06.2008</enrichment>
    <author>Uwe Reinholz</author>
    <author>Wolfram Bremser</author>
    <author>Klaus-Werner Brzezinka</author>
    <author>Erik Strub</author>
    <author>Hans-Peter Weise</author>
    <author>Silke Merchel</author>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Hydrogen</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Nuclear reaction analysis</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Depth profiling</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Reference material</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Ion beam analysis</value>
    </subject>
    <collection role="literaturgattung" number="">Verlagsliteratur</collection>
    <collection role="fulltextaccess" number="">Physisches Exemplar in der Bibliothek der BAM vorhanden ("Hardcopy Access")</collection>
  </doc>
  <doc>
    <id>6846</id>
    <completedYear/>
    <publishedYear>2005</publishedYear>
    <thesisYearAccepted/>
    <language>eng</language>
    <pageFirst>42</pageFirst>
    <pageLast>45</pageLast>
    <pageNumber/>
    <edition/>
    <issue/>
    <volume>34</volume>
    <type>article</type>
    <publisherName>Wiley</publisherName>
    <publisherPlace>Chichester</publisherPlace>
    <creatingCorporation/>
    <contributingCorporation/>
    <belongsToBibliography>1</belongsToBibliography>
    <completedDate>--</completedDate>
    <publishedDate>--</publishedDate>
    <thesisDateAccepted>--</thesisDateAccepted>
    <title language="eng">An external PIXE study: Mughal painting pigments</title>
    <parentTitle language="eng">X-ray spectrometry</parentTitle>
    <identifier type="old">7264</identifier>
    <identifier type="issn">0049-8246</identifier>
    <enrichment key="bibliotheksstandort">Sonderstandort: Publica-Schrank</enrichment>
    <enrichment key="date_peer_review">07.02.2005</enrichment>
    <author>I. Reiche</author>
    <author>Ralf Britzke</author>
    <author>Gregor Bukalis</author>
    <author>Uwe Reinholz</author>
    <author>Hans-Peter Weise</author>
    <author>R.D. Gadebusch</author>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>PIXE</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Mughal painting</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Pigments</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Archaeometry</value>
    </subject>
    <collection role="literaturgattung" number="">Verlagsliteratur</collection>
    <collection role="fulltextaccess" number="">Physisches Exemplar in der Bibliothek der BAM vorhanden ("Hardcopy Access")</collection>
  </doc>
  <doc>
    <id>8313</id>
    <completedYear/>
    <publishedYear>1975</publishedYear>
    <thesisYearAccepted/>
    <language>eng</language>
    <pageFirst>1768</pageFirst>
    <pageLast>1769</pageLast>
    <pageNumber/>
    <edition/>
    <issue>8</issue>
    <volume>14</volume>
    <type>article</type>
    <publisherName>Optical Society of America</publisherName>
    <publisherPlace>Washington, DC</publisherPlace>
    <creatingCorporation/>
    <contributingCorporation/>
    <belongsToBibliography>1</belongsToBibliography>
    <completedDate>--</completedDate>
    <publishedDate>--</publishedDate>
    <thesisDateAccepted>--</thesisDateAccepted>
    <title language="eng">Test Colors for Specifying Color Reproduction</title>
    <parentTitle language="eng">Applied optics</parentTitle>
    <identifier type="old">8788</identifier>
    <identifier type="issn">0003-6935</identifier>
    <identifier type="issn">1539-4522</identifier>
    <enrichment key="bibliotheksstandort">ZM 54/22:1975/172</enrichment>
    <enrichment key="date_peer_review">16.07.2002</enrichment>
    <author>Karin Witt</author>
    <author>Peter Otto</author>
    <author>Hans-Peter Weise</author>
    <collection role="literaturgattung" number="">Verlagsliteratur</collection>
    <collection role="fulltextaccess" number="">Physisches Exemplar in der Bibliothek der BAM vorhanden ("Hardcopy Access")</collection>
  </doc>
  <doc>
    <id>8779</id>
    <completedYear/>
    <publishedYear>1977</publishedYear>
    <thesisYearAccepted/>
    <language>deu</language>
    <pageFirst>426</pageFirst>
    <pageLast>430</pageLast>
    <pageNumber/>
    <edition/>
    <issue>10</issue>
    <volume>19</volume>
    <type>article</type>
    <publisherName>Carl Hanser Verlag</publisherName>
    <publisherPlace>München</publisherPlace>
    <creatingCorporation>Bundesanstalt für Materialforschung und -prüfung</creatingCorporation>
    <contributingCorporation/>
    <belongsToBibliography>1</belongsToBibliography>
    <completedDate>--</completedDate>
    <publishedDate>--</publishedDate>
    <thesisDateAccepted>--</thesisDateAccepted>
    <title language="deu">Messung, Interpretation und Vergleich der Energieverteilungen von Röntgenstrahlen verschiedener industrieller Röntgenanlagen</title>
    <parentTitle language="deu">Materialprüfung = Materials testing</parentTitle>
    <identifier type="old">9257</identifier>
    <identifier type="issn">0025-5300</identifier>
    <enrichment key="bibliotheksstandort">ZM 54/24:1977/199</enrichment>
    <enrichment key="date_peer_review">26.07.2002</enrichment>
    <author>Peter Jost</author>
    <author>Hans-Peter Weise</author>
    <author>Wolfgang Freundt</author>
    <author>Eberhard Mundry</author>
    <author>Dierk Schnitger</author>
    <collection role="literaturgattung" number="">Eigenverlag BAM</collection>
    <collection role="fulltextaccess" number="">Physisches Exemplar in der Bibliothek der BAM vorhanden ("Hardcopy Access")</collection>
  </doc>
  <doc>
    <id>8790</id>
    <completedYear/>
    <publishedYear>1977</publishedYear>
    <thesisYearAccepted/>
    <language>deu</language>
    <pageFirst>420</pageFirst>
    <pageLast>423</pageLast>
    <pageNumber/>
    <edition/>
    <issue>10</issue>
    <volume>19</volume>
    <type>article</type>
    <publisherName>Carl Hanser Verlag</publisherName>
    <publisherPlace>München</publisherPlace>
    <creatingCorporation>Bundesanstalt für Materialforschung und -prüfung</creatingCorporation>
    <contributingCorporation/>
    <belongsToBibliography>1</belongsToBibliography>
    <completedDate>--</completedDate>
    <publishedDate>--</publishedDate>
    <thesisDateAccepted>--</thesisDateAccepted>
    <title language="deu">Untersuchung der Energie und Winkelverteilung der Streustrahlung und Ihre Bedeutung für die Durchstrahlungsprüfung</title>
    <parentTitle language="deu">Materialprüfung = Materials testing</parentTitle>
    <identifier type="old">9268</identifier>
    <identifier type="issn">0025-5300</identifier>
    <enrichment key="bibliotheksstandort">ZM 54/24:1977/210</enrichment>
    <enrichment key="date_peer_review">26.07.2002</enrichment>
    <author>Hans-Peter Weise</author>
    <author>Peter Jost</author>
    <author>Wolfgang Freundt</author>
    <author>Hans-Joachim Malitte</author>
    <author>Dierk Schnitger</author>
    <collection role="literaturgattung" number="">Eigenverlag BAM</collection>
    <collection role="fulltextaccess" number="">Physisches Exemplar in der Bibliothek der BAM vorhanden ("Hardcopy Access")</collection>
  </doc>
  <doc>
    <id>9007</id>
    <completedYear/>
    <publishedYear>1978</publishedYear>
    <thesisYearAccepted/>
    <language>deu</language>
    <pageFirst>256</pageFirst>
    <pageLast>261</pageLast>
    <pageNumber/>
    <edition/>
    <issue/>
    <volume>167</volume>
    <type>article</type>
    <publisherName>Springer</publisherName>
    <publisherPlace>Berlin</publisherPlace>
    <creatingCorporation>Federation of European Chemical Societies / Food Chemistry Division</creatingCorporation>
    <contributingCorporation/>
    <belongsToBibliography>1</belongsToBibliography>
    <completedDate>--</completedDate>
    <publishedDate>--</publishedDate>
    <thesisDateAccepted>--</thesisDateAccepted>
    <title language="deu">Nachweis der Strahlenbehandlung bei bestrahltem Geflügelfleisch anhand des strahleninduzierten Verlustes von Proteinsulfhydrylgruppen</title>
    <parentTitle language="deu">Zeitschrift für Lebensmittel-Untersuchung und -Forschung = International journal of food research and technology</parentTitle>
    <identifier type="old">9670</identifier>
    <identifier type="issn">1438-2377</identifier>
    <identifier type="issn">1431-4630</identifier>
    <identifier type="issn">1438-2385</identifier>
    <enrichment key="bibliotheksstandort">ZM 54/25:1978/202</enrichment>
    <enrichment key="date_peer_review">31.07.2002</enrichment>
    <author>K. Stockhausen</author>
    <author>W. Bögl</author>
    <author>Hans-Peter Weise</author>
    <collection role="literaturgattung" number="">Verlagsliteratur</collection>
    <collection role="fulltextaccess" number="">Physisches Exemplar in der Bibliothek der BAM vorhanden ("Hardcopy Access")</collection>
  </doc>
  <doc>
    <id>9009</id>
    <completedYear/>
    <publishedYear>1978</publishedYear>
    <thesisYearAccepted/>
    <language>deu</language>
    <pageFirst>1</pageFirst>
    <pageLast>4</pageLast>
    <pageNumber/>
    <edition/>
    <issue>1</issue>
    <volume>30</volume>
    <type>article</type>
    <publisherName>Verl. Chemie</publisherName>
    <publisherPlace>Weinheim, Bergstr.</publisherPlace>
    <creatingCorporation/>
    <contributingCorporation/>
    <belongsToBibliography>1</belongsToBibliography>
    <completedDate>--</completedDate>
    <publishedDate>--</publishedDate>
    <thesisDateAccepted>--</thesisDateAccepted>
    <title language="deu">Gamma-Bestrahlung von Stärke in wäßriger Lösung und in Gegenwart von Sauerstoff - Untersuchung über die Bildung von organischen Peroxyverbindungen</title>
    <parentTitle language="deu">Starch</parentTitle>
    <identifier type="old">9672</identifier>
    <identifier type="issn">0038-9056</identifier>
    <identifier type="issn">1521-379X</identifier>
    <enrichment key="bibliotheksstandort">ZM 54/25:1978/204</enrichment>
    <enrichment key="date_peer_review">31.07.2002</enrichment>
    <author>K. Stockhausen</author>
    <author>W. Bögl</author>
    <author>Marcus Jahn</author>
    <author>Hans-Peter Weise</author>
    <collection role="literaturgattung" number="">Verlagsliteratur</collection>
    <collection role="fulltextaccess" number="">Physisches Exemplar in der Bibliothek der BAM vorhanden ("Hardcopy Access")</collection>
  </doc>
  <doc>
    <id>9011</id>
    <completedYear/>
    <publishedYear>1978</publishedYear>
    <thesisYearAccepted/>
    <language>eng</language>
    <pageFirst>483</pageFirst>
    <pageLast>486</pageLast>
    <pageNumber/>
    <edition/>
    <issue/>
    <volume>34</volume>
    <type>article</type>
    <publisherName>Lippincott, Williams &amp; Wilkins</publisherName>
    <publisherPlace>Hagerston, Md.</publisherPlace>
    <creatingCorporation>Health Physics Society</creatingCorporation>
    <contributingCorporation/>
    <belongsToBibliography>1</belongsToBibliography>
    <completedDate>--</completedDate>
    <publishedDate>--</publishedDate>
    <thesisDateAccepted>--</thesisDateAccepted>
    <title language="eng">A simple filter method for measuring peak voltage and inherent filtration of pulsating potential X-ray machines</title>
    <parentTitle language="eng">Health physics</parentTitle>
    <identifier type="old">9674</identifier>
    <identifier type="issn">0017-9078</identifier>
    <identifier type="issn">1538-5159</identifier>
    <enrichment key="bibliotheksstandort">ZM 54/25:1978/206</enrichment>
    <enrichment key="date_peer_review">31.07.2002</enrichment>
    <author>Hans-Peter Weise</author>
    <collection role="literaturgattung" number="">Verlagsliteratur</collection>
    <collection role="fulltextaccess" number="">Physisches Exemplar in der Bibliothek der BAM vorhanden ("Hardcopy Access")</collection>
  </doc>
  <doc>
    <id>9415</id>
    <completedYear/>
    <publishedYear>1980</publishedYear>
    <thesisYearAccepted/>
    <language>deu</language>
    <pageFirst>211</pageFirst>
    <pageLast>213</pageLast>
    <pageNumber/>
    <edition/>
    <issue>5</issue>
    <volume>22</volume>
    <type>article</type>
    <publisherName>Carl Hanser Verlag</publisherName>
    <publisherPlace>München</publisherPlace>
    <creatingCorporation>Bundesanstalt für Materialforschung und -prüfung</creatingCorporation>
    <contributingCorporation/>
    <belongsToBibliography>1</belongsToBibliography>
    <completedDate>--</completedDate>
    <publishedDate>--</publishedDate>
    <thesisDateAccepted>--</thesisDateAccepted>
    <title language="deu">Bestimmung von Geräteeigenschaften technischer Röntgenanlagen als Beitrag zur Objektivierung der Durchstrahlungsprüfung</title>
    <parentTitle language="deu">Materialprüfung = Materials testing</parentTitle>
    <identifier type="old">10767</identifier>
    <identifier type="issn">0025-5300</identifier>
    <enrichment key="bibliotheksstandort">ZM 54/27:1980/183</enrichment>
    <enrichment key="date_peer_review">27.08.2002</enrichment>
    <author>Heinrich Heidt</author>
    <author>Hans-Peter Weise</author>
    <author>Dierk Schnitger</author>
    <collection role="literaturgattung" number="">Eigenverlag BAM</collection>
    <collection role="fulltextaccess" number="">Physisches Exemplar in der Bibliothek der BAM vorhanden ("Hardcopy Access")</collection>
  </doc>
  <doc>
    <id>9433</id>
    <completedYear/>
    <publishedYear>1980</publishedYear>
    <thesisYearAccepted/>
    <language>deu</language>
    <pageFirst>214</pageFirst>
    <pageLast>217</pageLast>
    <pageNumber/>
    <edition/>
    <issue>5</issue>
    <volume>22</volume>
    <type>article</type>
    <publisherName>Carl Hanser Verlag</publisherName>
    <publisherPlace>München</publisherPlace>
    <creatingCorporation>Bundesanstalt für Materialforschung und -prüfung</creatingCorporation>
    <contributingCorporation/>
    <belongsToBibliography>1</belongsToBibliography>
    <completedDate>--</completedDate>
    <publishedDate>--</publishedDate>
    <thesisDateAccepted>--</thesisDateAccepted>
    <title language="deu">Beispiele für die Anwendung der Computer-Tomographie (CAT) in der zerstörungsfreien Materialprüfung</title>
    <parentTitle language="deu">Materialprüfung = Materials testing</parentTitle>
    <identifier type="old">10785</identifier>
    <identifier type="issn">0025-5300</identifier>
    <enrichment key="bibliotheksstandort">ZM 54/27:1980/201</enrichment>
    <enrichment key="date_peer_review">27.08.2002</enrichment>
    <author>Peter Reimers</author>
    <author>Heinrich Heidt</author>
    <author>Jürgen Stade</author>
    <author>Hans-Peter Weise</author>
    <collection role="literaturgattung" number="">Eigenverlag BAM</collection>
    <collection role="fulltextaccess" number="">Physisches Exemplar in der Bibliothek der BAM vorhanden ("Hardcopy Access")</collection>
  </doc>
  <doc>
    <id>9439</id>
    <completedYear/>
    <publishedYear>1980</publishedYear>
    <thesisYearAccepted/>
    <language>deu</language>
    <pageFirst>300</pageFirst>
    <pageLast>303</pageLast>
    <pageNumber/>
    <edition/>
    <issue>7</issue>
    <volume>22</volume>
    <type>article</type>
    <publisherName>Carl Hanser Verlag</publisherName>
    <publisherPlace>München</publisherPlace>
    <creatingCorporation>Bundesanstalt für Materialforschung und -prüfung</creatingCorporation>
    <contributingCorporation/>
    <belongsToBibliography>1</belongsToBibliography>
    <completedDate>--</completedDate>
    <publishedDate>--</publishedDate>
    <thesisDateAccepted>--</thesisDateAccepted>
    <title language="deu">Spektroskopische Meßverfahren zur Beurteilung der Geräteeigenschaften technischer Röntgenanlagen</title>
    <parentTitle language="deu">Materialprüfung = Materials testing</parentTitle>
    <identifier type="old">10791</identifier>
    <identifier type="issn">0025-5300</identifier>
    <enrichment key="bibliotheksstandort">ZM 54/27:1980/207</enrichment>
    <enrichment key="date_peer_review">27.08.2002</enrichment>
    <author>Hans-Peter Weise</author>
    <collection role="literaturgattung" number="">Eigenverlag BAM</collection>
    <collection role="fulltextaccess" number="">Physisches Exemplar in der Bibliothek der BAM vorhanden ("Hardcopy Access")</collection>
  </doc>
  <doc>
    <id>12844</id>
    <completedYear/>
    <publishedYear>2006</publishedYear>
    <thesisYearAccepted/>
    <language>eng</language>
    <pageFirst>608</pageFirst>
    <pageLast>611</pageLast>
    <pageNumber/>
    <edition/>
    <issue>1-2</issue>
    <volume>249</volume>
    <type>article</type>
    <publisherName>Elsevier</publisherName>
    <publisherPlace>Amsterdam</publisherPlace>
    <creatingCorporation/>
    <contributingCorporation/>
    <belongsToBibliography>1</belongsToBibliography>
    <completedDate>--</completedDate>
    <publishedDate>--</publishedDate>
    <thesisDateAccepted>--</thesisDateAccepted>
    <title language="eng">Analyses of hydrogen in quartz and in sapphire using depth profiling by ERDA at atmospheric pressure: Comparison with resonant NRA and SIMS</title>
    <abstract language="eng">Hydrogen is present in anhydrous materials as a result of their synthesis and of their environment during conservation. IBA provides techniques to measure H concentration depth profiles allowing to identify various aspects of the materials including the history of objects such as gemstones used in cultural heritage.
A newly established ERDA set-up, using an external microbeam of alpha particles, has been developed to study hydrated near-surface layers in quartz and sapphire by non-destructive H depth profiling in different atmospheres. The samples were also analysed using resonant NRA and SIMS.</abstract>
    <parentTitle language="eng">Nuclear instruments and methods in physics research B</parentTitle>
    <identifier type="old">14583</identifier>
    <identifier type="doi">10.1016/j.nimb.2006.03.066</identifier>
    <identifier type="issn">0168-583X</identifier>
    <identifier type="issn">1872-9584</identifier>
    <enrichment key="bibliotheksstandort">Sonderstandort: Publica-Schrank</enrichment>
    <enrichment key="date_peer_review">15.09.2006</enrichment>
    <author>I. Reiche</author>
    <author>J. Castaing</author>
    <author>T. Calligaro</author>
    <author>J. Salomon</author>
    <author>M. Aucouturier</author>
    <author>Uwe Reinholz</author>
    <author>Hans-Peter Weise</author>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Hydrogen</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Gemstones</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>ERDA</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>External beam</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Depth profiling</value>
    </subject>
    <collection role="literaturgattung" number="">Verlagsliteratur</collection>
    <collection role="fulltextaccess" number="">Physisches Exemplar in der Bibliothek der BAM vorhanden ("Hardcopy Access")</collection>
  </doc>
</export-example>
