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  <doc>
    <id>53185</id>
    <completedYear/>
    <publishedYear>2021</publishedYear>
    <thesisYearAccepted/>
    <language>eng</language>
    <pageFirst>1</pageFirst>
    <pageLast>23</pageLast>
    <pageNumber/>
    <edition/>
    <issue>17</issue>
    <volume>26</volume>
    <type>article</type>
    <publisherName>MDPI</publisherName>
    <publisherPlace>Basel</publisherPlace>
    <creatingCorporation/>
    <contributingCorporation/>
    <belongsToBibliography>1</belongsToBibliography>
    <completedDate>--</completedDate>
    <publishedDate>--</publishedDate>
    <thesisDateAccepted>--</thesisDateAccepted>
    <title language="eng">Benchmarking the ACEnano toolbox for characterisation of nanoparticle size and concentration by interlaboratory comparisons</title>
    <abstract language="eng">ACEnano is an EU-funded project which aims at developing, optimising and validating methods for the detection and characterisation of nanomaterials (NMs) in increasingly complex matrices to improve confidence in the results and support their use in regulation. Within this project, several interlaboratory comparisons (ILCs) for the determination of particle size and concentration have been organised to benchmark existing analytical methods. In this paper the results of a number of these ILCs for the characterisation of NMs are presented and discussed. The results of the analyses of pristine well-defined particles such as 60 nm Au NMs in a simple aqueous suspension showed that laboratories are well capable of determining the sizes of these particles. The analysis of particles in complex matrices or formulations such as consumer products resulted in larger variations in particle sizes within technologies and clear differences in capability between techniques. Sunscreen lotion sample analysis by laboratories using spICP-MS and TEM/SEM identified and confirmed the TiO2 particles as being nanoscale and compliant with the EU definition of an NM for regulatory purposes. In a toothpaste sample orthogonal results by PTA, spICP-MS and TEM/SEM agreed and stated the TiO2 particles as not fitting the EU definition of an NM. In general, from the results of these ILCs we conclude that laboratories are well capable of determining particle sizes of NM, even in fairly complex formulations.</abstract>
    <parentTitle language="eng">Molecules</parentTitle>
    <identifier type="doi">10.3390/molecules26175315</identifier>
    <identifier type="issn">1420-3049</identifier>
    <identifier type="urn">urn:nbn:de:kobv:b43-531852</identifier>
    <enrichment key="opus.source">publish</enrichment>
    <enrichment key="date_peer_review">22.09.2021</enrichment>
    <enrichment key="RelatedIdentifier">https://nbn-resolving.org/urn:nbn:de:kobv:b43-554381</enrichment>
    <licence>Creative Commons - CC BY - Namensnennung 4.0 International</licence>
    <author>R. Peters</author>
    <author>I. Elbers</author>
    <author>A. Undas</author>
    <author>E. Sijtsma</author>
    <author>S. Briffa</author>
    <author>P. Carnell-Morris</author>
    <author>A. Siupa</author>
    <author>T.-H. Yoon</author>
    <author>L. Burr</author>
    <author>D. Schmid</author>
    <author>J. Tentschert</author>
    <author>Y. Hachenberger</author>
    <author>H. Jungnickel</author>
    <author>A. Luch</author>
    <author>F. Meier</author>
    <author>J. Kocic</author>
    <author>J. Kim</author>
    <author>B. C. Park</author>
    <author>B. Hardy</author>
    <author>C. Johnston</author>
    <author>K. Jurkschat</author>
    <author>Jörg Radnik</author>
    <author>Vasile-Dan Hodoroaba</author>
    <author>I. Lynch</author>
    <author>E. Valsami-Jones</author>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Nanomaterials</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Benchmarking</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Inter-laboratory comparison</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>ACEnano</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Characterisation</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Size</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Concentration</value>
    </subject>
    <collection role="ddc" number="620">Ingenieurwissenschaften und zugeordnete Tätigkeiten</collection>
    <collection role="institutes" number="">6 Materialchemie</collection>
    <collection role="institutes" number="">6.1 Oberflächen- und Dünnschichtanalyse</collection>
    <collection role="themenfelder" number="">Material</collection>
    <collection role="literaturgattung" number="">Verlagsliteratur</collection>
    <collection role="fulltextaccess" number="">Datei für die Öffentlichkeit verfügbar ("Open Access")</collection>
    <collection role="unnumberedseries" number="">Wissenschaftliche Artikel der BAM</collection>
    <collection role="themenfelder" number="">Advanced Materials</collection>
    <thesisPublisher>Bundesanstalt für Materialforschung und -prüfung (BAM)</thesisPublisher>
    <file>https://opus4.kobv.de/opus4-bam/files/53185/molecules-26-05315.pdf</file>
    <file>https://opus4.kobv.de/opus4-bam/files/53185/molecules-26-05315-supplementary-material.pdf</file>
    <file>https://opus4.kobv.de/opus4-bam/files/53185/molecules-26-05315-v2.pdf</file>
  </doc>
  <doc>
    <id>55438</id>
    <completedYear/>
    <publishedYear>2022</publishedYear>
    <thesisYearAccepted/>
    <language>eng</language>
    <pageFirst>1</pageFirst>
    <pageLast>3</pageLast>
    <pageNumber/>
    <edition/>
    <issue>4849</issue>
    <volume>27</volume>
    <type>corrigendum</type>
    <publisherName>MDPI</publisherName>
    <publisherPlace>Basel</publisherPlace>
    <creatingCorporation/>
    <contributingCorporation/>
    <belongsToBibliography>0</belongsToBibliography>
    <completedDate>--</completedDate>
    <publishedDate>--</publishedDate>
    <thesisDateAccepted>--</thesisDateAccepted>
    <title language="eng">Correction: Peters et al. Benchmarking the ACEnano Toolbox for Characterisation of Nanoparticle Size and Concentration by Interlaboratory Comparisons. Molecules 2021, 26, 5315</title>
    <abstract language="eng">This is a corrigendum to the original article "Benchmarking the ACEnano toolbox for characterisation of nanoparticle size and concentration by interlaboratory comparisons" that was published in the journal "Molecules", vol. 26 (2021), no. 17, article 5315.</abstract>
    <parentTitle language="eng">Molecules</parentTitle>
    <identifier type="doi">10.3390/molecules27154849</identifier>
    <identifier type="urn">urn:nbn:de:kobv:b43-554381</identifier>
    <enrichment key="opus.source">publish</enrichment>
    <enrichment key="RelatedIdentifier">https://nbn-resolving.org/urn:nbn:de:kobv:b43-531852</enrichment>
    <licence>Creative Commons - CC BY - Namensnennung 4.0 International</licence>
    <author>R. Peters</author>
    <author>I. Elbers</author>
    <author>A. Undas</author>
    <author>E. Sijtsma</author>
    <author>S. Briffa</author>
    <author>P. Carnell-Morris</author>
    <author>A. Siupa</author>
    <author>T.-H. Yoon</author>
    <author>L. Burr</author>
    <author>D. Schmid</author>
    <author>J. Tentschert</author>
    <author>Y. Hachenberger</author>
    <author>H. Jungnickel</author>
    <author>A. Luch</author>
    <author>F. Meier</author>
    <author>J. Kocic</author>
    <author>J. Kim</author>
    <author>B. C. Park</author>
    <author>B. Hardy</author>
    <author>C. Johnston</author>
    <author>K. Jurkschat</author>
    <author>Jörg Radnik</author>
    <author>Vasile-Dan Hodoroaba</author>
    <author>I. Lynch</author>
    <author>E. Valsami-Jones</author>
    <collection role="ddc" number="620">Ingenieurwissenschaften und zugeordnete Tätigkeiten</collection>
    <collection role="literaturgattung" number="">Verlagsliteratur</collection>
    <collection role="fulltextaccess" number="">Datei für die Öffentlichkeit verfügbar ("Open Access")</collection>
    <thesisPublisher>Bundesanstalt für Materialforschung und -prüfung (BAM)</thesisPublisher>
    <file>https://opus4.kobv.de/opus4-bam/files/55438/molecules-27-04849.pdf</file>
  </doc>
  <doc>
    <id>54398</id>
    <completedYear/>
    <publishedYear>2022</publishedYear>
    <thesisYearAccepted/>
    <language>eng</language>
    <pageFirst>1</pageFirst>
    <pageLast>22</pageLast>
    <pageNumber/>
    <edition/>
    <issue>3</issue>
    <volume>27</volume>
    <type>article</type>
    <publisherName>MDPI</publisherName>
    <publisherPlace/>
    <creatingCorporation/>
    <contributingCorporation/>
    <belongsToBibliography>1</belongsToBibliography>
    <completedDate>--</completedDate>
    <publishedDate>--</publishedDate>
    <thesisDateAccepted>--</thesisDateAccepted>
    <title language="eng">Automation and Standardization—A Coupled Approach  Towards Reproducible Sample Preparation Protocols for  Nanomaterial Analysis</title>
    <abstract language="eng">Whereas the characterization of nanomaterials using different analytical techniques is often highly automated and standardized, the sample preparation that precedes it causes a bottleneck in nanomaterial analysis as it is performed manually. Usually, this pretreatment depends on the skills and experience of the analysts. Furthermore, adequate reporting of the sample preparation is often missing. In this overview, some solutions for techniques widely used in nano-analytics to overcome this problem are discussed. Two examples of sample preparation optimization by au-tomation are presented, which demonstrate that this approach is leading to increased analytical confidence. Our first example is motivated by the need to exclude human bias and focuses on the development of automation in sample introduction. To this end, a robotic system has been de-veloped, which can prepare stable and homogeneous nanomaterial suspensions amenable to a variety of well-established analytical methods, such as dynamic light scattering (DLS), small-angle X-ray scattering (SAXS), field-flow fractionation (FFF) or single-particle inductively coupled mass spectrometry (sp-ICP-MS). Our second example addresses biological samples, such as cells exposed to nanomaterials, which are still challenging for reliable analysis. An air–liquid interface has been developed for the exposure of biological samples to nanomaterial-containing aerosols. The system exposes transmission electron microscopy (TEM) grids under reproducible conditions, whilst also allowing characterization of aerosol composition with mass spectrometry. Such an approach enables correlative measurements combining biological with physicochemical analysis. These case studies demonstrate that standardization and automation of sample preparation setups, combined with appropriate measurement processes and data reduction are crucial steps towards more reliable and reproducible data.</abstract>
    <parentTitle language="eng">Molecules</parentTitle>
    <identifier type="doi">10.3390/molecules27030985</identifier>
    <identifier type="urn">urn:nbn:de:kobv:b43-543988</identifier>
    <enrichment key="opus.source">publish</enrichment>
    <enrichment key="date_peer_review">28.02.2022</enrichment>
    <enrichment key="opus.doi.autoCreate">false</enrichment>
    <enrichment key="opus.urn.autoCreate">true</enrichment>
    <licence>Creative Commons - CC BY - Namensnennung 4.0 International</licence>
    <author>Jörg Radnik</author>
    <author>Vasile-Dan Hodoroaba</author>
    <author>H. Jungnickel</author>
    <author>J. Tentschert</author>
    <author>A. Luch</author>
    <author>V. Sogne</author>
    <author>F. Maier</author>
    <author>L. Burr</author>
    <author>D. Schmid</author>
    <author>T.-H. Yoon</author>
    <author>R. Petters</author>
    <author>S.M. Briffa</author>
    <author>E. Valsami-Jones</author>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Sample preparation</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Automation</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Nanomaterial analysis</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Standardization</value>
    </subject>
    <collection role="ddc" number="543">Analytische Chemie</collection>
    <collection role="ddc" number="620">Ingenieurwissenschaften und zugeordnete Tätigkeiten</collection>
    <collection role="institutes" number="">6 Materialchemie</collection>
    <collection role="institutes" number="">6.1 Oberflächen- und Dünnschichtanalyse</collection>
    <collection role="themenfelder" number="">Material</collection>
    <collection role="themenfelder" number="">Chemie und Prozesstechnik</collection>
    <collection role="literaturgattung" number="">Verlagsliteratur</collection>
    <collection role="fulltextaccess" number="">Datei für die Öffentlichkeit verfügbar ("Open Access")</collection>
    <collection role="unnumberedseries" number="">Wissenschaftliche Artikel der BAM</collection>
    <collection role="themenfelder" number="">Advanced Materials</collection>
    <thesisPublisher>Bundesanstalt für Materialforschung und -prüfung (BAM)</thesisPublisher>
    <file>https://opus4.kobv.de/opus4-bam/files/54398/molecules-27-00985-v2.pdf</file>
    <file>https://opus4.kobv.de/opus4-bam/files/54398/molecules-1560739-supplementary.pdf</file>
  </doc>
  <doc>
    <id>58229</id>
    <completedYear/>
    <publishedYear>2023</publishedYear>
    <thesisYearAccepted/>
    <language>eng</language>
    <pageFirst>053210-1</pageFirst>
    <pageLast>053210-13</pageLast>
    <pageNumber/>
    <edition/>
    <issue>5</issue>
    <volume>41</volume>
    <type>article</type>
    <publisherName>AIP (American Institute of Physics)</publisherName>
    <publisherPlace/>
    <creatingCorporation/>
    <contributingCorporation/>
    <belongsToBibliography>1</belongsToBibliography>
    <completedDate>--</completedDate>
    <publishedDate>--</publishedDate>
    <thesisDateAccepted>--</thesisDateAccepted>
    <title language="eng">VAMAS TWA2 interlaboratory comparison: Surface analysis of TiO2 nanoparticles using ToF-SIMS</title>
    <abstract language="eng">Due to the extremely high specific surface area of nanoparticles and corresponding potential for adsorption, the results of surface analysis can be highly dependent on the history of the particles, particularly regarding sample preparation and storage. The sample preparation method has, therefore, the potential to have a significant influence on the results. This report describes an interlaboratory comparison (ILC) with the aim of assessing which sample preparation methods for ToF-SIMS analysis of nanoparticles provided the most intra- and interlaboratory consistency and the least amount of sample contamination. The BAM reference material BAM-P110 (TiO2 nanoparticles with a mean Feret diameter of 19 nm) was used as a sample representing typical nanoparticles. A total of 11 participants returned ToF-SIMS data,in positive and (optionally) negative polarity, using sample preparation methods of “stick-and-go” as well as optionally “drop-dry” and “spin-coat.” The results showed that the largest sources of variation within the entire data set were caused by adventitious hydrocarbon contamination or insufficient sample coverage, with the spin-coating protocol applied in this ILC showing a tendency toward insufficient sample coverage; the sample preparation method or the participant had a lesser influence on results.</abstract>
    <parentTitle language="eng">Journal of Vacuum Science and Technology A</parentTitle>
    <identifier type="doi">10.1116/6.0002814</identifier>
    <identifier type="issn">0734-2101</identifier>
    <identifier type="urn">urn:nbn:de:kobv:b43-582290</identifier>
    <enrichment key="date_peer_review">13.09.2023</enrichment>
    <enrichment key="opus.source">publish</enrichment>
    <enrichment key="opus.doi.autoCreate">false</enrichment>
    <enrichment key="opus.urn.autoCreate">true</enrichment>
    <licence>Creative Commons - CC BY - Namensnennung 4.0 International</licence>
    <author>Francesca Bennet</author>
    <author>R. Opitz</author>
    <author>N. Ghoreishi</author>
    <author>K. Plate</author>
    <author>J.-P. Barnes</author>
    <author>A. Bellew</author>
    <author>A. Bellu</author>
    <author>G. Ceccone</author>
    <author>E. de Vito</author>
    <author>A. Delcorte</author>
    <author>A. Franquet</author>
    <author>F. Fumageli</author>
    <author>D. Gilliland</author>
    <author>H. Jungnickel</author>
    <author>T.G. Lee</author>
    <author>C. Poleunis</author>
    <author>D. Rading</author>
    <author>H.K. Shon</author>
    <author>V. Spampinato</author>
    <author>J.G. Son</author>
    <author>F. Wang</author>
    <author>Y.-C. A. Wang</author>
    <author>Y. Zhao</author>
    <author>A. Roloff</author>
    <author>J. Tentschert</author>
    <author>Jörg Radnik</author>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Secondary Ion Mass Spectrometry</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>VMAAS</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Titania</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Interlaboratory comparison</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Reproducibility</value>
    </subject>
    <collection role="ddc" number="543">Analytische Chemie</collection>
    <collection role="ddc" number="620">Ingenieurwissenschaften und zugeordnete Tätigkeiten</collection>
    <collection role="institutes" number="">6 Materialchemie</collection>
    <collection role="institutes" number="">6.1 Oberflächen- und Dünnschichtanalyse</collection>
    <collection role="themenfelder" number="">Material</collection>
    <collection role="themenfelder" number="">Chemie und Prozesstechnik</collection>
    <collection role="literaturgattung" number="">Verlagsliteratur</collection>
    <collection role="fulltextaccess" number="">Datei für die Öffentlichkeit verfügbar ("Open Access")</collection>
    <collection role="unnumberedseries" number="">Wissenschaftliche Artikel der BAM</collection>
    <collection role="themenfelder" number="">Advanced Materials</collection>
    <thesisPublisher>Bundesanstalt für Materialforschung und -prüfung (BAM)</thesisPublisher>
    <file>https://opus4.kobv.de/opus4-bam/files/58229/jvst_a_2023_tof-sims.pdf</file>
  </doc>
  <doc>
    <id>52010</id>
    <completedYear/>
    <publishedYear>2020</publishedYear>
    <thesisYearAccepted/>
    <language>eng</language>
    <pageFirst>e61758</pageFirst>
    <pageLast/>
    <pageNumber/>
    <edition/>
    <issue/>
    <volume>163</volume>
    <type>article</type>
    <publisherName/>
    <publisherPlace/>
    <creatingCorporation/>
    <contributingCorporation/>
    <belongsToBibliography>1</belongsToBibliography>
    <completedDate>--</completedDate>
    <publishedDate>--</publishedDate>
    <thesisDateAccepted>--</thesisDateAccepted>
    <title language="eng">Preparation of Nanoparticles for ToF-SIMS and XPS Analysis</title>
    <abstract language="eng">Nanoparticles have gained increasing attention in recent years due to their potential and application in different fields including medicine, cosmetics, chemistry, and their potential to enable advanced materials. To effectively understand and regulate the physico-chemical properties and potential adverse effects of nanoparticles, validated measurement procedures for the various properties of nanoparticles need to be developed. While procedures for measuring nanoparticle size and size Distribution are already established, standardized methods for analysis of their surface chemistry are not yet in place, although the influence of the surface chemistry on nanoparticle properties is undisputed. In particular, storage and preparation of nanoparticles for surface analysis strongly influences the analytical results from various methods, and in order to obtain consistent results, sample preparation must be both optimized and standardized. In this contribution, we present, in detail, some standard procedures for preparing nanoparticles for surface analytics. In principle, nanoparticles can be deposited on a suitable substrate from suspension or as a powder. Silicon (Si) Wafers are commonly used as substrate, however, their cleaning is critical to the process. For sample preparation from suspension, we will discuss drop-casting and spin-coating, where not only the cleanliness of the substrate and purity of the suspension but also its concentration play important roles for the success of the preparation methodology.&#13;
For nanoparticles with sensitive ligand shells or coatings, deposition as powders is more suitable, although this method requires particular care in fixing the sample.</abstract>
    <parentTitle language="eng">Jove-Journal of Visualized Experiments</parentTitle>
    <identifier type="doi">10.3791/61758</identifier>
    <identifier type="url">https://www.jove.com/video/61758</identifier>
    <identifier type="urn">urn:nbn:de:kobv:b43-520103</identifier>
    <enrichment key="date_peer_review">18.01.2021</enrichment>
    <enrichment key="opus.doi.autoCreate">false</enrichment>
    <enrichment key="opus.urn.autoCreate">true</enrichment>
    <licence>Creative Commons - Namensnennung - Nicht kommerziell - Keine Bearbeitung 3.0</licence>
    <author>Francesca Bennet</author>
    <author>Anja Müller</author>
    <author>Jörg Radnik</author>
    <author>Y. Hachenberger</author>
    <author>H. Jungnickel</author>
    <author>P. Laue</author>
    <author>A. Luch</author>
    <author>J. Tentschert</author>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Titania nanoparticles</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>X-ray photoelectron spectroscopy</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Secondary ion mass spectrometry</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Surface chemisttry</value>
    </subject>
    <collection role="ddc" number="543">Analytische Chemie</collection>
    <collection role="ddc" number="620">Ingenieurwissenschaften und zugeordnete Tätigkeiten</collection>
    <collection role="institutes" number="">6 Materialchemie</collection>
    <collection role="institutes" number="">6.1 Oberflächen- und Dünnschichtanalyse</collection>
    <collection role="themenfelder" number="">Material</collection>
    <collection role="themenfelder" number="">Chemie und Prozesstechnik</collection>
    <collection role="literaturgattung" number="">Verlagsliteratur</collection>
    <collection role="fulltextaccess" number="">Datei für die Öffentlichkeit verfügbar ("Open Access")</collection>
    <collection role="unnumberedseries" number="">Wissenschaftliche Artikel der BAM</collection>
    <collection role="themenfelder" number="">Advanced Materials</collection>
    <thesisPublisher>Bundesanstalt für Materialforschung und -prüfung (BAM)</thesisPublisher>
    <file>https://opus4.kobv.de/opus4-bam/files/52010/document.pdf</file>
  </doc>
</export-example>
