<?xml version="1.0" encoding="utf-8"?>
<export-example>
  <doc>
    <id>6856</id>
    <completedYear/>
    <publishedYear>1999</publishedYear>
    <thesisYearAccepted/>
    <language>eng</language>
    <pageFirst>259</pageFirst>
    <pageLast>267</pageLast>
    <pageNumber/>
    <edition/>
    <issue/>
    <volume>147</volume>
    <type>article</type>
    <publisherName>Wiley-VCH Verl.</publisherName>
    <publisherPlace>Weinheim, Germany</publisherPlace>
    <creatingCorporation/>
    <contributingCorporation/>
    <belongsToBibliography>1</belongsToBibliography>
    <completedDate>--</completedDate>
    <publishedDate>--</publishedDate>
    <thesisDateAccepted>--</thesisDateAccepted>
    <title language="eng">Scanning force microscopy experiments probing micromechanical properties on polymer surfaces using harmonically modulated friction techniques - II. Investigations of heterogeneous systems</title>
    <abstract language="eng">Applying a high-frequency lateral vibration between tip and sample in a scanning force microscope (SFM), a harmonically modulated lateral (friction) force image can be obtained using lock-in techniques. Harmonically modulated lateral force microscopy (HM-LFM) offers several advantages compared with standard lateral force microscopy (LFM). After a brief investigation of the scan velocity dependence of LFM and HM-LFM, two samples were investigated. First, the surface of a poly(acrylonitrile-co-styrene)/polybutadiene blend (ABS) was used to demonstrate the ability of the new technique to decrease the stick effects of the SFM tip. Second, an interface between two chemically very similar polymers was prepared by melting polypropylene (PP) and poly(propene-block-ethene) (PP-block-PE) films on each other. After cutting, the surface roughness of this sample was very high. It is shown that only HM-LFM clearly resolves the local micromechanical properties without artefacts.</abstract>
    <parentTitle language="eng">Macromolecular symposia</parentTitle>
    <identifier type="old">7274</identifier>
    <identifier type="issn">1022-1360</identifier>
    <identifier type="issn">0258-0322</identifier>
    <identifier type="issn">1521-3900</identifier>
    <identifier type="doi">10.1002/masy.19991470125</identifier>
    <enrichment key="date_peer_review">14.06.2016</enrichment>
    <author>Heinz Sturm</author>
    <author>Eckhard Schulz</author>
    <author>Martin Munz</author>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Scale</value>
    </subject>
    <collection role="literaturgattung" number="">Verlagsliteratur</collection>
    <collection role="fulltextaccess" number="">Datei im Netzwerk der BAM verfügbar ("Closed Access")</collection>
  </doc>
  <doc>
    <id>6862</id>
    <completedYear/>
    <publishedYear>1999</publishedYear>
    <thesisYearAccepted/>
    <language>eng</language>
    <pageFirst>465</pageFirst>
    <pageLast>468</pageLast>
    <pageNumber/>
    <edition/>
    <issue/>
    <volume/>
    <type>bookpartcollection</type>
    <publisherName>IEEE Operations Center</publisherName>
    <publisherPlace>Piscataway, NJ</publisherPlace>
    <creatingCorporation>Ethnikon Metsobion Polytechneion, Ath¯enai</creatingCorporation>
    <contributingCorporation/>
    <belongsToBibliography>0</belongsToBibliography>
    <completedDate>--</completedDate>
    <publishedDate>--</publishedDate>
    <thesisDateAccepted>--</thesisDateAccepted>
    <title language="eng">Scanning force microscopy investigations on electroactive polymer films</title>
    <abstract language="eng">The authors present investigations on a PVDF (polyvinylidenefluoride) film supplied with top and bottom Au electrodes, which is analysed using a SFM and a contactless optical sensor to measure the sample strain with respect to applied fields.</abstract>
    <parentTitle language="eng">Proceedings of the 10th International Symposium on Electrets</parentTitle>
    <identifier type="old">7281</identifier>
    <identifier type="isbn">0-7803-5025-1</identifier>
    <identifier type="doi">10.1109/ISE.1999.832086</identifier>
    <enrichment key="eventName">10th IEEE International Symposium on Electrets (ISE)</enrichment>
    <enrichment key="eventPlace">Delphi, Greece</enrichment>
    <enrichment key="eventStart">1999-09-22</enrichment>
    <enrichment key="eventEnd">1999-09-24</enrichment>
    <author>Heinz Sturm</author>
    <author>Markus Geuss</author>
    <author>Eckhard Schulz</author>
    <collection role="literaturgattung" number="">Verlagsliteratur</collection>
    <collection role="fulltextaccess" number="">Weder Datei noch physisches Exemplar vorhanden ("No Access")</collection>
  </doc>
</export-example>
