<?xml version="1.0" encoding="utf-8"?>
<export-example>
  <doc>
    <id>37453</id>
    <completedYear/>
    <publishedYear>2016</publishedYear>
    <thesisYearAccepted/>
    <language>eng</language>
    <pageFirst>89</pageFirst>
    <pageLast>97</pageLast>
    <pageNumber/>
    <edition/>
    <issue/>
    <volume>169</volume>
    <type>article</type>
    <publisherName>Elsevier B.V.</publisherName>
    <publisherPlace/>
    <creatingCorporation/>
    <contributingCorporation/>
    <belongsToBibliography>1</belongsToBibliography>
    <completedDate>--</completedDate>
    <publishedDate>--</publishedDate>
    <thesisDateAccepted>--</thesisDateAccepted>
    <title language="eng">Microstrain distribution mapping on CuInSe2 thin films by means of electron backscatter diffraction, X-ray diffraction, and Raman microspectroscopy</title>
    <abstract language="eng">The investigation of the microstructure in functional, polycrystalline thin films is an important contribution to the enhanced understanding of structure–property relationships in corresponding devices. Linear and planar defects within individual grains may affect substantially the performance of the device. These defects are closely related to strain distributions. The present work compares electron and X-ray diffraction as well as Raman microspectroscopy, which provide access to microstrain distributions within individual grains. CuInSe₂ thin films or solar cells are used as a modelsystem. High-resolution electron backscatter diffraction and X-ray microdiffraction as well as Ramanmicrospectroscopy were applied for this comparison. Consistently, microstrain values were determined of the order of 10⁻⁴ by these three techniques. However,only electron backscatter diffraction, X-ray microdiffraction exhibit sensitivities appropriate for mapping local strain changes at the submicrometer level within individual grains in polycrystalline materials.</abstract>
    <parentTitle language="eng">Ultramicroscopy</parentTitle>
    <identifier type="doi">10.1016/j.ultramic.2016.07.001</identifier>
    <identifier type="issn">0304-3991</identifier>
    <identifier type="issn">1879-2723</identifier>
    <enrichment key="date_peer_review">13.10.2016</enrichment>
    <author>N. Schäfer</author>
    <author>A. J. Wilkinson</author>
    <author>Thomas Schmid</author>
    <author>Aimo Winkelmann</author>
    <author>G. A. Chahine</author>
    <author>T. U. Schülli</author>
    <author>T. Rissom</author>
    <author>J. Marquardt</author>
    <author>S. Schorr</author>
    <author>D. Abou-Ras</author>
    <subject>
      <language>deu</language>
      <type>uncontrolled</type>
      <value>Microstrain</value>
    </subject>
    <subject>
      <language>deu</language>
      <type>uncontrolled</type>
      <value>Thin film</value>
    </subject>
    <subject>
      <language>deu</language>
      <type>uncontrolled</type>
      <value>X-ray microdiffraction</value>
    </subject>
    <subject>
      <language>deu</language>
      <type>uncontrolled</type>
      <value>EBSD</value>
    </subject>
    <subject>
      <language>deu</language>
      <type>uncontrolled</type>
      <value>Raman microspectroscopy</value>
    </subject>
    <collection role="ddc" number="543">Analytische Chemie</collection>
    <collection role="literaturgattung" number="">Verlagsliteratur</collection>
    <collection role="fulltextaccess" number="">Datei im Netzwerk der BAM verfügbar ("Closed Access")</collection>
  </doc>
  <doc>
    <id>36659</id>
    <completedYear/>
    <publishedYear>2016</publishedYear>
    <thesisYearAccepted/>
    <language>eng</language>
    <pageFirst>632</pageFirst>
    <pageLast>635</pageLast>
    <pageNumber/>
    <edition/>
    <issue/>
    <volume>49</volume>
    <type>article</type>
    <publisherName/>
    <publisherPlace/>
    <creatingCorporation/>
    <contributingCorporation/>
    <belongsToBibliography>1</belongsToBibliography>
    <completedDate>--</completedDate>
    <publishedDate>--</publishedDate>
    <thesisDateAccepted>--</thesisDateAccepted>
    <title language="eng">Microstrain distributions in polycrystalline thin films measured by X-ray microdiffraction</title>
    <abstract language="eng">Microstrain distributions were acquired in functional thin films by high-resolution X-ray microdiffraction measurements, using polycrystalline CuInSe2 thin films as a model system. This technique not only provides spatial resolutions at the submicrometre scale but also allows for analysis of thin films buried within a complete solar-cell stack. The microstrain values within individual CuInSe2 grains were determined to be of the order of 10^-4. These values confirmed corresponding microstrain distribution maps obtained on the same CuInSe2 layer by electron backscatter diffraction and Raman microspectroscopy.</abstract>
    <parentTitle language="eng">Journal of Applied Crystallography</parentTitle>
    <identifier type="doi">10.1107/S1600576716003204</identifier>
    <identifier type="issn">1600-5767</identifier>
    <identifier type="urn">urn:nbn:de:kobv:b43-366592</identifier>
    <enrichment key="date_peer_review">27.06.2016</enrichment>
    <licence>Creative Commons - Namensnennung - Weitergabe unter gleichen Bedingungen 3.0</licence>
    <author>N. Schäfer</author>
    <author>G. A. Chahine</author>
    <author>A. J. Wilkinson</author>
    <author>Thomas Schmid</author>
    <author>T. Rissom</author>
    <author>T. U. Schülli</author>
    <author>D. Abou-Ras</author>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Microstrain distribution</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>X-ray microdiffraction</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Polycrystalline thin films</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Raman microscopy</value>
    </subject>
    <collection role="ddc" number="543">Analytische Chemie</collection>
    <collection role="literaturgattung" number="">Verlagsliteratur</collection>
    <collection role="fulltextaccess" number="">Datei für die Öffentlichkeit verfügbar ("Open Access")</collection>
    <collection role="unnumberedseries" number="">Wissenschaftliche Artikel der BAM</collection>
    <thesisPublisher>Bundesanstalt für Materialforschung und -prüfung (BAM)</thesisPublisher>
    <file>https://opus4.kobv.de/opus4-bam/files/36659/Schmid_et_al - Microstrain distributions in polycrystalline thin films measured by X-ray microdiffraction.pdf</file>
  </doc>
</export-example>
