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  <doc>
    <id>36598</id>
    <completedYear/>
    <publishedYear>2016</publishedYear>
    <thesisYearAccepted/>
    <language>eng</language>
    <pageFirst>Tu.3.G.2., 1</pageFirst>
    <pageLast>9</pageLast>
    <pageNumber/>
    <edition/>
    <issue/>
    <volume>BB 158</volume>
    <type>conferenceobject</type>
    <publisherName/>
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    <creatingCorporation>Deutsche Gesellschaft für zerstörungsfreie Prüfung (DGZfP)</creatingCorporation>
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    <belongsToBibliography>0</belongsToBibliography>
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    <title language="eng">Talbot- Lau interferometry with a non- binary phase grating for non-destructive testing</title>
    <abstract language="eng">Grating interferometric set-ups have been established in the last decade. They are promising candidates to obtain enhanced image contrast from weakly absorbing micro and nano structures. They are based on X-ray refraction and near-field diffraction using the Talbot effect. &#13;
At the expense of taking multiple images, Talbot-Lau grating interferometry allows separating the absorption, refraction, and scattering contributions by analysing the disturbances of a phase grating interference pattern. Contrary to other refraction enhanced methods, this technique can be applied using conventional X-ray tubes (divergent, polychromatic source). This makes it attractive to solve typical non-destructive testing problems.&#13;
We investigated the efficiency of phase gratings, i.e. the visibility (the amplitude of oscillations) upon variation of propagation distance and phase grating rotation around an axis parallel to the grid lines. This grating rotation changes the grating shape (i.e. the distributions of phase shifts). This can yield higher visibilities than derived from rectangular shapes. &#13;
Our study includes experimental results obtained from synchrotron radiation, as well as simulations for monochromatic radiation. The advantages of Talbot-Lau interferometry are demonstrated at the example of glass capillaries.</abstract>
    <parentTitle language="eng">19th World Conference on Non-Destructive Testing 2016</parentTitle>
    <identifier type="isbn">978-3-940283-78-8</identifier>
    <identifier type="urn">urn:nbn:de:kobv:b43-365987</identifier>
    <enrichment key="eventName">WCNDT2016</enrichment>
    <enrichment key="eventPlace">Munich, Germany</enrichment>
    <enrichment key="eventStart">13.06.2016</enrichment>
    <enrichment key="eventEnd">17.06.2016</enrichment>
    <licence>Creative Commons - Namensnennung 3.0</licence>
    <author>Yury Shashev</author>
    <author>Andreas Kupsch</author>
    <author>Axel Lange</author>
    <author>Ralf Britzke</author>
    <author>Giovanni Bruno</author>
    <author>Bernd R. Mueller</author>
    <author>Manfred P. Hentschel</author>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Phase-contrast X-ray imaging</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Talbot- Lau interferometry</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Phase grating</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Visibility</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Synchrotron radiation</value>
    </subject>
    <collection role="ddc" number="620">Ingenieurwissenschaften und zugeordnete Tätigkeiten</collection>
    <collection role="fulltextaccess" number="">Datei für die Öffentlichkeit verfügbar ("Open Access")</collection>
    <collection role="literaturgattung" number="">Präsentation</collection>
    <collection role="unnumberedseries" number="">Wissenschaftliche Artikel der BAM</collection>
    <thesisPublisher>Bundesanstalt für Materialforschung und -prüfung (BAM)</thesisPublisher>
    <file>https://opus4.kobv.de/opus4-bam/files/36598/Shashev_et_al - Talbot- Lau interferometry with a non-binary phase grating for non-destructive testing.pdf</file>
  </doc>
  <doc>
    <id>40469</id>
    <completedYear/>
    <publishedYear>2017</publishedYear>
    <thesisYearAccepted/>
    <language>deu</language>
    <pageFirst>1</pageFirst>
    <pageLast>10</pageLast>
    <pageNumber/>
    <edition/>
    <issue/>
    <volume/>
    <type>conferenceobject</type>
    <publisherName>DGZfP</publisherName>
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    <belongsToBibliography>0</belongsToBibliography>
    <completedDate>--</completedDate>
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    <title language="deu">Talbot-Lau Röntgen-Interferometrie für die zerstörungsfreie Prüfung</title>
    <abstract language="deu">Im vergangenen Jahrzehnt sind gitterinterferometrische Röntgenabbildungen zunehmend in den Fokus des Interesses gerückt. Sie sind insbesondere dann Vorteil, wenn der in der Standardradiographie erreichbare Kontrast nicht genügt, schwach absorbierende Mikro- und Nanostrukturen abzubilden.&#13;
Auf Kosten mehrerer Aufnahmen gestattet die Talbot-Lau Gitterinterferometrie, die Beiträge aus Absorption, Refraktion und (refraktiver) Streuung zu trennen. Dazu werden die Störungen der Interferenzmuster von Phasengittern ausgewertet. Im Gegensatz zu einer Vielzahl anderer refraktionsbasierter Abbildungsmethoden kann diese Technik mit konventionellen Röntgenröhren (mit divergenter, polychromatischer Strahlung) angewendet werden. Damit ist die Technik geeignet, typische ZfP-Fragestellungen zu lösen.&#13;
Hier stellen wir Untersuchungen zur Effizienz von Phasengittern vor. Die Visibilität (d.h. die Höhe der Oszillation im Interferenzmuster) wird als Funktion verschiedener geometrischer Parameter verfolgt. Eine Rotation um die Achse parallel zu den Gitterstegen ändert die Form des Gitterprofils (d.h. die Verteilung der Phasenschiebungen). Die kontinuierliche Variation des Winkels und des Detektionsabstandes führt zur Identifikation von ausgezeichneten Kombinationen mit maximaler Visibilität, wobei die Abstände deutlich geringer sind als im Standardaufbau mit senkrechter Gitterbestrahlung.&#13;
Unsere Studie umfasst Simulationen für monochromatische Quelle und den Vergleich zu experimentellen Ergebnissen mit der Synchrotronstrahlung.&#13;
In der Literatur wurden die Vorteile der Talbot-Lau Interferometrie für die zerstörungsfreie Prüfung von Faserkompositen und Verbundwerkstoffen demonstriert. Hier werden als Beispiele Messungen an Aluminiumtitanat (Al2TiO5) Pulver gezeigt.</abstract>
    <parentTitle language="deu">Materialcharakterisierung</parentTitle>
    <identifier type="urn">urn:nbn:de:kobv:b43-404691</identifier>
    <enrichment key="eventName">DGZfP 2017</enrichment>
    <enrichment key="eventPlace">Koblenz, Germany</enrichment>
    <enrichment key="eventStart">22.05.2017</enrichment>
    <licence>Creative Commons - Namensnennung 3.0</licence>
    <author>Yury Shashev</author>
    <author>Andreas Kupsch</author>
    <author>Axel Lange</author>
    <author>Sergei Evsevleev</author>
    <author>Ralf Britzke</author>
    <author>Giovanni Bruno</author>
    <author>Bernd R. Müller</author>
    <subject>
      <language>deu</language>
      <type>uncontrolled</type>
      <value>Gitterinterferometrische Röntgenabbildung</value>
    </subject>
    <subject>
      <language>deu</language>
      <type>uncontrolled</type>
      <value>Phasengitter</value>
    </subject>
    <subject>
      <language>deu</language>
      <type>uncontrolled</type>
      <value>Talbot-Lau Interferometrie</value>
    </subject>
    <subject>
      <language>deu</language>
      <type>uncontrolled</type>
      <value>Zerstörungsfreie Prüfung</value>
    </subject>
    <collection role="ddc" number="620">Ingenieurwissenschaften und zugeordnete Tätigkeiten</collection>
    <collection role="fulltextaccess" number="">Datei für die Öffentlichkeit verfügbar ("Open Access")</collection>
    <collection role="literaturgattung" number="">Graue Literatur</collection>
    <collection role="unnumberedseries" number="">Wissenschaftliche Artikel der BAM</collection>
    <thesisPublisher>Bundesanstalt für Materialforschung und -prüfung (BAM)</thesisPublisher>
    <file>https://opus4.kobv.de/opus4-bam/files/40469/Mo_3_B_1_Shashev_final.pdf</file>
  </doc>
  <doc>
    <id>38316</id>
    <completedYear/>
    <publishedYear>2016</publishedYear>
    <thesisYearAccepted/>
    <language>eng</language>
    <pageFirst>Tu_3_G_2, 1</pageFirst>
    <pageLast>9</pageLast>
    <pageNumber/>
    <edition/>
    <issue/>
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    <publisherName/>
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    <belongsToBibliography>0</belongsToBibliography>
    <completedDate>--</completedDate>
    <publishedDate>--</publishedDate>
    <thesisDateAccepted>--</thesisDateAccepted>
    <title language="eng">Talbot- Lau interferometry with a non- binary phase grating for non-destructive testing</title>
    <abstract language="eng">Grating interferometric set-ups have been established in the last decade. They are promising candidates to obtain enhanced image contrast from weakly absorbing micro and nano structures. They are based on X-ray refraction and near-field diffraction using the Talbot effect.&#13;
At the expense of taking multiple images, Talbot-Lau grating interferometry allows separating the absorption, refraction, and scattering contributions by analysing the disturbances of a phase grating interference pattern. Contrary to other refraction enhanced methods, this technique can be applied using conventional X-ray tubes (divergent, polychromatic source). This makes it attractive to solve typical non-destructive testing problems.&#13;
We investigated the efficiency of phase gratings, i.e. the visibility (the amplitude of oscillations) upon variation of propagation distance and phase grating rotation around an axis parallel to the grid lines. This grating rotation changes the grating shape (i.e. the distributions of phase shifts). This can yield higher visibilities than derived from rectangular shapes.&#13;
Our study includes experimental results obtained from synchrotron radiation, as well as simulations for monochromatic radiation. The advantages of Talbot-Lau interferometry are demonstrated at the example of glass capillaries.</abstract>
    <parentTitle language="eng">Talbot- Lau interferometry with a non- binary phase grating for non-destructive testing</parentTitle>
    <identifier type="urn">urn:nbn:de:kobv:b43-383163</identifier>
    <enrichment key="eventName">19th World Conference on Non-Destructive Testing 2016</enrichment>
    <enrichment key="eventPlace">Munich, Germany</enrichment>
    <enrichment key="eventStart">13.06.2016</enrichment>
    <enrichment key="eventEnd">17.06.2016</enrichment>
    <licence>Creative Commons - Namensnennung 3.0</licence>
    <author>Yury Shashev</author>
    <author>Andreas Kupsch</author>
    <author>Axel Lange</author>
    <author>Ralf Britzke</author>
    <author>Giovanni Bruno</author>
    <author>Bernd R. Müller</author>
    <author>M. P. Hentschel</author>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Talbot- Lau interferometry</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Phase grating</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Non-destructive testing</value>
    </subject>
    <collection role="ddc" number="620">Ingenieurwissenschaften und zugeordnete Tätigkeiten</collection>
    <collection role="fulltextaccess" number="">Datei für die Öffentlichkeit verfügbar ("Open Access")</collection>
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    <collection role="unnumberedseries" number="">Wissenschaftliche Artikel der BAM</collection>
    <thesisPublisher>Bundesanstalt für Materialforschung und -prüfung (BAM)</thesisPublisher>
    <file>https://opus4.kobv.de/opus4-bam/files/38316/Tu_3_G_2_Shashev_new.pdf</file>
  </doc>
  <doc>
    <id>55690</id>
    <completedYear/>
    <publishedYear>2022</publishedYear>
    <thesisYearAccepted/>
    <language>eng</language>
    <pageFirst>1292</pageFirst>
    <pageLast>1298</pageLast>
    <pageNumber/>
    <edition/>
    <issue>Pt 5</issue>
    <volume>29</volume>
    <type>article</type>
    <publisherName>International Union of Crystallography</publisherName>
    <publisherPlace>Chester</publisherPlace>
    <creatingCorporation/>
    <contributingCorporation/>
    <belongsToBibliography>1</belongsToBibliography>
    <completedDate>--</completedDate>
    <publishedDate>--</publishedDate>
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    <title language="eng">Upgraded imaging capabilities at the BAMline (BESSY II)</title>
    <abstract language="eng">The BAMline at the BESSY II synchrotron X-ray source has enabled research for more than 20 years in widely spread research fields such as materials science, biology, cultural heritage and medicine. As a nondestructive characterization method, synchrotron X-ray imaging, especially tomography, plays a particularly important role in structural characterization. A recent upgrade of key equipment of the BAMline widens its imaging capabilities: shorter scan acquisition times are now possible, in situ and operando studies can now be routinely performed, and different energy spectra can easily be set up. In fact, the upgraded double-multilayer monochromator brings full flexibility by yielding different energy spectra to optimize flux and energy resolution as desired. The upgraded detector (based on an sCMOS camera) also allows exploiting the higher flux with reduced readout times. Furthermore, an installed slip ring allows the sample stage to continuously rotate. The latter feature enables tomographic observation of processes occurring in the time scale of a few seconds.</abstract>
    <parentTitle language="eng">Journal of Synchrotron Radiation</parentTitle>
    <identifier type="doi">10.1107/S1600577522007342</identifier>
    <identifier type="issn">1600-5775</identifier>
    <identifier type="urn">urn:nbn:de:kobv:b43-556907</identifier>
    <enrichment key="opus.source">publish</enrichment>
    <enrichment key="date_peer_review">19.09.2022</enrichment>
    <licence>Creative Commons - CC BY - Namensnennung 4.0 International</licence>
    <author>Henning Markötter</author>
    <author>Michael Sintschuk</author>
    <author>Ralf Britzke</author>
    <author>Shahabeddin Dayani</author>
    <author>Giovanni Bruno</author>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Synchrotron radiation</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Computed tomography</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Double-multilayer monochromators</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Pink beams</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>X-ray optics</value>
    </subject>
    <collection role="ddc" number="543">Analytische Chemie</collection>
    <collection role="institutes" number="">8 Zerstörungsfreie Prüfung</collection>
    <collection role="institutes" number="">8.5 Röntgenbildgebung</collection>
    <collection role="themenfelder" number="">Chemie und Prozesstechnik</collection>
    <collection role="literaturgattung" number="">Verlagsliteratur</collection>
    <collection role="fulltextaccess" number="">Datei für die Öffentlichkeit verfügbar ("Open Access")</collection>
    <collection role="unnumberedseries" number="">Wissenschaftliche Artikel der BAM</collection>
    <thesisPublisher>Bundesanstalt für Materialforschung und -prüfung (BAM)</thesisPublisher>
    <file>https://opus4.kobv.de/opus4-bam/files/55690/BAMline_CT-upgrade_final_ye5023.pdf</file>
  </doc>
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