<?xml version="1.0" encoding="utf-8"?>
<export-example>
  <doc>
    <id>22490</id>
    <completedYear/>
    <publishedYear>2011</publishedYear>
    <thesisYearAccepted/>
    <language>eng</language>
    <pageFirst>5</pageFirst>
    <pageLast>8</pageLast>
    <pageNumber/>
    <edition/>
    <issue>1</issue>
    <volume>299</volume>
    <type>article</type>
    <publisherName>Elsevier B.V.</publisherName>
    <publisherPlace>Amsterdam</publisherPlace>
    <creatingCorporation/>
    <contributingCorporation/>
    <belongsToBibliography>1</belongsToBibliography>
    <completedDate>--</completedDate>
    <publishedDate>--</publishedDate>
    <thesisDateAccepted>--</thesisDateAccepted>
    <title language="eng">Time-of-flight mass spectroscopy of femtosecond and nanosecond laser ablated TeO2 crystals</title>
    <abstract language="eng">Single-pulse femtosecond (fs) (pulse duration ~200 fs, wavelength 398 nm) and nanosecond (ns) (pulse duration 4 ns, wavelength 355 nm) laser ablation have been applied in combination with time-of-flight mass spectrometer (TOFMS) to analyze the elemental composition of the plasma plume of single-crystalline telluria (c-TeO2, grown by the balance controlled Czochralski growth method). Due to the three-order difference of the peak intensities of the ns and fs-laser pulses, significant differences were observed regarding the laser-induced species in the plasma plume. Positive singly, doubly and triply charged Te ions (Te+, Te2+, Te3+) in the form of their isotopes were observed in case of both irradiations. In case of the ns-laser ablation the TeO+ formation was negligible compared to the fs case and there was no Te trimer (Te3+) formation observed. It was found that the amplitude of Te ion signals strongly depended on the applied laser pulse energy. Singly charged oxygen ions (O+) are always present as a byproduct in both kinds of laser ablation.</abstract>
    <parentTitle language="eng">International Journal of Mass Spectrometry</parentTitle>
    <identifier type="old">25020</identifier>
    <identifier type="doi">10.1016/j.ijms.2010.08.022</identifier>
    <identifier type="issn">0168-1176</identifier>
    <identifier type="issn">0020-7381</identifier>
    <identifier type="issn">1387-3806</identifier>
    <identifier type="issn">1873-2798</identifier>
    <enrichment key="date_peer_review">25.11.2010</enrichment>
    <author>S. Beke</author>
    <author>T. Kobayashi</author>
    <author>K. Sugioka</author>
    <author>K. Midorikawa</author>
    <author>Jörn Bonse</author>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Time-of-flight mass spectroscopy</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Tellurium dioxide crystals</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>second laser</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Nanosecond laser</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Ablation</value>
    </subject>
    <collection role="literaturgattung" number="">Verlagsliteratur</collection>
    <collection role="fulltextaccess" number="">Datei im Netzwerk der BAM verfügbar ("Closed Access")</collection>
  </doc>
</export-example>
