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<export-example>
  <doc>
    <id>50556</id>
    <completedYear/>
    <publishedYear>2020</publishedYear>
    <thesisYearAccepted/>
    <language>deu</language>
    <pageFirst>1</pageFirst>
    <pageLast>44</pageLast>
    <pageNumber/>
    <edition/>
    <issue/>
    <volume/>
    <type>other</type>
    <publisherName>Verein Deutscher Ingenieure (VDI)</publisherName>
    <publisherPlace>Düsseldorf</publisherPlace>
    <creatingCorporation>VDI/VDE-Gesellschaft Mess- und Automatisierungstechnik</creatingCorporation>
    <contributingCorporation/>
    <belongsToBibliography>0</belongsToBibliography>
    <completedDate>--</completedDate>
    <publishedDate>--</publishedDate>
    <thesisDateAccepted>--</thesisDateAccepted>
    <title language="deu">Terahertzsysteme und Anwendungsfelder</title>
    <abstract language="deu">Der Frequenzbereich der Terahertzwellen liegt im elektromagnetischen Spektrum zwischen den Mikrowellen und dem infraroten Licht – also etwa im Bereich von 0,1 bis 10 Terahertz (THz). Der VDI-Statusreport „Terahertzsysteme und Anwendungen“ stellt die unterschiedlichen Konzepte für Terahertzsysteme vor und zeigt Anwendungsbeispiele, bei denen die Terahertztechnik erfolgreich eingesetzt wird. Umfangreiche Literaturangaben ermöglichen eine intensivere Beschäftigung mit allen Themen des VDI-Statusreports.</abstract>
    <parentTitle language="deu">VDI-Statusreport</parentTitle>
    <identifier type="url">https://www.vdi.de/ueber-uns/presse/publikationen/details/terahertzsysteme-und-anwendungsfelder</identifier>
    <enrichment key="opus.doi.autoCreate">false</enrichment>
    <enrichment key="opus.urn.autoCreate">true</enrichment>
    <author>S. Becker</author>
    <author>Jörg Beckmann</author>
    <author>M.-T. Braun</author>
    <author>O. Cojocari</author>
    <author>V. Feige</author>
    <author>B. Fischer</author>
    <author>F. Friederich</author>
    <author>B. Globisch</author>
    <author>G. Hechtfischer</author>
    <author>K. Hens</author>
    <author>H.-W. Hübers</author>
    <author>J. Jelonnek</author>
    <author>J. Jonuscheit</author>
    <author>A. Keil</author>
    <author>T. Kleine-Ostmann</author>
    <author>E. Marquardt</author>
    <author>M. Mayr</author>
    <author>H.-U. Nickel</author>
    <author>D. Nüßler</author>
    <author>M. Peichl</author>
    <author>O. Peters</author>
    <author>J. Schür</author>
    <author>T. Sprenger</author>
    <author>A. Steiger</author>
    <author>S. van Frank</author>
    <author>N. Vieweg</author>
    <author>R. Wilk</author>
    <subject>
      <language>deu</language>
      <type>uncontrolled</type>
      <value>Terahertzsysteme</value>
    </subject>
    <collection role="ddc" number="543">Analytische Chemie</collection>
    <collection role="institutes" number="">8 Zerstörungsfreie Prüfung</collection>
    <collection role="themenfelder" number="">Chemie und Prozesstechnik</collection>
    <collection role="literaturgattung" number="">Verlagsliteratur</collection>
    <collection role="fulltextaccess" number="">Datei im Netzwerk der BAM verfügbar ("Closed Access")</collection>
    <collection role="institutes" number="">8.0 Abteilungsleitung und andere</collection>
  </doc>
  <doc>
    <id>51367</id>
    <completedYear/>
    <publishedYear>2020</publishedYear>
    <thesisYearAccepted/>
    <language>eng</language>
    <pageFirst>1530</pageFirst>
    <pageLast>1539</pageLast>
    <pageNumber/>
    <edition/>
    <issue>12</issue>
    <volume>74</volume>
    <type>article</type>
    <publisherName>Sage journals</publisherName>
    <publisherPlace/>
    <creatingCorporation/>
    <contributingCorporation/>
    <belongsToBibliography>1</belongsToBibliography>
    <completedDate>--</completedDate>
    <publishedDate>--</publishedDate>
    <thesisDateAccepted>--</thesisDateAccepted>
    <title language="eng">Removal of Etalon Features in the Far-Infrared–Terahertz Transmittance Spectra of Thin Polymer Films</title>
    <abstract language="eng">Etalon features in infrared spectra of stratified samples, their influence on the interpretation and methods to circumvent their presence in infrared spectra have been in discussion for decades. This paper focuses on the application of a method originally developed to remove interference fringes in the mid-infrared spectra for far-infrared Fourier transform spectroscopy on thin polymer films. We show that the total transmittance-reflectance technique, commonly used for mid-infrared, also works successfully in the far infrared spectral range where other approaches fail. Experimental spectra obtained by such technique are supported by model calculations and reveal the possibility and limits to obtain almost undisturbed far-infrared spectra which are suitable to determine low energy vibrations of ionomer salts under certain sample conditions.</abstract>
    <parentTitle language="eng">Applied Spectroscopy Express</parentTitle>
    <identifier type="doi">10.1177/0003702820922295</identifier>
    <enrichment key="date_peer_review">04.01.2021</enrichment>
    <author>U. Schade</author>
    <author>C. Dawei</author>
    <author>L. Puskar</author>
    <author>E. Ritter</author>
    <author>Jörg Beckmann</author>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Far-infrared spectroscopy</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Absorption</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Etalon feature</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Total transmittance reflectance</value>
    </subject>
    <collection role="ddc" number="543">Analytische Chemie</collection>
    <collection role="ddc" number="620">Ingenieurwissenschaften und zugeordnete Tätigkeiten</collection>
    <collection role="institutes" number="">8 Zerstörungsfreie Prüfung</collection>
    <collection role="themenfelder" number="">Material</collection>
    <collection role="themenfelder" number="">Chemie und Prozesstechnik</collection>
    <collection role="literaturgattung" number="">Verlagsliteratur</collection>
    <collection role="fulltextaccess" number="">Datei im Netzwerk der BAM verfügbar ("Closed Access")</collection>
    <collection role="institutes" number="">8.0 Abteilungsleitung und andere</collection>
  </doc>
  <doc>
    <id>51804</id>
    <completedYear/>
    <publishedYear>2020</publishedYear>
    <thesisYearAccepted/>
    <language>eng</language>
    <pageFirst/>
    <pageLast/>
    <pageNumber/>
    <edition/>
    <issue/>
    <volume/>
    <type>poster</type>
    <publisherName/>
    <publisherPlace/>
    <creatingCorporation/>
    <contributingCorporation/>
    <belongsToBibliography>0</belongsToBibliography>
    <completedDate>--</completedDate>
    <publishedDate>--</publishedDate>
    <thesisDateAccepted>--</thesisDateAccepted>
    <title language="eng">One-Line Monitoring of the Curing Process of FRP</title>
    <abstract language="eng">The knowledge of the cure situation during the production process of&#13;
thermosetting material is of enormous importance.&#13;
• Mid- and near- infrared (IR) spectroscopy in attenuated total&#13;
reflectance (ATR) geometry are promising techniques for curing&#13;
studies.&#13;
• An IR/THz sensor system was developed to investigate its suitability&#13;
for future online monitoring of curing processes in the production line.</abstract>
    <enrichment key="eventName">BESSY@HZB User Meeting 2020</enrichment>
    <enrichment key="eventPlace">Online meeting</enrichment>
    <enrichment key="eventStart">10.12.2020</enrichment>
    <enrichment key="eventEnd">10.12.2020</enrichment>
    <enrichment key="opus.doi.autoCreate">false</enrichment>
    <enrichment key="opus.urn.autoCreate">true</enrichment>
    <author>Jörg Beckmann</author>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Fiber Reinforced Polymers</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Curing Monitoring</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Attenuated Total  Reflectance</value>
    </subject>
    <collection role="ddc" number="543">Analytische Chemie</collection>
    <collection role="institutes" number="">8 Zerstörungsfreie Prüfung</collection>
    <collection role="themenfelder" number="">Chemie und Prozesstechnik</collection>
    <collection role="fulltextaccess" number="">Datei im Netzwerk der BAM verfügbar ("Closed Access")</collection>
    <collection role="literaturgattung" number="">Präsentation</collection>
    <collection role="institutes" number="">8.0 Abteilungsleitung und andere</collection>
  </doc>
  <doc>
    <id>51649</id>
    <completedYear/>
    <publishedYear>2020</publishedYear>
    <thesisYearAccepted/>
    <language>eng</language>
    <pageFirst/>
    <pageLast/>
    <pageNumber/>
    <edition/>
    <issue/>
    <volume/>
    <type>poster</type>
    <publisherName/>
    <publisherPlace/>
    <creatingCorporation/>
    <contributingCorporation/>
    <belongsToBibliography>0</belongsToBibliography>
    <completedDate>--</completedDate>
    <publishedDate>--</publishedDate>
    <thesisDateAccepted>--</thesisDateAccepted>
    <title language="eng">Novel Technique for On-Line Monitoring of the Curing Process of  Fiber Reinforced Polymer Composites</title>
    <abstract language="eng">A specially designed experimental set up has been integrated into a commercially available FT IR Spectrometer for ATR experiments on Epoxy Systems. Representative data of far infrared spectra measured during the curing process at different temperatures of an epoxy system will be presented in dependency of the curing situation. The experiments and the selected set up are discussed to demonstrate its potential for future monitoring and ageing control applications during a manufacturing process of polymer composites.</abstract>
    <identifier type="url">https://live-irmmwthz.pantheonsite.io/technical-program</identifier>
    <enrichment key="eventName">45. International Confercene on  infrared, milimeter and terahertz waves</enrichment>
    <enrichment key="eventPlace">Online meeting</enrichment>
    <enrichment key="eventStart">08.11.2020</enrichment>
    <enrichment key="eventEnd">13.11.2020</enrichment>
    <author>Jörg Beckmann</author>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Far-infrared spectroscopy</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Curing Monitoring</value>
    </subject>
    <collection role="ddc" number="543">Analytische Chemie</collection>
    <collection role="ddc" number="620">Ingenieurwissenschaften und zugeordnete Tätigkeiten</collection>
    <collection role="institutes" number="">8 Zerstörungsfreie Prüfung</collection>
    <collection role="themenfelder" number="">Material</collection>
    <collection role="themenfelder" number="">Chemie und Prozesstechnik</collection>
    <collection role="fulltextaccess" number="">Datei im Netzwerk der BAM verfügbar ("Closed Access")</collection>
    <collection role="literaturgattung" number="">Präsentation</collection>
    <collection role="institutes" number="">8.0 Abteilungsleitung und andere</collection>
  </doc>
  <doc>
    <id>51947</id>
    <completedYear/>
    <publishedYear>2020</publishedYear>
    <thesisYearAccepted/>
    <language>deu</language>
    <pageFirst>1</pageFirst>
    <pageLast>22</pageLast>
    <pageNumber/>
    <edition>Entwurf - Oktober 2020</edition>
    <issue/>
    <volume>VDI/VDE 5590 Blatt 2</volume>
    <type>other</type>
    <publisherName>VDI-Verlag</publisherName>
    <publisherPlace>Düsseldorf</publisherPlace>
    <creatingCorporation/>
    <contributingCorporation/>
    <belongsToBibliography>0</belongsToBibliography>
    <completedDate>--</completedDate>
    <publishedDate>--</publishedDate>
    <thesisDateAccepted>--</thesisDateAccepted>
    <title language="deu">Terahertzsysteme - Zeitbereichsspektrometer (TDS-Systeme)</title>
    <abstract language="deu">Diese Richtlinie definiert Kenngrößen und Messverfahren, um Terahertzsysteme für die Zeitbereichsspektroskopie (TDS)zu spezifizieren. So können Hersteller ihre Systeme übereinstimmend beschreiben und Anwender einfach Systeme vergleichen. Systeme für die Terahertz-Zeitbereichsspektroskopie sind aktive Systeme und nutzen verschiedene Techniken sowohl zur Erzeugung als auch zur zeitaufgelösten Messung von breitbandigen Terahertzimpulsen. Die dazugehörigen Terahertzspektren und -Phasen werden nach einer zeitlichen Abtastung über eine Fourier-Transformation berechnet. In dieser Richtlinie wird ein Überblick über die Funktionsweisen von Zeitbereichsspektrometern gegeben, die eingesetzten Messverfahren näher erläutert sowie die benötigten Begriffe und Kenngrößen definiert. Die Richtlinie konzentriert sich dabei auf Systeme, die auf sogenannten Abtastmessverfahren (Sampling-Messverfahren) basieren.</abstract>
    <parentTitle language="deu">VDI/VDE-Richtlinie</parentTitle>
    <identifier type="url">https://www.vdi.de/5590</identifier>
    <author>S. Becker</author>
    <author>Jörg Beckmann</author>
    <author>O. Cojocari</author>
    <author>V. Feige</author>
    <author>B. Fischer</author>
    <author>F. Friederich</author>
    <author>B. Globisch</author>
    <author>G. Hechtfischer</author>
    <author>K. Hens</author>
    <author>H.-W. Hübers</author>
    <author>J. Jelonnek</author>
    <author>J. Jonuscheit</author>
    <author>A. Keil</author>
    <author>T. Kleine-Ostmann</author>
    <author>M. Mayr</author>
    <author>D. Nüßler</author>
    <author>M. Peichl</author>
    <author>O. Peters</author>
    <author>J. Schür</author>
    <author>T. Sprenger</author>
    <author>A. Steiger</author>
    <author>S. van Frank</author>
    <author>N. Vieweg</author>
    <author>R. Wilk</author>
    <subject>
      <language>deu</language>
      <type>uncontrolled</type>
      <value>TDS-Systeme</value>
    </subject>
    <collection role="ddc" number="543">Analytische Chemie</collection>
    <collection role="institutes" number="">8 Zerstörungsfreie Prüfung</collection>
    <collection role="themenfelder" number="">Chemie und Prozesstechnik</collection>
    <collection role="literaturgattung" number="">Verlagsliteratur</collection>
    <collection role="fulltextaccess" number="">Weder Datei noch physisches Exemplar vorhanden ("No Access")</collection>
    <collection role="institutes" number="">8.0 Abteilungsleitung und andere</collection>
  </doc>
  <doc>
    <id>53059</id>
    <completedYear/>
    <publishedYear>2021</publishedYear>
    <thesisYearAccepted/>
    <language>eng</language>
    <pageFirst>1</pageFirst>
    <pageLast/>
    <pageNumber/>
    <edition/>
    <issue/>
    <volume/>
    <type>conferenceobject</type>
    <publisherName>IEEE</publisherName>
    <publisherPlace/>
    <creatingCorporation/>
    <contributingCorporation/>
    <belongsToBibliography>1</belongsToBibliography>
    <completedDate>--</completedDate>
    <publishedDate>--</publishedDate>
    <thesisDateAccepted>--</thesisDateAccepted>
    <title language="eng">Novel Technique for On-Line Monitoring of the Curing Process of Fiber Reinforced Polymer Composites</title>
    <abstract language="eng">A specially developed experimental set up has been integrated into a commercially available FT IR Spectrometer to study the curing of Epoxy Systems. MIR and FIR spectra measured during the curing process at different temperatures of an epoxy system will be presented in dependency of the curing time. The experiments and the selected set up are discussed to demonstrate its potential for future monitoring and ageing control applications during a manufacturing process of polymer composites.</abstract>
    <parentTitle language="eng">International Conference on Infrared Millimeter and Terahertz Waves</parentTitle>
    <identifier type="doi">10.1109/irmmw-thz46771.2020.9370646</identifier>
    <identifier type="isbn">978-1-7281-6620-9</identifier>
    <enrichment key="eventName">45. International conference on infrared, millimeter, and terahertz waves</enrichment>
    <enrichment key="eventPlace">Online meeting</enrichment>
    <enrichment key="eventStart">08.11.2020</enrichment>
    <enrichment key="eventEnd">13.11.2020</enrichment>
    <enrichment key="opus.source">publish</enrichment>
    <enrichment key="date_peer_review">04.08.2021</enrichment>
    <enrichment key="opus.doi.autoCreate">false</enrichment>
    <enrichment key="opus.urn.autoCreate">true</enrichment>
    <author>Jörg Beckmann</author>
    <author>L. Puskar</author>
    <author>E. Ritter</author>
    <author>U. Schade</author>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Far-infrared spectroscopy</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Online Curing Monitoring</value>
    </subject>
    <collection role="ddc" number="543">Analytische Chemie</collection>
    <collection role="institutes" number="">8 Zerstörungsfreie Prüfung</collection>
    <collection role="themenfelder" number="">Chemie und Prozesstechnik</collection>
    <collection role="literaturgattung" number="">Verlagsliteratur</collection>
    <collection role="fulltextaccess" number="">Datei im Netzwerk der BAM verfügbar ("Closed Access")</collection>
    <collection role="institutes" number="">8.0 Abteilungsleitung und andere</collection>
  </doc>
  <doc>
    <id>50555</id>
    <completedYear/>
    <publishedYear>2020</publishedYear>
    <thesisYearAccepted/>
    <language>eng</language>
    <pageFirst/>
    <pageLast/>
    <pageNumber/>
    <edition/>
    <issue/>
    <volume/>
    <type>poster</type>
    <publisherName/>
    <publisherPlace/>
    <creatingCorporation/>
    <contributingCorporation/>
    <belongsToBibliography>0</belongsToBibliography>
    <completedDate>--</completedDate>
    <publishedDate>--</publishedDate>
    <thesisDateAccepted>--</thesisDateAccepted>
    <title language="eng">Photolytically and Thermally Initiated Destruction on the Stability of (Ultra)High Molecular Polyethylene</title>
    <abstract language="eng">THz and mid IR spectroscopy of high-molecular PE (HMW) and ultra high-molecular PE (UHMW) reveals modifications of the molecular structure. Characteristic absorption bands are changed if the two materials are exposed by γ-Co60 radiation up to 600 kGy and subsequently stored at an annealing temperature of 398 K until for 729 days. UHMW-PE and HMW-PE behave differently during the ageing process because of their molecular weight and inherent structure distinctions. The spectroscopic data offer characteristic absorption bands, which have been used to describe the complete ageing process in more detail. For instance, the integral absorption in the B1u THz-region can be used to describe quantitatively the reduction of crystallinity. The formation of trans vinylene unsaturation and the decay of vinyl during ageing can be observed in detail in the mid IR range.</abstract>
    <enrichment key="eventName">9th International Workshop on Terahertz Technology and Applications</enrichment>
    <enrichment key="eventPlace">Kaiserslautern, Germany</enrichment>
    <enrichment key="eventStart">03.03.2020</enrichment>
    <enrichment key="eventEnd">04.03.2020</enrichment>
    <enrichment key="opus.doi.autoCreate">false</enrichment>
    <enrichment key="opus.urn.autoCreate">true</enrichment>
    <author>Jörg Beckmann</author>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>Degradation</value>
    </subject>
    <subject>
      <language>eng</language>
      <type>uncontrolled</type>
      <value>MID IR Spectroscopy</value>
    </subject>
    <collection role="ddc" number="620">Ingenieurwissenschaften und zugeordnete Tätigkeiten</collection>
    <collection role="ddc" number="621">Angewandte Physik</collection>
    <collection role="institutes" number="">3 Gefahrgutumschließungen; Energiespeicher</collection>
    <collection role="institutes" number="">3.4 Sicherheit von Lagerbehältern</collection>
    <collection role="institutes" number="">8 Zerstörungsfreie Prüfung</collection>
    <collection role="themenfelder" number="">Energie</collection>
    <collection role="themenfelder" number="">Material</collection>
    <collection role="themenfelder" number="">Degradationsmechanismen</collection>
    <collection role="fulltextaccess" number="">Datei im Netzwerk der BAM verfügbar ("Closed Access")</collection>
    <collection role="literaturgattung" number="">Präsentation</collection>
    <collection role="themenfelder" number="">Kerntechnische Entsorgung</collection>
    <collection role="institutes" number="">8.0 Abteilungsleitung und andere</collection>
  </doc>
</export-example>
