Dokument-ID Dokumenttyp Autoren/innen Persönliche Herausgeber/innen Haupttitel Abstract Auflage Verlagsort Verlag Herausgeber (Institution) Erscheinungsjahr Titel des übergeordneten Werkes Jahrgang/Band ISBN Veranstaltung Veranstaltungsort Beginndatum der Veranstaltung Enddatum der Veranstaltung Ausgabe/Heft Erste Seite Letzte Seite URN DOI Lizenz Datum der Freischaltung OPUS4-1322 misc Berger, Achim; Ecker, Klaus; Görner, Wolf; Merchel, Silke; Procop, Mathias; Radtke, Martin; Riesemeier, Heinrich X-ray fluorescence analysis at the BAMline Berlin Berliner Elektronenspeicherring-Gesellschaft für Synchrotronstrahlung 2002 BESSY highlights - annual report 2001 253 254 2016-02-19 OPUS4-1323 misc Berger, Achim; Görner, Wolf; Merchel, Silke; Radtke, Martin; Riesemeier, Heinrich; Reiche, I.; Riederer, J. A closer look at Albrecht Dürer's drawings (1471-1528) Berlin Berliner Elektronenspeicherring-Gesellschaft für Synchrotronstrahlung 2002 BESSY highlights 2001 32 33 2016-02-19 OPUS4-1324 misc Berger, Achim; Görner, Wolf; Merchel, Silke; Radtke, Martin; Riesemeier, Heinrich; Reiche, I.; Riederer, J. Non-destructive investigations of Dürer's silver point drawings by Sy-XRF Berlin Berliner Elektronenspeicherring-Gesellschaft für Synchrotronstrahlung 2002 BESSY highlights - annual report 2001 292 293 2016-02-19 OPUS4-2496 misc Reiche, I.; Berger, Achim; Buck, St.; Görner, Wolf; Ketelsen, Th.; Merchel, Silke; Radtke, Martin; Riederer, J.; Riesemeier, Heinrich BAMline meets Dürer and van Eyck - Multi-disciplinary investigation of Renaissance silver point drawings by µ-SR-XRF - http://www.bessy.de/publications/05.annual_reports/files/AnnualReport2002.pdf - Berlin Berliner Elektronenspeicherring-Gesellschaft für Synchrotronstrahlung 2003 BESSY highlights - annual report 2002 416 418 2016-02-19 OPUS4-2492 misc Berger, Achim; Görner, Wolf; Merchel, Silke; Procop, Mathias; Radtke, Martin; Riesemeier, Heinrich SY-XRF in certification of a reference material at the BAMline Berlin Berliner Elektronenspeicherring-Gesellschaft für Synchrotronstrahlung 2003 BESSY highlights - annual report 2002 311 312 2016-02-19 OPUS4-2025 Beitrag zu einem Tagungsband Berger, Achim; Ecker, Klaus; Görner, Wolf; Radtke, Martin; Reinholz, Uwe; Riesemeier, Heinrich; Segebade, Christian Strahlenverfahren in Kombination - ein Werkzeug für Analyse und Zertifizierung von Feststoffen Interessengemeinschaft Atomspektroskopie Berlin 2002 12. Jahreskolloquium "Analyse von Feststoffen unterschiedlicher Materialien aus Industrie und Umwelt" 12. Jahrescolloquium "Analyse von Feststoffen unterschiedlicher Materialien aus Industrie und Umwelt" Berlin, Deutschland 2002-11-19 1(?) 2016-02-19 OPUS4-2978 Vortrag Berger, Achim Quand Dürer rencontre AGLAE et BESSY - Etude non destructive de dessins a la pointe de metal du carnet de voyage d'Albrecht 2002 DAAD PROCOPE - Informations- und Kontaktbörse (pre-Procope) DAAD PROCOPE - Informations- und Kontaktbörse (pre-Procope) Lyon, France 2002-11-08 2016-02-19 OPUS4-2994 Vortrag Berger, Achim Dürer's chemischer Fingerprint - Untersuchungen mittels Synchrotroninduzierter Röntgenfluoreszenzanalyse rescon 2002 5. Erfurter Fachtage für Konservierung und Restaurierung 5. Erfurter Fachtage für Konservierung und Restaurierung Erfurt, Germany 2002-11-28 2002-11-30 2016-02-19 OPUS4-2969 Vortrag Berger, Achim With spezialized Irradiation and Detector Twins to High-Precision Photon 2002 Activation Analysis 14th Radiochemical Conference Activation Analysis 14th Radiochemical Conference Mariánské Lázne, Czech Republic 2002-04-14 2002-04-19 2016-02-19 OPUS4-2992 Vortrag Berger, Achim Strahlenverfahren in Kombination - ein Werkzeug für Analyse und Zertifizierung von Feststoffen 2002 Interessengemeinschaft Atomspektroskopie Berlin (IGAS), 12. Jahrescolloquium "Analyse von Feststoffen unterschiedlicher Materialien aus Industrie und Umwelt Interessengemeinschaft Atomspektroskopie Berlin (IGAS), 12. Jahrescolloquium "Analyse von Feststoffen unterschiedlicher Materialien aus Industrie und Umwelt Berlin, Germany 2002-11-19 2016-02-19 OPUS4-3080 Vortrag Berger, Achim Silberstiftzeichnungen - Zerstörungsfreie Spurenanalyse mit Synchrotronstrahlung 2003 Papier-Restaurierung / 10. IADA-Kongress (Internationale Arbeitsgemeinschaft der Archiv-, Bibliotheks- und Graphikrestauratoren) Papier-Restaurierung / 10. IADA-Kongress (Internationale Arbeitsgemeinschaft der Archiv-, Bibliotheks- und Graphikrestauratoren) Göttingen, Germany 2003-09-21 2003-09-25 2016-02-19 OPUS4-3797 Vortrag Berger, Achim Bestimmung von Kobalt in Nickel bei Gehalten im sub-mg/g Bereich 2003 GDCh Jahrestagung Chemie 2003, 19. Seminar Aktivierungsanalyse GDCh Jahrestagung Chemie 2003, 19. Seminar Aktivierungsanalyse Munich, Germany 2003-10-06 2003-10-11 2016-02-19 OPUS4-1525 Beitrag zu einem Sammelband Radtke, Martin; Berger, Achim; Ecker, Klaus; Merchel, Silke; Procop, Mathias; Riesemeier, Heinrich; Görner, Wolf; Reiche, I. Synchrotron induced X-ray fluorescence for trace element analysis Gesellschaft Deutscher Chemiker Workshop Application of Synchrotron Radiation in Chemistry - Status and Future 2002 Hamburg Workshop 3-924330-53-0 Hamburg Workshop Hamburg, Germany 2002-09-16 2002-09-17 1(?) 2016-02-19 OPUS4-2123 Beitrag zu einem Tagungsband Reiche, I.; Berger, Achim; Görner, Wolf; Merchel, Silke; Radtke, Martin; Riederer, J.; Riesemeier, Heinrich Dürer's chemischer Fingerprint - Untersuchungen mittels Synchrotron-induzierter Röntgenfluoreszenzanalyse 2002 5. Erfurter Fachtage für Konservierung und Restaurierung (rescon) 5. Erfurter Fachtage für Konservierung und Restaurierung Erfurt, Germany 2002-11-28 2002-11-30 2016-02-19 OPUS4-2686 Beitrag zu einem Sammelband Merchel, Silke; Berger, Achim; Görner, Wolf; Radtke, Martin; Reinholz, Uwe; Riesemeier, Heinrich; Vogl, Jochen; Frisch, A.; Reiche, I. Kunst- und Kulturgüter unter "Beschuss" Frankfurt am Main Gesellschaft Deutscher Chemiker Gesellschaft Deutscher Chemiker / Fachgruppe Nuklearchemie 2003 Jahrestagung der Fachgruppe Nuklearchemie und 19. Seminar Aktivierungsanalyse 3-936028-14-1 GDCh-Jahrestagung Chemie 2003 ; Jahrestagung der Fachgruppe Nuklearchemie ; 19. Seminar Aktivierungsanalyse München, Deutschland 2003-10-06 2003-10-11 5 68 2016-02-19 OPUS4-2690 Beitrag zu einem Tagungsband Radtke, Martin; Reiche, I.; Berger, Achim; Merchel, Silke; Riesemeier, Heinrich; Görner, Wolf; Riederer, J.; Roth, M. Simionovici, A. BAMline meets Dürer and Van Eyck - Spatially resolved SR-XRF analyses of silver point drawings and their mysterious inscriptions Amsterdam Elsevier 2003 17th International Conference on X-Ray Optics and Microanalysis 17th International Conference on X-Ray Optics and Microanalysis ; 17th ICXOM Chamonix, France 2003-09-22 2003-09-26 59.2004,10/11 48 2016-02-19 OPUS4-2675 Beitrag zu einem Sammelband Berger, Achim; Alber, D. Bestimmung von Kobalt in Nickel bei Gehalten im sub-mu/g Bereich Frankfurt am Main Gesellschaft Deutscher Chemiker Gesellschaft Deutscher Chemiker / Fachgruppe Nuklearchemie 2003 Jahrestagung der Fachgruppe Nuklearchemie und 19. Seminar Aktivierungsanalyse 3-936028-14-1 GDCh-Jahrestagung Chemie 2003 ; Jahrestagung der Fachgruppe Nuklearchemie ; 19. Seminar Aktivierungsanalyse München, Deutschland 2003-10-06 2003-10-11 5 4 2016-02-19 OPUS4-2663 Zeitschriftenartikel Reiche, I.; Berger, Achim; Görner, Wolf; Merchel, Silke; Radtke, Martin; Riederer, J.; Riesemeier, Heinrich Silberstiftzeichnungen - Zerstörungsfreie Spurenanalyse mit Synchrotronstrahlung Stuttgart Foto Text Verl. 2003 PapierRestaurierung 4 10. IADA-Kongress (Internationale Arbeitsgemeinschaft der Archiv-, Bibliotheks- und Graphikrestauratoren) Göttingen, Deutschland 2003-09-21 2003-09-25 2016-02-19 OPUS4-3507 misc Berger, Achim; Calligaro, T.; Duval, A.; Görner, Wolf; Guerra, M.-F.; Merchel, Silke; Radtke, Martin; Reiche, I.; Riesemeier, Heinrich; Roth, M. Study of Ag and Au based historical and archaeological objects by high energy Sy-XRF Berlin Berliner Elektronenspeicherring-Gesellschaft für Synchrotronstrahlung 2004 BESSY highlights - annual report 2003 544 546 2016-02-19 OPUS4-3570 Zeitschriftenartikel Reiche, I.; Berger, Achim; Duval, A.; Görner, Wolf; Merchel, Silke; Radtke, Martin; Riederer, J.; Riesemeier, Heinrich Metallstiftzeichnungen Albrecht Dürers Stuttgart Foto Text Verl. 2004 PapierRestaurierung 5 2 30 38 2016-02-19 OPUS4-1397 Beitrag zu einem Tagungsband Radtke, Martin; Berger, Achim; Görner, Wolf; Merchel, Silke; Reiche, I.; Riederer, J.; Riesemeier, H. Spatial Resolved Trace Analysis of Dürer's Silver Point Drawings by Means of SR-XRF 2002 Proceedings of the European Conference on Energy Dispersive X-Ray Spectrometry European Conference on Energy Dispersive X-Ray Spectrometry (EDXRS) Berlin, Germany 2002-06-16 2002-06-21 158 2016-02-19 OPUS4-1400 Beitrag zu einem Tagungsband Merchel, Silke; Berger, Achim; Görner, Wolf; Radtke, Martin; Riesemeier, Heinrich; Reiche, I.; Riederer, J.; Duval, A.; Guicharnaud, H. Non-Destructive Investigations of Dürer's Silver Point Drawings by Pixe and SY-XRF Dept. of Chemistry, Micro- and Trace Analysis Centre, University of Antwerp, Belgium 2002 Proceedings of the 7th International Conference on Non-destructive testing and Microanalysis for the Diagnostics and Conservation of the Cultural and Environmental Heritage 7th International Conference on Non-destructive testing and Microanalysis for the Diagnostics and Conservation of the Cultural and Environmental Heritage ; art 2002 Antwerp, Belgium 2002-06-02 2002-06-06 82 2016-02-19 OPUS4-2356 Beitrag zu einem Sammelband Reiche, I.; Berger, Achim; Duval, A.; Görner, Wolf; Guicharnaud, H.; Merchel, Silke; Radtke, Martin; Riederer, J.; Riesemeier, Heinrich; Roth, M. Röhrs, S. Auf den Spuren Albrecht Dürers - Zerstörungsfreie Untersuchung von Silberstiftzeichnungen mittels Mikro-PIXE und Synchrotron-induzierter Mikro-RFA [Frankfurt am Main] Gesellschaft Deutscher Chemiker / Arbeitskreis Archäometrie 2003 Archäometrie und Denkmalpflege (Jahrestagung ... / AK Archäometrie in der GDCh 2003) 3-00-014223-1 Jahrestagung 2003 im Ethnologischen Museum Berlin-Dahlem Berlin, Deutschland 2003-03-12 2003-03-14 118 120 2016-02-19 OPUS4-3632 Posterpräsentation Berger, Achim Kunst- und Kulturgüter unter "Beschuss" 2004 Tag der Chemie, Universitätsstandort Tag der Chemie, Universitätsstandort Potsdam, Germany 2004-07-07 2016-02-19 OPUS4-3635 Vortrag Berger, Achim Determination of cobalt in nickel in the SUB-PPM level with cold neutrons 2004 11th International Conference on Modern Trends in Activation Analysis (MTAA-11) 11th International Conference on Modern Trends in Activation Analysis (MTAA-11) Guildford, England 2004-06-20 2004-06-25 2016-02-19 OPUS4-7460 Posterpräsentation Berger, Achim Bestimmung von ionen-implantiertem Molybdän in Halbleitersilizium 2005 Tag der Chemie, Freie Universität Berlin Tag der Chemie, Freie Universität Berlin Berlin, Germany 2005-06-08 2016-02-19 OPUS4-5058 Posterpräsentation Berger, Achim Non-destructive analyses by PIXE and Sy-XRF: Indian Miniatures, Renaissance metal point drawings and the Sky Disc of Nebra 2004 ECAART-8 8th European Conference on Accelerators in Applied Research and Technology ECAART-8 8th European Conference on Accelerators in Applied Research and Technology Paris, France 2004-09-20 2004-09-24 2016-02-19 OPUS4-7677 Beitrag zu einem Tagungsband Reiche, I.; Berger, Achim; Duval, A.; Görner, Wolf; Guicharnaud, H.; Merchel, Silke; Radtke, Martin; Riederer, J.; Riesemeier, Heinrich; Roth, M. Marabelli, M.; Tabaso, M. Spatially resolved SR-XRF analyses of complex drawings of the Holbein family Lecce Italian Society of Non Destructive Testing 2005 Proceedings of the 8th International Conference on "Non-Destructive Investigations and Microanalysis for the Diagnostics and Conservation of the Cultural and Environmental Heritage" 8th International Conference on "Non-Destructive Investigations and Microanalysis for the Diagnostics and Conservation of the Cultural and Environmental Heritage" Lecce, Italy 2005-05-15 2005-06-19 7 pages 2016-02-19 OPUS4-11623 Posterpräsentation Berger, Achim Bestimmung von ionen-implantiertem Molybdän in Halbleitersilizium 2005 20. Seminar Aktivierungsanalyse, TU München/Garching 20. Seminar Aktivierungsanalyse, TU München/Garching Munich, Germany 2005-02-24 2005-02-25 2016-02-19 OPUS4-11229 Zeitschriftenartikel Görner, Wolf; Berger, Achim; Ecker, Klaus; Haase, Oskar; Hedrich, Martina; Segebade, Christian; Weidemann, Gerd; Dudek, Gabriele Broad band application of combined instrumental photon and neutron activation analysis Lausanne Elsevier Sequoia 2001 Journal of radioanalytical and nuclear chemistry 248 1 45 52 2016-02-19 OPUS4-12532 Zeitschriftenartikel Reiche, I.; Radtke, Martin; Berger, Achim; Görner, Wolf; Merchel, Silke; Riesemeier, Heinrich; Bevers, H. Spatially resolved synchrotron radiation induced X-ray fluorescence analyses of rare Rembrandt silverpoint drawings New analyses of a series of very rare silverpoint drawings that were executed by Rembrandt Harmensz. van Rijn (1606–1669) which are kept today in the Kupferstichkabinett (Museum of Prints and Drawings) of the State Museums of Berlin are reported here. Analysis of these drawings requires particular attention because the study has to be fully non-destructive and extremely sensitive. The metal alloy on the paper does not exceed some hundreds of µg/cm². Therefore, synchrotron radiation induced X-ray fluorescence (SR-XRF) is – together with external micro-proton-induced X-ray emission – the only well-suited method for the analyses of metalpoint drawings. In some primary work, about 25 German and Flemish metalpoint drawings were investigated using spatially resolved SR-XRF analysis at the BAMline at BESSY. This study enlarges the existing French–German database of metalpoint drawings dating from the 15th and 16th centuries, as these Rembrandt drawings originate from the 17th century where this graphical technique was even rarer and already obsolete. It also illustrates how SR-XRF analysis can reinforce art historical assumptions on the dating of drawings and their connection. Berlin Springer 2006 Applied physics A 83 2 169 173 10.1007/s00339-006-3505-4 2016-02-19 OPUS4-5548 Beitrag zu einem Sammelband Reiche, I.; Berger, Achim; Duval, A.; Görner, Wolf; Guicharnaud, H.; Merchel, Silke; Radtke, Martin; Riederer, J.; Riesemeier, Heinrich Traces of Albrecht Dürer: Non-destructive analyses of Renaissance silverpoint drawings Vienna IAEA International Atomic Energy Agency 2004 Analytical applications of nuclear techniques 92-0-114703-1 1181 138 142 2016-02-19 OPUS4-7220 Zeitschriftenartikel Pritzkow, Wolfgang; Vogl, Jochen; Berger, Achim; Ecker, Klaus; Grötzschel, R.; Klingbeil, Patrick; Persson, L.; Riebe, Gundel; Wätjen, U. Contribution of ICP-IDMS to the certification of antimony implanted in a silicon wafer - comparison with RBS and INAA results A thin-layer reference material for surface and near-surface analytical methods was produced and certified. The surface density of the implanted Sb layer was determined by Rutherford backscattering spectrometry (RBS), instrumental neutron activation analysis (INAA), and inductively coupled plasma isotope dilution mass spectrometry (ICP-IDMS) equipped with a multi-collector. The isotopic abundances of Sb (121Sb and 123Sb) were determined by multi-collector ICP-MS and INAA. ICP-IDMS measurements are discussed in detail in this paper. All methods produced values traceable to the SI and are accompanied by a complete uncertainty budget. The homogeneity of the material was measured with RBS. From these measurements the standard uncertainty due to possible inhomogeneities was estimated to be less than 0.78% for fractions of the area increments down to 0.75 mm2 in size. Excellent agreement between the results of the three different methods was found. For the surface density of implanted Sb atoms the unweighted mean value of the means of four data sets is 4.8121016 cm-2 with an expanded uncertainty (coverage factor k=2) of 0.0921016 cm-2. For the isotope amount ratio R (121Sb/123Sb) the unweighted mean value of the means of two data sets is 1.435 with an expanded uncertainty (coverage factor k=2) of 0.006. Berlin Springer 2001 Fresenius' journal of analytical chemistry 371 867 873 10.1007/s002160100987 2016-02-19 OPUS4-13870 Zeitschriftenartikel Ecker, Klaus; Wätjen, U.; Berger, Achim; Persson, L.; Pritzkow, Wolfgang; Radtke, Martin; Riesemeier, Heinrich RBS, SY-XRF, INAA and ICP-IDMS of antimony implanted in silicon - A multi-method approach to characterize and certify a reference material A layer of Sb atoms, implanted with an energy of 400 keV and a nominal dose of 5×1016 atoms/cm2 into a high purity silicon wafer, was certified for its areal density (atoms/cm2) using Rutherford backscattering spectrometry (RBS), instrumental neutron activation analysis (INAA) and inductively coupled plasma isotope dilution mass spectrometry (ICP-IDMS) and for its isotope ratio using INAA and ICP-IDMS. Excellent agreement between the results of the different independent methods was found. In the present work, the measurements of the homogeneity of the areal density of Sb, previously determined with RBS in spots having 1 mm diameter, are improved with synchrotron X-ray fluorescence analysis: Higher precision in even smaller sample spots allows to estimate a reduced inhomogeneity of the whole batch of samples of the order of only 0.4%. Thus the uncertainty of the certified value can further be reduced. Down to fractions of a chip with 0.3×0.4 mm2 area, the areal density is now certified as (4.81±0.06)×1016 Sb atoms/cm2, where the expanded uncertainty 0.06 (coverage factor k=2) corresponds to only 1.2%. The relative merits of the different analytical methods are discussed. Amsterdam Elsevier 2002 Nuclear instruments and methods in physics research B 188 1-4 120 125 10.1016/S0168-583X(01)01038-2 2016-02-19 OPUS4-24386 Zeitschriftenartikel Kühn, Andreas; Scharf, Oliver; Ordavo, I.; Riesemeier, Heinrich; Reinholz, Uwe; Radtke, Martin; Berger, Achim; Ostermann, Markus; Panne, Ulrich Pushing the limits for fast spatially resolved elemental distribution patterns A new setup for fast spatially resolved measurements of elemental trace amounts under total reflection conditions using a new colour X-ray camera is described. Samples prepared on conventional total reflection X-ray fluorescence (TXRF) reflectors were measured at BESSY II synchrotron. A spatial resolution of 50 × 50 µm² was obtained, while the required time for the investigation of a 10 × 10 mm² sample is 30 seconds. The set-up is up to 350 times faster than conventional X-ray fluorescence systems for elemental traces. The major components of the X-ray camera are polycapillary optics and a pn-CCD chip with an active area of 13 × 13 mm². This area is divided into 264 × 264 pixels of 48 × 48 µm². A full X-ray spectrum with a resolution of 152 eV @ 5.9 keV and a chip temperature of 246 K is recorded for each pixel. The chip has a read-out rate of 400 Hz. London Royal Society of Chemistry 2011 Journal of analytical atomic spectrometry 26 1986 1989 10.1039/c1ja10069f 2016-02-19 OPUS4-16301 Posterpräsentation Berger, Achim Nitrogen determination in boron carbide by IPAA and gas fusion analyses 2007 GDCh-Wissenschaftsforum Chemie 2007 GDCh-Wissenschaftsforum Chemie 2007 Ulm, Germany 2007-09-16 2007-09-19 2016-02-19 OPUS4-16640 Vortrag Berger, Achim Schritte auf dem Weg zu einer "idealen" Kernstrahlungsspektrometrie 2007 21. Seminar Aktivierungsanalyse und Gammaspektroskopie (SAAGAS 21) 21. Seminar Aktivierungsanalyse und Gammaspektroskopie (SAAGAS 21) Mainz, Germany 2007-03-21 2007-03-23 2016-02-19 OPUS4-14190 Beitrag zu einem Sammelband Reiche, I.; Berger, Achim; Duval, A.; Görner, Wolf; Guicharnaud, H.; Merchel, Silke; Radtke, Martin; Riederer, J.; Riesemeier, Heinrich; Roth, M. Denker, A.; Adriaens, A.; Dowsett, M.; Giumlia-Mair, A. Synchrotron radiation and protons on the traces of famous artists - Non-destructive analyses of silverpoint drawings by Albrecht Dürer Stuttgart Fraunhofer-IRB-Verl. European Cooperation in the Field of Scientific and Technical Research 2006 COST Action G8 3-8167-7178-5 91 101 2016-02-19 OPUS4-14568 Zeitschriftenartikel Berger, Achim; Alber, D.; Bukalis, G. Determination of cobalt in nickel in the sub-ppm level with cold neutrons Lausanne Elsevier Sequoia 2007 Journal of radioanalytical and nuclear chemistry 271 1 251 253 2016-02-19 OPUS4-14637 Posterpräsentation Berger, Achim Nitrogen determination in boron carbide by INAA and gas fusion analysis 2007 21. Seminar Aktivierungsanalyse und Gammaspektroskopie (SAAGAS 21) 21. Seminar Aktivierungsanalyse und Gammaspektroskopie (SAAGAS 21) Mainz, Germany 2007-03-21 2007-03-23 2016-02-19 OPUS4-16149 Zeitschriftenartikel Merchel, Silke; Berger, Achim Determination of nitrogen in boron carbide by instrumental photon activation analysis Boron carbide is widely used as industrial material, because of its extreme hardness, and as a neutron absorber. As part of a round-robin exercise leading to certification of a new reference material (ERM-ED102) which was demanded by the industry we analysed nitrogen in boron carbide by inert gas fusion analysis (GFA) and instrumental photon activation analysis (IPAA) using the 14N(γ,n)13N nuclear reaction. The latter approach is the only non-destructive method among all the methods applied. By using photons with energy below the threshold of the 12C(γ,n)11C reaction, we hindered activation of matrix and other impurities. A recently installed beam with a very low lateral activating flux gradient enabled us to homogeneously activate sample masses of approximately 1 g. Taking extra precautions, i.e. self-absorption correction and deconvolution of the complex decay curves, we calculated a nitrogen concentration of 2260 ± 100 µg g-1, which is in good agreement with our GFA value of 2303 ± 64 µg g-1. The values are the second and third highest of a rather atypical (non-S-shape) distribution of data of 14 round-robin participants. It is of utmost importance for the certification process that our IPAA value is the only one not produced by inert gas fusion analysis and, therefore, the only one which is not affected by a possible incomplete release of nitrogen from high-melting boron carbide. Berlin Springer 2007 Analytical and bioanalytical chemistry 388 2 385 389 10.1007/s00216-007-1217-z 2016-02-19 OPUS4-16150 Zeitschriftenartikel Reiche, I.; Berger, Achim; Duval, A.; Guicharnaud, H.; Merchel, Silke; Radtke, Martin; Schäfer, D.; Simon, R. SY-XRF study of Hans Baldung Grien silverpoint drawings and the silver stylus from the 'Karlsruhe sketchbook' We performed spatially resolved synchrotron-induced x-ray fluorescence analyses (SY-XRF) of five silverpoint drawings from the famous `Karlsruhe sketchbook´ and a silverpoint, which is assumed to be an original one used by the Renaissance artist Hans Baldung Grien (1484-1545) himself. The silverpoint, one out of a very small number of ancient styli conserved nowadays, is fixed on the so-called `Karlsruhe sketchbook´. Measurements were executed at the FLUO-TOPO beamline at the electron storage ring ANKA. It has been shown, that SY-XRF at this beamline is nondestructive and sensitive enough for the analysis of minor and major elements in the silver strokes. This study provides new insights into this graphical technique and ancient drawing instruments: results are that three drawings have been created with a common type of silverpoint containing about (10.4 ± 0.7) wt% of Cu. In all the cases, Hg at a 10% level by weight was identified in the strokes. Presence of Hg is not due to the original silver alloy, but is a result of a general alteration phenomenon of silverpoint drawings. This fact is confirmed by the analysis of the original silverpoint, which contains only small traces of Hg. The result for the copper content of the silverpoint (10.4 ± 1.7) wt% is in good agreement with that of these three drawings. It is supposable that the silverpoint found attached today served for the creation of the corresponding drawings. Moreover, the graphical technique of Baldung is found to be continual over three decades. Only one very late drawing dated to 1543 was probably realized with another silverpoint, containing about 3 wt% of Cu. This difference in the chemical composition of drawings from the late period might be used as a more precise dating indicator of Baldung drawings that are not clearly attributed to a certain period. Chichester Wiley 2007 X-ray spectrometry 36 3 173 177 10.1002/xrs.963 2016-02-19 OPUS4-4899 Posterpräsentation Berger, Achim BAMline meets Dürer and Van Eyck: Multidisciplinary investigations of Renaissance silver point drawings 2002 21st BESSY Users' Meeting 21st BESSY Users' Meeting Berlin, Germany 2002-12-05 2002-12-06 2016-02-19 OPUS4-6907 Zeitschriftenartikel Görner, Wolf; Alber, D.; Berger, Achim; Haase, Oskar; Monse, G.; Segebade, Christian BEAMGAA - A chance for high precision analysis of big samples In activation analysis of traces in small samples, the non-equivalence of the activating radiation doses of sample and calibration material gives rise to sometimes tolerable systematic errors. Conversely, analysis of major components usually demands high trueness and precision. To meet this, beam geometry activation analysis (BEAMGAA) procedures have been developed for instrumental photon (IPAA) and neutron activation analysis (INAA) in which the activating neutron/photon beam exhibits broad, flat-topped characteristics. This results in a very low lateral activating flux gradient compared to known radiation facilities, however, at significantly lower flux density. The axial flux gradient can be accounted for by a monitor-sample-monitor assembly. As a first approach, major components were determined in high purity substances as well as selenium in a cattle fodder additive. Lausanne Elsevier Sequoia 2005 Journal of radioanalytical and nuclear chemistry 263 6th International Conference "Methods and Applications of Radioanalytical Chemistry" Kailua-Kona, HI, United States of America 2003-04-07 2003-04-11 3 791 796 10.1007/s10967-005-0660-6 2016-02-19 OPUS4-6897 Beitrag zu einem Sammelband Görner, Wolf; Berger, Achim; Merchel, Silke; Pernicka, E.; Radtke, Martin; Reiche, I.; Reinholz, Uwe; Riederer, J.; Riesemeier, Heinrich; Wunderlich, C. H. Kunst- und Kulturgüter unter "Beschuss" Berlin DGZfP Deutsche Gesellschaft für Zerstörungsfreie Prüfung 2004 ZfP in Forschung, Entwicklung und Anwendung - Jahrestagung 2004 3-931381-55-2 Jahrestagung Zerstörungsfreie Materialprüfung 2004 Salzburg, Österreich 2004-05-17 2004-05-19 1(?) 11(?) 2016-02-19 OPUS4-4574 Zeitschriftenartikel Reiche, I.; Berger, Achim; Görner, Wolf; Merchel, Silke; Radtke, Martin; Riederer, J.; Riesemeier, Heinrich; Roth, M. Following the traces of Albrecht Dürer: analysis of silverpoint drawings by spatially resolved synchrotron-induced X-ray fluorescence analysis Spatially resolved X-ray fluorescence analysis using synchrotron radiation (SR-XRF) at the wavelength shifter beamline, BAMline, at BESSY was used to investigate Renaissance silverpoint drawings as it is extremely sensitive, non-destructive and can be carried out in air using an excitation spot in the hundred micrometer range. This paper deals with first results of the study of silverpoint drawings of Albrecht Dürer (1471–1528) belonging to the sketchbook that Albrecht Dürer used during a travel to the Netherlands in 1520/21. These results are compared to a PIXE study performed on drawings from the same sketchbook. The minor element composition of the silverpoint used for the drawings in the sketchbook was (10.6 ± 3.5) wt.% of Cu and traces of Zn. Mercury was found in the marks but does not belong to the initial composition of the silverpoint as it is attributed to an alteration phenomenon. One drawing of the sketchbook represents an exception. It consists of silver marks containing an additional minor element, Zn, in the marks and was, therefore, created with another silverpoint, probably at a different time than the other drawings. Amsterdam Elsevier 2004 Nuclear instruments and methods in physics research B 226 1-2 83 91 10.1016/j.nimb.2004.03.081 2016-02-19 OPUS4-4575 Zeitschriftenartikel Reiche, I.; Radtke, Martin; Berger, Achim; Görner, Wolf; Ketelsen, T.; Merchel, Silke; Riederer, J.; Riesemeier, Heinrich; Roth, M. Spatially resolved synchrotron-induced X-ray fluorescence analyses of metal point drawings and their mysterious inscriptions Synchrotron-induced X-ray fluorescence (Sy-XRF) analysis was used to study the chemical composition of precious Renaissance silverpoint drawings. Drawings by famous artists such as Albrecht Dürer (1471–1528) and Jan van Eyck (approximately 1395–1441) must be investigated non-destructively. Moreover, extremely sensitive synchrotron- or accelerator-based techniques are needed since only small quantities of silver are deposited on the paper. New criteria for attributing these works to a particular artist could be established based on the analysis of the chemical composition of the metal points used. We illustrate how analysis can give new art historical information by means of two case studies. Two particular drawings, one of Albrecht Dürer, showing a profile portrait of his closest friend, “Willibald Pirckheimer” (1503), and a second one attributed to Jan van Eyck, showing a “Portrait of an elderly man”, often named “Niccolò Albergati”, are the object of intense art historical controversy. Both drawings show inscriptions next to the figures. Analyses by Sy-XRF could reveal the same kind of silverpoint for the Pirckheimer portrait and its mysterious Greek inscription, contrary to the drawing by Van Eyck where at least three different metal points were applied. Two different types of silver marks were found in this portrait. Silver containing gold marks were detected in the inscriptions and over-subscriptions. This is the first evidence of the use of gold points for metal point drawings in the Middle Ages. Amsterdam Elsevier 2004 Spectrochimica acta B 59 10-11 1657 1662 10.1016/j.sab.2004.07.023 2016-02-19 OPUS4-7380 misc Reiche, I.; Berger, Achim; Bevers, H.; Dupuis, G.; Duval, A.; Görner, Wolf; Guicharnaud, H.; Merchel, Silke; Radtke, Martin; Riederer, J.; Riesemeier, Heinrich; Roth, M. Spatially resolved SR-XRF analyses of complex drawings by the Holbein family and silverpoint drawings by Rembrandt Berlin Berliner Elektronenspeicherring-Gesellschaft für Synchrotronstrahlung 2005 BESSY highlights - annual report 2004 491 493 2016-02-19 OPUS4-19215 Beitrag zu einem Sammelband Segebade, Christian; Berger, Achim Robert A. Meyers, Photon activation analysis In photon activation analysis (PAA), nuclides of the analyte elements in the material sample under study are converted to radioactive nuclides through exposure to high-energy photons. Characteristic radiation upon disintegration of these radionuclides (preferably ? quanta) is then measured with appropriate spectrometers. PAA is not an “absolute” method; hence, the samples under investigation have to be irradiated together with a comparative material sample (calibration material) with well-known chemical composition. After spectroscopic measurement of both samples, the quantitative evaluation is performed by comparison of the two resulting element spectra, basically following the same procedure as in most instrumental methods, e.g. ICP, AAS, etc. The particular advantages of this method are freedom from blank values; reduced danger of contamination; and, since frequent investigations can be carried out “nondestructively”, easy handling of materials that are difficult to treat chemically, e.g. certain refractory metals, dusts, ashes, etc. Another advantage is the option to study very small samples (a few milligrams) as well as very large ones (up to kilogram amounts). Basically, there are no limitations concerning the nature of material studied but matrices like lead or other heavy elements raise the limit of detection considerably, and separation techniques have to be used. John Wiley & Sons, Ltd. 2008 Encyclopedia of analytical chemistry: Applications, Theory, and Instrumentation 978-0-471-97670-7 1 23 10.1002/9780470027318.a6211.pub2 2016-02-19 OPUS4-20787 Zeitschriftenartikel Ma, L.; Feng, L.; Hioki, A.; Cho, K.H.; Vogl, Jochen; Berger, Achim; Turk, G.; Macleod, S.; Labarraque, G.; Tong, W.F.; Schiel, D.; Yafa, C.; Valiente, L.; Konopelko, L.A.; Quetel, C.; Vermaercke, P.; Manzano, J.V.L.; Linsky, M.; Cortés, E.; Tangpitayakul, S.; Plangsangmas, L.; Bergamaschi, L.; Hearn, R. International comparison of the determination of the mass fraction of cadmium, chromium, mercury and lead in polypropylene: the Comité Consultatif pour la quantité de matière pilot study CCQM-P106 Berlin Springer 2010 Accreditation and quality assurance 15 1 39 44 10.1007/s00769-009-0574-z 2016-02-19 OPUS4-29893 Zeitschriftenartikel Balski, Matthias; Kipphardt, Heinrich; Berger, Achim; Meyer, S.; Panne, Ulrich Determination of impurities in solar grade silicon by inductively coupled plasma sector field mass spectrometry (ICP-SFMS) subsequent to matrix evaporation A method for the determination of 22 trace impurities in solar grade silicon after dissolution in a mixture of HF and HNO3 and subsequent matrix evaporation is reported. The presented method involves a simple, inexpensive, one-vessel sample preparation apparatus design. The recoveries of B, Na, Mg, Al, P, K, Ca, Ti, Cr, Mn, Fe, Co, Ni, Cu, Zn, Ga, Ge, As, Mo, Sb, W, and Tl at 250 µg kg-1 level are in the range of 93 to 108%. After careful selection of monitored isotopes and their respective resolutions, a sector field mass spectrometer has been used to carry out the measurements. Limits of determination down to 120 ng kg-1 have been obtained using a calibration by three-point standard addition. The method was tested on diluted NIST SRM 57b silicon powder as well as on synthetic test samples and also applied successfully on raw solar grade silicon samples in an interlaboratory comparison including NAA. Cambridge RSC Publ. Royal Society of Chemistry 2014 Analytical methods 6 1 77 85 10.1039/C3AY41213J 2016-02-20 OPUS4-24249 Zeitschriftenartikel Ostermann, Markus; Berger, Achim; Mans, C.; Simons, C.; Hanning, S.; Janßen, A.; Kreyenschmidt, M. Results and effects of homogeneity and stability studies carried out by X-ray fluorescence on the new reference material BAM-H010 The Federal Institute for materials research and testing (BAM)in cooperation with the Fachhochschule Münster has developed a new certified polymeric reference material, BAM-H010. The reference material consists of acrylonitrile-butadiene-styrene terpolymer (ABS) and has been doped with different contents of the elements Br, Cd, Cr, Hg and Pb. The monitoring of these elements is demanded in the EU directive 2002/95/EG, commonly referred to as RoHS. We have shown that the uncertainty contribution of the thermal long-term stability (ustability) is negligible compared to the contribution to the uncertainty caused by the method used for the characterization of the elemental content and the batch inhomogeneity (uhomogeneity). The stability of theABS material during exposure of the samples with hard X-radiation leads to a degradation of the ABS matrix with either long- or short-chain products. Berlin Springer 2011 Accreditation and quality assurance 16 10 515 522 10.1007/s00769-011-0806-x 2016-02-19 OPUS4-35575 Forschungsbericht Ecker, K. H.; Wätjen, U.; Berger, Achim; Grötzschel, R.; Persson, L.; Pritzkow, W.; Radtke, Martin; Riebe, Gundel; Riesemeier, Heinrich; Vogl, Jochen Certification of antimony implanted in silicon wafer with a silicon dioxide diffusion barrier - IRMM-302 and BAM-L001 This Report describes the certification of the reference material antimony implanted in Si/SiO2 intended to be used for calibration of surface and near surface analytical methods. It describes the preparation, homogeneity measurements and the analytical work performed for the certification of both Areal density of antimony Atoms (retained dose) and the isotope amount Ratio as well as giving considerations on the stability of the material. Geel, Belgium Institute for Reference Materials and Measurements 2002 IRMM and BAM Information Reference Materials 1 40 urn:nbn:de:kobv:b43-355752 http://www.gesetze-im-internet.de/urhg/index.html 2016-03-29