Dokument-ID Dokumenttyp Autoren/innen Persönliche Herausgeber/innen Haupttitel Abstract Auflage Verlagsort Verlag Herausgeber (Institution) Erscheinungsjahr Titel des übergeordneten Werkes Jahrgang/Band ISBN Veranstaltung Veranstaltungsort Beginndatum der Veranstaltung Enddatum der Veranstaltung Ausgabe/Heft Erste Seite Letzte Seite URN DOI Lizenz Datum der Freischaltung OPUS4-15730 Zeitschriftenartikel Cieslak, J.; Dubiel, S.M.; Eichhorn, F.; Menzel, Michael; Reuther, H. Investigation of single-crystals of chromium implanted with 119Sn-ions of various energies Single-crystals of chromium doped with 10 16 119Sn ions per cm2 and energies ranging between 45 and 190 keV were investigated with conversion electron Mössbauer spectroscopy (CEMS), Auger electron spectroscopy (AES), grazing angle X-ray diffraction (GAXRD), and scanning electron microscopy (SEM). The Mössbauer spectra were found to be significantly different than those of the bulk. Both the maximum and the average hf. field values were higher by a factor of ˜3 than the corresponding quantities for the bulk. The overall shape of the spectra is also different. GAXRD study has revealed that the near-surface zone of the investigated samples has a nanocrystalline structure with the average size of grains ranging between ˜20 and ˜40 nm. The latter seems to be the main reason for the observed enhancement of the spin-density and its distortion. Lausanne Elsevier Sequoia 2007 Journal of alloys and compounds 442 1-2 235 238 10.1016/j.jallcom.2006.07.143 2016-02-19