Dokument-ID Dokumenttyp Autoren/innen Persönliche Herausgeber/innen Haupttitel Abstract Auflage Verlagsort Verlag Herausgeber (Institution) Erscheinungsjahr Titel des übergeordneten Werkes Jahrgang/Band ISBN Veranstaltung Veranstaltungsort Beginndatum der Veranstaltung Enddatum der Veranstaltung Ausgabe/Heft Erste Seite Letzte Seite URN DOI Lizenz Datum der Freischaltung OPUS4-18136 Posterpräsentation Rackwitz, Vanessa Quantitative referenzfreie Röntgenfluoreszenzanalyse (RFA) - Unsicherheiten bei der Bestimmung der spektralen Röntgenröhrenverteilungen 2009 ANAKON 2009 ANAKON 2009 Berlin, Germany 2009-03-17 2009-03-20 2016-02-19 OPUS4-18477 Posterpräsentation Rackwitz, Vanessa Uncertainties at the Determination of the X-Ray Tube Spectral Distribution 2009 EMAS 2009 EMAS 2009 Gdansk, Poland 2009-05-10 2009-05-14 2016-02-19 OPUS4-18462 Vortrag Rackwitz, Vanessa The Determination of the Efficiency of an Energy Dispersive X-Ray Spectrometer up to 50keV with a SEM using a calibrated Reference Spectrometer 2009 EMAS 2009 EMAS 2009 Gdansk, Poland 2009-05-10 2009-05-14 2016-02-19 OPUS4-18730 Vortrag Rackwitz, Vanessa Kalibrierung eines Messstandes für Röntgenröhren 2009 Forschungsseminar "Moderne analytische Methoden der Physik", TU Berlin Forschungsseminar "Moderne analytische Methoden der Physik", TU Berlin Berlin, Germany 2009-02-03 2016-02-19 OPUS4-19714 Zeitschriftenartikel Rackwitz, Vanessa; Warrikhoff, A.; Panne, Ulrich; Hodoroaba, Vasile-Dan Determination of the efficiency of an energy dispersive X-ray spectrometer up to 50 keV with a SEM Both electron and polychromatic photon excitations (micro-focus X-ray source) at a scanning electron microscope (SEM) are used to determine the efficiency of an energy dispersive X-ray spectrometer up to 50 keV by means of a calibrated X-ray spectrometer and reference materials (RM) specially selected for this purpose. London Royal Society of Chemistry 2009 Journal of analytical atomic spectrometry 24 1034 1036 10.1039/b907815k 2016-02-19 OPUS4-19792 Zeitschriftenartikel Hodoroaba, Vasile-Dan; Rackwitz, Vanessa; Reuter, Dirk X-ray scattering and its benefits for X-ray spectrometry at the SEM New York, NY Cambridge University Press Microscopy Society of America 2009 Microscopy and microanalysis 15 Suppl. 2 1122 1123 10.1017/S1431927609094392 2016-02-19 OPUS4-19529 Vortrag Rackwitz, Vanessa Mikro-Röntgenfluorenszenz-Analyse (µ-RFA) am Rasterelektronen-Mikroskop (REM) 2009 15. Tagung Festkörperanalytik 15. Tagung Festkörperanalytik Chemnitz, Germany 2009-07-12 2009-07-16 2016-02-19 OPUS4-19533 Posterpräsentation Rackwitz, Vanessa Characterisation of Polycapillary Lenses with a Scanning Electron Microscope (SEM) 2009 ICXOM20, 20th International Congress on X-ray Optics and Microanalysis ICXOM20, 20th International Congress on X-ray Optics and Microanalysis Karlsruhe, Germany 2009-09-14 2009-09-18 2016-02-19 OPUS4-19536 Vortrag Rackwitz, Vanessa Micro-Focus X-Ray Fluorescence (µ-XRF) Analysis with a Scanning Electron Microscope (SEM) 2009 Euroanalysis 2009 Euroanalysis 2009 Innsbruck, Austria 2009-09-06 2009-09-10 2016-02-19 OPUS4-19537 Posterpräsentation Rackwitz, Vanessa Experimental Determination of the X-Ray Tube Spectral Distribution with a Scanning Electron Microscope (SEM) 2009 ICXOM20, 20th International Congress on X-ray Optics and Microanalysis ICXOM20, 20th International Congress on X-ray Optics and Microanalysis Karlsruhe, Germany 2009-09-14 2009-09-18 2016-02-19