TY  - CONF
A1  - Hodoroaba, Vasile-Dan
T1  - Quantitative EDS analysis on graphene related 2D materials
N2  - The elemental analysis of solid matter by means of the Energy-Dispersive X-Ray Spectrometry (EDS)  is meanwhile posible as a quick (seconds!) and more and more accurate analysis via standardsless (instantaneous) quantification. The sensitivity & quantification accuracy for light elements (C, O,..) has significantly increased in the recent years. The availability via table-top SEMs with incorporated EDS is also enhanced.
Further, the EDS analysis at an SEM is well-standardized, see ISO/TC 202 Microbeam Analysis & VAMAS/ TWA 37 Quantitative Microstructural Analysis in good liaisonships with ISO/TC 229 Nanotechnologies.
It is demostrated that key parameters such as oxygen-to-carbon atomic-% ratio and impurities can be realibly measured, with XPS as a reference method. Various EDS spectrometers and analysis conditions are tested and the validity of the EDS quantification of an ionic liquid of well-defined chemical composition is demonstrated.
Next steps are to launch a corresponding VAMAS interlaboratory comparison and to discuss within ISO/TC 229 towards inclusion of EDS as a routine method for the elemental analysis of GR2M into the ISO/TS 23359 Nanotechnologies — Chemical characterization of GR2Ms in powders and suspensions.
T2  - Annual Microscopy Community Meeting for the National Research Council in Canada
CY  - Online meeting
DA  - 18.11.2025
KW  - Graphene-related 2D materials (GR2M)
KW  - Elemental analysis
KW  - Light elements
KW  - SEM/EDS
KW  - Standardisation
PY  - 2025
AN  - OPUS4-64766
LA  - eng
AD  - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany
ER  -