TY  - JOUR
A1  - Chemello, Giovanni
A1  - Radnik, Jörg
A1  - Hodoroaba, Vasile-Dan
T1  - XPS–SEM/EDS Tandem Analysis for the Elemental Composition of Functionalized Graphene Nanoplatelets
JF  - ACS Omega
N2  - Over the past decade, energy-dispersive X-ray spectrometry (EDS) with scanning electron microscopy (SEM) has advanced to enable the accurate analysis of light elements such as C, N, or O. For this reason, EDS is becoming increasingly interesting as an analytical method for the elemental analysis of functionalized graphene and could be an attractive alternative to Xray photoelectron spectroscopy (XPS), which is considered the most important method for elemental analysis. In this study, comparative XPS and EDS investigations under different excitation conditions are carried out on commercially available powders containing graphene particles with different morphologies. The slightly different XPS/HAXPES and EDS results can be explained by the different information depths of the methods and the functionalization of the particle surfaces. For the material with smaller graphene particles and higher O/C ratios, all methods reported a lower O/C ratio in pellets compared with the unpressed powder samples. This clearly shows that sample preparation has a significant influence on the quantification results, especially for such a type of morphology. Overall, the study demonstrates that EDS is a reliable and fast alternative to XPS for the elemental quantification of functionalized graphene particles, provided that differences in the information depth are taken into account. Particle morphology can be examined in parallel with quantitative element analysis, since EDS spectrometers are typically coupled with SEM, which are available in a huge number of analytical laboratories.
KW  - Graphene oxide
KW  - SEM/EDS
KW  - XPS/HAXPES
KW  - Elemental composition
KW  - Functionalization
PY  - 2025
UR  - https://nbn-resolving.org/urn:nbn:de:kobv:b43-647294
DO  - https://doi.org/10.1021/acsomega.5c07830
SN  - 2470-1343
SP  - 1
EP  - 7
PB  - American Chemical Society (ACS)
AN  - OPUS4-64729
LA  - eng
AD  - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany
ER  -