TY  - JOUR
A1  - Scharek, Vera M.
A1  - Kröger, Tommy
A1  - Keil, Karin
A1  - Traub, Heike
A1  - Meermann, Björn
T1  - A new elemental analytical approach for microplastic sum parameter analysis—ETV/ICP-MS with CO2
JF  - Analytical and Bioanalytical Chemistry
N2  - Microplastics (MPs) are pervasive environmental pollutants and are considered one of the main challenges of our time. However, a fast and comprehensive analytical approach for MP analysis in complex matrices traceable to SI units is still lacking. In this context, we report a fast screening tool for the sum parameter analysis of MPs using electrothermal vaporization (ETV) coupled to inductively coupled plasma-mass spectrometry (ICP-MS). In our proof-of-concept study, we observed size-independent detection of MPs as peaks above the 13C+ signal background in the nano- to micrometer range without limitations regarding the polymer type. Quantification of the 13C+ MP signals was accomplished via an external gas calibration utilizing dynamic dilution of carbon dioxide with argon, yielding recovery rates of 80–96% for MP reference material (RM) of polymer types commonly found in the environment. The applicability to a soil sample was demonstrated through spiking experiments with a polyethylene (PE) MP RM in soil. The limit of detection (LOD) was estimated to be 0.13 µg C, equaling the detection of a single spherical low-density-PE particle of about 70 µm, and a limit of quantification (LOQ) of 0.42 µg C.
KW  - ETV/ICP-MS
KW  - Mikroplastik
KW  - Summenparameter
PY  - 2025
UR  - https://nbn-resolving.org/urn:nbn:de:kobv:b43-646418
DO  - https://doi.org/10.1007/s00216-025-06146-x
SN  - 1618-2642
SP  - 1
EP  - 10
PB  - Springer
CY  - Berlin ; Heidelberg
AN  - OPUS4-64641
LA  - eng
AD  - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany
ER  -