TY  - CONF
A1  - Güttler, Arne
T1  - Certified Reference Materials for the Quantification and Standardization of Fluorescence-based Measurements
N2  - The size and shape of photoluminescence signals is affected by wavelength-, polarization-, and time-dependent instrumentspecific contributions and the compound- and environment-specific photoluminescence quantum yield. The former hamper the comparability of fluorescence measurements performed on different measuring devices. The commonly relatively done determination of the performance parameter requires suitable quantum yield standards with well-known. The performance of such measurements is, e.g., described in the written standard IEC 62607 currently revised.
T2  - Colloquium für Optische Spektrometrie 2025
CY  - Jena, Germany
DA  - 24.09.2025
KW  - Quality assurance
KW  - Fluorescence
KW  - Nano
KW  - Particle
KW  - Advanced material
KW  - Calibration
KW  - Characterization
KW  - Fluorescence quantum yield
KW  - Phosphor
KW  - Absolute
KW  - Integrating sphere spectroscopy
KW  - Dye
KW  - Standardization
KW  - Reference material
KW  - Interlaboratory comparison
KW  - Uncertainty
PY  - 2025
AN  - OPUS4-64213
LA  - eng
AD  - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany
ER  -