TY  - JOUR
A1  - Lapenna, Michela
A1  - Faglioni, Francesco
A1  - Chand, Keerthana
A1  - Hejazi, Bardia
A1  - Fioresi, Rita
A1  - Bruno, Giovanni
T1  - Chamfer distance for non-linear registration of Triply Periodic Minimal Surface lattices
JF  - Additive Manufacturing Letters
N2  - We present a 3D image registration technique for non-linear deformation estimation in Additive Manufacturing processes. The methodology involves comparing X-ray Computed Tomography (XCT) data with Computer Aided Design (CAD) models for Triply Periodic Minimal Surface (TPMS) lattices and employs the Chamfer distance to refine mesh non-linear deformations.
KW  - X-ray Computed tomography
KW  - Defects
KW  - Machine Learning
KW  - Digital Twin
KW  - Registration
PY  - 2025
UR  - https://nbn-resolving.org/urn:nbn:de:kobv:b43-637367
DO  - https://doi.org/10.1016/j.addlet.2025.100299
SN  - 2772-3690
VL  - 14
SP  - 1
EP  - 8
PB  - Elsevier B.V.
AN  - OPUS4-63736
LA  - eng
AD  - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany
ER  -