TY - JOUR A1 - Bauch, J. A1 - Wege, Stefan A1 - Böhling, M. A1 - Ullrich, H.-J. T1 - Improved approaches to the determination of residual stresses in micro regions with the KOSSEL and the XRT technique JF - Crystal research and technology N2 - A new application of the KOSSEL and the XRT (X-ray Rotation-Tilt) technique arises from local residual stress measurements in micro regions. Already in 1996/97, we started to conduct such investigations based on the KOSSEL method. Because of the high lateral resolution residual stresses of the third kind can be determined. Some further evaluation procedures are described. KW - X-ray microdiffraction KW - KOSSEL technique KW - XRT technique KW - Determination of lattice parameters KW - Determination of resudal stress PY - 2004 DO - https://doi.org/10.1002/crat.200310234 SN - 0023-4753 SN - 1521-4079 SN - 0232-1300 VL - 39 IS - 7 SP - 623 EP - 633 PB - Wiley-VCH Verlag GmbH & Co. KGaA CY - Weinheim AN - OPUS4-5063 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -