TY - GEN A1 - Peplinski, Burkhard T1 - Can the Rietveld method be successfully applied to the severely superimposed diffraction patterns of technical products containing seven solid solutions and a stoichiometric phase? T2 - 9th European Powder Diffraction Conference (EPDIC-9) T2 - 9th European Powder Diffraction Conference (EPDIC-9) CY - Prague, Czech Republic DA - 2004-09-02 PY - 2004 UR - https://opus4.kobv.de/opus4-bam/frontdoor/index/index/docId/3881 AN - OPUS4-3881 AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany