TY - CONF A1 - Unger, Wolfgang T1 - Fabrication, microscopic and spectroscopic characterization of planar, nanopatterned,multi-metallic samples C T2 - 16th European Conference on Applications of Surface and Interface Analysis (ECASIA 15) T2 - 16th European Conference on Applications of Surface and Interface Analysis (ECASIA 15) CY - Granada, Spain DA - 2015-09-28 PY - 2015 AN - OPUS4-34809 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -